
Hoai V. Ho
Examiner (ID: 15701)
| Most Active Art Unit | 2827 |
| Art Unit(s) | 2818, 2827, 2312, 2511 |
| Total Applications | 2584 |
| Issued Applications | 2371 |
| Pending Applications | 99 |
| Abandoned Applications | 149 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
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[id] => 8258790
[patent_doc_number] => 08208293
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[patent_issue_date] => 2012-06-26
[patent_title] => 'Programmable phase-change memory and method therefor'
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[patent_app_country] => US
[patent_app_date] => 2005-12-09
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 11721432
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Array
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[patent_issue_date] => 2007-05-10
[patent_title] => 'Method for operating a semiconductor memory device and semiconductor memory device'
[patent_app_type] => utility
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Array
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[patent_doc_number] => 07248530
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[patent_issue_date] => 2007-07-24
[patent_title] => 'Integrated semiconductor memory device'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/261912 | Integrated semiconductor memory device | Oct 30, 2005 | Issued |
Array
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[patent_title] => 'Semiconductor device and method for controlling the same'
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Array
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Array
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[patent_issue_date] => 2007-03-06
[patent_title] => 'Self refresh circuit of PSRAM for real access time measurement and operating method for the same'
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Array
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[patent_title] => 'Circuit and method for subdividing a CAMRAM bank by controlling a virtual ground'
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Array
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[id] => 451343
[patent_doc_number] => 07251169
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[patent_title] => 'Voltage supply circuit and semiconductor memory'
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Array
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[patent_title] => 'Semiconductor memory and burn-in test method of semiconductor memory'
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Array
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[id] => 409894
[patent_doc_number] => 07286395
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[patent_issue_date] => 2007-10-23
[patent_title] => 'Current driven switched magnetic storage cells having improved read and write margins and magnetic memories using such cells'
[patent_app_type] => utility
[patent_app_number] => 11/260778
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Array
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[patent_title] => 'Magneto-resistive RAM having multi-bit cell array structure'
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Array
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Array
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Array
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