Search

Hung Nguyen

Examiner (ID: 13829, Phone: (571)272-2124 , Office: P/2882 )

Most Active Art Unit
2882
Art Unit(s)
2851, 2882
Total Applications
3062
Issued Applications
2654
Pending Applications
133
Abandoned Applications
304

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 17534650 [patent_doc_number] => 20220113259 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-04-14 [patent_title] => METHOD AND SYSTEM FOR INSPECTING REPAIR OR ASSEMBLY OPERATIONS [patent_app_type] => utility [patent_app_number] => 17/497211 [patent_app_country] => US [patent_app_date] => 2021-10-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8323 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17497211 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/497211
Method and system for inspecting repair or assembly operations Oct 7, 2021 Issued
Array ( [id] => 17521723 [patent_doc_number] => 20220107572 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-04-07 [patent_title] => POSITIONING APPARATUS, LITHOGRAPHY APPARATUS AND ARTICLE MANUFACTURING METHOD [patent_app_type] => utility [patent_app_number] => 17/492987 [patent_app_country] => US [patent_app_date] => 2021-10-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7692 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -23 [patent_words_short_claim] => 175 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17492987 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/492987
Positioning apparatus, lithography apparatus and article manufacturing method Oct 3, 2021 Issued
Array ( [id] => 18802315 [patent_doc_number] => 11835471 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-12-05 [patent_title] => Z-axis measurement fixture and method of determining the planarity of objects using the fixture [patent_app_type] => utility [patent_app_number] => 17/490461 [patent_app_country] => US [patent_app_date] => 2021-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 10 [patent_no_of_words] => 8712 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 261 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17490461 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/490461
Z-axis measurement fixture and method of determining the planarity of objects using the fixture Sep 29, 2021 Issued
Array ( [id] => 18546683 [patent_doc_number] => 11720031 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-08-08 [patent_title] => Overlay design for electron beam and scatterometry overlay measurements [patent_app_type] => utility [patent_app_number] => 17/487725 [patent_app_country] => US [patent_app_date] => 2021-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 7673 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17487725 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/487725
Overlay design for electron beam and scatterometry overlay measurements Sep 27, 2021 Issued
Array ( [id] => 18832256 [patent_doc_number] => 20230400783 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-12-14 [patent_title] => OBJECT TABLE, STAGE APPARATUS, HOLDING METHOD AND LITHOGRAPHIC APPARATUS [patent_app_type] => utility [patent_app_number] => 18/027343 [patent_app_country] => US [patent_app_date] => 2021-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9870 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18027343 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/027343
Object table, stage apparatus, holding method and lithographic apparatus Sep 26, 2021 Issued
Array ( [id] => 17337776 [patent_doc_number] => 20220004107 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-01-06 [patent_title] => OPTICAL ARRANGEMENT AND LITHOGRAPHY APPARATUS [patent_app_type] => utility [patent_app_number] => 17/480800 [patent_app_country] => US [patent_app_date] => 2021-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9322 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17480800 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/480800
Optical arrangement and lithography apparatus Sep 20, 2021 Issued
Array ( [id] => 19028193 [patent_doc_number] => 11927544 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-03-12 [patent_title] => Wafer defect tracing method and apparatus, electronic device and computer readable medium [patent_app_type] => utility [patent_app_number] => 17/475628 [patent_app_country] => US [patent_app_date] => 2021-09-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5860 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 231 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17475628 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/475628
Wafer defect tracing method and apparatus, electronic device and computer readable medium Sep 14, 2021 Issued
Array ( [id] => 17461965 [patent_doc_number] => 20220075270 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-03-10 [patent_title] => BAKE UNIT AND APPARATUS FOR TREATING SUBSTRATE [patent_app_type] => utility [patent_app_number] => 17/469366 [patent_app_country] => US [patent_app_date] => 2021-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7393 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17469366 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/469366
Bake unit and apparatus for treating substrate Sep 7, 2021 Issued
Array ( [id] => 17984226 [patent_doc_number] => 20220350263 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-11-03 [patent_title] => WAFER STAGE AND METHOD THEREOF [patent_app_type] => utility [patent_app_number] => 17/468432 [patent_app_country] => US [patent_app_date] => 2021-09-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11036 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17468432 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/468432
Wafer stage and method thereof Sep 6, 2021 Issued
Array ( [id] => 17816848 [patent_doc_number] => 11422455 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-08-23 [patent_title] => EUV exposure apparatus, and overlay correction method and semiconductor device fabricating method using the same [patent_app_type] => utility [patent_app_number] => 17/464826 [patent_app_country] => US [patent_app_date] => 2021-09-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 9120 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 183 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17464826 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/464826
EUV exposure apparatus, and overlay correction method and semiconductor device fabricating method using the same Sep 1, 2021 Issued
Array ( [id] => 18780536 [patent_doc_number] => 11822256 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-11-21 [patent_title] => Semiconductor processing tool and methods of operation [patent_app_type] => utility [patent_app_number] => 17/446254 [patent_app_country] => US [patent_app_date] => 2021-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 8957 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17446254 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/446254
Semiconductor processing tool and methods of operation Aug 26, 2021 Issued
Array ( [id] => 18225846 [patent_doc_number] => 20230064840 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-02 [patent_title] => METHOD AND APPARATUS FOR MITIGATING CONTAMINATION [patent_app_type] => utility [patent_app_number] => 17/460144 [patent_app_country] => US [patent_app_date] => 2021-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7138 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17460144 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/460144
Method and apparatus for mitigating contamination Aug 26, 2021 Issued
Array ( [id] => 18430063 [patent_doc_number] => 11675280 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-06-13 [patent_title] => Lithography system and method [patent_app_type] => utility [patent_app_number] => 17/459357 [patent_app_country] => US [patent_app_date] => 2021-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6255 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17459357 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/459357
Lithography system and method Aug 26, 2021 Issued
Array ( [id] => 20415054 [patent_doc_number] => 12498332 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-12-16 [patent_title] => Imaging metrology [patent_app_type] => utility [patent_app_number] => 18/043331 [patent_app_country] => US [patent_app_date] => 2021-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 3531 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18043331 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/043331
Imaging metrology Aug 26, 2021 Issued
Array ( [id] => 18203725 [patent_doc_number] => 11586115 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-02-21 [patent_title] => Method of operating semiconductor apparatus [patent_app_type] => utility [patent_app_number] => 17/411571 [patent_app_country] => US [patent_app_date] => 2021-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 19 [patent_no_of_words] => 7588 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17411571 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/411571
Method of operating semiconductor apparatus Aug 24, 2021 Issued
Array ( [id] => 17461977 [patent_doc_number] => 20220075282 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-03-10 [patent_title] => SYSTEM AND METHOD FOR OPTIMIZING A LITHOGRAPHY EXPOSURE PROCESS [patent_app_type] => utility [patent_app_number] => 17/407678 [patent_app_country] => US [patent_app_date] => 2021-08-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 15304 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17407678 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/407678
System and method for optimizing a lithography exposure process Aug 19, 2021 Issued
Array ( [id] => 20188325 [patent_doc_number] => 12399436 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-08-26 [patent_title] => Substrate holder, carrier system comprising a substrate holder and lithographic apparatus [patent_app_type] => utility [patent_app_number] => 18/027094 [patent_app_country] => US [patent_app_date] => 2021-08-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 2780 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18027094 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/027094
Substrate holder, carrier system comprising a substrate holder and lithographic apparatus Aug 19, 2021 Issued
Array ( [id] => 17445292 [patent_doc_number] => 20220065797 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-03-03 [patent_title] => SUBSTRATE DEFECT INSPECTION METHOD AND SUBSTRATE DEFECT INSPECTION APPARATUS [patent_app_type] => utility [patent_app_number] => 17/406743 [patent_app_country] => US [patent_app_date] => 2021-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9242 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17406743 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/406743
Substrate defect inspection method and substrate defect inspection apparatus Aug 18, 2021 Issued
Array ( [id] => 19355423 [patent_doc_number] => 12055861 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-08-06 [patent_title] => Inspection method, inspection system, and semiconductor fabrication using the same [patent_app_type] => utility [patent_app_number] => 17/406529 [patent_app_country] => US [patent_app_date] => 2021-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 4462 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 206 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17406529 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/406529
Inspection method, inspection system, and semiconductor fabrication using the same Aug 18, 2021 Issued
Array ( [id] => 17507001 [patent_doc_number] => 20220100104 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-03-31 [patent_title] => LITHOGRAPHIC APPARATUS [patent_app_type] => utility [patent_app_number] => 17/445344 [patent_app_country] => US [patent_app_date] => 2021-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5174 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 340 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17445344 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/445344
Lithographic apparatus Aug 17, 2021 Issued
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