
Hung Nguyen
Examiner (ID: 13829, Phone: (571)272-2124 , Office: P/2882 )
| Most Active Art Unit | 2882 |
| Art Unit(s) | 2851, 2882 |
| Total Applications | 3062 |
| Issued Applications | 2654 |
| Pending Applications | 133 |
| Abandoned Applications | 304 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 17534650
[patent_doc_number] => 20220113259
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-04-14
[patent_title] => METHOD AND SYSTEM FOR INSPECTING REPAIR OR ASSEMBLY OPERATIONS
[patent_app_type] => utility
[patent_app_number] => 17/497211
[patent_app_country] => US
[patent_app_date] => 2021-10-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 8323
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -10
[patent_words_short_claim] => 166
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17497211
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/497211 | Method and system for inspecting repair or assembly operations | Oct 7, 2021 | Issued |
Array
(
[id] => 17521723
[patent_doc_number] => 20220107572
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-04-07
[patent_title] => POSITIONING APPARATUS, LITHOGRAPHY APPARATUS AND ARTICLE MANUFACTURING METHOD
[patent_app_type] => utility
[patent_app_number] => 17/492987
[patent_app_country] => US
[patent_app_date] => 2021-10-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7692
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -23
[patent_words_short_claim] => 175
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17492987
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/492987 | Positioning apparatus, lithography apparatus and article manufacturing method | Oct 3, 2021 | Issued |
Array
(
[id] => 18802315
[patent_doc_number] => 11835471
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-12-05
[patent_title] => Z-axis measurement fixture and method of determining the planarity of objects using the fixture
[patent_app_type] => utility
[patent_app_number] => 17/490461
[patent_app_country] => US
[patent_app_date] => 2021-09-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 10
[patent_no_of_words] => 8712
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 261
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17490461
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/490461 | Z-axis measurement fixture and method of determining the planarity of objects using the fixture | Sep 29, 2021 | Issued |
Array
(
[id] => 18546683
[patent_doc_number] => 11720031
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-08-08
[patent_title] => Overlay design for electron beam and scatterometry overlay measurements
[patent_app_type] => utility
[patent_app_number] => 17/487725
[patent_app_country] => US
[patent_app_date] => 2021-09-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 7673
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 150
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17487725
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/487725 | Overlay design for electron beam and scatterometry overlay measurements | Sep 27, 2021 | Issued |
Array
(
[id] => 18832256
[patent_doc_number] => 20230400783
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-12-14
[patent_title] => OBJECT TABLE, STAGE APPARATUS, HOLDING METHOD AND LITHOGRAPHIC APPARATUS
[patent_app_type] => utility
[patent_app_number] => 18/027343
[patent_app_country] => US
[patent_app_date] => 2021-09-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 9870
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18027343
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/027343 | Object table, stage apparatus, holding method and lithographic apparatus | Sep 26, 2021 | Issued |
Array
(
[id] => 17337776
[patent_doc_number] => 20220004107
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-01-06
[patent_title] => OPTICAL ARRANGEMENT AND LITHOGRAPHY APPARATUS
[patent_app_type] => utility
[patent_app_number] => 17/480800
[patent_app_country] => US
[patent_app_date] => 2021-09-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 9322
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -19
[patent_words_short_claim] => 102
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17480800
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/480800 | Optical arrangement and lithography apparatus | Sep 20, 2021 | Issued |
Array
(
[id] => 19028193
[patent_doc_number] => 11927544
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-03-12
[patent_title] => Wafer defect tracing method and apparatus, electronic device and computer readable medium
[patent_app_type] => utility
[patent_app_number] => 17/475628
[patent_app_country] => US
[patent_app_date] => 2021-09-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 5860
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 231
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17475628
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/475628 | Wafer defect tracing method and apparatus, electronic device and computer readable medium | Sep 14, 2021 | Issued |
Array
(
[id] => 17461965
[patent_doc_number] => 20220075270
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-03-10
[patent_title] => BAKE UNIT AND APPARATUS FOR TREATING SUBSTRATE
[patent_app_type] => utility
[patent_app_number] => 17/469366
[patent_app_country] => US
[patent_app_date] => 2021-09-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7393
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 86
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17469366
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/469366 | Bake unit and apparatus for treating substrate | Sep 7, 2021 | Issued |
Array
(
[id] => 17984226
[patent_doc_number] => 20220350263
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-11-03
[patent_title] => WAFER STAGE AND METHOD THEREOF
[patent_app_type] => utility
[patent_app_number] => 17/468432
[patent_app_country] => US
[patent_app_date] => 2021-09-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 11036
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17468432
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/468432 | Wafer stage and method thereof | Sep 6, 2021 | Issued |
Array
(
[id] => 17816848
[patent_doc_number] => 11422455
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2022-08-23
[patent_title] => EUV exposure apparatus, and overlay correction method and semiconductor device fabricating method using the same
[patent_app_type] => utility
[patent_app_number] => 17/464826
[patent_app_country] => US
[patent_app_date] => 2021-09-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
[patent_figures_cnt] => 19
[patent_no_of_words] => 9120
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 183
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17464826
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/464826 | EUV exposure apparatus, and overlay correction method and semiconductor device fabricating method using the same | Sep 1, 2021 | Issued |
Array
(
[id] => 18780536
[patent_doc_number] => 11822256
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-11-21
[patent_title] => Semiconductor processing tool and methods of operation
[patent_app_type] => utility
[patent_app_number] => 17/446254
[patent_app_country] => US
[patent_app_date] => 2021-08-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 15
[patent_no_of_words] => 8957
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 80
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17446254
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/446254 | Semiconductor processing tool and methods of operation | Aug 26, 2021 | Issued |
Array
(
[id] => 18225846
[patent_doc_number] => 20230064840
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-03-02
[patent_title] => METHOD AND APPARATUS FOR MITIGATING CONTAMINATION
[patent_app_type] => utility
[patent_app_number] => 17/460144
[patent_app_country] => US
[patent_app_date] => 2021-08-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7138
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17460144
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/460144 | Method and apparatus for mitigating contamination | Aug 26, 2021 | Issued |
Array
(
[id] => 18430063
[patent_doc_number] => 11675280
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-06-13
[patent_title] => Lithography system and method
[patent_app_type] => utility
[patent_app_number] => 17/459357
[patent_app_country] => US
[patent_app_date] => 2021-08-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 6255
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 98
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17459357
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/459357 | Lithography system and method | Aug 26, 2021 | Issued |
Array
(
[id] => 20415054
[patent_doc_number] => 12498332
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-12-16
[patent_title] => Imaging metrology
[patent_app_type] => utility
[patent_app_number] => 18/043331
[patent_app_country] => US
[patent_app_date] => 2021-08-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
[patent_figures_cnt] => 17
[patent_no_of_words] => 3531
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 114
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18043331
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/043331 | Imaging metrology | Aug 26, 2021 | Issued |
Array
(
[id] => 18203725
[patent_doc_number] => 11586115
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-02-21
[patent_title] => Method of operating semiconductor apparatus
[patent_app_type] => utility
[patent_app_number] => 17/411571
[patent_app_country] => US
[patent_app_date] => 2021-08-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 19
[patent_no_of_words] => 7588
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 89
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17411571
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/411571 | Method of operating semiconductor apparatus | Aug 24, 2021 | Issued |
Array
(
[id] => 17461977
[patent_doc_number] => 20220075282
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-03-10
[patent_title] => SYSTEM AND METHOD FOR OPTIMIZING A LITHOGRAPHY EXPOSURE PROCESS
[patent_app_type] => utility
[patent_app_number] => 17/407678
[patent_app_country] => US
[patent_app_date] => 2021-08-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 15304
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -15
[patent_words_short_claim] => 77
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17407678
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/407678 | System and method for optimizing a lithography exposure process | Aug 19, 2021 | Issued |
Array
(
[id] => 20188325
[patent_doc_number] => 12399436
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-08-26
[patent_title] => Substrate holder, carrier system comprising a substrate holder and lithographic apparatus
[patent_app_type] => utility
[patent_app_number] => 18/027094
[patent_app_country] => US
[patent_app_date] => 2021-08-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 8
[patent_no_of_words] => 2780
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 133
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18027094
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/027094 | Substrate holder, carrier system comprising a substrate holder and lithographic apparatus | Aug 19, 2021 | Issued |
Array
(
[id] => 17445292
[patent_doc_number] => 20220065797
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-03-03
[patent_title] => SUBSTRATE DEFECT INSPECTION METHOD AND SUBSTRATE DEFECT INSPECTION APPARATUS
[patent_app_type] => utility
[patent_app_number] => 17/406743
[patent_app_country] => US
[patent_app_date] => 2021-08-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 9242
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -16
[patent_words_short_claim] => 139
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17406743
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/406743 | Substrate defect inspection method and substrate defect inspection apparatus | Aug 18, 2021 | Issued |
Array
(
[id] => 19355423
[patent_doc_number] => 12055861
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-08-06
[patent_title] => Inspection method, inspection system, and semiconductor fabrication using the same
[patent_app_type] => utility
[patent_app_number] => 17/406529
[patent_app_country] => US
[patent_app_date] => 2021-08-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 4462
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 206
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17406529
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/406529 | Inspection method, inspection system, and semiconductor fabrication using the same | Aug 18, 2021 | Issued |
Array
(
[id] => 17507001
[patent_doc_number] => 20220100104
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-03-31
[patent_title] => LITHOGRAPHIC APPARATUS
[patent_app_type] => utility
[patent_app_number] => 17/445344
[patent_app_country] => US
[patent_app_date] => 2021-08-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5174
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -15
[patent_words_short_claim] => 340
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17445344
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/445344 | Lithographic apparatus | Aug 17, 2021 | Issued |