Search

Jack I. Berman

Examiner (ID: 581, Phone: (571)272-2468 , Office: P/2881 )

Most Active Art Unit
2506
Art Unit(s)
2506, 2878, 2881, 2899
Total Applications
2582
Issued Applications
2252
Pending Applications
67
Abandoned Applications
266

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4424501 [patent_doc_number] => 06225627 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-05-01 [patent_title] => 'Focused ion beam system' [patent_app_type] => 1 [patent_app_number] => 9/264142 [patent_app_country] => US [patent_app_date] => 1999-03-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 2164 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 40 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/225/06225627.pdf [firstpage_image] =>[orig_patent_app_number] => 264142 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/264142
Focused ion beam system Mar 4, 1999 Issued
Array ( [id] => 4376173 [patent_doc_number] => 06288406 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-09-11 [patent_title] => 'Electron beam lithography system having variable writing speed' [patent_app_type] => 1 [patent_app_number] => 9/262639 [patent_app_country] => US [patent_app_date] => 1999-03-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 3687 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/288/06288406.pdf [firstpage_image] =>[orig_patent_app_number] => 262639 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/262639
Electron beam lithography system having variable writing speed Mar 3, 1999 Issued
Array ( [id] => 1280966 [patent_doc_number] => 06646269 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-11-11 [patent_title] => 'Radiation source module and cleaning apparatus therefor' [patent_app_type] => B1 [patent_app_number] => 09/258142 [patent_app_country] => US [patent_app_date] => 1999-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 17 [patent_no_of_words] => 6205 [patent_no_of_claims] => 67 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/646/06646269.pdf [firstpage_image] =>[orig_patent_app_number] => 09258142 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/258142
Radiation source module and cleaning apparatus therefor Feb 25, 1999 Issued
Array ( [id] => 4413311 [patent_doc_number] => 06310341 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-30 [patent_title] => 'Projecting type charged particle microscope and projecting type substrate inspection system' [patent_app_type] => 1 [patent_app_number] => 9/253456 [patent_app_country] => US [patent_app_date] => 1999-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 6323 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 143 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/310/06310341.pdf [firstpage_image] =>[orig_patent_app_number] => 253456 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/253456
Projecting type charged particle microscope and projecting type substrate inspection system Feb 21, 1999 Issued
Array ( [id] => 1169119 [patent_doc_number] => 06756600 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-06-29 [patent_title] => 'Ion implantation with improved ion source life expectancy' [patent_app_type] => B2 [patent_app_number] => 09/252845 [patent_app_country] => US [patent_app_date] => 1999-02-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1506 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/756/06756600.pdf [firstpage_image] =>[orig_patent_app_number] => 09252845 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/252845
Ion implantation with improved ion source life expectancy Feb 18, 1999 Issued
Array ( [id] => 4363871 [patent_doc_number] => 06191416 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-20 [patent_title] => 'Apparatus for producing a beam of atoms or radicals' [patent_app_type] => 1 [patent_app_number] => 9/252349 [patent_app_country] => US [patent_app_date] => 1999-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2603 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 183 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/191/06191416.pdf [firstpage_image] =>[orig_patent_app_number] => 252349 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/252349
Apparatus for producing a beam of atoms or radicals Feb 17, 1999 Issued
Array ( [id] => 4293583 [patent_doc_number] => 06211516 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-04-03 [patent_title] => 'Photoionization mass spectrometer' [patent_app_type] => 1 [patent_app_number] => 9/247646 [patent_app_country] => US [patent_app_date] => 1999-02-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 14 [patent_no_of_words] => 3629 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 48 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/211/06211516.pdf [firstpage_image] =>[orig_patent_app_number] => 247646 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/247646
Photoionization mass spectrometer Feb 8, 1999 Issued
09/246657 TIME-OF-FLIGHT MASS SPECTROMETER WITH FIRST AND SECOND ORDER LONGITUDINAL FOCUSING Feb 4, 1999 Abandoned
Array ( [id] => 4324261 [patent_doc_number] => 06248997 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-19 [patent_title] => 'Method of analyzing substances existing in gas' [patent_app_type] => 1 [patent_app_number] => 9/243853 [patent_app_country] => US [patent_app_date] => 1999-02-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 3719 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/248/06248997.pdf [firstpage_image] =>[orig_patent_app_number] => 243853 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/243853
Method of analyzing substances existing in gas Feb 2, 1999 Issued
Array ( [id] => 4037420 [patent_doc_number] => 05994705 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-11-30 [patent_title] => 'Flow-through photo-chemical reactor' [patent_app_type] => 1 [patent_app_number] => 9/240592 [patent_app_country] => US [patent_app_date] => 1999-02-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 4531 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 215 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/994/05994705.pdf [firstpage_image] =>[orig_patent_app_number] => 240592 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/240592
Flow-through photo-chemical reactor Jan 31, 1999 Issued
Array ( [id] => 4413732 [patent_doc_number] => 06265715 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-24 [patent_title] => 'Non-porous membrane for MALDI-TOFMS' [patent_app_type] => 1 [patent_app_number] => 9/239547 [patent_app_country] => US [patent_app_date] => 1999-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 18 [patent_no_of_words] => 6764 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/265/06265715.pdf [firstpage_image] =>[orig_patent_app_number] => 239547 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/239547
Non-porous membrane for MALDI-TOFMS Jan 28, 1999 Issued
Array ( [id] => 4375939 [patent_doc_number] => 06288393 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-09-11 [patent_title] => 'Automated method of circuit analysis' [patent_app_type] => 1 [patent_app_number] => 9/238436 [patent_app_country] => US [patent_app_date] => 1999-01-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5490 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/288/06288393.pdf [firstpage_image] =>[orig_patent_app_number] => 238436 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/238436
Automated method of circuit analysis Jan 27, 1999 Issued
Array ( [id] => 4422071 [patent_doc_number] => 06194717 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-27 [patent_title] => 'Quadrupole mass analyzer and method of operation in RF only mode to reduce background signal' [patent_app_type] => 1 [patent_app_number] => 9/238549 [patent_app_country] => US [patent_app_date] => 1999-01-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 4309 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 149 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/194/06194717.pdf [firstpage_image] =>[orig_patent_app_number] => 238549 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/238549
Quadrupole mass analyzer and method of operation in RF only mode to reduce background signal Jan 27, 1999 Issued
09/235946 MASS SPECTOMETRY WITH MULTIPLE ION GUIDES Jan 21, 1999 Abandoned
Array ( [id] => 4224198 [patent_doc_number] => 06040575 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-03-21 [patent_title] => 'Mass spectrometry from surfaces' [patent_app_type] => 1 [patent_app_number] => 9/235945 [patent_app_country] => US [patent_app_date] => 1999-01-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 24 [patent_no_of_words] => 17961 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/040/06040575.pdf [firstpage_image] =>[orig_patent_app_number] => 235945 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/235945
Mass spectrometry from surfaces Jan 21, 1999 Issued
Array ( [id] => 4422261 [patent_doc_number] => 06194732 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-27 [patent_title] => 'Charged-particle-beam exposure methods with beam parallelism detection and correction' [patent_app_type] => 1 [patent_app_number] => 9/222338 [patent_app_country] => US [patent_app_date] => 1998-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 17 [patent_no_of_words] => 7753 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 173 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/194/06194732.pdf [firstpage_image] =>[orig_patent_app_number] => 222338 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/222338
Charged-particle-beam exposure methods with beam parallelism detection and correction Dec 27, 1998 Issued
Array ( [id] => 4309409 [patent_doc_number] => 06252228 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-26 [patent_title] => 'Method of analyzing morphology of bulk defect and surface defect on semiconductor wafer' [patent_app_type] => 1 [patent_app_number] => 9/204054 [patent_app_country] => US [patent_app_date] => 1998-12-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 3550 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/252/06252228.pdf [firstpage_image] =>[orig_patent_app_number] => 204054 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/204054
Method of analyzing morphology of bulk defect and surface defect on semiconductor wafer Dec 2, 1998 Issued
Array ( [id] => 4276534 [patent_doc_number] => 06246060 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-12 [patent_title] => 'Apparatus for holding and aligning a scanning electron microscope sample' [patent_app_type] => 1 [patent_app_number] => 9/197351 [patent_app_country] => US [patent_app_date] => 1998-11-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 17 [patent_no_of_words] => 4668 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 171 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/246/06246060.pdf [firstpage_image] =>[orig_patent_app_number] => 197351 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/197351
Apparatus for holding and aligning a scanning electron microscope sample Nov 19, 1998 Issued
Array ( [id] => 4140349 [patent_doc_number] => 06015976 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-01-18 [patent_title] => 'Fabrication apparatus employing energy beam' [patent_app_type] => 1 [patent_app_number] => 9/195254 [patent_app_country] => US [patent_app_date] => 1998-11-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 84 [patent_figures_cnt] => 166 [patent_no_of_words] => 17845 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 157 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/015/06015976.pdf [firstpage_image] =>[orig_patent_app_number] => 195254 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/195254
Fabrication apparatus employing energy beam Nov 17, 1998 Issued
Array ( [id] => 4104649 [patent_doc_number] => 06066848 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-05-23 [patent_title] => 'Parallel fluid electrospray mass spectrometer' [patent_app_type] => 1 [patent_app_number] => 9/185450 [patent_app_country] => US [patent_app_date] => 1998-11-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 12 [patent_no_of_words] => 8069 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/066/06066848.pdf [firstpage_image] =>[orig_patent_app_number] => 185450 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/185450
Parallel fluid electrospray mass spectrometer Nov 2, 1998 Issued
Menu