Search

Jack I. Berman

Examiner (ID: 581, Phone: (571)272-2468 , Office: P/2881 )

Most Active Art Unit
2506
Art Unit(s)
2506, 2878, 2881, 2899
Total Applications
2582
Issued Applications
2252
Pending Applications
67
Abandoned Applications
266

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 3949544 [patent_doc_number] => 05990483 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-11-23 [patent_title] => 'Particle detection and particle detector devices' [patent_app_type] => 1 [patent_app_number] => 8/939735 [patent_app_country] => US [patent_app_date] => 1997-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 13 [patent_no_of_words] => 4089 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 42 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/990/05990483.pdf [firstpage_image] =>[orig_patent_app_number] => 939735 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/939735
Particle detection and particle detector devices Oct 5, 1997 Issued
Array ( [id] => 4090241 [patent_doc_number] => 06025591 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-15 [patent_title] => 'Quadrupole mass spectrometers' [patent_app_type] => 1 [patent_app_number] => 8/939725 [patent_app_country] => US [patent_app_date] => 1997-10-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 19 [patent_no_of_words] => 2527 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 27 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/025/06025591.pdf [firstpage_image] =>[orig_patent_app_number] => 939725 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/939725
Quadrupole mass spectrometers Oct 2, 1997 Issued
Array ( [id] => 4243454 [patent_doc_number] => 06080985 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-06-27 [patent_title] => 'Ion source and accelerator for improved dynamic range and mass selection in a time of flight mass spectrometer' [patent_app_type] => 1 [patent_app_number] => 8/940576 [patent_app_country] => US [patent_app_date] => 1997-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 5512 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/080/06080985.pdf [firstpage_image] =>[orig_patent_app_number] => 940576 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/940576
Ion source and accelerator for improved dynamic range and mass selection in a time of flight mass spectrometer Sep 29, 1997 Issued
Array ( [id] => 4070222 [patent_doc_number] => 06008498 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-12-28 [patent_title] => 'Charged particle beam apparatus and method of using the same' [patent_app_type] => 1 [patent_app_number] => 8/940741 [patent_app_country] => US [patent_app_date] => 1997-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 6758 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/008/06008498.pdf [firstpage_image] =>[orig_patent_app_number] => 940741 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/940741
Charged particle beam apparatus and method of using the same Sep 29, 1997 Issued
90/004771 MASS SPECTROMETER AND METHOD AND IMPROVED ION TRANSMISSION Sep 29, 1997 Issued
Array ( [id] => 4222200 [patent_doc_number] => 06087667 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-07-11 [patent_title] => 'Charged-particle-beam (CPB) lithography apparatus, evaluation method, and CPB source' [patent_app_type] => 1 [patent_app_number] => 8/940638 [patent_app_country] => US [patent_app_date] => 1997-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 2752 [patent_no_of_claims] => 38 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/087/06087667.pdf [firstpage_image] =>[orig_patent_app_number] => 940638 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/940638
Charged-particle-beam (CPB) lithography apparatus, evaluation method, and CPB source Sep 29, 1997 Issued
Array ( [id] => 3960575 [patent_doc_number] => 05936252 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-08-10 [patent_title] => 'Charged particle beam performance measurement system and method thereof' [patent_app_type] => 1 [patent_app_number] => 8/936353 [patent_app_country] => US [patent_app_date] => 1997-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 14 [patent_no_of_words] => 4774 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/936/05936252.pdf [firstpage_image] =>[orig_patent_app_number] => 936353 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/936353
Charged particle beam performance measurement system and method thereof Sep 23, 1997 Issued
Array ( [id] => 4221673 [patent_doc_number] => 06111251 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-29 [patent_title] => 'Method and apparatus for MALDI analysis' [patent_app_type] => 1 [patent_app_number] => 8/934455 [patent_app_country] => US [patent_app_date] => 1997-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 24 [patent_no_of_words] => 6860 [patent_no_of_claims] => 39 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 15 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/111/06111251.pdf [firstpage_image] =>[orig_patent_app_number] => 934455 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/934455
Method and apparatus for MALDI analysis Sep 18, 1997 Issued
Array ( [id] => 3980051 [patent_doc_number] => 05917186 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-06-29 [patent_title] => 'Focused ion beam optical axis adjustment method and focused ion beam apparatus' [patent_app_type] => 1 [patent_app_number] => 8/925976 [patent_app_country] => US [patent_app_date] => 1997-09-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3774 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 179 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/917/05917186.pdf [firstpage_image] =>[orig_patent_app_number] => 925976 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/925976
Focused ion beam optical axis adjustment method and focused ion beam apparatus Sep 8, 1997 Issued
Array ( [id] => 4055636 [patent_doc_number] => 05969366 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-10-19 [patent_title] => 'Ion implanter with post mass selection deceleration' [patent_app_type] => 1 [patent_app_number] => 8/860748 [patent_app_country] => US [patent_app_date] => 1997-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 12287 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/969/05969366.pdf [firstpage_image] =>[orig_patent_app_number] => 860748 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/860748
Ion implanter with post mass selection deceleration Sep 7, 1997 Issued
Array ( [id] => 4048943 [patent_doc_number] => 05912470 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-06-15 [patent_title] => 'Process and an apparatus for the curing of light-sensitive polymeric compositions' [patent_app_type] => 1 [patent_app_number] => 8/924169 [patent_app_country] => US [patent_app_date] => 1997-09-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3193 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/912/05912470.pdf [firstpage_image] =>[orig_patent_app_number] => 924169 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/924169
Process and an apparatus for the curing of light-sensitive polymeric compositions Sep 4, 1997 Issued
Array ( [id] => 4002015 [patent_doc_number] => 05986260 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-11-16 [patent_title] => 'Mass analyzer' [patent_app_type] => 1 [patent_app_number] => 8/921365 [patent_app_country] => US [patent_app_date] => 1997-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 23 [patent_no_of_words] => 7028 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/986/05986260.pdf [firstpage_image] =>[orig_patent_app_number] => 921365 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/921365
Mass analyzer Aug 28, 1997 Issued
Array ( [id] => 4009090 [patent_doc_number] => 06005245 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-12-21 [patent_title] => 'Method and apparatus for ionizing a sample under atmospheric pressure and selectively introducing ions into a mass analysis region' [patent_app_type] => 1 [patent_app_number] => 8/919785 [patent_app_country] => US [patent_app_date] => 1997-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 37 [patent_no_of_words] => 9814 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 22 [patent_words_short_claim] => 64 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/005/06005245.pdf [firstpage_image] =>[orig_patent_app_number] => 919785 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/919785
Method and apparatus for ionizing a sample under atmospheric pressure and selectively introducing ions into a mass analysis region Aug 28, 1997 Issued
Array ( [id] => 3980057 [patent_doc_number] => 05905259 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-05-18 [patent_title] => 'Linear time-of-flight mass spectrometer with high mass resolution' [patent_app_type] => 1 [patent_app_number] => 8/919295 [patent_app_country] => US [patent_app_date] => 1997-08-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 6133 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/905/05905259.pdf [firstpage_image] =>[orig_patent_app_number] => 919295 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/919295
Linear time-of-flight mass spectrometer with high mass resolution Aug 27, 1997 Issued
Array ( [id] => 3931397 [patent_doc_number] => 05952668 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-09-14 [patent_title] => 'Resolution in microscopy and microlithography' [patent_app_type] => 1 [patent_app_number] => 8/919382 [patent_app_country] => US [patent_app_date] => 1997-08-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 18 [patent_no_of_words] => 11425 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 228 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/952/05952668.pdf [firstpage_image] =>[orig_patent_app_number] => 919382 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/919382
Resolution in microscopy and microlithography Aug 27, 1997 Issued
Array ( [id] => 4041584 [patent_doc_number] => 05856677 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-01-05 [patent_title] => 'Pattern projection method with charged particle beam and charged particle beam projection system' [patent_app_type] => 1 [patent_app_number] => 8/917845 [patent_app_country] => US [patent_app_date] => 1997-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 25 [patent_no_of_words] => 10391 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 120 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/856/05856677.pdf [firstpage_image] =>[orig_patent_app_number] => 917845 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/917845
Pattern projection method with charged particle beam and charged particle beam projection system Aug 26, 1997 Issued
Array ( [id] => 3971885 [patent_doc_number] => 05886345 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-03-23 [patent_title] => 'Accurate mass determination with maldi time-of-flight mass spectrometers using internal reference substances' [patent_app_type] => 1 [patent_app_number] => 8/918087 [patent_app_country] => US [patent_app_date] => 1997-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 5531 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/886/05886345.pdf [firstpage_image] =>[orig_patent_app_number] => 918087 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/918087
Accurate mass determination with maldi time-of-flight mass spectrometers using internal reference substances Aug 24, 1997 Issued
Array ( [id] => 4079734 [patent_doc_number] => 05965883 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-10-12 [patent_title] => 'Capillary for electrospray ion source' [patent_app_type] => 1 [patent_app_number] => 8/924477 [patent_app_country] => US [patent_app_date] => 1997-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 7 [patent_no_of_words] => 2524 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/965/05965883.pdf [firstpage_image] =>[orig_patent_app_number] => 924477 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/924477
Capillary for electrospray ion source Aug 24, 1997 Issued
Array ( [id] => 4376187 [patent_doc_number] => 06288407 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-09-11 [patent_title] => 'Electron beam-writing apparatus and electron beam-writing method' [patent_app_type] => 1 [patent_app_number] => 8/918165 [patent_app_country] => US [patent_app_date] => 1997-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 14 [patent_no_of_words] => 3377 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 169 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/288/06288407.pdf [firstpage_image] =>[orig_patent_app_number] => 918165 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/918165
Electron beam-writing apparatus and electron beam-writing method Aug 24, 1997 Issued
Array ( [id] => 4212007 [patent_doc_number] => 06028316 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-22 [patent_title] => 'Method and apparatus for removal of material utilizing near-blackbody radiator means' [patent_app_type] => 1 [patent_app_number] => 8/915814 [patent_app_country] => US [patent_app_date] => 1997-08-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 7288 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/028/06028316.pdf [firstpage_image] =>[orig_patent_app_number] => 915814 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/915814
Method and apparatus for removal of material utilizing near-blackbody radiator means Aug 20, 1997 Issued
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