
Jack I. Berman
Examiner (ID: 581, Phone: (571)272-2468 , Office: P/2881 )
| Most Active Art Unit | 2506 |
| Art Unit(s) | 2506, 2878, 2881, 2899 |
| Total Applications | 2582 |
| Issued Applications | 2252 |
| Pending Applications | 67 |
| Abandoned Applications | 266 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4196758
[patent_doc_number] => 06043488
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-03-28
[patent_title] => 'Carrier gas separator for mass spectroscopy'
[patent_app_type] => 1
[patent_app_number] => 8/914386
[patent_app_country] => US
[patent_app_date] => 1997-08-18
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[pdf_file] => patents/06/043/06043488.pdf
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Array
(
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[patent_issue_date] => 2001-05-08
[patent_title] => 'Ion implantation with programmable energy, angle, and beam current'
[patent_app_type] => 1
[patent_app_number] => 8/909345
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Array
(
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[patent_kind] => NA
[patent_issue_date] => 1999-04-13
[patent_title] => 'Ultraviolet sterilization unit'
[patent_app_type] => 1
[patent_app_number] => 8/907536
[patent_app_country] => US
[patent_app_date] => 1997-08-08
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Array
(
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[patent_title] => 'Pattern transfer apparatus, an operation management system thereof, and an operation management system for a semiconductor manufacture apparatus'
[patent_app_type] => 1
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Array
(
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[patent_title] => 'Method for monitoring the performance of an ion implanter using reusable wafers'
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Array
(
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Array
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[patent_title] => 'Variable-axis stigmator lens and charged-particle-beam microlithography apparatus comprising same'
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Array
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[patent_title] => 'Method of implanting low doses of ions into a substrate'
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Array
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Array
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[patent_issue_date] => 1999-02-09
[patent_title] => 'Time-of-flight mass spectrometer with first and second order longitudinal focusing'
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Array
(
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[patent_title] => 'Multilayer microtip probe and method'
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Array
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Array
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Array
(
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Array
(
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Array
(
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Array
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Array
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Array
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