Jack I. Berman

Array ( [id] => 3595419 [patent_doc_number] => 05521377 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-05-28 [patent_title] => 'Measurement of trace element concentration distribution, and evaluation of carriers, in semiconductors, and preparation of standard samples' [patent_app_type] => 1 [patent_app_number] => 8/445098 [patent_app_country] => US [patent_app_date] => 1995-05-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 35 [patent_no_of_words] => 8935 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/521/05521377.pdf [firstpage_image] =>[orig_patent_app_number] => 445098 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3585771 [patent_doc_number] => 05581083 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-12-03 [patent_title] => 'Method for fabricating a sensor on a probe tip used for atomic force microscopy and the like' [patent_app_type] => 1 [patent_app_number] => 8/439425 [patent_app_country] => US [patent_app_date] => 1995-05-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 13 [patent_no_of_words] => 4998 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/581/05581083.pdf [firstpage_image] =>[orig_patent_app_number] => 439425 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3692191 [patent_doc_number] => 05696380 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-12-09 [patent_title] => 'Flow-through photo-chemical reactor' [patent_app_type] => 1 [patent_app_number] => 8/438234 [patent_app_country] => US [patent_app_date] => 1995-05-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 4521 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 260 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/696/05696380.pdf [firstpage_image] =>[orig_patent_app_number] => 438234 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3651685 [patent_doc_number] => 05629527 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-05-13 [patent_title] => 'Dental hygiene system' [patent_app_type] => 1 [patent_app_number] => 8/432607 [patent_app_country] => US [patent_app_date] => 1995-05-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2908 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 41 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/629/05629527.pdf [firstpage_image] =>[orig_patent_app_number] => 432607 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4002400 [patent_doc_number] => 05923041 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-07-13 [patent_title] => 'Overlay target and measurement procedure to enable self-correction for wafer-induced tool-induced shift by imaging sensor means' [patent_app_type] => 1 [patent_app_number] => 8/428036 [patent_app_country] => US [patent_app_date] => 1995-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 3634 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 16 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/923/05923041.pdf [firstpage_image] =>[orig_patent_app_number] => 428036 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4002400 [patent_doc_number] => 05923041 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-07-13 [patent_title] => 'Overlay target and measurement procedure to enable self-correction for wafer-induced tool-induced shift by imaging sensor means' [patent_app_type] => 1 [patent_app_number] => 8/428036 [patent_app_country] => US [patent_app_date] => 1995-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 3634 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 16 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/923/05923041.pdf [firstpage_image] =>[orig_patent_app_number] => 428036 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4002400 [patent_doc_number] => 05923041 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-07-13 [patent_title] => 'Overlay target and measurement procedure to enable self-correction for wafer-induced tool-induced shift by imaging sensor means' [patent_app_type] => 1 [patent_app_number] => 8/428036 [patent_app_country] => US [patent_app_date] => 1995-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 3634 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 16 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/923/05923041.pdf [firstpage_image] =>[orig_patent_app_number] => 428036 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3693948 [patent_doc_number] => 05604352 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-02-18 [patent_title] => 'Apparatus comprising voltage multiplication components' [patent_app_type] => 1 [patent_app_number] => 8/428615 [patent_app_country] => US [patent_app_date] => 1995-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 31 [patent_no_of_words] => 16002 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 202 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/604/05604352.pdf [firstpage_image] =>[orig_patent_app_number] => 428615 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4002400 [patent_doc_number] => 05923041 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-07-13 [patent_title] => 'Overlay target and measurement procedure to enable self-correction for wafer-induced tool-induced shift by imaging sensor means' [patent_app_type] => 1 [patent_app_number] => 8/428036 [patent_app_country] => US [patent_app_date] => 1995-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 3634 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 16 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/923/05923041.pdf [firstpage_image] =>[orig_patent_app_number] => 428036 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3626335 [patent_doc_number] => 05594246 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-01-14 [patent_title] => 'Method and apparatus for x-ray analyses' [patent_app_type] => 1 [patent_app_number] => 8/430535 [patent_app_country] => US [patent_app_date] => 1995-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 19 [patent_no_of_words] => 8880 [patent_no_of_claims] => 75 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/594/05594246.pdf [firstpage_image] =>[orig_patent_app_number] => 430535 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3475785 [patent_doc_number] => 05477046 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-12-19 [patent_title] => 'Electron source for a mini ion trap mass spectrometer' [patent_app_type] => 1 [patent_app_number] => 8/427326 [patent_app_country] => US [patent_app_date] => 1995-04-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 10 [patent_no_of_words] => 6365 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/477/05477046.pdf [firstpage_image] =>[orig_patent_app_number] => 427326 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3496127 [patent_doc_number] => 05536944 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-07-16 [patent_title] => 'Thermal field emmission electron gun' [patent_app_type] => 1 [patent_app_number] => 8/424097 [patent_app_country] => US [patent_app_date] => 1995-04-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3655 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/536/05536944.pdf [firstpage_image] =>[orig_patent_app_number] => 424097 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3662390 [patent_doc_number] => 05591969 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-01-07 [patent_title] => 'Inductive detector for time-of-flight mass spectrometers' [patent_app_type] => 1 [patent_app_number] => 8/420536 [patent_app_country] => US [patent_app_date] => 1995-04-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 8099 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 60 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/591/05591969.pdf [firstpage_image] =>[orig_patent_app_number] => 420536 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3593930 [patent_doc_number] => 05585643 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-12-17 [patent_title] => 'Method and apparatus for directing electron radiation to subcutaneous cells' [patent_app_type] => 1 [patent_app_number] => 8/421507 [patent_app_country] => US [patent_app_date] => 1995-04-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 3098 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/585/05585643.pdf [firstpage_image] =>[orig_patent_app_number] => 421507 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3528587 [patent_doc_number] => 05528034 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-06-18 [patent_title] => 'Method of ultra high sensitivity hydrogen detection with slow multiply-charged ions' [patent_app_type] => 1 [patent_app_number] => 8/411992 [patent_app_country] => US [patent_app_date] => 1995-03-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 18 [patent_no_of_words] => 4967 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 181 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/528/05528034.pdf [firstpage_image] =>[orig_patent_app_number] => 411992 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3585753 [patent_doc_number] => 05581082 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-12-03 [patent_title] => 'Combined scanning probe and scanning energy microscope' [patent_app_type] => 1 [patent_app_number] => 8/412036 [patent_app_country] => US [patent_app_date] => 1995-03-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 11 [patent_no_of_words] => 6386 [patent_no_of_claims] => 98 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/581/05581082.pdf [firstpage_image] =>[orig_patent_app_number] => 412036 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3623969 [patent_doc_number] => 05614712 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-03-25 [patent_title] => 'Method of engaging the scanning probe of a scanning probe microscope with a sample surface' [patent_app_type] => 1 [patent_app_number] => 8/409999 [patent_app_country] => US [patent_app_date] => 1995-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2786 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 202 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/614/05614712.pdf [firstpage_image] =>[orig_patent_app_number] => 409999 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3560575 [patent_doc_number] => 05500528 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-03-19 [patent_title] => 'Scanning electron microscope' [patent_app_type] => 1 [patent_app_number] => 8/408839 [patent_app_country] => US [patent_app_date] => 1995-03-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3733 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 61 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/500/05500528.pdf [firstpage_image] =>[orig_patent_app_number] => 408839 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3652564 [patent_doc_number] => 05684301 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1997-11-04 [patent_title] => 'Monocrystalline test structures, and use for calibrating instruments' [patent_app_type] => 1 [patent_app_number] => 8/409467 [patent_app_country] => US [patent_app_date] => 1995-03-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 8 [patent_no_of_words] => 5278 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/684/05684301.pdf [firstpage_image] =>[orig_patent_app_number] => 409467 [rel_patent_id] =>[rel_patent_doc_number] =>)