Search

Jack I. Berman

Examiner (ID: 581, Phone: (571)272-2468 , Office: P/2881 )

Most Active Art Unit
2506
Art Unit(s)
2506, 2878, 2881, 2899
Total Applications
2582
Issued Applications
2252
Pending Applications
67
Abandoned Applications
266

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 3493873 [patent_doc_number] => 05440133 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-08-08 [patent_title] => 'Charged particle beam scattering system' [patent_app_type] => 1 [patent_app_number] => 8/102770 [patent_app_country] => US [patent_app_date] => 1993-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 4299 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/440/05440133.pdf [firstpage_image] =>[orig_patent_app_number] => 102770 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/102770
Charged particle beam scattering system Aug 5, 1993 Issued
Array ( [id] => 3412876 [patent_doc_number] => 05438194 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-08-01 [patent_title] => 'Ultra-sensitive molecular identifier' [patent_app_type] => 1 [patent_app_number] => 8/099844 [patent_app_country] => US [patent_app_date] => 1993-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2728 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/438/05438194.pdf [firstpage_image] =>[orig_patent_app_number] => 099844 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/099844
Ultra-sensitive molecular identifier Jul 29, 1993 Issued
Array ( [id] => 2999589 [patent_doc_number] => 05362964 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-11-08 [patent_title] => 'Environmental scanning electron microscope' [patent_app_type] => 1 [patent_app_number] => 8/100545 [patent_app_country] => US [patent_app_date] => 1993-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 18 [patent_no_of_words] => 7122 [patent_no_of_claims] => 56 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/362/05362964.pdf [firstpage_image] =>[orig_patent_app_number] => 100545 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/100545
Environmental scanning electron microscope Jul 29, 1993 Issued
Array ( [id] => 3097767 [patent_doc_number] => 05369282 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-11-29 [patent_title] => 'Electron beam exposure method and system for exposing a pattern on a substrate with an improved accuracy and throughput' [patent_app_type] => 1 [patent_app_number] => 8/098875 [patent_app_country] => US [patent_app_date] => 1993-07-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 29 [patent_figures_cnt] => 58 [patent_no_of_words] => 14405 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/369/05369282.pdf [firstpage_image] =>[orig_patent_app_number] => 098875 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/098875
Electron beam exposure method and system for exposing a pattern on a substrate with an improved accuracy and throughput Jul 28, 1993 Issued
Array ( [id] => 3002481 [patent_doc_number] => 05359201 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-10-25 [patent_title] => 'Aftertreatment apparatus for imagewise exposed printing plates' [patent_app_type] => 1 [patent_app_number] => 8/098065 [patent_app_country] => US [patent_app_date] => 1993-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 3157 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/359/05359201.pdf [firstpage_image] =>[orig_patent_app_number] => 098065 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/098065
Aftertreatment apparatus for imagewise exposed printing plates Jul 27, 1993 Issued
Array ( [id] => 3548367 [patent_doc_number] => 05554855 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-09-10 [patent_title] => 'Photopolymerization reactor and small-sized light irradiator for dental use' [patent_app_type] => 1 [patent_app_number] => 8/096305 [patent_app_country] => US [patent_app_date] => 1993-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 17 [patent_no_of_words] => 4883 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 141 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/554/05554855.pdf [firstpage_image] =>[orig_patent_app_number] => 096305 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/096305
Photopolymerization reactor and small-sized light irradiator for dental use Jul 25, 1993 Issued
Array ( [id] => 3061315 [patent_doc_number] => 05350921 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-09-27 [patent_title] => 'Analytical electron microscope and a method of operating such an electron microscope' [patent_app_type] => 1 [patent_app_number] => 8/094955 [patent_app_country] => US [patent_app_date] => 1993-07-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 12 [patent_no_of_words] => 6307 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 73 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/350/05350921.pdf [firstpage_image] =>[orig_patent_app_number] => 094955 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/094955
Analytical electron microscope and a method of operating such an electron microscope Jul 22, 1993 Issued
Array ( [id] => 3002500 [patent_doc_number] => 05359202 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-10-25 [patent_title] => 'Electron beam exposure apparatus employing blanking aperture array' [patent_app_type] => 1 [patent_app_number] => 8/095424 [patent_app_country] => US [patent_app_date] => 1993-07-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 23 [patent_no_of_words] => 5017 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 189 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/359/05359202.pdf [firstpage_image] =>[orig_patent_app_number] => 095424 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/095424
Electron beam exposure apparatus employing blanking aperture array Jul 22, 1993 Issued
Array ( [id] => 3069563 [patent_doc_number] => 05352893 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-10-04 [patent_title] => 'Isotopic-ratio plasma source mass spectrometer' [patent_app_type] => 1 [patent_app_number] => 8/090205 [patent_app_country] => US [patent_app_date] => 1993-07-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 5904 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 275 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/352/05352893.pdf [firstpage_image] =>[orig_patent_app_number] => 090205 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/090205
Isotopic-ratio plasma source mass spectrometer Jul 21, 1993 Issued
Array ( [id] => 3069526 [patent_doc_number] => 05352891 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-10-04 [patent_title] => 'Method and apparatus for estimating molecular mass from electrospray spectra' [patent_app_type] => 1 [patent_app_number] => 8/092845 [patent_app_country] => US [patent_app_date] => 1993-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 13 [patent_no_of_words] => 6425 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/352/05352891.pdf [firstpage_image] =>[orig_patent_app_number] => 092845 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/092845
Method and apparatus for estimating molecular mass from electrospray spectra Jul 15, 1993 Issued
Array ( [id] => 3002408 [patent_doc_number] => 05359197 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-10-25 [patent_title] => 'Apparatus and method of aligning electron beam of scanning electron microscope' [patent_app_type] => 1 [patent_app_number] => 8/092466 [patent_app_country] => US [patent_app_date] => 1993-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 14 [patent_no_of_words] => 2935 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/359/05359197.pdf [firstpage_image] =>[orig_patent_app_number] => 092466 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/092466
Apparatus and method of aligning electron beam of scanning electron microscope Jul 15, 1993 Issued
Array ( [id] => 3446911 [patent_doc_number] => 05397896 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-03-14 [patent_title] => 'Multiple source and detection frequencies in detecting threshold phenomena associated with and/or atomic or molecular spectra' [patent_app_type] => 1 [patent_app_number] => 8/092016 [patent_app_country] => US [patent_app_date] => 1993-07-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 16 [patent_no_of_words] => 9459 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/397/05397896.pdf [firstpage_image] =>[orig_patent_app_number] => 092016 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/092016
Multiple source and detection frequencies in detecting threshold phenomena associated with and/or atomic or molecular spectra Jul 14, 1993 Issued
Array ( [id] => 3032708 [patent_doc_number] => 05349198 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-09-20 [patent_title] => 'Beam supply device' [patent_app_type] => 1 [patent_app_number] => 8/090306 [patent_app_country] => US [patent_app_date] => 1993-07-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 2826 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/349/05349198.pdf [firstpage_image] =>[orig_patent_app_number] => 090306 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/090306
Beam supply device Jul 11, 1993 Issued
08/087196 PROTON BEAM SCATTERING SYSTEM Jul 1, 1993 Pending
Array ( [id] => 3430939 [patent_doc_number] => 05404017 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-04-04 [patent_title] => 'Ion implantation apparatus' [patent_app_type] => 1 [patent_app_number] => 8/084145 [patent_app_country] => US [patent_app_date] => 1993-07-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 2034 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/404/05404017.pdf [firstpage_image] =>[orig_patent_app_number] => 084145 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/084145
Ion implantation apparatus Jun 30, 1993 Issued
Array ( [id] => 3061278 [patent_doc_number] => 05350919 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-09-27 [patent_title] => 'Quantitative analyzing method by a secondary ion mass spectrometric method and a secondary ion mass spectrometer' [patent_app_type] => 1 [patent_app_number] => 8/084476 [patent_app_country] => US [patent_app_date] => 1993-07-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 26 [patent_no_of_words] => 7446 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/350/05350919.pdf [firstpage_image] =>[orig_patent_app_number] => 084476 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/084476
Quantitative analyzing method by a secondary ion mass spectrometric method and a secondary ion mass spectrometer Jun 30, 1993 Issued
Array ( [id] => 3427689 [patent_doc_number] => 05422490 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-06-06 [patent_title] => 'Focused ion beam implantation apparatus' [patent_app_type] => 1 [patent_app_number] => 8/083035 [patent_app_country] => US [patent_app_date] => 1993-06-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2275 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/422/05422490.pdf [firstpage_image] =>[orig_patent_app_number] => 083035 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/083035
Focused ion beam implantation apparatus Jun 28, 1993 Issued
Array ( [id] => 3032488 [patent_doc_number] => 05349186 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-09-20 [patent_title] => 'Electrospray interface for mass spectrometer and method of supplying analyte to a mass spectrometer' [patent_app_type] => 1 [patent_app_number] => 8/083714 [patent_app_country] => US [patent_app_date] => 1993-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 12 [patent_no_of_words] => 7416 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/349/05349186.pdf [firstpage_image] =>[orig_patent_app_number] => 083714 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/083714
Electrospray interface for mass spectrometer and method of supplying analyte to a mass spectrometer Jun 24, 1993 Issued
Array ( [id] => 3033994 [patent_doc_number] => 05343047 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-08-30 [patent_title] => 'Ion implantation system' [patent_app_type] => 1 [patent_app_number] => 8/082454 [patent_app_country] => US [patent_app_date] => 1993-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 15 [patent_no_of_words] => 5891 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 171 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/343/05343047.pdf [firstpage_image] =>[orig_patent_app_number] => 082454 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/082454
Ion implantation system Jun 24, 1993 Issued
Array ( [id] => 3032472 [patent_doc_number] => 05349185 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1994-09-20 [patent_title] => 'High resolution detector device for a particle time-of-flight measurement system' [patent_app_type] => 1 [patent_app_number] => 8/083675 [patent_app_country] => US [patent_app_date] => 1993-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 2529 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/349/05349185.pdf [firstpage_image] =>[orig_patent_app_number] => 083675 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/083675
High resolution detector device for a particle time-of-flight measurement system Jun 24, 1993 Issued
Menu