
James Beyer
Examiner (ID: 6285)
| Most Active Art Unit | 2506 |
| Art Unit(s) | 2506 |
| Total Applications | 326 |
| Issued Applications | 300 |
| Pending Applications | 5 |
| Abandoned Applications | 21 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 2972237
[patent_doc_number] => 05202563
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-04-13
[patent_title] => 'Tandem time-of-flight mass spectrometer'
[patent_app_type] => 1
[patent_app_number] => 7/700697
[patent_app_country] => US
[patent_app_date] => 1991-05-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 4767
[patent_no_of_claims] => 33
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[patent_words_short_claim] => 23
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/202/05202563.pdf
[firstpage_image] =>[orig_patent_app_number] => 700697
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/700697 | Tandem time-of-flight mass spectrometer | May 15, 1991 | Issued |
Array
(
[id] => 2980652
[patent_doc_number] => 05256876
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-10-26
[patent_title] => 'Scanning tunnel microscope equipped with scanning electron microscope'
[patent_app_type] => 1
[patent_app_number] => 7/696787
[patent_app_country] => US
[patent_app_date] => 1991-05-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 6
[patent_no_of_words] => 4905
[patent_no_of_claims] => 7
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[patent_words_short_claim] => 251
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/256/05256876.pdf
[firstpage_image] =>[orig_patent_app_number] => 696787
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/696787 | Scanning tunnel microscope equipped with scanning electron microscope | May 6, 1991 | Issued |
Array
(
[id] => 2948687
[patent_doc_number] => 05260929
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-11-09
[patent_title] => 'Optical disk drive including dust-proofing annular projections'
[patent_app_type] => 1
[patent_app_number] => 7/696413
[patent_app_country] => US
[patent_app_date] => 1991-05-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_no_of_words] => 3446
[patent_no_of_claims] => 8
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[patent_words_short_claim] => 153
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/260/05260929.pdf
[firstpage_image] =>[orig_patent_app_number] => 696413
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/696413 | Optical disk drive including dust-proofing annular projections | May 5, 1991 | Issued |
Array
(
[id] => 2905643
[patent_doc_number] => 05184343
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-02-02
[patent_title] => 'Compensation for dust on an optical disk by increasing laser writing power'
[patent_app_type] => 1
[patent_app_number] => 7/696230
[patent_app_country] => US
[patent_app_date] => 1991-05-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 3411
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 164
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/184/05184343.pdf
[firstpage_image] =>[orig_patent_app_number] => 696230
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/696230 | Compensation for dust on an optical disk by increasing laser writing power | May 5, 1991 | Issued |
Array
(
[id] => 2794690
[patent_doc_number] => 05103094
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-04-07
[patent_title] => 'Compact temperature-compensated tube-type scanning probe with large scan range'
[patent_app_type] => 1
[patent_app_number] => 7/694827
[patent_app_country] => US
[patent_app_date] => 1991-05-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 4100
[patent_no_of_claims] => 20
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/103/05103094.pdf
[firstpage_image] =>[orig_patent_app_number] => 694827
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/694827 | Compact temperature-compensated tube-type scanning probe with large scan range | May 1, 1991 | Issued |
Array
(
[id] => 2943307
[patent_doc_number] => 05233594
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-08-03
[patent_title] => 'Easily installable removable integrated hard disk and controller'
[patent_app_type] => 1
[patent_app_number] => 7/694477
[patent_app_country] => US
[patent_app_date] => 1991-05-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 4
[patent_no_of_words] => 3056
[patent_no_of_claims] => 7
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[patent_words_short_claim] => 269
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/233/05233594.pdf
[firstpage_image] =>[orig_patent_app_number] => 694477
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/694477 | Easily installable removable integrated hard disk and controller | May 1, 1991 | Issued |
| 07/693808 | METHOD OF OPERATING AN ION TRAP MASS SPECTROMETER IN A HIGH RESOLUTION MODE | Apr 29, 1991 | Abandoned |
Array
(
[id] => 2912152
[patent_doc_number] => 05218596
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-06-08
[patent_title] => 'Optical disc apparatus having a particular lasar source orientation'
[patent_app_type] => 1
[patent_app_number] => 7/691964
[patent_app_country] => US
[patent_app_date] => 1991-04-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 3141
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 163
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/218/05218596.pdf
[firstpage_image] =>[orig_patent_app_number] => 691964
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/691964 | Optical disc apparatus having a particular lasar source orientation | Apr 25, 1991 | Issued |
Array
(
[id] => 2807919
[patent_doc_number] => 05146090
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-09-08
[patent_title] => 'Particle beam apparatus having an immersion lens arranged in an intermediate image of the beam'
[patent_app_type] => 1
[patent_app_number] => 7/691238
[patent_app_country] => US
[patent_app_date] => 1991-04-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 5
[patent_no_of_words] => 2792
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 3
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[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/146/05146090.pdf
[firstpage_image] =>[orig_patent_app_number] => 691238
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/691238 | Particle beam apparatus having an immersion lens arranged in an intermediate image of the beam | Apr 24, 1991 | Issued |
Array
(
[id] => 2873716
[patent_doc_number] => 05162655
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-11-10
[patent_title] => 'Apparatus for calibrating radioactive detection instruments utilizing a beta-ray source within an aluminum mass'
[patent_app_type] => 1
[patent_app_number] => 7/683827
[patent_app_country] => US
[patent_app_date] => 1991-04-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 1777
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[pdf_file] => patents/05/162/05162655.pdf
[firstpage_image] =>[orig_patent_app_number] => 683827
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/683827 | Apparatus for calibrating radioactive detection instruments utilizing a beta-ray source within an aluminum mass | Apr 10, 1991 | Issued |
Array
(
[id] => 2790503
[patent_doc_number] => 05155359
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-10-13
[patent_title] => 'Atomic scale calibration system'
[patent_app_type] => 1
[patent_app_number] => 7/682097
[patent_app_country] => US
[patent_app_date] => 1991-04-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 3386
[patent_no_of_claims] => 15
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/155/05155359.pdf
[firstpage_image] =>[orig_patent_app_number] => 682097
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/682097 | Atomic scale calibration system | Apr 4, 1991 | Issued |
Array
(
[id] => 2856117
[patent_doc_number] => 05126566
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-06-30
[patent_title] => 'Dimension measurement system utilizing scanning electron beam'
[patent_app_type] => 1
[patent_app_number] => 7/681188
[patent_app_country] => US
[patent_app_date] => 1991-04-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 2906
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/126/05126566.pdf
[firstpage_image] =>[orig_patent_app_number] => 681188
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/681188 | Dimension measurement system utilizing scanning electron beam | Apr 4, 1991 | Issued |
Array
(
[id] => 2808076
[patent_doc_number] => 05146098
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-09-08
[patent_title] => 'Ion beam contamination sensor'
[patent_app_type] => 1
[patent_app_number] => 7/681807
[patent_app_country] => US
[patent_app_date] => 1991-04-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[pdf_file] => patents/05/146/05146098.pdf
[firstpage_image] =>[orig_patent_app_number] => 681807
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/681807 | Ion beam contamination sensor | Apr 4, 1991 | Issued |
Array
(
[id] => 2833809
[patent_doc_number] => 05128545
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-07-07
[patent_title] => 'Method and apparatus for background correction in analysis of a specimen surface'
[patent_app_type] => 1
[patent_app_number] => 7/680427
[patent_app_country] => US
[patent_app_date] => 1991-04-04
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/128/05128545.pdf
[firstpage_image] =>[orig_patent_app_number] => 680427
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/680427 | Method and apparatus for background correction in analysis of a specimen surface | Apr 3, 1991 | Issued |
Array
(
[id] => 2792757
[patent_doc_number] => 05101106
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-03-31
[patent_title] => 'Resonant technique and apparatus for thermal capacitor screening'
[patent_app_type] => 1
[patent_app_number] => 7/679118
[patent_app_country] => US
[patent_app_date] => 1991-04-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 3922
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/101/05101106.pdf
[firstpage_image] =>[orig_patent_app_number] => 679118
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/679118 | Resonant technique and apparatus for thermal capacitor screening | Apr 1, 1991 | Issued |
Array
(
[id] => 2935637
[patent_doc_number] => 05233191
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-08-03
[patent_title] => 'Method and apparatus of inspecting foreign matters during mass production start-up and mass production line in semiconductor production process'
[patent_app_type] => 1
[patent_app_number] => 7/679317
[patent_app_country] => US
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/233/05233191.pdf
[firstpage_image] =>[orig_patent_app_number] => 679317
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/679317 | Method and apparatus of inspecting foreign matters during mass production start-up and mass production line in semiconductor production process | Apr 1, 1991 | Issued |
Array
(
[id] => 2684667
[patent_doc_number] => 05066860
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-11-19
[patent_title] => 'Optical sensor'
[patent_app_type] => 1
[patent_app_number] => 7/680606
[patent_app_country] => US
[patent_app_date] => 1991-04-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_no_of_words] => 2984
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/066/05066860.pdf
[firstpage_image] =>[orig_patent_app_number] => 680606
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/680606 | Optical sensor | Mar 31, 1991 | Issued |
| 07/679994 | INFRARED SPECTROMETER | Mar 27, 1991 | Abandoned |
Array
(
[id] => 2808354
[patent_doc_number] => 05148024
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-09-15
[patent_title] => 'Ion beam processing apparatus and gas gun therefor'
[patent_app_type] => 1
[patent_app_number] => 7/676447
[patent_app_country] => US
[patent_app_date] => 1991-03-28
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/148/05148024.pdf
[firstpage_image] =>[orig_patent_app_number] => 676447
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/676447 | Ion beam processing apparatus and gas gun therefor | Mar 27, 1991 | Issued |
Array
(
[id] => 2789449
[patent_doc_number] => 05130537
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-07-14
[patent_title] => 'Plasma analyzer for trace element analysis'
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[patent_app_number] => 7/674407
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[pdf_file] => patents/05/130/05130537.pdf
[firstpage_image] =>[orig_patent_app_number] => 674407
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/674407 | Plasma analyzer for trace element analysis | Mar 24, 1991 | Issued |