
James Beyer
Examiner (ID: 17669)
| Most Active Art Unit | 2506 |
| Art Unit(s) | 2506 |
| Total Applications | 326 |
| Issued Applications | 300 |
| Pending Applications | 5 |
| Abandoned Applications | 21 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 3465265
[patent_doc_number] => 05468958
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-11-21
[patent_title] => 'Quadrupole ion trap with switchable multipole fractions'
[patent_app_type] => 1
[patent_app_number] => 8/277667
[patent_app_country] => US
[patent_app_date] => 1994-07-20
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[pdf_file] => patents/05/468/05468958.pdf
[firstpage_image] =>[orig_patent_app_number] => 277667
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/277667 | Quadrupole ion trap with switchable multipole fractions | Jul 19, 1994 | Issued |
Array
(
[id] => 3449620
[patent_doc_number] => 05420415
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-05-30
[patent_title] => 'Structure for alignment of an ion source aperture with a predetermined ion beam path'
[patent_app_type] => 1
[patent_app_number] => 8/267437
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[patent_app_date] => 1994-06-29
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[pdf_file] => patents/05/420/05420415.pdf
[firstpage_image] =>[orig_patent_app_number] => 267437
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/267437 | Structure for alignment of an ion source aperture with a predetermined ion beam path | Jun 28, 1994 | Issued |
Array
(
[id] => 3413004
[patent_doc_number] => 05438203
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-08-01
[patent_title] => 'System and method for unipolar magnetic scanning of heavy ion beams'
[patent_app_type] => 1
[patent_app_number] => 8/257989
[patent_app_country] => US
[patent_app_date] => 1994-06-10
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[patent_drawing_sheets_cnt] => 7
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[pdf_file] => patents/05/438/05438203.pdf
[firstpage_image] =>[orig_patent_app_number] => 257989
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/257989 | System and method for unipolar magnetic scanning of heavy ion beams | Jun 9, 1994 | Issued |
Array
(
[id] => 3416188
[patent_doc_number] => 05444263
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-08-22
[patent_title] => 'Instrument for the visual recognition of authenticity features in banknotes and security documents'
[patent_app_type] => 1
[patent_app_number] => 8/257138
[patent_app_country] => US
[patent_app_date] => 1994-06-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[pdf_file] => patents/05/444/05444263.pdf
[firstpage_image] =>[orig_patent_app_number] => 257138
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/257138 | Instrument for the visual recognition of authenticity features in banknotes and security documents | Jun 8, 1994 | Issued |
Array
(
[id] => 3465250
[patent_doc_number] => 05468957
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-11-21
[patent_title] => 'Ejection of ions from ion traps by combined electrical dipole and quadrupole fields'
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[patent_app_date] => 1994-05-19
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Array
(
[id] => 3432568
[patent_doc_number] => 05463218
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-10-31
[patent_title] => 'Detection of very large molecular ions in a time-of-flight mass spectrometer'
[patent_app_type] => 1
[patent_app_number] => 8/245958
[patent_app_country] => US
[patent_app_date] => 1994-05-19
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[firstpage_image] =>[orig_patent_app_number] => 245958
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/245958 | Detection of very large molecular ions in a time-of-flight mass spectrometer | May 18, 1994 | Issued |
Array
(
[id] => 3429748
[patent_doc_number] => 05416334
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-05-16
[patent_title] => 'Hot cell shield plug extraction apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/241908
[patent_app_country] => US
[patent_app_date] => 1994-05-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[pdf_file] => patents/05/416/05416334.pdf
[firstpage_image] =>[orig_patent_app_number] => 241908
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/241908 | Hot cell shield plug extraction apparatus | May 11, 1994 | Issued |
Array
(
[id] => 3120501
[patent_doc_number] => 05449920
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-09-12
[patent_title] => 'Large area ion implantation process and apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/230327
[patent_app_country] => US
[patent_app_date] => 1994-04-20
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/449/05449920.pdf
[firstpage_image] =>[orig_patent_app_number] => 230327
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/230327 | Large area ion implantation process and apparatus | Apr 19, 1994 | Issued |
Array
(
[id] => 3098479
[patent_doc_number] => 05369321
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1994-11-29
[patent_title] => 'Optical recording medium'
[patent_app_type] => 1
[patent_app_number] => 8/229063
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[patent_app_date] => 1994-04-18
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[pdf_file] => patents/05/369/05369321.pdf
[firstpage_image] =>[orig_patent_app_number] => 229063
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/229063 | Optical recording medium | Apr 17, 1994 | Issued |
Array
(
[id] => 3445772
[patent_doc_number] => 05430300
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-07-04
[patent_title] => 'Oxidized porous silicon field emission devices'
[patent_app_type] => 1
[patent_app_number] => 8/226397
[patent_app_country] => US
[patent_app_date] => 1994-04-12
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[pdf_file] => patents/05/430/05430300.pdf
[firstpage_image] =>[orig_patent_app_number] => 226397
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/226397 | Oxidized porous silicon field emission devices | Apr 11, 1994 | Issued |
Array
(
[id] => 3493858
[patent_doc_number] => 05440132
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-08-08
[patent_title] => 'Systems and methods for controlling the temperature and uniformity of a wafer during a SIMOX implantation process'
[patent_app_type] => 1
[patent_app_number] => 8/220308
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[pdf_file] => patents/05/440/05440132.pdf
[firstpage_image] =>[orig_patent_app_number] => 220308
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/220308 | Systems and methods for controlling the temperature and uniformity of a wafer during a SIMOX implantation process | Mar 29, 1994 | Issued |
Array
(
[id] => 3432612
[patent_doc_number] => 05463221
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-10-31
[patent_title] => 'Electron beam measuring apparatus'
[patent_app_type] => 1
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[pdf_file] => patents/05/463/05463221.pdf
[firstpage_image] =>[orig_patent_app_number] => 216288
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/216288 | Electron beam measuring apparatus | Mar 22, 1994 | Issued |
Array
(
[id] => 3465276
[patent_doc_number] => 05468959
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-11-21
[patent_title] => 'Scanning probe microscope and method for measuring surfaces by using this microscope'
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[firstpage_image] =>[orig_patent_app_number] => 210397
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/210397 | Scanning probe microscope and method for measuring surfaces by using this microscope | Mar 17, 1994 | Issued |
Array
(
[id] => 3422151
[patent_doc_number] => 05434420
[patent_country] => US
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[patent_issue_date] => 1995-07-18
[patent_title] => 'Industrial material processing electron linear accelerator'
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[pdf_file] => patents/05/434/05434420.pdf
[firstpage_image] =>[orig_patent_app_number] => 210159
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/210159 | Industrial material processing electron linear accelerator | Mar 16, 1994 | Issued |
Array
(
[id] => 3117630
[patent_doc_number] => 05396077
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-03-07
[patent_title] => 'Electron beam lithography apparatus having electron optics correction system'
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[firstpage_image] =>[orig_patent_app_number] => 213737
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/213737 | Electron beam lithography apparatus having electron optics correction system | Mar 15, 1994 | Issued |
Array
(
[id] => 3110085
[patent_doc_number] => 05418378
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-05-23
[patent_title] => 'Ion implant device with modulated scan output'
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[pdf_file] => patents/05/418/05418378.pdf
[firstpage_image] =>[orig_patent_app_number] => 212247
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/212247 | Ion implant device with modulated scan output | Mar 13, 1994 | Issued |
Array
(
[id] => 3463236
[patent_doc_number] => 05382795
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-01-17
[patent_title] => 'Ultrafine silicon tips for AFM/STM profilometry'
[patent_app_type] => 1
[patent_app_number] => 8/209682
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[pdf_file] => patents/05/382/05382795.pdf
[firstpage_image] =>[orig_patent_app_number] => 209682
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/209682 | Ultrafine silicon tips for AFM/STM profilometry | Mar 9, 1994 | Issued |
Array
(
[id] => 3109751
[patent_doc_number] => 05418363
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-05-23
[patent_title] => 'Scanning probe microscope using stored data for vertical probe positioning'
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[patent_app_number] => 8/202287
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[pdf_file] => patents/05/418/05418363.pdf
[firstpage_image] =>[orig_patent_app_number] => 202287
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/202287 | Scanning probe microscope using stored data for vertical probe positioning | Feb 24, 1994 | Issued |
| 08/194928 | MULTIPLE-DETECTOR SYSTEM FOR DETECTING CHARGED PARTICLES | Feb 13, 1994 | Abandoned |
Array
(
[id] => 3479810
[patent_doc_number] => 05432352
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[patent_issue_date] => 1995-07-11
[patent_title] => 'Ion beam scan control'
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[firstpage_image] =>[orig_patent_app_number] => 193436
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/193436 | Ion beam scan control | Feb 7, 1994 | Issued |