
James Beyer
Examiner (ID: 6285)
| Most Active Art Unit | 2506 |
| Art Unit(s) | 2506 |
| Total Applications | 326 |
| Issued Applications | 300 |
| Pending Applications | 5 |
| Abandoned Applications | 21 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 3460523
[patent_doc_number] => 05401974
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-03-28
[patent_title] => 'Charged particle beam exposure apparatus and method of cleaning the same'
[patent_app_type] => 1
[patent_app_number] => 8/191458
[patent_app_country] => US
[patent_app_date] => 1994-02-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
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[patent_no_of_words] => 10506
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/401/05401974.pdf
[firstpage_image] =>[orig_patent_app_number] => 191458
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/191458 | Charged particle beam exposure apparatus and method of cleaning the same | Feb 2, 1994 | Issued |
Array
(
[id] => 3493410
[patent_doc_number] => 05471063
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-11-28
[patent_title] => 'Fluid disinfection system'
[patent_app_type] => 1
[patent_app_number] => 8/181107
[patent_app_country] => US
[patent_app_date] => 1994-01-13
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/471/05471063.pdf
[firstpage_image] =>[orig_patent_app_number] => 181107
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/181107 | Fluid disinfection system | Jan 12, 1994 | Issued |
Array
(
[id] => 3105602
[patent_doc_number] => 05448061
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-09-05
[patent_title] => 'Method of space charge control for improved ion isolation in an ion trap mass spectrometer by dynamically adaptive sampling'
[patent_app_type] => 1
[patent_app_number] => 8/178698
[patent_app_country] => US
[patent_app_date] => 1994-01-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[pdf_file] => patents/05/448/05448061.pdf
[firstpage_image] =>[orig_patent_app_number] => 178698
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/178698 | Method of space charge control for improved ion isolation in an ion trap mass spectrometer by dynamically adaptive sampling | Jan 9, 1994 | Issued |
Array
(
[id] => 3413015
[patent_doc_number] => 05438204
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-08-01
[patent_title] => 'Twin-mask, and method and system for using same to pattern microelectronic substrates'
[patent_app_type] => 1
[patent_app_number] => 8/175977
[patent_app_country] => US
[patent_app_date] => 1993-12-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[patent_no_of_words] => 6012
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[pdf_file] => patents/05/438/05438204.pdf
[firstpage_image] =>[orig_patent_app_number] => 175977
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/175977 | Twin-mask, and method and system for using same to pattern microelectronic substrates | Dec 29, 1993 | Issued |
| 08/169168 | ABLATIVE FLASHLAMP IMAGING | Dec 16, 1993 | Abandoned |
Array
(
[id] => 2998103
[patent_doc_number] => 05367163
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1994-11-22
[patent_title] => 'Sample analyzing instrument using first and second plasma torches'
[patent_app_type] => 1
[patent_app_number] => 8/167517
[patent_app_country] => US
[patent_app_date] => 1993-12-14
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[firstpage_image] =>[orig_patent_app_number] => 167517
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/167517 | Sample analyzing instrument using first and second plasma torches | Dec 13, 1993 | Issued |
Array
(
[id] => 3452653
[patent_doc_number] => 05424539
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-06-13
[patent_title] => 'Process for the analysis of gaseous components by mass spectrometry'
[patent_app_type] => 1
[patent_app_number] => 8/167537
[patent_app_country] => US
[patent_app_date] => 1993-12-14
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[pdf_file] => patents/05/424/05424539.pdf
[firstpage_image] =>[orig_patent_app_number] => 167537
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/167537 | Process for the analysis of gaseous components by mass spectrometry | Dec 13, 1993 | Issued |
Array
(
[id] => 3463226
[patent_doc_number] => 05442186
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-08-15
[patent_title] => 'Radioactive source re-encapsulation including scored outer jacket'
[patent_app_type] => 1
[patent_app_number] => 8/163349
[patent_app_country] => US
[patent_app_date] => 1993-12-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
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[pdf_file] => patents/05/442/05442186.pdf
[firstpage_image] =>[orig_patent_app_number] => 163349
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/163349 | Radioactive source re-encapsulation including scored outer jacket | Dec 6, 1993 | Issued |
Array
(
[id] => 3478358
[patent_doc_number] => 05428220
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-06-27
[patent_title] => 'Aerosol mass spectrometer and method of classifying aerosol particles according to specific mass'
[patent_app_type] => 1
[patent_app_number] => 8/158568
[patent_app_country] => US
[patent_app_date] => 1993-11-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[pdf_file] => patents/05/428/05428220.pdf
[firstpage_image] =>[orig_patent_app_number] => 158568
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/158568 | Aerosol mass spectrometer and method of classifying aerosol particles according to specific mass | Nov 28, 1993 | Issued |
Array
(
[id] => 3449908
[patent_doc_number] => 05420436
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-05-30
[patent_title] => 'Methods for measuring optical system, and method and apparatus for exposure using said measuring method'
[patent_app_type] => 1
[patent_app_number] => 8/155857
[patent_app_country] => US
[patent_app_date] => 1993-11-23
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[firstpage_image] =>[orig_patent_app_number] => 155857
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/155857 | Methods for measuring optical system, and method and apparatus for exposure using said measuring method | Nov 22, 1993 | Issued |
Array
(
[id] => 3465419
[patent_doc_number] => 05468969
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-11-21
[patent_title] => 'Method and apparatus for electron beam lithography'
[patent_app_type] => 1
[patent_app_number] => 8/153157
[patent_app_country] => US
[patent_app_date] => 1993-11-17
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 153157
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/153157 | Method and apparatus for electron beam lithography | Nov 16, 1993 | Issued |
Array
(
[id] => 3006226
[patent_doc_number] => 05371373
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1994-12-06
[patent_title] => 'Electron beam lithography method and apparatus separating repetitive and non-repetitive pattern data'
[patent_app_type] => 1
[patent_app_number] => 8/152958
[patent_app_country] => US
[patent_app_date] => 1993-11-16
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[pdf_file] => patents/05/371/05371373.pdf
[firstpage_image] =>[orig_patent_app_number] => 152958
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/152958 | Electron beam lithography method and apparatus separating repetitive and non-repetitive pattern data | Nov 15, 1993 | Issued |
Array
(
[id] => 3461274
[patent_doc_number] => 05473165
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-12-05
[patent_title] => 'Method and apparatus for altering material'
[patent_app_type] => 1
[patent_app_number] => 8/153248
[patent_app_country] => US
[patent_app_date] => 1993-11-16
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[firstpage_image] =>[orig_patent_app_number] => 153248
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/153248 | Method and apparatus for altering material | Nov 15, 1993 | Issued |
Array
(
[id] => 3528915
[patent_doc_number] => 05504327
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[patent_kind] => NA
[patent_issue_date] => 1996-04-02
[patent_title] => 'Electrospray ionization source and method for mass spectrometric analysis'
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[firstpage_image] =>[orig_patent_app_number] => 147688
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/147688 | Electrospray ionization source and method for mass spectrometric analysis | Nov 3, 1993 | Issued |
Array
(
[id] => 3463395
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[patent_issue_date] => 1995-01-17
[patent_title] => 'Double wall infrared emitter'
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[patent_app_date] => 1993-11-01
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[pdf_file] => patents/05/382/05382805.pdf
[firstpage_image] =>[orig_patent_app_number] => 146480
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/146480 | Double wall infrared emitter | Oct 31, 1993 | Issued |
Array
(
[id] => 3463177
[patent_doc_number] => 05442183
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[patent_issue_date] => 1995-08-15
[patent_title] => 'Charged particle beam apparatus including means for maintaining a vacuum seal'
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[pdf_file] => patents/05/442/05442183.pdf
[firstpage_image] =>[orig_patent_app_number] => 137965
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/137965 | Charged particle beam apparatus including means for maintaining a vacuum seal | Oct 18, 1993 | Issued |
Array
(
[id] => 3483412
[patent_doc_number] => 05399860
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-03-21
[patent_title] => 'Electron optic column and scanning electron microscope'
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[pdf_file] => patents/05/399/05399860.pdf
[firstpage_image] =>[orig_patent_app_number] => 127498
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/127498 | Electron optic column and scanning electron microscope | Sep 27, 1993 | Issued |
Array
(
[id] => 3484904
[patent_doc_number] => 05406079
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-04-11
[patent_title] => 'Ionization device for ionizing liquid sample'
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[pdf_file] => patents/05/406/05406079.pdf
[firstpage_image] =>[orig_patent_app_number] => 127927
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/127927 | Ionization device for ionizing liquid sample | Sep 27, 1993 | Issued |
Array
(
[id] => 2999660
[patent_doc_number] => 05362968
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1994-11-08
[patent_title] => 'Optic column having particular major/minor axis magnification ratio'
[patent_app_type] => 1
[patent_app_number] => 8/126968
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[pdf_file] => patents/05/362/05362968.pdf
[firstpage_image] =>[orig_patent_app_number] => 126968
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/126968 | Optic column having particular major/minor axis magnification ratio | Sep 26, 1993 | Issued |
| 08/123148 | ION BEAM SCAN CONTROL | Sep 19, 1993 | Abandoned |