Search

James Largen

Examiner (ID: 14395)

Most Active Art Unit
2901
Art Unit(s)
2902, 2903, 2901, 2904, 2900
Total Applications
2691
Issued Applications
2645
Pending Applications
1
Abandoned Applications
45

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 11472862 [patent_doc_number] => 20170059646 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-03-02 [patent_title] => 'SEMICONDUCTOR CIRCUIT HAVING TEST FUNCTION' [patent_app_type] => utility [patent_app_number] => 14/762569 [patent_app_country] => US [patent_app_date] => 2014-11-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2018 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14762569 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/762569
Semiconductor circuit having test function Nov 10, 2014 Issued
Array ( [id] => 11077186 [patent_doc_number] => 20160274150 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-09-22 [patent_title] => 'ISOLATION INTERFACE FOR AN ELECTRICITY METER AND ELECTRICITY METERING SYSTEM' [patent_app_type] => utility [patent_app_number] => 15/033948 [patent_app_country] => US [patent_app_date] => 2014-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3444 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15033948 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/033948
Isolation interface for an electricity meter and electricity metering system Nov 4, 2014 Issued
Array ( [id] => 12569226 [patent_doc_number] => 10018656 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-07-10 [patent_title] => Device, arrangement, and method for measuring a current intensity in a primary conductor through which current flows [patent_app_type] => utility [patent_app_number] => 15/032103 [patent_app_country] => US [patent_app_date] => 2014-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3306 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 238 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15032103 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/032103
Device, arrangement, and method for measuring a current intensity in a primary conductor through which current flows Oct 28, 2014 Issued
Array ( [id] => 10199676 [patent_doc_number] => 20150084662 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-03-26 [patent_title] => 'APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER' [patent_app_type] => utility [patent_app_number] => 14/504694 [patent_app_country] => US [patent_app_date] => 2014-10-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 1818 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14504694 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/504694
Apparatus and method for terminating probe apparatus of semiconductor wafer Oct 1, 2014 Issued
Array ( [id] => 10998687 [patent_doc_number] => 20160195635 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-07-07 [patent_title] => 'DOWNHOLE INSPECTION, DETECTION, AND IMAGING USING CONFORMABLE SENSORS' [patent_app_type] => utility [patent_app_number] => 14/915879 [patent_app_country] => US [patent_app_date] => 2014-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7452 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14915879 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/915879
Downhole inspection, detection, and imaging using conformable sensors Sep 29, 2014 Issued
Array ( [id] => 10998002 [patent_doc_number] => 20160194948 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-07-07 [patent_title] => 'DOWNHOLE MULTI-PIPE SCALE AND CORROSION DETECTION USING CONFORMABLE SENSORS' [patent_app_type] => utility [patent_app_number] => 14/915825 [patent_app_country] => US [patent_app_date] => 2014-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 7737 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14915825 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/915825
Downhole multi-pipe scale and corrosion detection using conformable sensors Sep 29, 2014 Issued
Array ( [id] => 11763811 [patent_doc_number] => 09372228 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-06-21 [patent_title] => 'Non-contact test system for determining whether electronic device structures contain manufacturing faults' [patent_app_type] => utility [patent_app_number] => 14/500418 [patent_app_country] => US [patent_app_date] => 2014-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 25 [patent_no_of_words] => 9034 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14500418 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/500418
Non-contact test system for determining whether electronic device structures contain manufacturing faults Sep 28, 2014 Issued
Array ( [id] => 11896346 [patent_doc_number] => 09766277 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-09-19 [patent_title] => 'Self-calibrating contactless power consumption sensing' [patent_app_type] => utility [patent_app_number] => 14/485424 [patent_app_country] => US [patent_app_date] => 2014-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 17 [patent_no_of_words] => 18087 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 253 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14485424 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/485424
Self-calibrating contactless power consumption sensing Sep 11, 2014 Issued
Array ( [id] => 10972315 [patent_doc_number] => 20140375349 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-12-25 [patent_title] => 'TESTER AND TEST SYSTEM INCLUDING THE SAME' [patent_app_type] => utility [patent_app_number] => 14/484777 [patent_app_country] => US [patent_app_date] => 2014-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 8372 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14484777 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/484777
Tester to simultaneously test different types of semiconductor devices and test system including the same Sep 11, 2014 Issued
Array ( [id] => 11598032 [patent_doc_number] => 09645191 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-05-09 [patent_title] => 'Testing and setting performance parameters in a semiconductor device and method therefor' [patent_app_type] => utility [patent_app_number] => 14/484593 [patent_app_country] => US [patent_app_date] => 2014-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 21 [patent_no_of_words] => 12024 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14484593 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/484593
Testing and setting performance parameters in a semiconductor device and method therefor Sep 11, 2014 Issued
Array ( [id] => 10731010 [patent_doc_number] => 20160077161 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-03-17 [patent_title] => 'METHOD FOR IMPROVED DIAGNOSTIC IN DETERMINING AND PREVENTING INVERTER FAULTS' [patent_app_type] => utility [patent_app_number] => 14/484337 [patent_app_country] => US [patent_app_date] => 2014-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3011 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14484337 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/484337
METHOD FOR IMPROVED DIAGNOSTIC IN DETERMINING AND PREVENTING INVERTER FAULTS Sep 11, 2014 Abandoned
Array ( [id] => 9914787 [patent_doc_number] => 20150069993 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-03-12 [patent_title] => 'APPARATUS FOR MONITORING AND DIAGNOSING POWER TRANSMISSION LINE' [patent_app_type] => utility [patent_app_number] => 14/483407 [patent_app_country] => US [patent_app_date] => 2014-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1753 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14483407 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/483407
APPARATUS FOR MONITORING AND DIAGNOSING POWER TRANSMISSION LINE Sep 10, 2014 Abandoned
Array ( [id] => 11540019 [patent_doc_number] => 09614444 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-04-04 [patent_title] => 'Dynamic voltage transition control in switched mode power converters' [patent_app_type] => utility [patent_app_number] => 14/483615 [patent_app_country] => US [patent_app_date] => 2014-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 11 [patent_no_of_words] => 5212 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14483615 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/483615
Dynamic voltage transition control in switched mode power converters Sep 10, 2014 Issued
Array ( [id] => 11231313 [patent_doc_number] => 09458535 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-10-04 [patent_title] => 'Semiconductor manufacturing device and semiconductor manufacturing method' [patent_app_type] => utility [patent_app_number] => 14/482075 [patent_app_country] => US [patent_app_date] => 2014-09-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4067 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14482075 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/482075
Semiconductor manufacturing device and semiconductor manufacturing method Sep 9, 2014 Issued
Array ( [id] => 10300271 [patent_doc_number] => 20150185271 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-07-02 [patent_title] => 'METHOD AND SYSTEM OF DIAGNOSING BREAKDOWN DURING PRE-CHARGING' [patent_app_type] => utility [patent_app_number] => 14/480946 [patent_app_country] => US [patent_app_date] => 2014-09-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3698 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14480946 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/480946
Method and system of diagnosing breakdown during pre-charging Sep 8, 2014 Issued
Array ( [id] => 10350709 [patent_doc_number] => 20150235714 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-08-20 [patent_title] => 'SEMICONDUCTOR DEVICE FOR PARALLEL BIT TEST AND TEST METHOD THEREOF' [patent_app_type] => utility [patent_app_number] => 14/477618 [patent_app_country] => US [patent_app_date] => 2014-09-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6546 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14477618 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/477618
Semiconductor device for parallel bit test and test method thereof Sep 3, 2014 Issued
Array ( [id] => 9906445 [patent_doc_number] => 20150061645 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-03-05 [patent_title] => 'SENSOR DEVICE' [patent_app_type] => utility [patent_app_number] => 14/477538 [patent_app_country] => US [patent_app_date] => 2014-09-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3421 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14477538 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/477538
Sensor device with inductors Sep 3, 2014 Issued
Array ( [id] => 10723803 [patent_doc_number] => 20160069952 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-03-10 [patent_title] => 'DETECTOR DEVICE FOR FUNCTIONAL CERTIFICATION' [patent_app_type] => utility [patent_app_number] => 14/477279 [patent_app_country] => US [patent_app_date] => 2014-09-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3611 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14477279 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/477279
Detector device for functional certification Sep 3, 2014 Issued
Array ( [id] => 10327108 [patent_doc_number] => 20150212112 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-07-30 [patent_title] => 'Active Probe Card' [patent_app_type] => utility [patent_app_number] => 14/476729 [patent_app_country] => US [patent_app_date] => 2014-09-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3384 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14476729 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/476729
Active probe card Sep 2, 2014 Issued
Array ( [id] => 12113739 [patent_doc_number] => 09869727 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-01-16 [patent_title] => 'Arrangement and method for monitoring a power supply' [patent_app_type] => utility [patent_app_number] => 14/915524 [patent_app_country] => US [patent_app_date] => 2014-09-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 5170 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14915524 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/915524
Arrangement and method for monitoring a power supply Sep 1, 2014 Issued
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