
James Largen
Examiner (ID: 14395)
| Most Active Art Unit | 2901 |
| Art Unit(s) | 2902, 2903, 2901, 2904, 2900 |
| Total Applications | 2691 |
| Issued Applications | 2645 |
| Pending Applications | 1 |
| Abandoned Applications | 45 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 8528528
[patent_doc_number] => 08305104
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-11-06
[patent_title] => 'Testing and sorting system having a linear track and method of using the same'
[patent_app_type] => utility
[patent_app_number] => 12/732002
[patent_app_country] => US
[patent_app_date] => 2010-03-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
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[patent_no_of_words] => 3502
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[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12732002
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/732002 | Testing and sorting system having a linear track and method of using the same | Mar 24, 2010 | Issued |
Array
(
[id] => 6386029
[patent_doc_number] => 20100176834
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-07-15
[patent_title] => 'Cantilever Microprobes For Contacting Electronic Components and Methods for Making Such Probes'
[patent_app_type] => utility
[patent_app_number] => 12/724287
[patent_app_country] => US
[patent_app_date] => 2010-03-15
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0176/20100176834.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/724287 | Cantilever Microprobes For Contacting Electronic Components and Methods for Making Such Probes | Mar 14, 2010 | Abandoned |
Array
(
[id] => 5492
[patent_doc_number] => 07816936
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-10-19
[patent_title] => 'Apparatus for controlling substrate voltage of semiconductor device'
[patent_app_type] => utility
[patent_app_number] => 12/721652
[patent_app_country] => US
[patent_app_date] => 2010-03-11
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[pdf_file] => patents/07/816/07816936.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/721652 | Apparatus for controlling substrate voltage of semiconductor device | Mar 10, 2010 | Issued |
Array
(
[id] => 10893472
[patent_doc_number] => 08917088
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2014-12-23
[patent_title] => 'Method and device for diagnosis of sensor faults for determination of angular position of polyphase rotary electrical machine'
[patent_app_type] => utility
[patent_app_number] => 13/260858
[patent_app_country] => US
[patent_app_date] => 2010-03-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13260858
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/260858 | Method and device for diagnosis of sensor faults for determination of angular position of polyphase rotary electrical machine | Mar 7, 2010 | Issued |
Array
(
[id] => 9100436
[patent_doc_number] => 08564317
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-10-22
[patent_title] => 'Test socket, and test apparatus with test socket to control a temperature of an object to be tested'
[patent_app_type] => utility
[patent_app_number] => 12/719267
[patent_app_country] => US
[patent_app_date] => 2010-03-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12719267
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/719267 | Test socket, and test apparatus with test socket to control a temperature of an object to be tested | Mar 7, 2010 | Issued |
Array
(
[id] => 9483957
[patent_doc_number] => 08729910
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2014-05-20
[patent_title] => 'Capacitance touch panel module and fabrication method thereof'
[patent_app_type] => utility
[patent_app_number] => 12/718068
[patent_app_country] => US
[patent_app_date] => 2010-03-05
[patent_effective_date] => 0000-00-00
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/718068 | Capacitance touch panel module and fabrication method thereof | Mar 4, 2010 | Issued |
Array
(
[id] => 8520315
[patent_doc_number] => 20120319723
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2012-12-20
[patent_title] => 'ELECTRIC MACHINE FOR WHICH THE GROUNDING FUNCTION IS MONITORED AND METHOD'
[patent_app_type] => utility
[patent_app_number] => 13/581582
[patent_app_country] => US
[patent_app_date] => 2010-03-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13581582
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/581582 | ELECTRIC MACHINE FOR WHICH THE GROUNDING FUNCTION IS MONITORED AND METHOD | Feb 28, 2010 | Abandoned |
Array
(
[id] => 6395911
[patent_doc_number] => 20100164521
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-07-01
[patent_title] => 'Parametric Testline with Increased Test Pattern Areas'
[patent_app_type] => utility
[patent_app_number] => 12/704252
[patent_app_country] => US
[patent_app_date] => 2010-02-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
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[pdf_file] => publications/A1/0164/20100164521.pdf
[firstpage_image] =>[orig_patent_app_number] => 12704252
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/704252 | Parametric testline with increased test pattern areas | Feb 10, 2010 | Issued |
Array
(
[id] => 8155585
[patent_doc_number] => 20120098544
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2012-04-26
[patent_title] => 'Reference Electrode and Combined Electrode'
[patent_app_type] => utility
[patent_app_number] => 13/265617
[patent_app_country] => US
[patent_app_date] => 2010-02-03
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[patent_drawing_sheets_cnt] => 3
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[pdf_file] => publications/A1/0098/20120098544.pdf
[firstpage_image] =>[orig_patent_app_number] => 13265617
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/265617 | Reference electrode and combined electrode | Feb 2, 2010 | Issued |
Array
(
[id] => 6225732
[patent_doc_number] => 20100181991
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[patent_kind] => A1
[patent_issue_date] => 2010-07-22
[patent_title] => 'Arrangement and Method for Measuring a Current Flowing in an Electrical Conductor'
[patent_app_type] => utility
[patent_app_number] => 12/698718
[patent_app_country] => US
[patent_app_date] => 2010-02-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[pdf_file] => publications/A1/0181/20100181991.pdf
[firstpage_image] =>[orig_patent_app_number] => 12698718
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/698718 | Arrangement and method for measuring a current flowing in an electrical conductor | Feb 1, 2010 | Issued |
Array
(
[id] => 6237426
[patent_doc_number] => 20100132561
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-06-03
[patent_title] => 'ELECTROSTATIC CHARGING AND COLLECTION'
[patent_app_type] => utility
[patent_app_number] => 12/698047
[patent_app_country] => US
[patent_app_date] => 2010-02-01
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[firstpage_image] =>[orig_patent_app_number] => 12698047
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/698047 | ELECTROSTATIC CHARGING AND COLLECTION | Jan 31, 2010 | Abandoned |
Array
(
[id] => 7516072
[patent_doc_number] => 08040146
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-10-18
[patent_title] => 'Inspection apparatus having a heating mechanism for performing sample temperature regulation'
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[patent_app_number] => 12/693266
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/693266 | Inspection apparatus having a heating mechanism for performing sample temperature regulation | Jan 24, 2010 | Issued |
Array
(
[id] => 6225822
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[patent_country] => US
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[patent_issue_date] => 2010-07-22
[patent_title] => 'ELECTRICAL TESTING DEVICE AND ELECTRICAL TESTING METHOD FOR ELECTRONIC DEVICE'
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[patent_app_number] => 12/692224
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/692224 | Electrical testing device and electrical testing method with control of probe contact pressure | Jan 21, 2010 | Issued |
Array
(
[id] => 8446984
[patent_doc_number] => 08289042
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[patent_issue_date] => 2012-10-16
[patent_title] => 'Test apparatus and pallet for parallel RF testing of printed circuit boards'
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[patent_app_number] => 12/689324
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/689324 | Test apparatus and pallet for parallel RF testing of printed circuit boards | Jan 18, 2010 | Issued |
Array
(
[id] => 6386032
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[patent_title] => 'TEST APPARATUS AND TRANSMISSION APPARATUS'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/685524 | Test apparatus and transmission apparatus | Jan 10, 2010 | Issued |
Array
(
[id] => 6580245
[patent_doc_number] => 20100097143
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[patent_issue_date] => 2010-04-22
[patent_title] => 'RF DETECTOR WITH CREST FACTOR MEASUREMENT'
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[firstpage_image] =>[orig_patent_app_number] => 12645196
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/645196 | RF detector with crest factor measurement | Dec 21, 2009 | Issued |
Array
(
[id] => 4645111
[patent_doc_number] => 08022719
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[patent_title] => 'Carrier tray for use with prober'
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[firstpage_image] =>[orig_patent_app_number] => 12634513
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/634513 | Carrier tray for use with prober | Dec 8, 2009 | Issued |
Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/628827 | Signal readout circuit of amperometric sensor | Nov 30, 2009 | Issued |
Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/592582 | Method and apparatus for measuring electric currents | Nov 26, 2009 | Abandoned |