James Largen

Array ( [id] => 6605599 [patent_doc_number] => 20100033202 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-11 [patent_title] => 'Cantilever Microprobes for Contacting Electronic Components and Methods for Making Such Probes' [patent_app_type] => utility [patent_app_number] => 12/507378 [patent_app_country] => US [patent_app_date] => 2009-07-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 22 [patent_no_of_words] => 11070 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0033/20100033202.pdf [firstpage_image] =>[orig_patent_app_number] => 12507378 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8283570 [patent_doc_number] => 08217675 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-07-10 [patent_title] => 'Electrical testing apparatus with a tilt adjusting arrangement for testing an electrical test sample and electrical testing method' [patent_app_type] => utility [patent_app_number] => 12/506822 [patent_app_country] => US [patent_app_date] => 2009-07-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 4986 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12506822 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5483595 [patent_doc_number] => 20090273360 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-11-05 [patent_title] => 'SYSTEM FOR ISOLATING A SHORT-CIRCUITED INTEGRATED CIRCUIT (IC) FROM OTHER ICs ON A SEMICONDUCTOR WAFER' [patent_app_type] => utility [patent_app_number] => 12/504001 [patent_app_country] => US [patent_app_date] => 2009-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3324 [patent_no_of_claims] => 41 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0273/20090273360.pdf [firstpage_image] =>[orig_patent_app_number] => 12504001 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6217033 [patent_doc_number] => 20100052713 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-03-04 [patent_title] => 'DISPLAY DEVICE AND TEST PROBE FOR TESTING DISPLAY DEVICE' [patent_app_type] => utility [patent_app_number] => 12/503921 [patent_app_country] => US [patent_app_date] => 2009-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 15748 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0052/20100052713.pdf [firstpage_image] =>[orig_patent_app_number] => 12503921 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8283537 [patent_doc_number] => 08217644 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-07-10 [patent_title] => 'High sensitivity differential current transformer for insulation health monitoring' [patent_app_type] => utility [patent_app_number] => 12/499819 [patent_app_country] => US [patent_app_date] => 2009-07-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6999 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12499819 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4458067 [patent_doc_number] => 07893707 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-02-22 [patent_title] => 'Physical property measuring method for TFT liquid crystal panel and physical property measuring apparatus for TFT liquid crystal panel' [patent_app_type] => utility [patent_app_number] => 12/498844 [patent_app_country] => US [patent_app_date] => 2009-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 25 [patent_no_of_words] => 12406 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 145 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/893/07893707.pdf [firstpage_image] =>[orig_patent_app_number] => 12498844 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7776090 [patent_doc_number] => 08120377 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-02-21 [patent_title] => 'Integrated circuit having secure access to test modes' [patent_app_type] => utility [patent_app_number] => 12/492427 [patent_app_country] => US [patent_app_date] => 2009-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 7465 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/120/08120377.pdf [firstpage_image] =>[orig_patent_app_number] => 12492427 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6330800 [patent_doc_number] => 20100327892 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-12-30 [patent_title] => 'Parallel Array Architecture for Constant Current Electro-Migration Stress Testing' [patent_app_type] => utility [patent_app_number] => 12/492619 [patent_app_country] => US [patent_app_date] => 2009-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 9582 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0327/20100327892.pdf [firstpage_image] =>[orig_patent_app_number] => 12492619 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6330806 [patent_doc_number] => 20100327894 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-12-30 [patent_title] => 'Dual Tip Test Probe Assembly' [patent_app_type] => utility [patent_app_number] => 12/490624 [patent_app_country] => US [patent_app_date] => 2009-06-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 4326 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0327/20100327894.pdf [firstpage_image] =>[orig_patent_app_number] => 12490624 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5456338 [patent_doc_number] => 20090256490 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-10-15 [patent_title] => 'VOLTAGE SENSING CIRCUITS AND METHODS FOR INVERTERS' [patent_app_type] => utility [patent_app_number] => 12/489033 [patent_app_country] => US [patent_app_date] => 2009-06-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3608 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0256/20090256490.pdf [firstpage_image] =>[orig_patent_app_number] => 12489033 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5395521 [patent_doc_number] => 20090315584 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-12-24 [patent_title] => 'MEASURING BOARD FOR EXAMINING DIFFERENT TYPES OF SECTIONS OF MCP PRODUCT' [patent_app_type] => utility [patent_app_number] => 12/488026 [patent_app_country] => US [patent_app_date] => 2009-06-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6627 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0315/20090315584.pdf [firstpage_image] =>[orig_patent_app_number] => 12488026 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6595924 [patent_doc_number] => 20100001742 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-07 [patent_title] => 'Calibration technique' [patent_app_type] => utility [patent_app_number] => 12/456118 [patent_app_country] => US [patent_app_date] => 2009-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 5908 [patent_no_of_claims] => 40 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0001/20100001742.pdf [firstpage_image] =>[orig_patent_app_number] => 12456118 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4565952 [patent_doc_number] => 07839136 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2010-11-23 [patent_title] => 'System and method for testing radio frequency (RF) shielding defects' [patent_app_type] => utility [patent_app_number] => 12/481525 [patent_app_country] => US [patent_app_date] => 2009-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3707 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/839/07839136.pdf [firstpage_image] =>[orig_patent_app_number] => 12481525 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5874 [patent_doc_number] => 07812624 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2010-10-12 [patent_title] => 'Testing method for LED module' [patent_app_type] => utility [patent_app_number] => 12/471627 [patent_app_country] => US [patent_app_date] => 2009-05-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2290 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/812/07812624.pdf [firstpage_image] =>[orig_patent_app_number] => 12471627 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5383546 [patent_doc_number] => 20090224790 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-09-10 [patent_title] => 'ELECTRICAL TESTING PROBE ASSEMBLY HAVING NONPARALLEL FACING SURFACES AND SLOTS FORMED THEREON FOR RECEIVING PROBES' [patent_app_type] => utility [patent_app_number] => 12/471242 [patent_app_country] => US [patent_app_date] => 2009-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7447 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0224/20090224790.pdf [firstpage_image] =>[orig_patent_app_number] => 12471242 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4614716 [patent_doc_number] => 07990160 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-08-02 [patent_title] => 'Capacitive sensing with combinatorial sensor layout' [patent_app_type] => utility [patent_app_number] => 12/471206 [patent_app_country] => US [patent_app_date] => 2009-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 11 [patent_no_of_words] => 8376 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 164 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/990/07990160.pdf [firstpage_image] =>[orig_patent_app_number] => 12471206 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7776063 [patent_doc_number] => 08120366 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-02-21 [patent_title] => 'Cold cathode ionization vacuum gauge with trigger plate' [patent_app_type] => utility [patent_app_number] => 12/470683 [patent_app_country] => US [patent_app_date] => 2009-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 12 [patent_no_of_words] => 2619 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 194 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/120/08120366.pdf [firstpage_image] =>[orig_patent_app_number] => 12470683 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6115674 [patent_doc_number] => 20110074444 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-31 [patent_title] => 'SENSOR FOR DETECTION OF CONDUCTIVE BODIES' [patent_app_type] => utility [patent_app_number] => 12/993019 [patent_app_country] => US [patent_app_date] => 2009-05-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 7590 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0074/20110074444.pdf [firstpage_image] =>[orig_patent_app_number] => 12993019 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5973091 [patent_doc_number] => 20110068770 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-24 [patent_title] => 'Method for Determining the Offset of a Periodic Signal' [patent_app_type] => utility [patent_app_number] => 12/993286 [patent_app_country] => US [patent_app_date] => 2009-05-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 26 [patent_no_of_words] => 6438 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0068/20110068770.pdf [firstpage_image] =>[orig_patent_app_number] => 12993286 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9100439 [patent_doc_number] => 08564321 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-10-22 [patent_title] => 'Ceramic substrate, functional ceramic substrate, probe card and method for manufacturing ceramic substrate' [patent_app_type] => utility [patent_app_number] => 12/991805 [patent_app_country] => US [patent_app_date] => 2009-05-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 10 [patent_no_of_words] => 6261 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12991805 [rel_patent_id] =>[rel_patent_doc_number] =>)