
James Largen
Examiner (ID: 14395)
| Most Active Art Unit | 2901 |
| Art Unit(s) | 2902, 2903, 2901, 2904, 2900 |
| Total Applications | 2691 |
| Issued Applications | 2645 |
| Pending Applications | 1 |
| Abandoned Applications | 45 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6551662
[patent_doc_number] => 20100045325
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-02-25
[patent_title] => 'Test Pad Design for Reducing the Effect of Contact Resistances'
[patent_app_type] => utility
[patent_app_number] => 12/196531
[patent_app_country] => US
[patent_app_date] => 2008-08-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 3137
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0045/20100045325.pdf
[firstpage_image] =>[orig_patent_app_number] => 12196531
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/196531 | Test pad design for reducing the effect of contact resistances | Aug 21, 2008 | Issued |
Array
(
[id] => 6551676
[patent_doc_number] => 20100045326
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-02-25
[patent_title] => 'THERMAL MONITORING AND MANAGEMENT OF INTEGRATED CIRCUITS'
[patent_app_type] => utility
[patent_app_number] => 12/194706
[patent_app_country] => US
[patent_app_date] => 2008-08-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 4567
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0045/20100045326.pdf
[firstpage_image] =>[orig_patent_app_number] => 12194706
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/194706 | Thermal monitoring and management of integrated circuits | Aug 19, 2008 | Issued |
Array
(
[id] => 6551306
[patent_doc_number] => 20100045296
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-02-25
[patent_title] => 'Cable system for marine data acquisition'
[patent_app_type] => utility
[patent_app_number] => 12/228989
[patent_app_country] => US
[patent_app_date] => 2008-08-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3735
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0045/20100045296.pdf
[firstpage_image] =>[orig_patent_app_number] => 12228989
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/228989 | Cable system for marine data acquisition | Aug 18, 2008 | Abandoned |
Array
(
[id] => 4757133
[patent_doc_number] => 20080309358
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-12-18
[patent_title] => 'Active wafer probe'
[patent_app_type] => utility
[patent_app_number] => 12/228812
[patent_app_country] => US
[patent_app_date] => 2008-08-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 6348
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0309/20080309358.pdf
[firstpage_image] =>[orig_patent_app_number] => 12228812
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/228812 | Active wafer probe | Aug 13, 2008 | Issued |
Array
(
[id] => 103396
[patent_doc_number] => 07728580
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-06-01
[patent_title] => 'Connecting device for electronic testing system'
[patent_app_type] => utility
[patent_app_number] => 12/189129
[patent_app_country] => US
[patent_app_date] => 2008-08-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 1353
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 157
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/728/07728580.pdf
[firstpage_image] =>[orig_patent_app_number] => 12189129
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/189129 | Connecting device for electronic testing system | Aug 7, 2008 | Issued |
Array
(
[id] => 5444583
[patent_doc_number] => 20090045809
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-02-19
[patent_title] => 'Magnetic sensor and manufacturing method of the same'
[patent_app_type] => utility
[patent_app_number] => 12/222380
[patent_app_country] => US
[patent_app_date] => 2008-08-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 24
[patent_figures_cnt] => 24
[patent_no_of_words] => 9654
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0045/20090045809.pdf
[firstpage_image] =>[orig_patent_app_number] => 12222380
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/222380 | Magnetic sensor and manufacturing method of the same | Aug 6, 2008 | Issued |
Array
(
[id] => 5579079
[patent_doc_number] => 20090174425
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-07-09
[patent_title] => 'TEST CIRCUIT FOR A SEMICONDUCTOR INTEGRATED CIRCUIT'
[patent_app_type] => utility
[patent_app_number] => 12/181226
[patent_app_country] => US
[patent_app_date] => 2008-07-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5655
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0174/20090174425.pdf
[firstpage_image] =>[orig_patent_app_number] => 12181226
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/181226 | Test circuit for a semiconductor integrated circuit | Jul 27, 2008 | Issued |
Array
(
[id] => 5512501
[patent_doc_number] => 20090212805
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-08-27
[patent_title] => 'PROBE OF VERTICAL PROBE CARD'
[patent_app_type] => utility
[patent_app_number] => 12/177525
[patent_app_country] => US
[patent_app_date] => 2008-07-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 2781
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0212/20090212805.pdf
[firstpage_image] =>[orig_patent_app_number] => 12177525
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/177525 | PROBE OF VERTICAL PROBE CARD | Jul 21, 2008 | Abandoned |
Array
(
[id] => 6324323
[patent_doc_number] => 20100244877
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-09-30
[patent_title] => 'METHOD AND APPARATUS FOR CONTROLLING POSITION OF Z-AXIS FOR WAFER PROBER'
[patent_app_type] => utility
[patent_app_number] => 12/743970
[patent_app_country] => US
[patent_app_date] => 2008-07-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 4046
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0244/20100244877.pdf
[firstpage_image] =>[orig_patent_app_number] => 12743970
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/743970 | Method and apparatus for controlling position of Z-axis for wafer prober | Jul 21, 2008 | Issued |
Array
(
[id] => 5414023
[patent_doc_number] => 20090039910
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-02-12
[patent_title] => 'TEST APPARATUS FOR SEMICONDUCTOR MODULES'
[patent_app_type] => utility
[patent_app_number] => 12/174302
[patent_app_country] => US
[patent_app_date] => 2008-07-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2318
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0039/20090039910.pdf
[firstpage_image] =>[orig_patent_app_number] => 12174302
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/174302 | TEST APPARATUS FOR SEMICONDUCTOR MODULES | Jul 15, 2008 | Abandoned |
Array
(
[id] => 260554
[patent_doc_number] => 07573284
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-08-11
[patent_title] => 'Increase productivity at wafer test using probe retest data analysis'
[patent_app_type] => utility
[patent_app_number] => 12/169670
[patent_app_country] => US
[patent_app_date] => 2008-07-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 12
[patent_no_of_words] => 3243
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 169
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/573/07573284.pdf
[firstpage_image] =>[orig_patent_app_number] => 12169670
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/169670 | Increase productivity at wafer test using probe retest data analysis | Jul 8, 2008 | Issued |
Array
(
[id] => 5494
[patent_doc_number] => 07816937
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-10-19
[patent_title] => 'Apparatus for testing a semiconductor package'
[patent_app_type] => utility
[patent_app_number] => 12/167000
[patent_app_country] => US
[patent_app_date] => 2008-07-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 4
[patent_no_of_words] => 3094
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 160
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/816/07816937.pdf
[firstpage_image] =>[orig_patent_app_number] => 12167000
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/167000 | Apparatus for testing a semiconductor package | Jul 1, 2008 | Issued |
Array
(
[id] => 142976
[patent_doc_number] => 07688063
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-03-30
[patent_title] => 'Apparatus and method for adjusting thermally induced movement of electro-mechanical assemblies'
[patent_app_type] => utility
[patent_app_number] => 12/165325
[patent_app_country] => US
[patent_app_date] => 2008-06-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 19
[patent_no_of_words] => 9144
[patent_no_of_claims] => 41
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 52
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/688/07688063.pdf
[firstpage_image] =>[orig_patent_app_number] => 12165325
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/165325 | Apparatus and method for adjusting thermally induced movement of electro-mechanical assemblies | Jun 29, 2008 | Issued |
Array
(
[id] => 4708616
[patent_doc_number] => 20080297142
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-12-04
[patent_title] => 'CONTACT INSERT FOR A MICROCIRCUIT TEST SOCKET'
[patent_app_type] => utility
[patent_app_number] => 12/147273
[patent_app_country] => US
[patent_app_date] => 2008-06-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 4526
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0297/20080297142.pdf
[firstpage_image] =>[orig_patent_app_number] => 12147273
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/147273 | CONTACT INSERT FOR A MICROCIRCUIT TEST SOCKET | Jun 25, 2008 | Abandoned |
Array
(
[id] => 35008
[patent_doc_number] => 07786720
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-08-31
[patent_title] => 'Passive mixer power detector method and apparatus'
[patent_app_type] => utility
[patent_app_number] => 12/146904
[patent_app_country] => US
[patent_app_date] => 2008-06-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 4021
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 56
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/786/07786720.pdf
[firstpage_image] =>[orig_patent_app_number] => 12146904
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/146904 | Passive mixer power detector method and apparatus | Jun 25, 2008 | Issued |
Array
(
[id] => 7590818
[patent_doc_number] => 07663390
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-02-16
[patent_title] => 'Inspection apparatus and method'
[patent_app_type] => utility
[patent_app_number] => 12/146029
[patent_app_country] => US
[patent_app_date] => 2008-06-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 12
[patent_no_of_words] => 7277
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 95
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/663/07663390.pdf
[firstpage_image] =>[orig_patent_app_number] => 12146029
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/146029 | Inspection apparatus and method | Jun 24, 2008 | Issued |
Array
(
[id] => 5276042
[patent_doc_number] => 20090128174
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-05-21
[patent_title] => 'Probe card using thermoplastic resin'
[patent_app_type] => utility
[patent_app_number] => 12/213869
[patent_app_country] => US
[patent_app_date] => 2008-06-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 2477
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0128/20090128174.pdf
[firstpage_image] =>[orig_patent_app_number] => 12213869
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/213869 | Probe card using thermoplastic resin | Jun 24, 2008 | Abandoned |
Array
(
[id] => 5294278
[patent_doc_number] => 20090009204
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-01-08
[patent_title] => 'Test socket'
[patent_app_type] => utility
[patent_app_number] => 12/214932
[patent_app_country] => US
[patent_app_date] => 2008-06-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 3997
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0009/20090009204.pdf
[firstpage_image] =>[orig_patent_app_number] => 12214932
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/214932 | Test socket | Jun 23, 2008 | Abandoned |
Array
(
[id] => 143038
[patent_doc_number] => 07688092
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-03-30
[patent_title] => 'Measuring board for electronic device test apparatus'
[patent_app_type] => utility
[patent_app_number] => 12/144007
[patent_app_country] => US
[patent_app_date] => 2008-06-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 4648
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 186
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/688/07688092.pdf
[firstpage_image] =>[orig_patent_app_number] => 12144007
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/144007 | Measuring board for electronic device test apparatus | Jun 22, 2008 | Issued |
Array
(
[id] => 5492835
[patent_doc_number] => 20090260863
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-10-22
[patent_title] => 'Parallel Test Fixture for Mixed Signal Integrated Circuits'
[patent_app_type] => utility
[patent_app_number] => 12/144529
[patent_app_country] => US
[patent_app_date] => 2008-06-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2821
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0260/20090260863.pdf
[firstpage_image] =>[orig_patent_app_number] => 12144529
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/144529 | Parallel test fixture for mixed signal integrated circuits | Jun 22, 2008 | Issued |