Search

James Largen

Examiner (ID: 14395)

Most Active Art Unit
2901
Art Unit(s)
2902, 2903, 2901, 2904, 2900
Total Applications
2691
Issued Applications
2645
Pending Applications
1
Abandoned Applications
45

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6551662 [patent_doc_number] => 20100045325 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-25 [patent_title] => 'Test Pad Design for Reducing the Effect of Contact Resistances' [patent_app_type] => utility [patent_app_number] => 12/196531 [patent_app_country] => US [patent_app_date] => 2008-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3137 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0045/20100045325.pdf [firstpage_image] =>[orig_patent_app_number] => 12196531 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/196531
Test pad design for reducing the effect of contact resistances Aug 21, 2008 Issued
Array ( [id] => 6551676 [patent_doc_number] => 20100045326 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-25 [patent_title] => 'THERMAL MONITORING AND MANAGEMENT OF INTEGRATED CIRCUITS' [patent_app_type] => utility [patent_app_number] => 12/194706 [patent_app_country] => US [patent_app_date] => 2008-08-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4567 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0045/20100045326.pdf [firstpage_image] =>[orig_patent_app_number] => 12194706 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/194706
Thermal monitoring and management of integrated circuits Aug 19, 2008 Issued
Array ( [id] => 6551306 [patent_doc_number] => 20100045296 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-25 [patent_title] => 'Cable system for marine data acquisition' [patent_app_type] => utility [patent_app_number] => 12/228989 [patent_app_country] => US [patent_app_date] => 2008-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3735 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0045/20100045296.pdf [firstpage_image] =>[orig_patent_app_number] => 12228989 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/228989
Cable system for marine data acquisition Aug 18, 2008 Abandoned
Array ( [id] => 4757133 [patent_doc_number] => 20080309358 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-18 [patent_title] => 'Active wafer probe' [patent_app_type] => utility [patent_app_number] => 12/228812 [patent_app_country] => US [patent_app_date] => 2008-08-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 6348 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0309/20080309358.pdf [firstpage_image] =>[orig_patent_app_number] => 12228812 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/228812
Active wafer probe Aug 13, 2008 Issued
Array ( [id] => 103396 [patent_doc_number] => 07728580 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-06-01 [patent_title] => 'Connecting device for electronic testing system' [patent_app_type] => utility [patent_app_number] => 12/189129 [patent_app_country] => US [patent_app_date] => 2008-08-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1353 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 157 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/728/07728580.pdf [firstpage_image] =>[orig_patent_app_number] => 12189129 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/189129
Connecting device for electronic testing system Aug 7, 2008 Issued
Array ( [id] => 5444583 [patent_doc_number] => 20090045809 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-02-19 [patent_title] => 'Magnetic sensor and manufacturing method of the same' [patent_app_type] => utility [patent_app_number] => 12/222380 [patent_app_country] => US [patent_app_date] => 2008-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 24 [patent_no_of_words] => 9654 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0045/20090045809.pdf [firstpage_image] =>[orig_patent_app_number] => 12222380 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/222380
Magnetic sensor and manufacturing method of the same Aug 6, 2008 Issued
Array ( [id] => 5579079 [patent_doc_number] => 20090174425 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-09 [patent_title] => 'TEST CIRCUIT FOR A SEMICONDUCTOR INTEGRATED CIRCUIT' [patent_app_type] => utility [patent_app_number] => 12/181226 [patent_app_country] => US [patent_app_date] => 2008-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5655 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0174/20090174425.pdf [firstpage_image] =>[orig_patent_app_number] => 12181226 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/181226
Test circuit for a semiconductor integrated circuit Jul 27, 2008 Issued
Array ( [id] => 5512501 [patent_doc_number] => 20090212805 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-08-27 [patent_title] => 'PROBE OF VERTICAL PROBE CARD' [patent_app_type] => utility [patent_app_number] => 12/177525 [patent_app_country] => US [patent_app_date] => 2008-07-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2781 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0212/20090212805.pdf [firstpage_image] =>[orig_patent_app_number] => 12177525 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/177525
PROBE OF VERTICAL PROBE CARD Jul 21, 2008 Abandoned
Array ( [id] => 6324323 [patent_doc_number] => 20100244877 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-09-30 [patent_title] => 'METHOD AND APPARATUS FOR CONTROLLING POSITION OF Z-AXIS FOR WAFER PROBER' [patent_app_type] => utility [patent_app_number] => 12/743970 [patent_app_country] => US [patent_app_date] => 2008-07-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4046 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0244/20100244877.pdf [firstpage_image] =>[orig_patent_app_number] => 12743970 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/743970
Method and apparatus for controlling position of Z-axis for wafer prober Jul 21, 2008 Issued
Array ( [id] => 5414023 [patent_doc_number] => 20090039910 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-02-12 [patent_title] => 'TEST APPARATUS FOR SEMICONDUCTOR MODULES' [patent_app_type] => utility [patent_app_number] => 12/174302 [patent_app_country] => US [patent_app_date] => 2008-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2318 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0039/20090039910.pdf [firstpage_image] =>[orig_patent_app_number] => 12174302 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/174302
TEST APPARATUS FOR SEMICONDUCTOR MODULES Jul 15, 2008 Abandoned
Array ( [id] => 260554 [patent_doc_number] => 07573284 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-08-11 [patent_title] => 'Increase productivity at wafer test using probe retest data analysis' [patent_app_type] => utility [patent_app_number] => 12/169670 [patent_app_country] => US [patent_app_date] => 2008-07-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 12 [patent_no_of_words] => 3243 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 169 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/573/07573284.pdf [firstpage_image] =>[orig_patent_app_number] => 12169670 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/169670
Increase productivity at wafer test using probe retest data analysis Jul 8, 2008 Issued
Array ( [id] => 5494 [patent_doc_number] => 07816937 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-10-19 [patent_title] => 'Apparatus for testing a semiconductor package' [patent_app_type] => utility [patent_app_number] => 12/167000 [patent_app_country] => US [patent_app_date] => 2008-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 3094 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/816/07816937.pdf [firstpage_image] =>[orig_patent_app_number] => 12167000 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/167000
Apparatus for testing a semiconductor package Jul 1, 2008 Issued
Array ( [id] => 142976 [patent_doc_number] => 07688063 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-03-30 [patent_title] => 'Apparatus and method for adjusting thermally induced movement of electro-mechanical assemblies' [patent_app_type] => utility [patent_app_number] => 12/165325 [patent_app_country] => US [patent_app_date] => 2008-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 19 [patent_no_of_words] => 9144 [patent_no_of_claims] => 41 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 52 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/688/07688063.pdf [firstpage_image] =>[orig_patent_app_number] => 12165325 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/165325
Apparatus and method for adjusting thermally induced movement of electro-mechanical assemblies Jun 29, 2008 Issued
Array ( [id] => 4708616 [patent_doc_number] => 20080297142 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-04 [patent_title] => 'CONTACT INSERT FOR A MICROCIRCUIT TEST SOCKET' [patent_app_type] => utility [patent_app_number] => 12/147273 [patent_app_country] => US [patent_app_date] => 2008-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4526 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0297/20080297142.pdf [firstpage_image] =>[orig_patent_app_number] => 12147273 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/147273
CONTACT INSERT FOR A MICROCIRCUIT TEST SOCKET Jun 25, 2008 Abandoned
Array ( [id] => 35008 [patent_doc_number] => 07786720 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-08-31 [patent_title] => 'Passive mixer power detector method and apparatus' [patent_app_type] => utility [patent_app_number] => 12/146904 [patent_app_country] => US [patent_app_date] => 2008-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4021 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/786/07786720.pdf [firstpage_image] =>[orig_patent_app_number] => 12146904 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/146904
Passive mixer power detector method and apparatus Jun 25, 2008 Issued
Array ( [id] => 7590818 [patent_doc_number] => 07663390 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-02-16 [patent_title] => 'Inspection apparatus and method' [patent_app_type] => utility [patent_app_number] => 12/146029 [patent_app_country] => US [patent_app_date] => 2008-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 12 [patent_no_of_words] => 7277 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/663/07663390.pdf [firstpage_image] =>[orig_patent_app_number] => 12146029 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/146029
Inspection apparatus and method Jun 24, 2008 Issued
Array ( [id] => 5276042 [patent_doc_number] => 20090128174 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-05-21 [patent_title] => 'Probe card using thermoplastic resin' [patent_app_type] => utility [patent_app_number] => 12/213869 [patent_app_country] => US [patent_app_date] => 2008-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2477 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0128/20090128174.pdf [firstpage_image] =>[orig_patent_app_number] => 12213869 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/213869
Probe card using thermoplastic resin Jun 24, 2008 Abandoned
Array ( [id] => 5294278 [patent_doc_number] => 20090009204 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-08 [patent_title] => 'Test socket' [patent_app_type] => utility [patent_app_number] => 12/214932 [patent_app_country] => US [patent_app_date] => 2008-06-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3997 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0009/20090009204.pdf [firstpage_image] =>[orig_patent_app_number] => 12214932 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/214932
Test socket Jun 23, 2008 Abandoned
Array ( [id] => 143038 [patent_doc_number] => 07688092 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-03-30 [patent_title] => 'Measuring board for electronic device test apparatus' [patent_app_type] => utility [patent_app_number] => 12/144007 [patent_app_country] => US [patent_app_date] => 2008-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 4648 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 186 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/688/07688092.pdf [firstpage_image] =>[orig_patent_app_number] => 12144007 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/144007
Measuring board for electronic device test apparatus Jun 22, 2008 Issued
Array ( [id] => 5492835 [patent_doc_number] => 20090260863 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-10-22 [patent_title] => 'Parallel Test Fixture for Mixed Signal Integrated Circuits' [patent_app_type] => utility [patent_app_number] => 12/144529 [patent_app_country] => US [patent_app_date] => 2008-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2821 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0260/20090260863.pdf [firstpage_image] =>[orig_patent_app_number] => 12144529 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/144529
Parallel test fixture for mixed signal integrated circuits Jun 22, 2008 Issued
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