
James Largen
Examiner (ID: 14395)
| Most Active Art Unit | 2901 |
| Art Unit(s) | 2902, 2903, 2901, 2904, 2900 |
| Total Applications | 2691 |
| Issued Applications | 2645 |
| Pending Applications | 1 |
| Abandoned Applications | 45 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 185948
[patent_doc_number] => 07649376
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-01-19
[patent_title] => 'Semiconductor device including test element group and method for testing therefor'
[patent_app_type] => utility
[patent_app_number] => 12/081932
[patent_app_country] => US
[patent_app_date] => 2008-04-23
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/07/649/07649376.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/081932 | Semiconductor device including test element group and method for testing therefor | Apr 22, 2008 | Issued |
Array
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[patent_doc_number] => 20090261852
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[patent_kind] => A1
[patent_issue_date] => 2009-10-22
[patent_title] => 'Ducted Test Socket'
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[patent_app_date] => 2008-04-22
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/107404 | Ducted test socket | Apr 21, 2008 | Issued |
Array
(
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[patent_doc_number] => 20090261849
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[patent_kind] => A1
[patent_issue_date] => 2009-10-22
[patent_title] => 'Low Force Interconnects For Probe Cards'
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[patent_app_number] => 12/106827
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[patent_app_date] => 2008-04-21
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/106827 | Low force interconnects for probe cards | Apr 20, 2008 | Issued |
Array
(
[id] => 133014
[patent_doc_number] => 07701197
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-04-20
[patent_title] => 'Current sensing assembly'
[patent_app_type] => utility
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[patent_app_date] => 2008-04-20
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/106305 | Current sensing assembly | Apr 19, 2008 | Issued |
Array
(
[id] => 4884415
[patent_doc_number] => 20080258747
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[patent_issue_date] => 2008-10-23
[patent_title] => 'TEST EQUIPMENT FOR AUTOMATED QUALITY CONTROL OF THIN FILM SOLAR MODULES'
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[patent_app_number] => 12/105331
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/105331 | Test equipment for automated quality control of thin film solar modules | Apr 17, 2008 | Issued |
Array
(
[id] => 4477870
[patent_doc_number] => 07868633
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[patent_kind] => B1
[patent_issue_date] => 2011-01-11
[patent_title] => 'Modular liquid cooled burn in system'
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[firstpage_image] =>[orig_patent_app_number] => 12082603
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/082603 | Modular liquid cooled burn in system | Apr 11, 2008 | Issued |
Array
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[patent_doc_number] => 20080211529
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[patent_title] => 'INTEGRATED CIRCUIT FOR BEING APPLIED TO ELECTRONIC DEVICE, AND ASSOCIATED TESTING SYSTEM'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/099790 | INTEGRATED CIRCUIT FOR BEING APPLIED TO ELECTRONIC DEVICE, AND ASSOCIATED TESTING SYSTEM | Apr 8, 2008 | Abandoned |
Array
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[id] => 4953024
[patent_doc_number] => 20080186048
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[patent_issue_date] => 2008-08-07
[patent_title] => 'Configurations and method for carrying out wafer level unclamped inductive switching (UIS) tests'
[patent_app_type] => utility
[patent_app_number] => 12/082059
[patent_app_country] => US
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Array
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[id] => 4661422
[patent_doc_number] => 20080252329
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[patent_title] => 'On-chip frequency degradation compensation'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/082065 | On-chip frequency degradation compensation | Apr 6, 2008 | Issued |
Array
(
[id] => 4680273
[patent_doc_number] => 20080246499
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[patent_issue_date] => 2008-10-09
[patent_title] => 'SYSTEM AND METHOD FOR THE ELECTRICAL CONTACTING OF SEMICONDUCTOR DEVICES'
[patent_app_type] => utility
[patent_app_number] => 12/098029
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/098029 | SYSTEM AND METHOD FOR THE ELECTRICAL CONTACTING OF SEMICONDUCTOR DEVICES | Apr 3, 2008 | Abandoned |
Array
(
[id] => 1077499
[patent_doc_number] => 07616016
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[patent_issue_date] => 2009-11-10
[patent_title] => 'Probe card assembly and kit'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/060753 | Probe card assembly and kit | Mar 31, 2008 | Issued |
Array
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[patent_title] => 'TEST DEVICE FOR SEMICONDUCTOR DEVICES'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/057432 | TEST DEVICE FOR SEMICONDUCTOR DEVICES | Mar 27, 2008 | Abandoned |
Array
(
[id] => 5401786
[patent_doc_number] => 20090237099
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/077627 | Probe card substrate with bonded via | Mar 19, 2008 | Issued |
Array
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[id] => 5450304
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Array
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Array
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Array
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Array
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Array
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