Search

James Largen

Examiner (ID: 14395)

Most Active Art Unit
2901
Art Unit(s)
2902, 2903, 2901, 2904, 2900
Total Applications
2691
Issued Applications
2645
Pending Applications
1
Abandoned Applications
45

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 185948 [patent_doc_number] => 07649376 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-01-19 [patent_title] => 'Semiconductor device including test element group and method for testing therefor' [patent_app_type] => utility [patent_app_number] => 12/081932 [patent_app_country] => US [patent_app_date] => 2008-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 14 [patent_no_of_words] => 7000 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/649/07649376.pdf [firstpage_image] =>[orig_patent_app_number] => 12081932 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/081932
Semiconductor device including test element group and method for testing therefor Apr 22, 2008 Issued
Array ( [id] => 5493824 [patent_doc_number] => 20090261852 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-10-22 [patent_title] => 'Ducted Test Socket' [patent_app_type] => utility [patent_app_number] => 12/107404 [patent_app_country] => US [patent_app_date] => 2008-04-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2766 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0261/20090261852.pdf [firstpage_image] =>[orig_patent_app_number] => 12107404 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/107404
Ducted test socket Apr 21, 2008 Issued
Array ( [id] => 5493821 [patent_doc_number] => 20090261849 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-10-22 [patent_title] => 'Low Force Interconnects For Probe Cards' [patent_app_type] => utility [patent_app_number] => 12/106827 [patent_app_country] => US [patent_app_date] => 2008-04-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2938 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0261/20090261849.pdf [firstpage_image] =>[orig_patent_app_number] => 12106827 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/106827
Low force interconnects for probe cards Apr 20, 2008 Issued
Array ( [id] => 133014 [patent_doc_number] => 07701197 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-04-20 [patent_title] => 'Current sensing assembly' [patent_app_type] => utility [patent_app_number] => 12/106305 [patent_app_country] => US [patent_app_date] => 2008-04-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 1171 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 173 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/701/07701197.pdf [firstpage_image] =>[orig_patent_app_number] => 12106305 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/106305
Current sensing assembly Apr 19, 2008 Issued
Array ( [id] => 4884415 [patent_doc_number] => 20080258747 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-23 [patent_title] => 'TEST EQUIPMENT FOR AUTOMATED QUALITY CONTROL OF THIN FILM SOLAR MODULES' [patent_app_type] => utility [patent_app_number] => 12/105331 [patent_app_country] => US [patent_app_date] => 2008-04-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6032 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0258/20080258747.pdf [firstpage_image] =>[orig_patent_app_number] => 12105331 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/105331
Test equipment for automated quality control of thin film solar modules Apr 17, 2008 Issued
Array ( [id] => 4477870 [patent_doc_number] => 07868633 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2011-01-11 [patent_title] => 'Modular liquid cooled burn in system' [patent_app_type] => utility [patent_app_number] => 12/082603 [patent_app_country] => US [patent_app_date] => 2008-04-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 10 [patent_no_of_words] => 2857 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/868/07868633.pdf [firstpage_image] =>[orig_patent_app_number] => 12082603 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/082603
Modular liquid cooled burn in system Apr 11, 2008 Issued
Array ( [id] => 4673901 [patent_doc_number] => 20080211529 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-04 [patent_title] => 'INTEGRATED CIRCUIT FOR BEING APPLIED TO ELECTRONIC DEVICE, AND ASSOCIATED TESTING SYSTEM' [patent_app_type] => utility [patent_app_number] => 12/099790 [patent_app_country] => US [patent_app_date] => 2008-04-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3307 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0211/20080211529.pdf [firstpage_image] =>[orig_patent_app_number] => 12099790 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/099790
INTEGRATED CIRCUIT FOR BEING APPLIED TO ELECTRONIC DEVICE, AND ASSOCIATED TESTING SYSTEM Apr 8, 2008 Abandoned
Array ( [id] => 4953024 [patent_doc_number] => 20080186048 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-08-07 [patent_title] => 'Configurations and method for carrying out wafer level unclamped inductive switching (UIS) tests' [patent_app_type] => utility [patent_app_number] => 12/082059 [patent_app_country] => US [patent_app_date] => 2008-04-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3830 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0186/20080186048.pdf [firstpage_image] =>[orig_patent_app_number] => 12082059 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/082059
Configurations and method for carrying out wafer level unclamped inductive switching (UIS) tests Apr 7, 2008 Issued
Array ( [id] => 4661422 [patent_doc_number] => 20080252329 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-16 [patent_title] => 'On-chip frequency degradation compensation' [patent_app_type] => utility [patent_app_number] => 12/082065 [patent_app_country] => US [patent_app_date] => 2008-04-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5361 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0252/20080252329.pdf [firstpage_image] =>[orig_patent_app_number] => 12082065 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/082065
On-chip frequency degradation compensation Apr 6, 2008 Issued
Array ( [id] => 4680273 [patent_doc_number] => 20080246499 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-09 [patent_title] => 'SYSTEM AND METHOD FOR THE ELECTRICAL CONTACTING OF SEMICONDUCTOR DEVICES' [patent_app_type] => utility [patent_app_number] => 12/098029 [patent_app_country] => US [patent_app_date] => 2008-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 4862 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0246/20080246499.pdf [firstpage_image] =>[orig_patent_app_number] => 12098029 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/098029
SYSTEM AND METHOD FOR THE ELECTRICAL CONTACTING OF SEMICONDUCTOR DEVICES Apr 3, 2008 Abandoned
Array ( [id] => 1077499 [patent_doc_number] => 07616016 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-11-10 [patent_title] => 'Probe card assembly and kit' [patent_app_type] => utility [patent_app_number] => 12/060753 [patent_app_country] => US [patent_app_date] => 2008-04-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 11655 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/616/07616016.pdf [firstpage_image] =>[orig_patent_app_number] => 12060753 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/060753
Probe card assembly and kit Mar 31, 2008 Issued
Array ( [id] => 4715940 [patent_doc_number] => 20080238462 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-02 [patent_title] => 'TEST DEVICE FOR SEMICONDUCTOR DEVICES' [patent_app_type] => utility [patent_app_number] => 12/057432 [patent_app_country] => US [patent_app_date] => 2008-03-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4478 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0238/20080238462.pdf [firstpage_image] =>[orig_patent_app_number] => 12057432 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/057432
TEST DEVICE FOR SEMICONDUCTOR DEVICES Mar 27, 2008 Abandoned
Array ( [id] => 5401786 [patent_doc_number] => 20090237099 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-09-24 [patent_title] => 'Probe card substrate with bonded via' [patent_app_type] => utility [patent_app_number] => 12/077627 [patent_app_country] => US [patent_app_date] => 2008-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 6020 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0237/20090237099.pdf [firstpage_image] =>[orig_patent_app_number] => 12077627 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/077627
Probe card substrate with bonded via Mar 19, 2008 Issued
Array ( [id] => 5450304 [patent_doc_number] => 20090066340 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-03-12 [patent_title] => 'TEST APPARATUS AND CONNECTING APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/047330 [patent_app_country] => US [patent_app_date] => 2008-03-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6826 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0066/20090066340.pdf [firstpage_image] =>[orig_patent_app_number] => 12047330 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/047330
Test apparatus that tests a device under test and connecting apparatus that connects a first apparatus and a second apparatus Mar 12, 2008 Issued
Array ( [id] => 4806226 [patent_doc_number] => 20080169804 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-17 [patent_title] => 'SEMICONDUCTOR DEVICE AND ELECTRONICS DEVICE' [patent_app_type] => utility [patent_app_number] => 12/046093 [patent_app_country] => US [patent_app_date] => 2008-03-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 10029 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0169/20080169804.pdf [firstpage_image] =>[orig_patent_app_number] => 12046093 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/046093
Semiconductor device and electronics device Mar 10, 2008 Issued
Array ( [id] => 93517 [patent_doc_number] => 07733111 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2010-06-08 [patent_title] => 'Segmented optical and electrical testing for photovoltaic devices' [patent_app_type] => utility [patent_app_number] => 12/045734 [patent_app_country] => US [patent_app_date] => 2008-03-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 3842 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/733/07733111.pdf [firstpage_image] =>[orig_patent_app_number] => 12045734 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/045734
Segmented optical and electrical testing for photovoltaic devices Mar 10, 2008 Issued
Array ( [id] => 580790 [patent_doc_number] => 07459925 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-12-02 [patent_title] => 'Probe card' [patent_app_type] => utility [patent_app_number] => 12/043136 [patent_app_country] => US [patent_app_date] => 2008-03-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 3224 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/459/07459925.pdf [firstpage_image] =>[orig_patent_app_number] => 12043136 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/043136
Probe card Mar 5, 2008 Issued
Array ( [id] => 315358 [patent_doc_number] => 07525331 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2009-04-28 [patent_title] => 'On-chip critical path test circuit and method' [patent_app_type] => utility [patent_app_number] => 12/043833 [patent_app_country] => US [patent_app_date] => 2008-03-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 4111 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/525/07525331.pdf [firstpage_image] =>[orig_patent_app_number] => 12043833 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/043833
On-chip critical path test circuit and method Mar 5, 2008 Issued
Array ( [id] => 5383548 [patent_doc_number] => 20090224792 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-09-10 [patent_title] => 'METHOD TO REDUCE TEST PROBE DAMAGE FROM EXCESSIVE DEVICE LEAKAGE CURRENTS' [patent_app_type] => utility [patent_app_number] => 12/041826 [patent_app_country] => US [patent_app_date] => 2008-03-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3216 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0224/20090224792.pdf [firstpage_image] =>[orig_patent_app_number] => 12041826 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/041826
METHOD TO REDUCE TEST PROBE DAMAGE FROM EXCESSIVE DEVICE LEAKAGE CURRENTS Mar 3, 2008 Abandoned
Array ( [id] => 54427 [patent_doc_number] => 07772859 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-08-10 [patent_title] => 'Probe for testing semiconductor devices with features that increase stress tolerance' [patent_app_type] => utility [patent_app_number] => 12/042295 [patent_app_country] => US [patent_app_date] => 2008-03-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 30 [patent_no_of_words] => 6364 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 38 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/772/07772859.pdf [firstpage_image] =>[orig_patent_app_number] => 12042295 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/042295
Probe for testing semiconductor devices with features that increase stress tolerance Mar 3, 2008 Issued
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