
James Largen
Examiner (ID: 14395)
| Most Active Art Unit | 2901 |
| Art Unit(s) | 2902, 2903, 2901, 2904, 2900 |
| Total Applications | 2691 |
| Issued Applications | 2645 |
| Pending Applications | 1 |
| Abandoned Applications | 45 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 236672
[patent_doc_number] => 07595654
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[patent_kind] => B2
[patent_issue_date] => 2009-09-29
[patent_title] => 'Methods and apparatus for inline variability measurement of integrated circuit components'
[patent_app_type] => utility
[patent_app_number] => 12/041388
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[pdf_file] => patents/07/595/07595654.pdf
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Array
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[patent_doc_number] => 20090015239
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[patent_kind] => A1
[patent_issue_date] => 2009-01-15
[patent_title] => 'Transmission Line Sensor'
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Array
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[patent_doc_number] => 20090219035
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[patent_kind] => A1
[patent_issue_date] => 2009-09-03
[patent_title] => 'METHOD AND SYSTEM FOR IMPROVED TESTING OF TRANSISTOR ARRAYS'
[patent_app_type] => utility
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[patent_app_date] => 2008-02-29
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/040807 | System for testing transistor arrays in production | Feb 28, 2008 | Issued |
Array
(
[id] => 282318
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[patent_kind] => B1
[patent_issue_date] => 2009-06-30
[patent_title] => 'Circuits and methods for voltage sensing'
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/039027 | Probe board mounting apparatus | Feb 27, 2008 | Issued |
Array
(
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[patent_title] => 'DEVICE AND METHOD FOR PERFORMING A TEST OF SEMICONDUCTOR DEVICES WITH AN OPTICAL INTERFACE'
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[patent_app_number] => 12/039133
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Array
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Array
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[patent_app_number] => 12/294127
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/294127 | Method and apparatus for inspecting semiconductor device | Feb 25, 2008 | Issued |
Array
(
[id] => 7713877
[patent_doc_number] => 08093909
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[patent_title] => 'Method and device for measuring phase noise'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/301966 | Method and device for measuring phase noise | Feb 6, 2008 | Issued |
Array
(
[id] => 185939
[patent_doc_number] => 07649372
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[patent_issue_date] => 2010-01-19
[patent_title] => 'Die design with integrated assembly aid'
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[patent_app_number] => 12/027711
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Array
(
[id] => 4953022
[patent_doc_number] => 20080186046
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[patent_title] => 'Test socket for testing semiconductor chip, test apparatus including the test socket and method for testing semiconductor chip'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/012537 | Test socket for testing semiconductor chip, test apparatus including the test socket and method for testing semiconductor chip | Feb 3, 2008 | Abandoned |
Array
(
[id] => 4871135
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Array
(
[id] => 331028
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Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/017730 | Test tray and handler using the test tray | Jan 21, 2008 | Issued |
Array
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Array
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