Search

James Largen

Examiner (ID: 14395)

Most Active Art Unit
2901
Art Unit(s)
2902, 2903, 2901, 2904, 2900
Total Applications
2691
Issued Applications
2645
Pending Applications
1
Abandoned Applications
45

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4877178 [patent_doc_number] => 20080150561 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-06-26 [patent_title] => 'Device and method for testing semiconductor element, and manufacturing method thereof' [patent_app_type] => utility [patent_app_number] => 12/003425 [patent_app_country] => US [patent_app_date] => 2007-12-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 4888 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0150/20080150561.pdf [firstpage_image] =>[orig_patent_app_number] => 12003425 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/003425
Device and method for testing semiconductor element, and manufacturing method thereof Dec 25, 2007 Abandoned
Array ( [id] => 4891225 [patent_doc_number] => 20080100322 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-01 [patent_title] => 'PORTABLE MANIPULATOR FOR STACKABLE SEMICONDUCTOR TEST SYSTEM' [patent_app_type] => utility [patent_app_number] => 11/963702 [patent_app_country] => US [patent_app_date] => 2007-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5468 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0100/20080100322.pdf [firstpage_image] =>[orig_patent_app_number] => 11963702 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/963702
PORTABLE MANIPULATOR FOR STACKABLE SEMICONDUCTOR TEST SYSTEM Dec 20, 2007 Abandoned
Array ( [id] => 6507065 [patent_doc_number] => 20100013455 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-21 [patent_title] => 'RF CIRCUIT ANALYSIS' [patent_app_type] => utility [patent_app_number] => 12/519161 [patent_app_country] => US [patent_app_date] => 2007-12-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2671 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0013/20100013455.pdf [firstpage_image] =>[orig_patent_app_number] => 12519161 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/519161
RF circuit analysis Dec 12, 2007 Issued
Array ( [id] => 191489 [patent_doc_number] => 07642803 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-01-05 [patent_title] => 'Address pin reduction mode circuit with parallel input for semiconductor memory device and test method using the same' [patent_app_type] => utility [patent_app_number] => 11/952536 [patent_app_country] => US [patent_app_date] => 2007-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2827 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/642/07642803.pdf [firstpage_image] =>[orig_patent_app_number] => 11952536 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/952536
Address pin reduction mode circuit with parallel input for semiconductor memory device and test method using the same Dec 6, 2007 Issued
Array ( [id] => 6021918 [patent_doc_number] => 20110050244 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-03 [patent_title] => 'METHOD AND APPARATUS FOR TESTING AIRCRAFT ELECTRICAL SYSTEMS' [patent_app_type] => utility [patent_app_number] => 12/744955 [patent_app_country] => US [patent_app_date] => 2007-11-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3397 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 22 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0050/20110050244.pdf [firstpage_image] =>[orig_patent_app_number] => 12744955 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/744955
Method and apparatus for testing aircraft electrical systems Nov 28, 2007 Issued
Array ( [id] => 5926464 [patent_doc_number] => 20110037544 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-02-17 [patent_title] => 'PULL SWITCH' [patent_app_type] => utility [patent_app_number] => 11/942417 [patent_app_country] => US [patent_app_date] => 2007-11-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 1829 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0037/20110037544.pdf [firstpage_image] =>[orig_patent_app_number] => 11942417 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/942417
PULL SWITCH Nov 18, 2007 Abandoned
Array ( [id] => 55350 [patent_doc_number] => 07768280 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2010-08-03 [patent_title] => 'Apparatus for a low-cost semiconductor test interface system' [patent_app_type] => utility [patent_app_number] => 11/941034 [patent_app_country] => US [patent_app_date] => 2007-11-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 12 [patent_no_of_words] => 5667 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/768/07768280.pdf [firstpage_image] =>[orig_patent_app_number] => 11941034 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/941034
Apparatus for a low-cost semiconductor test interface system Nov 14, 2007 Issued
Array ( [id] => 6539014 [patent_doc_number] => 20100271063 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-10-28 [patent_title] => 'TEST APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/742241 [patent_app_country] => US [patent_app_date] => 2007-11-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6184 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0271/20100271063.pdf [firstpage_image] =>[orig_patent_app_number] => 12742241 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/742241
Testing apparatus for multiple identical circuit components Nov 13, 2007 Issued
Array ( [id] => 4702291 [patent_doc_number] => 20080061813 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-13 [patent_title] => 'SEMICONDUCTOR INTEGRATED CIRCUIT TESTER WITH INTERCHANGEABLE TESTER MODULE' [patent_app_type] => utility [patent_app_number] => 11/934944 [patent_app_country] => US [patent_app_date] => 2007-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5272 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0061/20080061813.pdf [firstpage_image] =>[orig_patent_app_number] => 11934944 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/934944
Semiconductor integrated circuit tester with interchangeable tester module Nov 4, 2007 Issued
Array ( [id] => 590381 [patent_doc_number] => 07443188 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-10-28 [patent_title] => 'Electronic device having an interface supported testing mode' [patent_app_type] => utility [patent_app_number] => 11/981854 [patent_app_country] => US [patent_app_date] => 2007-10-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 25 [patent_no_of_words] => 12957 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/443/07443188.pdf [firstpage_image] =>[orig_patent_app_number] => 11981854 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/981854
Electronic device having an interface supported testing mode Oct 30, 2007 Issued
Array ( [id] => 4902736 [patent_doc_number] => 20080112149 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-15 [patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF' [patent_app_type] => utility [patent_app_number] => 11/930016 [patent_app_country] => US [patent_app_date] => 2007-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5004 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0112/20080112149.pdf [firstpage_image] =>[orig_patent_app_number] => 11930016 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/930016
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF Oct 29, 2007 Abandoned
Array ( [id] => 4897299 [patent_doc_number] => 20080116912 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-22 [patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF' [patent_app_type] => utility [patent_app_number] => 11/929711 [patent_app_country] => US [patent_app_date] => 2007-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5005 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0116/20080116912.pdf [firstpage_image] =>[orig_patent_app_number] => 11929711 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/929711
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF Oct 29, 2007 Abandoned
Array ( [id] => 4891218 [patent_doc_number] => 20080100315 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-01 [patent_title] => 'Electrochemically fabricated microprobes' [patent_app_type] => utility [patent_app_number] => 11/928398 [patent_app_country] => US [patent_app_date] => 2007-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 9375 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0100/20080100315.pdf [firstpage_image] =>[orig_patent_app_number] => 11928398 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/928398
Electrochemically fabricated microprobes Oct 29, 2007 Abandoned
Array ( [id] => 4891229 [patent_doc_number] => 20080100326 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-01 [patent_title] => 'Cantilever Microprobes For Contacting Electronic Components and Methods for Making Such Probes' [patent_app_type] => utility [patent_app_number] => 11/929666 [patent_app_country] => US [patent_app_date] => 2007-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 38 [patent_figures_cnt] => 38 [patent_no_of_words] => 17956 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0100/20080100326.pdf [firstpage_image] =>[orig_patent_app_number] => 11929666 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/929666
Cantilever microprobes for contacting electronic components and methods for making such probes Oct 29, 2007 Issued
Array ( [id] => 4763122 [patent_doc_number] => 20080174332 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-24 [patent_title] => 'Electrochemically fabricated microprobes' [patent_app_type] => utility [patent_app_number] => 11/928339 [patent_app_country] => US [patent_app_date] => 2007-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 9372 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0174/20080174332.pdf [firstpage_image] =>[orig_patent_app_number] => 11928339 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/928339
Electrochemically fabricated microprobes Oct 29, 2007 Abandoned
Array ( [id] => 8283533 [patent_doc_number] => 08217640 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-07-10 [patent_title] => 'Method and device for determining the phases in a multi-phase electrical system' [patent_app_type] => utility [patent_app_number] => 12/740650 [patent_app_country] => US [patent_app_date] => 2007-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 16 [patent_no_of_words] => 6417 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12740650 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/740650
Method and device for determining the phases in a multi-phase electrical system Oct 28, 2007 Issued
Array ( [id] => 4667615 [patent_doc_number] => 20080042675 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-21 [patent_title] => 'Probe station' [patent_app_type] => utility [patent_app_number] => 11/975477 [patent_app_country] => US [patent_app_date] => 2007-10-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4106 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0042/20080042675.pdf [firstpage_image] =>[orig_patent_app_number] => 11975477 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/975477
Probe station Oct 18, 2007 Abandoned
Array ( [id] => 4691457 [patent_doc_number] => 20080084227 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-04-10 [patent_title] => 'DIE DESIGN WITH INTEGRATED ASSEMBLY AID' [patent_app_type] => utility [patent_app_number] => 11/872433 [patent_app_country] => US [patent_app_date] => 2007-10-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4800 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0084/20080084227.pdf [firstpage_image] =>[orig_patent_app_number] => 11872433 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/872433
Die design with integrated assembly aid Oct 14, 2007 Issued
Array ( [id] => 4686031 [patent_doc_number] => 20080030212 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-07 [patent_title] => 'ACTIVE PROBE CONTACT ARRAY MANAGEMENT' [patent_app_type] => utility [patent_app_number] => 11/870349 [patent_app_country] => US [patent_app_date] => 2007-10-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4752 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0030/20080030212.pdf [firstpage_image] =>[orig_patent_app_number] => 11870349 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/870349
ACTIVE PROBE CONTACT ARRAY MANAGEMENT Oct 9, 2007 Abandoned
Array ( [id] => 4686030 [patent_doc_number] => 20080030211 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-07 [patent_title] => 'ACTIVE PROBE CONTACT ARRAY MANAGEMENT' [patent_app_type] => utility [patent_app_number] => 11/870334 [patent_app_country] => US [patent_app_date] => 2007-10-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4752 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0030/20080030211.pdf [firstpage_image] =>[orig_patent_app_number] => 11870334 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/870334
ACTIVE PROBE CONTACT ARRAY MANAGEMENT Oct 9, 2007 Abandoned
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