
James Largen
Examiner (ID: 14395)
| Most Active Art Unit | 2901 |
| Art Unit(s) | 2902, 2903, 2901, 2904, 2900 |
| Total Applications | 2691 |
| Issued Applications | 2645 |
| Pending Applications | 1 |
| Abandoned Applications | 45 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4877178
[patent_doc_number] => 20080150561
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-06-26
[patent_title] => 'Device and method for testing semiconductor element, and manufacturing method thereof'
[patent_app_type] => utility
[patent_app_number] => 12/003425
[patent_app_country] => US
[patent_app_date] => 2007-12-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 4888
[patent_no_of_claims] => 37
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0150/20080150561.pdf
[firstpage_image] =>[orig_patent_app_number] => 12003425
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/003425 | Device and method for testing semiconductor element, and manufacturing method thereof | Dec 25, 2007 | Abandoned |
Array
(
[id] => 4891225
[patent_doc_number] => 20080100322
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-05-01
[patent_title] => 'PORTABLE MANIPULATOR FOR STACKABLE SEMICONDUCTOR TEST SYSTEM'
[patent_app_type] => utility
[patent_app_number] => 11/963702
[patent_app_country] => US
[patent_app_date] => 2007-12-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5468
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0100/20080100322.pdf
[firstpage_image] =>[orig_patent_app_number] => 11963702
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/963702 | PORTABLE MANIPULATOR FOR STACKABLE SEMICONDUCTOR TEST SYSTEM | Dec 20, 2007 | Abandoned |
Array
(
[id] => 6507065
[patent_doc_number] => 20100013455
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-01-21
[patent_title] => 'RF CIRCUIT ANALYSIS'
[patent_app_type] => utility
[patent_app_number] => 12/519161
[patent_app_country] => US
[patent_app_date] => 2007-12-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 2671
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0013/20100013455.pdf
[firstpage_image] =>[orig_patent_app_number] => 12519161
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/519161 | RF circuit analysis | Dec 12, 2007 | Issued |
Array
(
[id] => 191489
[patent_doc_number] => 07642803
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-01-05
[patent_title] => 'Address pin reduction mode circuit with parallel input for semiconductor memory device and test method using the same'
[patent_app_type] => utility
[patent_app_number] => 11/952536
[patent_app_country] => US
[patent_app_date] => 2007-12-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 2827
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 104
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/642/07642803.pdf
[firstpage_image] =>[orig_patent_app_number] => 11952536
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/952536 | Address pin reduction mode circuit with parallel input for semiconductor memory device and test method using the same | Dec 6, 2007 | Issued |
Array
(
[id] => 6021918
[patent_doc_number] => 20110050244
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-03-03
[patent_title] => 'METHOD AND APPARATUS FOR TESTING AIRCRAFT ELECTRICAL SYSTEMS'
[patent_app_type] => utility
[patent_app_number] => 12/744955
[patent_app_country] => US
[patent_app_date] => 2007-11-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3397
[patent_no_of_claims] => 34
[patent_no_of_ind_claims] => 22
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0050/20110050244.pdf
[firstpage_image] =>[orig_patent_app_number] => 12744955
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/744955 | Method and apparatus for testing aircraft electrical systems | Nov 28, 2007 | Issued |
Array
(
[id] => 5926464
[patent_doc_number] => 20110037544
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-02-17
[patent_title] => 'PULL SWITCH'
[patent_app_type] => utility
[patent_app_number] => 11/942417
[patent_app_country] => US
[patent_app_date] => 2007-11-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 1829
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0037/20110037544.pdf
[firstpage_image] =>[orig_patent_app_number] => 11942417
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/942417 | PULL SWITCH | Nov 18, 2007 | Abandoned |
Array
(
[id] => 55350
[patent_doc_number] => 07768280
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2010-08-03
[patent_title] => 'Apparatus for a low-cost semiconductor test interface system'
[patent_app_type] => utility
[patent_app_number] => 11/941034
[patent_app_country] => US
[patent_app_date] => 2007-11-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 12
[patent_no_of_words] => 5667
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 111
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/768/07768280.pdf
[firstpage_image] =>[orig_patent_app_number] => 11941034
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/941034 | Apparatus for a low-cost semiconductor test interface system | Nov 14, 2007 | Issued |
Array
(
[id] => 6539014
[patent_doc_number] => 20100271063
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-10-28
[patent_title] => 'TEST APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 12/742241
[patent_app_country] => US
[patent_app_date] => 2007-11-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 6184
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0271/20100271063.pdf
[firstpage_image] =>[orig_patent_app_number] => 12742241
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/742241 | Testing apparatus for multiple identical circuit components | Nov 13, 2007 | Issued |
Array
(
[id] => 4702291
[patent_doc_number] => 20080061813
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-03-13
[patent_title] => 'SEMICONDUCTOR INTEGRATED CIRCUIT TESTER WITH INTERCHANGEABLE TESTER MODULE'
[patent_app_type] => utility
[patent_app_number] => 11/934944
[patent_app_country] => US
[patent_app_date] => 2007-11-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 5272
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0061/20080061813.pdf
[firstpage_image] =>[orig_patent_app_number] => 11934944
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/934944 | Semiconductor integrated circuit tester with interchangeable tester module | Nov 4, 2007 | Issued |
Array
(
[id] => 590381
[patent_doc_number] => 07443188
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-10-28
[patent_title] => 'Electronic device having an interface supported testing mode'
[patent_app_type] => utility
[patent_app_number] => 11/981854
[patent_app_country] => US
[patent_app_date] => 2007-10-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 25
[patent_no_of_words] => 12957
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 128
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/443/07443188.pdf
[firstpage_image] =>[orig_patent_app_number] => 11981854
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/981854 | Electronic device having an interface supported testing mode | Oct 30, 2007 | Issued |
Array
(
[id] => 4902736
[patent_doc_number] => 20080112149
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-05-15
[patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF'
[patent_app_type] => utility
[patent_app_number] => 11/930016
[patent_app_country] => US
[patent_app_date] => 2007-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 5004
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0112/20080112149.pdf
[firstpage_image] =>[orig_patent_app_number] => 11930016
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/930016 | HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF | Oct 29, 2007 | Abandoned |
Array
(
[id] => 4897299
[patent_doc_number] => 20080116912
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-05-22
[patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF'
[patent_app_type] => utility
[patent_app_number] => 11/929711
[patent_app_country] => US
[patent_app_date] => 2007-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 5005
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0116/20080116912.pdf
[firstpage_image] =>[orig_patent_app_number] => 11929711
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/929711 | HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF | Oct 29, 2007 | Abandoned |
Array
(
[id] => 4891218
[patent_doc_number] => 20080100315
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-05-01
[patent_title] => 'Electrochemically fabricated microprobes'
[patent_app_type] => utility
[patent_app_number] => 11/928398
[patent_app_country] => US
[patent_app_date] => 2007-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 20
[patent_no_of_words] => 9375
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0100/20080100315.pdf
[firstpage_image] =>[orig_patent_app_number] => 11928398
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/928398 | Electrochemically fabricated microprobes | Oct 29, 2007 | Abandoned |
Array
(
[id] => 4891229
[patent_doc_number] => 20080100326
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-05-01
[patent_title] => 'Cantilever Microprobes For Contacting Electronic Components and Methods for Making Such Probes'
[patent_app_type] => utility
[patent_app_number] => 11/929666
[patent_app_country] => US
[patent_app_date] => 2007-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 38
[patent_figures_cnt] => 38
[patent_no_of_words] => 17956
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0100/20080100326.pdf
[firstpage_image] =>[orig_patent_app_number] => 11929666
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/929666 | Cantilever microprobes for contacting electronic components and methods for making such probes | Oct 29, 2007 | Issued |
Array
(
[id] => 4763122
[patent_doc_number] => 20080174332
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-07-24
[patent_title] => 'Electrochemically fabricated microprobes'
[patent_app_type] => utility
[patent_app_number] => 11/928339
[patent_app_country] => US
[patent_app_date] => 2007-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 20
[patent_no_of_words] => 9372
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0174/20080174332.pdf
[firstpage_image] =>[orig_patent_app_number] => 11928339
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/928339 | Electrochemically fabricated microprobes | Oct 29, 2007 | Abandoned |
Array
(
[id] => 8283533
[patent_doc_number] => 08217640
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-07-10
[patent_title] => 'Method and device for determining the phases in a multi-phase electrical system'
[patent_app_type] => utility
[patent_app_number] => 12/740650
[patent_app_country] => US
[patent_app_date] => 2007-10-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 16
[patent_no_of_words] => 6417
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 150
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12740650
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/740650 | Method and device for determining the phases in a multi-phase electrical system | Oct 28, 2007 | Issued |
Array
(
[id] => 4667615
[patent_doc_number] => 20080042675
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-21
[patent_title] => 'Probe station'
[patent_app_type] => utility
[patent_app_number] => 11/975477
[patent_app_country] => US
[patent_app_date] => 2007-10-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 4106
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0042/20080042675.pdf
[firstpage_image] =>[orig_patent_app_number] => 11975477
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/975477 | Probe station | Oct 18, 2007 | Abandoned |
Array
(
[id] => 4691457
[patent_doc_number] => 20080084227
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-04-10
[patent_title] => 'DIE DESIGN WITH INTEGRATED ASSEMBLY AID'
[patent_app_type] => utility
[patent_app_number] => 11/872433
[patent_app_country] => US
[patent_app_date] => 2007-10-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 4800
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0084/20080084227.pdf
[firstpage_image] =>[orig_patent_app_number] => 11872433
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/872433 | Die design with integrated assembly aid | Oct 14, 2007 | Issued |
Array
(
[id] => 4686031
[patent_doc_number] => 20080030212
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-07
[patent_title] => 'ACTIVE PROBE CONTACT ARRAY MANAGEMENT'
[patent_app_type] => utility
[patent_app_number] => 11/870349
[patent_app_country] => US
[patent_app_date] => 2007-10-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 4752
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0030/20080030212.pdf
[firstpage_image] =>[orig_patent_app_number] => 11870349
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/870349 | ACTIVE PROBE CONTACT ARRAY MANAGEMENT | Oct 9, 2007 | Abandoned |
Array
(
[id] => 4686030
[patent_doc_number] => 20080030211
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-07
[patent_title] => 'ACTIVE PROBE CONTACT ARRAY MANAGEMENT'
[patent_app_type] => utility
[patent_app_number] => 11/870334
[patent_app_country] => US
[patent_app_date] => 2007-10-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 4752
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0030/20080030211.pdf
[firstpage_image] =>[orig_patent_app_number] => 11870334
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/870334 | ACTIVE PROBE CONTACT ARRAY MANAGEMENT | Oct 9, 2007 | Abandoned |