Search

James Largen

Examiner (ID: 14395)

Most Active Art Unit
2901
Art Unit(s)
2902, 2903, 2901, 2904, 2900
Total Applications
2691
Issued Applications
2645
Pending Applications
1
Abandoned Applications
45

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4686032 [patent_doc_number] => 20080030213 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-07 [patent_title] => 'ACTIVE PROBE CONTACT ARRAY MANAGEMENT' [patent_app_type] => utility [patent_app_number] => 11/870367 [patent_app_country] => US [patent_app_date] => 2007-10-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4752 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0030/20080030213.pdf [firstpage_image] =>[orig_patent_app_number] => 11870367 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/870367
ACTIVE PROBE CONTACT ARRAY MANAGEMENT Oct 9, 2007 Abandoned
Array ( [id] => 7597152 [patent_doc_number] => 07619426 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-11-17 [patent_title] => 'Performance board and cover member' [patent_app_type] => utility [patent_app_number] => 11/864928 [patent_app_country] => US [patent_app_date] => 2007-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 6248 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/619/07619426.pdf [firstpage_image] =>[orig_patent_app_number] => 11864928 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/864928
Performance board and cover member Sep 28, 2007 Issued
Array ( [id] => 5483570 [patent_doc_number] => 20090273335 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-11-05 [patent_title] => 'Sensing instrument' [patent_app_type] => utility [patent_app_number] => 12/311261 [patent_app_country] => US [patent_app_date] => 2007-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6099 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0273/20090273335.pdf [firstpage_image] =>[orig_patent_app_number] => 12311261 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/311261
Sensing instrument Sep 26, 2007 Issued
Array ( [id] => 4909800 [patent_doc_number] => 20080020566 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-24 [patent_title] => 'Method of making an interposer' [patent_app_type] => utility [patent_app_number] => 11/902976 [patent_app_country] => US [patent_app_date] => 2007-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 7288 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0020/20080020566.pdf [firstpage_image] =>[orig_patent_app_number] => 11902976 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/902976
Method of making an interposer Sep 26, 2007 Issued
Array ( [id] => 6467164 [patent_doc_number] => 20100007331 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-14 [patent_title] => 'SELF-BALANCING FREQUENCY DETERMINING BRIDGE' [patent_app_type] => utility [patent_app_number] => 12/443119 [patent_app_country] => US [patent_app_date] => 2007-09-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 8737 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0007/20100007331.pdf [firstpage_image] =>[orig_patent_app_number] => 12443119 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/443119
Self-balancing frequency determining bridge Sep 25, 2007 Issued
Array ( [id] => 4907585 [patent_doc_number] => 20080018351 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-24 [patent_title] => 'TOOLLESS METHOD FOR ALIGNMENT, RETENTION, CONNECTION, TERMINATION AND TEST ON PRINTED CIRCUIT BOARDS' [patent_app_type] => utility [patent_app_number] => 11/858929 [patent_app_country] => US [patent_app_date] => 2007-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 4554 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0018/20080018351.pdf [firstpage_image] =>[orig_patent_app_number] => 11858929 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/858929
TOOLLESS METHOD FOR ALIGNMENT, RETENTION, CONNECTION, TERMINATION AND TEST ON PRINTED CIRCUIT BOARDS Sep 20, 2007 Abandoned
Array ( [id] => 4743736 [patent_doc_number] => 20080088337 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-04-17 [patent_title] => 'Apparatus for Inspecting a Display Device and Method for Inspecting the Display Device' [patent_app_type] => utility [patent_app_number] => 11/859633 [patent_app_country] => US [patent_app_date] => 2007-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 7032 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0088/20080088337.pdf [firstpage_image] =>[orig_patent_app_number] => 11859633 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/859633
Apparatus for Inspecting a Display Device and Method for Inspecting the Display Device Sep 20, 2007 Abandoned
Array ( [id] => 43995 [patent_doc_number] => 07782074 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-08-24 [patent_title] => 'System that detects damage in adjacent dice' [patent_app_type] => utility [patent_app_number] => 11/857043 [patent_app_country] => US [patent_app_date] => 2007-09-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 4777 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/782/07782074.pdf [firstpage_image] =>[orig_patent_app_number] => 11857043 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/857043
System that detects damage in adjacent dice Sep 17, 2007 Issued
Array ( [id] => 124530 [patent_doc_number] => 07705621 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-04-27 [patent_title] => 'Test pattern and method of monitoring defects using the same' [patent_app_type] => utility [patent_app_number] => 11/852625 [patent_app_country] => US [patent_app_date] => 2007-09-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 6076 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/705/07705621.pdf [firstpage_image] =>[orig_patent_app_number] => 11852625 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/852625
Test pattern and method of monitoring defects using the same Sep 9, 2007 Issued
Array ( [id] => 315328 [patent_doc_number] => 07525300 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-04-28 [patent_title] => 'Current measuring device and method' [patent_app_type] => utility [patent_app_number] => 11/897136 [patent_app_country] => US [patent_app_date] => 2007-08-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 3751 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/525/07525300.pdf [firstpage_image] =>[orig_patent_app_number] => 11897136 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/897136
Current measuring device and method Aug 27, 2007 Issued
Array ( [id] => 5334913 [patent_doc_number] => 20090051377 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-02-26 [patent_title] => 'Probe card and method for assembling the same' [patent_app_type] => utility [patent_app_number] => 11/892431 [patent_app_country] => US [patent_app_date] => 2007-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 1680 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0051/20090051377.pdf [firstpage_image] =>[orig_patent_app_number] => 11892431 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/892431
Probe card and method for assembling the same Aug 22, 2007 Issued
Array ( [id] => 1077498 [patent_doc_number] => 07616015 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-11-10 [patent_title] => 'Wafer type probe card, method for fabricating the same, and semiconductor test apparatus having the same' [patent_app_type] => utility [patent_app_number] => 11/892433 [patent_app_country] => US [patent_app_date] => 2007-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 45 [patent_no_of_words] => 8649 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/616/07616015.pdf [firstpage_image] =>[orig_patent_app_number] => 11892433 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/892433
Wafer type probe card, method for fabricating the same, and semiconductor test apparatus having the same Aug 22, 2007 Issued
Array ( [id] => 160456 [patent_doc_number] => 07675302 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-03-09 [patent_title] => 'Probe card assembly and method of attaching probes to the probe card assembly' [patent_app_type] => utility [patent_app_number] => 11/839852 [patent_app_country] => US [patent_app_date] => 2007-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 3716 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/675/07675302.pdf [firstpage_image] =>[orig_patent_app_number] => 11839852 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/839852
Probe card assembly and method of attaching probes to the probe card assembly Aug 15, 2007 Issued
Array ( [id] => 4731658 [patent_doc_number] => 20080048636 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-28 [patent_title] => 'Method and apparatus for silicon-on-insulator material characterization' [patent_app_type] => utility [patent_app_number] => 11/894032 [patent_app_country] => US [patent_app_date] => 2007-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2414 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0048/20080048636.pdf [firstpage_image] =>[orig_patent_app_number] => 11894032 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/894032
Method and apparatus for silicon-on-insulator material characterization Aug 15, 2007 Abandoned
Array ( [id] => 4649227 [patent_doc_number] => 20080036482 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-14 [patent_title] => 'CARRIER TRAY FOR USE WITH PROBER' [patent_app_type] => utility [patent_app_number] => 11/836327 [patent_app_country] => US [patent_app_date] => 2007-08-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 9548 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0036/20080036482.pdf [firstpage_image] =>[orig_patent_app_number] => 11836327 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/836327
Carrier tray for use with prober Aug 8, 2007 Issued
Array ( [id] => 315355 [patent_doc_number] => 07525328 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-04-28 [patent_title] => 'Cap at resistors of electrical test probe' [patent_app_type] => utility [patent_app_number] => 11/890095 [patent_app_country] => US [patent_app_date] => 2007-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 20 [patent_no_of_words] => 3976 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 38 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/525/07525328.pdf [firstpage_image] =>[orig_patent_app_number] => 11890095 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/890095
Cap at resistors of electrical test probe Aug 2, 2007 Issued
Array ( [id] => 4844386 [patent_doc_number] => 20080180794 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-31 [patent_title] => 'MICROSCOPE ENCLOSURE SYSTEM' [patent_app_type] => utility [patent_app_number] => 11/833203 [patent_app_country] => US [patent_app_date] => 2007-08-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 25 [patent_no_of_words] => 4744 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 11833203 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/833203
Microscope enclosure system Aug 1, 2007 Issued
Array ( [id] => 289464 [patent_doc_number] => 07548081 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2009-06-16 [patent_title] => 'System and method for controlling environmental parameters of a device under test' [patent_app_type] => utility [patent_app_number] => 11/888036 [patent_app_country] => US [patent_app_date] => 2007-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2962 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/548/07548081.pdf [firstpage_image] =>[orig_patent_app_number] => 11888036 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/888036
System and method for controlling environmental parameters of a device under test Jul 30, 2007 Issued
Array ( [id] => 4649209 [patent_doc_number] => 20080036464 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-14 [patent_title] => 'Probes and methods for semiconductor wafer analysis' [patent_app_type] => utility [patent_app_number] => 11/881730 [patent_app_country] => US [patent_app_date] => 2007-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 7234 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0036/20080036464.pdf [firstpage_image] =>[orig_patent_app_number] => 11881730 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/881730
Probes and methods for semiconductor wafer analysis Jul 26, 2007 Abandoned
Array ( [id] => 185941 [patent_doc_number] => 07649373 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-01-19 [patent_title] => 'Semiconductor integrated circuit with voltage drop detector' [patent_app_type] => utility [patent_app_number] => 11/878034 [patent_app_country] => US [patent_app_date] => 2007-07-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 3190 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 259 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/649/07649373.pdf [firstpage_image] =>[orig_patent_app_number] => 11878034 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/878034
Semiconductor integrated circuit with voltage drop detector Jul 19, 2007 Issued
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