
James Largen
Examiner (ID: 14395)
| Most Active Art Unit | 2901 |
| Art Unit(s) | 2902, 2903, 2901, 2904, 2900 |
| Total Applications | 2691 |
| Issued Applications | 2645 |
| Pending Applications | 1 |
| Abandoned Applications | 45 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4686032
[patent_doc_number] => 20080030213
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-07
[patent_title] => 'ACTIVE PROBE CONTACT ARRAY MANAGEMENT'
[patent_app_type] => utility
[patent_app_number] => 11/870367
[patent_app_country] => US
[patent_app_date] => 2007-10-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 4752
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0030/20080030213.pdf
[firstpage_image] =>[orig_patent_app_number] => 11870367
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/870367 | ACTIVE PROBE CONTACT ARRAY MANAGEMENT | Oct 9, 2007 | Abandoned |
Array
(
[id] => 7597152
[patent_doc_number] => 07619426
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-11-17
[patent_title] => 'Performance board and cover member'
[patent_app_type] => utility
[patent_app_number] => 11/864928
[patent_app_country] => US
[patent_app_date] => 2007-09-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
[patent_figures_cnt] => 19
[patent_no_of_words] => 6248
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 108
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/619/07619426.pdf
[firstpage_image] =>[orig_patent_app_number] => 11864928
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/864928 | Performance board and cover member | Sep 28, 2007 | Issued |
Array
(
[id] => 5483570
[patent_doc_number] => 20090273335
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-11-05
[patent_title] => 'Sensing instrument'
[patent_app_type] => utility
[patent_app_number] => 12/311261
[patent_app_country] => US
[patent_app_date] => 2007-09-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 6099
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0273/20090273335.pdf
[firstpage_image] =>[orig_patent_app_number] => 12311261
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/311261 | Sensing instrument | Sep 26, 2007 | Issued |
Array
(
[id] => 4909800
[patent_doc_number] => 20080020566
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-01-24
[patent_title] => 'Method of making an interposer'
[patent_app_type] => utility
[patent_app_number] => 11/902976
[patent_app_country] => US
[patent_app_date] => 2007-09-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 7288
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0020/20080020566.pdf
[firstpage_image] =>[orig_patent_app_number] => 11902976
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/902976 | Method of making an interposer | Sep 26, 2007 | Issued |
Array
(
[id] => 6467164
[patent_doc_number] => 20100007331
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-01-14
[patent_title] => 'SELF-BALANCING FREQUENCY DETERMINING BRIDGE'
[patent_app_type] => utility
[patent_app_number] => 12/443119
[patent_app_country] => US
[patent_app_date] => 2007-09-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 8737
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0007/20100007331.pdf
[firstpage_image] =>[orig_patent_app_number] => 12443119
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/443119 | Self-balancing frequency determining bridge | Sep 25, 2007 | Issued |
Array
(
[id] => 4907585
[patent_doc_number] => 20080018351
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-01-24
[patent_title] => 'TOOLLESS METHOD FOR ALIGNMENT, RETENTION, CONNECTION, TERMINATION AND TEST ON PRINTED CIRCUIT BOARDS'
[patent_app_type] => utility
[patent_app_number] => 11/858929
[patent_app_country] => US
[patent_app_date] => 2007-09-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 4554
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0018/20080018351.pdf
[firstpage_image] =>[orig_patent_app_number] => 11858929
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/858929 | TOOLLESS METHOD FOR ALIGNMENT, RETENTION, CONNECTION, TERMINATION AND TEST ON PRINTED CIRCUIT BOARDS | Sep 20, 2007 | Abandoned |
Array
(
[id] => 4743736
[patent_doc_number] => 20080088337
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-04-17
[patent_title] => 'Apparatus for Inspecting a Display Device and Method for Inspecting the Display Device'
[patent_app_type] => utility
[patent_app_number] => 11/859633
[patent_app_country] => US
[patent_app_date] => 2007-09-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 7032
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0088/20080088337.pdf
[firstpage_image] =>[orig_patent_app_number] => 11859633
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/859633 | Apparatus for Inspecting a Display Device and Method for Inspecting the Display Device | Sep 20, 2007 | Abandoned |
Array
(
[id] => 43995
[patent_doc_number] => 07782074
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-08-24
[patent_title] => 'System that detects damage in adjacent dice'
[patent_app_type] => utility
[patent_app_number] => 11/857043
[patent_app_country] => US
[patent_app_date] => 2007-09-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 4777
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 72
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/782/07782074.pdf
[firstpage_image] =>[orig_patent_app_number] => 11857043
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/857043 | System that detects damage in adjacent dice | Sep 17, 2007 | Issued |
Array
(
[id] => 124530
[patent_doc_number] => 07705621
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-04-27
[patent_title] => 'Test pattern and method of monitoring defects using the same'
[patent_app_type] => utility
[patent_app_number] => 11/852625
[patent_app_country] => US
[patent_app_date] => 2007-09-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 10
[patent_no_of_words] => 6076
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 139
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/705/07705621.pdf
[firstpage_image] =>[orig_patent_app_number] => 11852625
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/852625 | Test pattern and method of monitoring defects using the same | Sep 9, 2007 | Issued |
Array
(
[id] => 315328
[patent_doc_number] => 07525300
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-04-28
[patent_title] => 'Current measuring device and method'
[patent_app_type] => utility
[patent_app_number] => 11/897136
[patent_app_country] => US
[patent_app_date] => 2007-08-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 7
[patent_no_of_words] => 3751
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 114
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/525/07525300.pdf
[firstpage_image] =>[orig_patent_app_number] => 11897136
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/897136 | Current measuring device and method | Aug 27, 2007 | Issued |
Array
(
[id] => 5334913
[patent_doc_number] => 20090051377
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-02-26
[patent_title] => 'Probe card and method for assembling the same'
[patent_app_type] => utility
[patent_app_number] => 11/892431
[patent_app_country] => US
[patent_app_date] => 2007-08-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 1680
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0051/20090051377.pdf
[firstpage_image] =>[orig_patent_app_number] => 11892431
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/892431 | Probe card and method for assembling the same | Aug 22, 2007 | Issued |
Array
(
[id] => 1077498
[patent_doc_number] => 07616015
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-11-10
[patent_title] => 'Wafer type probe card, method for fabricating the same, and semiconductor test apparatus having the same'
[patent_app_type] => utility
[patent_app_number] => 11/892433
[patent_app_country] => US
[patent_app_date] => 2007-08-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
[patent_figures_cnt] => 45
[patent_no_of_words] => 8649
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 142
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/616/07616015.pdf
[firstpage_image] =>[orig_patent_app_number] => 11892433
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/892433 | Wafer type probe card, method for fabricating the same, and semiconductor test apparatus having the same | Aug 22, 2007 | Issued |
Array
(
[id] => 160456
[patent_doc_number] => 07675302
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-03-09
[patent_title] => 'Probe card assembly and method of attaching probes to the probe card assembly'
[patent_app_type] => utility
[patent_app_number] => 11/839852
[patent_app_country] => US
[patent_app_date] => 2007-08-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 11
[patent_no_of_words] => 3716
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 112
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/675/07675302.pdf
[firstpage_image] =>[orig_patent_app_number] => 11839852
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/839852 | Probe card assembly and method of attaching probes to the probe card assembly | Aug 15, 2007 | Issued |
Array
(
[id] => 4731658
[patent_doc_number] => 20080048636
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-28
[patent_title] => 'Method and apparatus for silicon-on-insulator material characterization'
[patent_app_type] => utility
[patent_app_number] => 11/894032
[patent_app_country] => US
[patent_app_date] => 2007-08-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2414
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0048/20080048636.pdf
[firstpage_image] =>[orig_patent_app_number] => 11894032
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/894032 | Method and apparatus for silicon-on-insulator material characterization | Aug 15, 2007 | Abandoned |
Array
(
[id] => 4649227
[patent_doc_number] => 20080036482
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-14
[patent_title] => 'CARRIER TRAY FOR USE WITH PROBER'
[patent_app_type] => utility
[patent_app_number] => 11/836327
[patent_app_country] => US
[patent_app_date] => 2007-08-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
[patent_figures_cnt] => 19
[patent_no_of_words] => 9548
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0036/20080036482.pdf
[firstpage_image] =>[orig_patent_app_number] => 11836327
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/836327 | Carrier tray for use with prober | Aug 8, 2007 | Issued |
Array
(
[id] => 315355
[patent_doc_number] => 07525328
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-04-28
[patent_title] => 'Cap at resistors of electrical test probe'
[patent_app_type] => utility
[patent_app_number] => 11/890095
[patent_app_country] => US
[patent_app_date] => 2007-08-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 20
[patent_no_of_words] => 3976
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 38
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/525/07525328.pdf
[firstpage_image] =>[orig_patent_app_number] => 11890095
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/890095 | Cap at resistors of electrical test probe | Aug 2, 2007 | Issued |
Array
(
[id] => 4844386
[patent_doc_number] => 20080180794
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-07-31
[patent_title] => 'MICROSCOPE ENCLOSURE SYSTEM'
[patent_app_type] => utility
[patent_app_number] => 11/833203
[patent_app_country] => US
[patent_app_date] => 2007-08-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 25
[patent_figures_cnt] => 25
[patent_no_of_words] => 4744
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 11833203
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/833203 | Microscope enclosure system | Aug 1, 2007 | Issued |
Array
(
[id] => 289464
[patent_doc_number] => 07548081
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2009-06-16
[patent_title] => 'System and method for controlling environmental parameters of a device under test'
[patent_app_type] => utility
[patent_app_number] => 11/888036
[patent_app_country] => US
[patent_app_date] => 2007-07-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 2962
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 108
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/548/07548081.pdf
[firstpage_image] =>[orig_patent_app_number] => 11888036
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/888036 | System and method for controlling environmental parameters of a device under test | Jul 30, 2007 | Issued |
Array
(
[id] => 4649209
[patent_doc_number] => 20080036464
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-14
[patent_title] => 'Probes and methods for semiconductor wafer analysis'
[patent_app_type] => utility
[patent_app_number] => 11/881730
[patent_app_country] => US
[patent_app_date] => 2007-07-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 7234
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0036/20080036464.pdf
[firstpage_image] =>[orig_patent_app_number] => 11881730
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/881730 | Probes and methods for semiconductor wafer analysis | Jul 26, 2007 | Abandoned |
Array
(
[id] => 185941
[patent_doc_number] => 07649373
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-01-19
[patent_title] => 'Semiconductor integrated circuit with voltage drop detector'
[patent_app_type] => utility
[patent_app_number] => 11/878034
[patent_app_country] => US
[patent_app_date] => 2007-07-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 9
[patent_no_of_words] => 3190
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 259
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/649/07649373.pdf
[firstpage_image] =>[orig_patent_app_number] => 11878034
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/878034 | Semiconductor integrated circuit with voltage drop detector | Jul 19, 2007 | Issued |