
James Largen
Examiner (ID: 14395)
| Most Active Art Unit | 2901 |
| Art Unit(s) | 2902, 2903, 2901, 2904, 2900 |
| Total Applications | 2691 |
| Issued Applications | 2645 |
| Pending Applications | 1 |
| Abandoned Applications | 45 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5478085
[patent_doc_number] => 20090201042
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-08-13
[patent_title] => 'THIN FILM TRANSISTOR ARRAY HAVING TEST CIRCUITRY'
[patent_app_type] => utility
[patent_app_number] => 12/374419
[patent_app_country] => US
[patent_app_date] => 2007-07-17
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[pdf_file] => publications/A1/0201/20090201042.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/374419 | Thin film transistor array having test circuitry | Jul 16, 2007 | Issued |
Array
(
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[patent_doc_number] => 07394274
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[patent_kind] => B2
[patent_issue_date] => 2008-07-01
[patent_title] => 'On-chip frequency degradation compensation'
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Array
(
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[patent_doc_number] => 20100025246
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[patent_issue_date] => 2010-02-04
[patent_title] => 'APPARATUS AND METHOD FOR DETECTING MOTION CHARACTERISTICS OF PARTICLES IN FLOW CHANNEL'
[patent_app_type] => utility
[patent_app_number] => 12/374092
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/374092 | Apparatus and method for detecting motion characteristics of particles in flow channel | Jul 15, 2007 | Issued |
Array
(
[id] => 23680
[patent_doc_number] => 07800389
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[patent_issue_date] => 2010-09-21
[patent_title] => 'Integrated circuit having built-in self-test features'
[patent_app_type] => utility
[patent_app_number] => 11/777406
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[patent_app_date] => 2007-07-13
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Array
(
[id] => 5307994
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[patent_title] => 'Ultra-Fine Area Array Pitch Probe Card'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/775732 | Ultra-fine area array pitch probe card | Jul 9, 2007 | Issued |
Array
(
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[patent_doc_number] => 08040125
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[patent_title] => 'Device and method for the analysis of a measured signal transmitted via a multi-channel system'
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Array
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[patent_doc_number] => 07615990
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[patent_title] => 'Loadboard enhancements for automated test equipment'
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Array
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[id] => 5248428
[patent_doc_number] => 20070244662
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[patent_kind] => A1
[patent_issue_date] => 2007-10-18
[patent_title] => 'INCREASED YIELD MANUFACTURING FOR INTEGRATED CIRCUITS'
[patent_app_type] => utility
[patent_app_number] => 11/766527
[patent_app_country] => US
[patent_app_date] => 2007-06-21
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/766527 | Increased yield manufacturing for integrated circuits | Jun 20, 2007 | Issued |
Array
(
[id] => 4757134
[patent_doc_number] => 20080309359
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[patent_issue_date] => 2008-12-18
[patent_title] => 'SUSPENSION SYSTEM AND ADJUSTMENT MECHANISM FOR AN INTEGRATED CHIP AND METHOD'
[patent_app_type] => utility
[patent_app_number] => 11/764230
[patent_app_country] => US
[patent_app_date] => 2007-06-18
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[pdf_file] => publications/A1/0309/20080309359.pdf
[firstpage_image] =>[orig_patent_app_number] => 11764230
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/764230 | Suspension system and adjustment mechanism for an integrated chip and method | Jun 17, 2007 | Issued |
Array
(
[id] => 5245533
[patent_doc_number] => 20070241767
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[patent_issue_date] => 2007-10-18
[patent_title] => 'Semiconductor device and method for testing semiconductor device'
[patent_app_type] => utility
[patent_app_number] => 11/812143
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[patent_app_date] => 2007-06-15
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[firstpage_image] =>[orig_patent_app_number] => 11812143
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/812143 | Semiconductor device and method for testing semiconductor device | Jun 14, 2007 | Issued |
Array
(
[id] => 4931110
[patent_doc_number] => 20080001885
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[patent_title] => 'Display device'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/812021 | Display device | Jun 13, 2007 | Issued |
Array
(
[id] => 296554
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[patent_title] => 'Burn-in sorter and sorting method using the same'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/808730 | Burn-in sorter and sorting method using the same | Jun 11, 2007 | Issued |
Array
(
[id] => 5163783
[patent_doc_number] => 20070285367
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[patent_title] => 'Burning system having optic-electric transformer and comparator circuit and method for burning liquid crystal display'
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Array
(
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[patent_title] => 'POGO PINS AND CONTACT-TYPE OF TEST DEVICE HAVING POGO PINS FOR TESTING SEMICONDUCTOR DEVICE'
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Array
(
[id] => 153173
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/811135 | Parametric testline with increased test pattern areas | Jun 7, 2007 | Issued |
Array
(
[id] => 4830217
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[patent_title] => 'TOUCH AND AUDITORY SENSORS BASED ON NANOTUBE ARRAYS'
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Array
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Array
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Array
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