James Leslie Grun

Array ( [id] => 6714140 [patent_doc_number] => 20030025488 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-02-06 [patent_title] => 'Power sensing RF termination apparatus including temperature compensation means' [patent_app_type] => new [patent_app_number] => 10/263007 [patent_app_country] => US [patent_app_date] => 2002-10-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3486 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 29 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0025/20030025488.pdf [firstpage_image] =>[orig_patent_app_number] => 10263007 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1035403 [patent_doc_number] => 06876211 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-04-05 [patent_title] => 'Printed circuit board test fixture that supports a PCB to be tested' [patent_app_type] => utility [patent_app_number] => 10/246233 [patent_app_country] => US [patent_app_date] => 2002-09-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3386 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/876/06876211.pdf [firstpage_image] =>[orig_patent_app_number] => 10246233 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7361032 [patent_doc_number] => 20040049711 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-03-11 [patent_title] => 'Oscillation based access time measurement' [patent_app_type] => new [patent_app_number] => 10/236328 [patent_app_country] => US [patent_app_date] => 2002-09-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2291 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 44 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0049/20040049711.pdf [firstpage_image] =>[orig_patent_app_number] => 10236328 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1074228 [patent_doc_number] => 06838894 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-01-04 [patent_title] => 'Stress relieved contact array' [patent_app_type] => utility [patent_app_number] => 10/233727 [patent_app_country] => US [patent_app_date] => 2002-09-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 9 [patent_no_of_words] => 4057 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/838/06838894.pdf [firstpage_image] =>[orig_patent_app_number] => 10233727 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1018946 [patent_doc_number] => 06891363 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-05-10 [patent_title] => 'Apparatus and method for detecting photon emissions from transistors' [patent_app_type] => utility [patent_app_number] => 10/234231 [patent_app_country] => US [patent_app_date] => 2002-09-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 31 [patent_no_of_words] => 14298 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 143 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/891/06891363.pdf [firstpage_image] =>[orig_patent_app_number] => 10234231 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 747323 [patent_doc_number] => 07026835 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-04-11 [patent_title] => 'Engagement probe having a grouping of projecting apexes for engaging a conductive pad' [patent_app_type] => utility [patent_app_number] => 10/232295 [patent_app_country] => US [patent_app_date] => 2002-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 19 [patent_no_of_words] => 3986 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 61 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/026/07026835.pdf [firstpage_image] =>[orig_patent_app_number] => 10232295 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1015171 [patent_doc_number] => 06894479 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-05-17 [patent_title] => 'Connector cable and method for probing vacuum-sealable electronic nodes of an electrical testing device' [patent_app_type] => utility [patent_app_number] => 10/228026 [patent_app_country] => US [patent_app_date] => 2002-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 5873 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/894/06894479.pdf [firstpage_image] =>[orig_patent_app_number] => 10228026 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6812097 [patent_doc_number] => 20030071647 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-04-17 [patent_title] => 'Method and arrangement for determining the high-frequency behavior of active circuit elements' [patent_app_type] => new [patent_app_number] => 10/227232 [patent_app_country] => US [patent_app_date] => 2002-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1743 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 26 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0071/20030071647.pdf [firstpage_image] =>[orig_patent_app_number] => 10227232 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6781470 [patent_doc_number] => 20030062917 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-04-03 [patent_title] => 'Semiconductor inspection device' [patent_app_type] => new [patent_app_number] => 10/225124 [patent_app_country] => US [patent_app_date] => 2002-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 8281 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0062/20030062917.pdf [firstpage_image] =>[orig_patent_app_number] => 10225124 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1097948 [patent_doc_number] => 06822465 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-11-23 [patent_title] => 'Method of regulating the temperature of integrated circuit modules, using a heat exchanger with a face of a solid malleable metal and a release agent' [patent_app_type] => B1 [patent_app_number] => 10/215993 [patent_app_country] => US [patent_app_date] => 2002-08-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 6034 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 169 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/822/06822465.pdf [firstpage_image] =>[orig_patent_app_number] => 10215993 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6748404 [patent_doc_number] => 20030042924 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-03-06 [patent_title] => 'Inspection terminal for inspecting electronic chip component, and inspection method and inspection apparatus using the same' [patent_app_type] => new [patent_app_number] => 10/215025 [patent_app_country] => US [patent_app_date] => 2002-08-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4061 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0042/20030042924.pdf [firstpage_image] =>[orig_patent_app_number] => 10215025 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1254792 [patent_doc_number] => 06670818 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-12-30 [patent_title] => 'Method for aligning and connecting semiconductor components to substrates' [patent_app_type] => B1 [patent_app_number] => 10/208335 [patent_app_country] => US [patent_app_date] => 2002-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 13 [patent_no_of_words] => 7335 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/670/06670818.pdf [firstpage_image] =>[orig_patent_app_number] => 10208335 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6430272 [patent_doc_number] => 20020175697 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-11-28 [patent_title] => 'Efficient parallel testing of semiconductor devices using a known good device to generate expected responses' [patent_app_type] => new [patent_app_number] => 10/208173 [patent_app_country] => US [patent_app_date] => 2002-07-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4067 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0175/20020175697.pdf [firstpage_image] =>[orig_patent_app_number] => 10208173 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6255530 [patent_doc_number] => 20020186003 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-12-12 [patent_title] => 'Semiconductor device testing apparatus having timing hold function' [patent_app_type] => new [patent_app_number] => 10/205742 [patent_app_country] => US [patent_app_date] => 2002-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 9182 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0186/20020186003.pdf [firstpage_image] =>[orig_patent_app_number] => 10205742 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6498139 [patent_doc_number] => 20020190706 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-12-19 [patent_title] => 'Semiconductor device testing apparatus having timing hold function' [patent_app_type] => new [patent_app_number] => 10/206521 [patent_app_country] => US [patent_app_date] => 2002-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 9182 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0190/20020190706.pdf [firstpage_image] =>[orig_patent_app_number] => 10206521 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1060509 [patent_doc_number] => 06853210 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-02-08 [patent_title] => 'Test interconnect having suspended contacts for bumped semiconductor components' [patent_app_type] => utility [patent_app_number] => 10/198895 [patent_app_country] => US [patent_app_date] => 2002-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 42 [patent_no_of_words] => 9029 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/853/06853210.pdf [firstpage_image] =>[orig_patent_app_number] => 10198895 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1060508 [patent_doc_number] => 06853209 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-02-08 [patent_title] => 'Contactor assembly for testing electrical circuits' [patent_app_type] => utility [patent_app_number] => 10/197133 [patent_app_country] => US [patent_app_date] => 2002-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 12 [patent_no_of_words] => 2960 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 189 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/853/06853209.pdf [firstpage_image] =>[orig_patent_app_number] => 10197133 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7429336 [patent_doc_number] => 20040008024 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-01-15 [patent_title] => 'Compensation for test signal degradation due to DUT fault' [patent_app_type] => new [patent_app_number] => 10/193831 [patent_app_country] => US [patent_app_date] => 2002-07-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6280 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 186 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0008/20040008024.pdf [firstpage_image] =>[orig_patent_app_number] => 10193831 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1230331 [patent_doc_number] => 06696848 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-02-24 [patent_title] => 'Load board socket adapter and interface method' [patent_app_type] => B2 [patent_app_number] => 10/183237 [patent_app_country] => US [patent_app_date] => 2002-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 1761 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/696/06696848.pdf [firstpage_image] =>[orig_patent_app_number] => 10183237 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1366268 [patent_doc_number] => 06573700 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-06-03 [patent_title] => 'Method of characterizing free-space radiation using a chirped optical pulse' [patent_app_type] => B2 [patent_app_number] => 10/164454 [patent_app_country] => US [patent_app_date] => 2002-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 23 [patent_no_of_words] => 8552 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/573/06573700.pdf [firstpage_image] =>[orig_patent_app_number] => 10164454 [rel_patent_id] =>[rel_patent_doc_number] =>)