Search

James Leslie Grun

Examiner (ID: 16633)

Most Active Art Unit
1641
Art Unit(s)
1645, 1802, 1641, 1816, 1678, 1817
Total Applications
766
Issued Applications
264
Pending Applications
95
Abandoned Applications
408

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 1580888 [patent_doc_number] => 06448804 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-09-10 [patent_title] => 'Contactless total charge measurement with corona' [patent_app_type] => B2 [patent_app_number] => 09/964944 [patent_app_country] => US [patent_app_date] => 2001-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 3403 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/448/06448804.pdf [firstpage_image] =>[orig_patent_app_number] => 09964944 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/964944
Contactless total charge measurement with corona Sep 26, 2001 Issued
Array ( [id] => 6721894 [patent_doc_number] => 20030055584 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-03-20 [patent_title] => 'Demagnetization for a motor in an electric or partially electric motor vehicle' [patent_app_type] => new [patent_app_number] => 09/682531 [patent_app_country] => US [patent_app_date] => 2001-09-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5108 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0055/20030055584.pdf [firstpage_image] =>[orig_patent_app_number] => 09682531 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/682531
Detection of demagnetization in a motor in an electric or partially electric motor vehicle Sep 16, 2001 Issued
Array ( [id] => 6777031 [patent_doc_number] => 20030048111 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-03-13 [patent_title] => 'Test Fixture Comprising Drilled and Etched Pin holes and Related Methods.' [patent_app_type] => new [patent_app_number] => 09/952685 [patent_app_country] => US [patent_app_date] => 2001-09-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 1370 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 38 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0048/20030048111.pdf [firstpage_image] =>[orig_patent_app_number] => 09952685 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/952685
Test Fixture Comprising Drilled and Etched Pin holes and Related Methods. Sep 12, 2001 Abandoned
Array ( [id] => 1074230 [patent_doc_number] => 06838896 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-01-04 [patent_title] => 'Method and system for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus' [patent_app_type] => utility [patent_app_number] => 09/946552 [patent_app_country] => US [patent_app_date] => 2001-09-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5591 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/838/06838896.pdf [firstpage_image] =>[orig_patent_app_number] => 09946552 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/946552
Method and system for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus Sep 5, 2001 Issued
Array ( [id] => 7645072 [patent_doc_number] => 06472901 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-10-29 [patent_title] => 'Method for in-line testing of flip-chip semiconductor assemblies' [patent_app_type] => B2 [patent_app_number] => 09/944507 [patent_app_country] => US [patent_app_date] => 2001-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2674 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 20 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/472/06472901.pdf [firstpage_image] =>[orig_patent_app_number] => 09944507 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/944507
Method for in-line testing of flip-chip semiconductor assemblies Aug 29, 2001 Issued
Array ( [id] => 1128840 [patent_doc_number] => 06791314 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-09-14 [patent_title] => 'Device and method for measuring weak current signals using a floating amplifier' [patent_app_type] => B1 [patent_app_number] => 09/913931 [patent_app_country] => US [patent_app_date] => 2001-08-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2395 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/791/06791314.pdf [firstpage_image] =>[orig_patent_app_number] => 09913931 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/913931
Device and method for measuring weak current signals using a floating amplifier Aug 19, 2001 Issued
Array ( [id] => 6743272 [patent_doc_number] => 20030020455 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-01-30 [patent_title] => 'Method and apparatus for measuring electrical energy consumption for multiple consumers' [patent_app_type] => new [patent_app_number] => 09/917333 [patent_app_country] => US [patent_app_date] => 2001-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1471 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0020/20030020455.pdf [firstpage_image] =>[orig_patent_app_number] => 09917333 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/917333
Method and apparatus for measuring electrical energy consumption for multiple consumers Jul 29, 2001 Abandoned
Array ( [id] => 1544787 [patent_doc_number] => 06373273 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-04-16 [patent_title] => 'Test insert containing vias for interfacing a device containing contact bumps with a test substrate' [patent_app_type] => B1 [patent_app_number] => 09/916771 [patent_app_country] => US [patent_app_date] => 2001-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 31 [patent_no_of_words] => 6537 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/373/06373273.pdf [firstpage_image] =>[orig_patent_app_number] => 09916771 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/916771
Test insert containing vias for interfacing a device containing contact bumps with a test substrate Jul 26, 2001 Issued
Array ( [id] => 5856844 [patent_doc_number] => 20020121912 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-09-05 [patent_title] => 'Method for making a card with multiple contact tips for testing microsphere integrated circuits, and testing device using said card' [patent_app_type] => new [patent_app_number] => 10/070833 [patent_app_country] => US [patent_app_date] => 2002-03-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 1755 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 19 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0121/20020121912.pdf [firstpage_image] =>[orig_patent_app_number] => 10070833 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/070833
Method for making a card with multiple contact tips for testing microsphere integrated circuits, and testing device using said card Jul 23, 2001 Issued
Array ( [id] => 6547128 [patent_doc_number] => 20020110939 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-08-15 [patent_title] => 'Semiconductor device and method of inspecting the same' [patent_app_type] => new [patent_app_number] => 09/906724 [patent_app_country] => US [patent_app_date] => 2001-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 8920 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 63 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0110/20020110939.pdf [firstpage_image] =>[orig_patent_app_number] => 09906724 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/906724
Semiconductor device with phase comparator comparing phases between internal signal and external signal Jul 17, 2001 Issued
Array ( [id] => 6735705 [patent_doc_number] => 20030013340 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-01-16 [patent_title] => 'Fiducial alignment marks on microelectronic spring contacts' [patent_app_type] => new [patent_app_number] => 09/906999 [patent_app_country] => US [patent_app_date] => 2001-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7896 [patent_no_of_claims] => 43 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 48 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0013/20030013340.pdf [firstpage_image] =>[orig_patent_app_number] => 09906999 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/906999
Fiducial alignment marks on microelectronic spring contacts Jul 15, 2001 Issued
Array ( [id] => 5799094 [patent_doc_number] => 20020008529 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-01-24 [patent_title] => 'High density, area array probe card apparatus' [patent_app_type] => new [patent_app_number] => 09/905426 [patent_app_country] => US [patent_app_date] => 2001-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3616 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 22 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0008/20020008529.pdf [firstpage_image] =>[orig_patent_app_number] => 09905426 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/905426
High density, area array probe card apparatus Jul 13, 2001 Issued
Array ( [id] => 1246914 [patent_doc_number] => 06677774 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-01-13 [patent_title] => 'Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester' [patent_app_type] => B2 [patent_app_number] => 09/681917 [patent_app_country] => US [patent_app_date] => 2001-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 5259 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/677/06677774.pdf [firstpage_image] =>[orig_patent_app_number] => 09681917 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/681917
Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester Jun 25, 2001 Issued
Array ( [id] => 6879265 [patent_doc_number] => 20010030550 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-10-18 [patent_title] => 'Methods of forming apparatuses and a method of engaging electrically conductive test pads on a semiconductor substrate' [patent_app_type] => new [patent_app_number] => 09/878949 [patent_app_country] => US [patent_app_date] => 2001-06-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3826 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0030/20010030550.pdf [firstpage_image] =>[orig_patent_app_number] => 09878949 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/878949
Methods of forming apparatuses and a method of engaging electrically conductive test pads on a semiconductor substrate Jun 10, 2001 Issued
Array ( [id] => 6397002 [patent_doc_number] => 20020036491 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-03-28 [patent_title] => 'Scanning electromagnetic-field imager with optical-fiber-based electro-optic field-mapping system' [patent_app_type] => new [patent_app_number] => 09/877936 [patent_app_country] => US [patent_app_date] => 2001-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 4617 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0036/20020036491.pdf [firstpage_image] =>[orig_patent_app_number] => 09877936 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/877936
Scanning electromagnetic-field imager with optical-fiber-based electro-optic field-mapping system Jun 7, 2001 Issued
Array ( [id] => 1060430 [patent_doc_number] => 06853178 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-02-08 [patent_title] => 'Integrated circuit leadframes patterned for measuring the accurate amplitude of changing currents' [patent_app_type] => utility [patent_app_number] => 09/873057 [patent_app_country] => US [patent_app_date] => 2001-06-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 8 [patent_no_of_words] => 3904 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/853/06853178.pdf [firstpage_image] =>[orig_patent_app_number] => 09873057 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/873057
Integrated circuit leadframes patterned for measuring the accurate amplitude of changing currents Jun 1, 2001 Issued
Array ( [id] => 6138552 [patent_doc_number] => 20020000821 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-01-03 [patent_title] => 'Contact probe and fabrication method thereof' [patent_app_type] => new [patent_app_number] => 09/870420 [patent_app_country] => US [patent_app_date] => 2001-05-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 4494 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 61 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0000/20020000821.pdf [firstpage_image] =>[orig_patent_app_number] => 09870420 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/870420
Contact probe and fabrication method thereof May 29, 2001 Abandoned
Array ( [id] => 7612296 [patent_doc_number] => 06903541 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-06-07 [patent_title] => 'Film-based microwave and millimeter-wave circuits and sensors' [patent_app_type] => utility [patent_app_number] => 09/864123 [patent_app_country] => US [patent_app_date] => 2001-05-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 6674 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/903/06903541.pdf [firstpage_image] =>[orig_patent_app_number] => 09864123 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/864123
Film-based microwave and millimeter-wave circuits and sensors May 24, 2001 Issued
Array ( [id] => 1114050 [patent_doc_number] => 06803781 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-10-12 [patent_title] => 'Resolver, resolver fault detection circuit, and resolver fault detection method' [patent_app_type] => B2 [patent_app_number] => 09/862597 [patent_app_country] => US [patent_app_date] => 2001-05-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 18 [patent_no_of_words] => 8671 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/803/06803781.pdf [firstpage_image] =>[orig_patent_app_number] => 09862597 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/862597
Resolver, resolver fault detection circuit, and resolver fault detection method May 22, 2001 Issued
Array ( [id] => 1226114 [patent_doc_number] => 06700396 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-03-02 [patent_title] => 'Integrated micromachine relay for automated test equipment applications' [patent_app_type] => B1 [patent_app_number] => 09/859842 [patent_app_country] => US [patent_app_date] => 2001-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 18 [patent_no_of_words] => 5087 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 21 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/700/06700396.pdf [firstpage_image] =>[orig_patent_app_number] => 09859842 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/859842
Integrated micromachine relay for automated test equipment applications May 15, 2001 Issued
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