
Jared Barsky
Examiner (ID: 10819, Phone: (571)272-2795 , Office: P/1628 )
| Most Active Art Unit | 1628 |
| Art Unit(s) | 1628 |
| Total Applications | 1114 |
| Issued Applications | 491 |
| Pending Applications | 145 |
| Abandoned Applications | 502 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4400956
[patent_doc_number] => 06297510
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-10-02
[patent_title] => 'Ion implant dose control'
[patent_app_type] => 1
[patent_app_number] => 9/293942
[patent_app_country] => US
[patent_app_date] => 1999-04-19
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Array
(
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[patent_issue_date] => 2001-10-02
[patent_title] => 'Simultaneous detection isotopic ratio mass spectrometer'
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Array
(
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[patent_issue_date] => 2001-07-31
[patent_title] => 'Apparatus and method for reducing heating of a workpiece in ion implantation'
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Array
(
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[patent_issue_date] => 2001-11-27
[patent_title] => 'Apparatus for reducing distortion in fluid bearing surfaces'
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Array
(
[id] => 4372703
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[patent_issue_date] => 2001-08-14
[patent_title] => 'Fluid bearing vacuum seal assembly'
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Array
(
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[patent_issue_date] => 2002-02-26
[patent_title] => 'Ion implanter with vacuum piston counterbalance'
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Array
(
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Array
(
[id] => 1420764
[patent_doc_number] => 06509564
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[patent_kind] => B1
[patent_issue_date] => 2003-01-21
[patent_title] => 'WORKPIECE HOLDER, SEMICONDUCTOR FABRICATING APPARATUS, SEMICONDUCTOR INSPECTING APPARATUS, CIRCUIT PATTERN INSPECTING APPARATUS, CHARGED PARTICLE BEAM APPLICATION APPARATUS, CALIBRATING SUBSTRATE, WORKPIECE HOLDING METHOD, CIRCUIT PATTERN INSPECTING METHOD, AND CHARGED PARTICLE BEAM APPLICATION METHOD'
[patent_app_type] => B1
[patent_app_number] => 09/292626
[patent_app_country] => US
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[firstpage_image] =>[orig_patent_app_number] => 09292626
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/292626 | WORKPIECE HOLDER, SEMICONDUCTOR FABRICATING APPARATUS, SEMICONDUCTOR INSPECTING APPARATUS, CIRCUIT PATTERN INSPECTING APPARATUS, CHARGED PARTICLE BEAM APPLICATION APPARATUS, CALIBRATING SUBSTRATE, WORKPIECE HOLDING METHOD, CIRCUIT PATTERN INSPECTING METHOD, AND CHARGED PARTICLE BEAM APPLICATION METHOD | Apr 14, 1999 | Issued |
Array
(
[id] => 4412500
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[patent_issue_date] => 2001-05-29
[patent_title] => 'Arc chamber for an ion implantation system'
[patent_app_type] => 1
[patent_app_number] => 9/290471
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Array
(
[id] => 4277388
[patent_doc_number] => 06323494
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-11-27
[patent_title] => 'Vertical direction force transducer'
[patent_app_type] => 1
[patent_app_number] => 9/289249
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Array
(
[id] => 1509178
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[patent_title] => 'Charged particle beam exposure device exhibiting reduced image blur'
[patent_app_type] => B1
[patent_app_number] => 09/289139
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Array
(
[id] => 1463589
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[patent_title] => 'Enzymatic reaction mechanisms by quenched-flow mass spectrometry'
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Array
(
[id] => 4151650
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Array
(
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Array
(
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Array
(
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Array
(
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Array
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Array
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