Jared Barsky

Array ( [id] => 1534422 [patent_doc_number] => 06410914 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-06-25 [patent_title] => 'Ionization chamber for atmospheric pressure ionization mass spectrometry' [patent_app_type] => B1 [patent_app_number] => 09/263659 [patent_app_country] => US [patent_app_date] => 1999-03-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 16 [patent_no_of_words] => 8013 [patent_no_of_claims] => 41 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 68 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/410/06410914.pdf [firstpage_image] =>[orig_patent_app_number] => 09263659 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4376173 [patent_doc_number] => 06288406 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-09-11 [patent_title] => 'Electron beam lithography system having variable writing speed' [patent_app_type] => 1 [patent_app_number] => 9/262639 [patent_app_country] => US [patent_app_date] => 1999-03-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 3687 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/288/06288406.pdf [firstpage_image] =>[orig_patent_app_number] => 262639 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1280966 [patent_doc_number] => 06646269 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-11-11 [patent_title] => 'Radiation source module and cleaning apparatus therefor' [patent_app_type] => B1 [patent_app_number] => 09/258142 [patent_app_country] => US [patent_app_date] => 1999-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 17 [patent_no_of_words] => 6205 [patent_no_of_claims] => 67 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/646/06646269.pdf [firstpage_image] =>[orig_patent_app_number] => 09258142 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4413311 [patent_doc_number] => 06310341 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-30 [patent_title] => 'Projecting type charged particle microscope and projecting type substrate inspection system' [patent_app_type] => 1 [patent_app_number] => 9/253456 [patent_app_country] => US [patent_app_date] => 1999-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 6323 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 143 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/310/06310341.pdf [firstpage_image] =>[orig_patent_app_number] => 253456 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1169119 [patent_doc_number] => 06756600 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-06-29 [patent_title] => 'Ion implantation with improved ion source life expectancy' [patent_app_type] => B2 [patent_app_number] => 09/252845 [patent_app_country] => US [patent_app_date] => 1999-02-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1506 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/756/06756600.pdf [firstpage_image] =>[orig_patent_app_number] => 09252845 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4363871 [patent_doc_number] => 06191416 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-20 [patent_title] => 'Apparatus for producing a beam of atoms or radicals' [patent_app_type] => 1 [patent_app_number] => 9/252349 [patent_app_country] => US [patent_app_date] => 1999-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2603 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 183 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/191/06191416.pdf [firstpage_image] =>[orig_patent_app_number] => 252349 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4293583 [patent_doc_number] => 06211516 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-04-03 [patent_title] => 'Photoionization mass spectrometer' [patent_app_type] => 1 [patent_app_number] => 9/247646 [patent_app_country] => US [patent_app_date] => 1999-02-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 14 [patent_no_of_words] => 3629 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 48 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/211/06211516.pdf [firstpage_image] =>[orig_patent_app_number] => 247646 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4324261 [patent_doc_number] => 06248997 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-19 [patent_title] => 'Method of analyzing substances existing in gas' [patent_app_type] => 1 [patent_app_number] => 9/243853 [patent_app_country] => US [patent_app_date] => 1999-02-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 3719 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/248/06248997.pdf [firstpage_image] =>[orig_patent_app_number] => 243853 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4037420 [patent_doc_number] => 05994705 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-11-30 [patent_title] => 'Flow-through photo-chemical reactor' [patent_app_type] => 1 [patent_app_number] => 9/240592 [patent_app_country] => US [patent_app_date] => 1999-02-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 4531 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 215 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/994/05994705.pdf [firstpage_image] =>[orig_patent_app_number] => 240592 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4413732 [patent_doc_number] => 06265715 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-24 [patent_title] => 'Non-porous membrane for MALDI-TOFMS' [patent_app_type] => 1 [patent_app_number] => 9/239547 [patent_app_country] => US [patent_app_date] => 1999-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 18 [patent_no_of_words] => 6764 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/265/06265715.pdf [firstpage_image] =>[orig_patent_app_number] => 239547 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4375939 [patent_doc_number] => 06288393 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-09-11 [patent_title] => 'Automated method of circuit analysis' [patent_app_type] => 1 [patent_app_number] => 9/238436 [patent_app_country] => US [patent_app_date] => 1999-01-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5490 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/288/06288393.pdf [firstpage_image] =>[orig_patent_app_number] => 238436 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4422071 [patent_doc_number] => 06194717 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-27 [patent_title] => 'Quadrupole mass analyzer and method of operation in RF only mode to reduce background signal' [patent_app_type] => 1 [patent_app_number] => 9/238549 [patent_app_country] => US [patent_app_date] => 1999-01-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 4309 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 149 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/194/06194717.pdf [firstpage_image] =>[orig_patent_app_number] => 238549 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4224198 [patent_doc_number] => 06040575 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-03-21 [patent_title] => 'Mass spectrometry from surfaces' [patent_app_type] => 1 [patent_app_number] => 9/235945 [patent_app_country] => US [patent_app_date] => 1999-01-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 24 [patent_no_of_words] => 17961 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/040/06040575.pdf [firstpage_image] =>[orig_patent_app_number] => 235945 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4422261 [patent_doc_number] => 06194732 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-27 [patent_title] => 'Charged-particle-beam exposure methods with beam parallelism detection and correction' [patent_app_type] => 1 [patent_app_number] => 9/222338 [patent_app_country] => US [patent_app_date] => 1998-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 17 [patent_no_of_words] => 7753 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 173 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/194/06194732.pdf [firstpage_image] =>[orig_patent_app_number] => 222338 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4309409 [patent_doc_number] => 06252228 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-26 [patent_title] => 'Method of analyzing morphology of bulk defect and surface defect on semiconductor wafer' [patent_app_type] => 1 [patent_app_number] => 9/204054 [patent_app_country] => US [patent_app_date] => 1998-12-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 3550 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/252/06252228.pdf [firstpage_image] =>[orig_patent_app_number] => 204054 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4276534 [patent_doc_number] => 06246060 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-12 [patent_title] => 'Apparatus for holding and aligning a scanning electron microscope sample' [patent_app_type] => 1 [patent_app_number] => 9/197351 [patent_app_country] => US [patent_app_date] => 1998-11-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 17 [patent_no_of_words] => 4668 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 171 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/246/06246060.pdf [firstpage_image] =>[orig_patent_app_number] => 197351 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4140349 [patent_doc_number] => 06015976 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-01-18 [patent_title] => 'Fabrication apparatus employing energy beam' [patent_app_type] => 1 [patent_app_number] => 9/195254 [patent_app_country] => US [patent_app_date] => 1998-11-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 84 [patent_figures_cnt] => 166 [patent_no_of_words] => 17845 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 157 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/015/06015976.pdf [firstpage_image] =>[orig_patent_app_number] => 195254 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4104649 [patent_doc_number] => 06066848 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-05-23 [patent_title] => 'Parallel fluid electrospray mass spectrometer' [patent_app_type] => 1 [patent_app_number] => 9/185450 [patent_app_country] => US [patent_app_date] => 1998-11-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 12 [patent_no_of_words] => 8069 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/066/06066848.pdf [firstpage_image] =>[orig_patent_app_number] => 185450 [rel_patent_id] =>[rel_patent_doc_number] =>)