Search

Jared Barsky

Examiner (ID: 10819, Phone: (571)272-2795 , Office: P/1628 )

Most Active Art Unit
1628
Art Unit(s)
1628
Total Applications
1114
Issued Applications
491
Pending Applications
145
Abandoned Applications
502

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4299279 [patent_doc_number] => 06180942 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-30 [patent_title] => 'Ion detector, detector array and instrument using same' [patent_app_type] => 1 [patent_app_number] => 9/180157 [patent_app_country] => US [patent_app_date] => 1998-11-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 2990 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 27 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/180/06180942.pdf [firstpage_image] =>[orig_patent_app_number] => 180157 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/180157
Ion detector, detector array and instrument using same Nov 2, 1998 Issued
Array ( [id] => 7645309 [patent_doc_number] => 06472663 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-10-29 [patent_title] => 'Electron microscope' [patent_app_type] => B2 [patent_app_number] => 09/182356 [patent_app_country] => US [patent_app_date] => 1998-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 10 [patent_no_of_words] => 6806 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 29 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/472/06472663.pdf [firstpage_image] =>[orig_patent_app_number] => 09182356 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/182356
Electron microscope Oct 28, 1998 Issued
Array ( [id] => 4363121 [patent_doc_number] => 06169282 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-02 [patent_title] => 'Defect inspection method and apparatus therefor' [patent_app_type] => 1 [patent_app_number] => 9/181851 [patent_app_country] => US [patent_app_date] => 1998-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 26 [patent_no_of_words] => 8020 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/169/06169282.pdf [firstpage_image] =>[orig_patent_app_number] => 181851 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/181851
Defect inspection method and apparatus therefor Oct 28, 1998 Issued
Array ( [id] => 4300716 [patent_doc_number] => 06184533 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-06 [patent_title] => 'Scanning probe microscope with the stage unit' [patent_app_type] => 1 [patent_app_number] => 9/166850 [patent_app_country] => US [patent_app_date] => 1998-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 4900 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/184/06184533.pdf [firstpage_image] =>[orig_patent_app_number] => 166850 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/166850
Scanning probe microscope with the stage unit Oct 5, 1998 Issued
Array ( [id] => 4324284 [patent_doc_number] => 06248999 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-19 [patent_title] => 'Assembly for coupling an ion source to a mass analyzer' [patent_app_type] => 1 [patent_app_number] => 9/160502 [patent_app_country] => US [patent_app_date] => 1998-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 10 [patent_no_of_words] => 1594 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/248/06248999.pdf [firstpage_image] =>[orig_patent_app_number] => 160502 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/160502
Assembly for coupling an ion source to a mass analyzer Sep 23, 1998 Issued
Array ( [id] => 6897350 [patent_doc_number] => 20010045515 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-11-29 [patent_title] => 'ANALYSIS ELECTRON MICROSCOPE' [patent_app_type] => new [patent_app_number] => 09/156431 [patent_app_country] => US [patent_app_date] => 1998-09-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5591 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 30 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0045/20010045515.pdf [firstpage_image] =>[orig_patent_app_number] => 09156431 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/156431
ANALYSIS ELECTRON MICROSCOPE Sep 17, 1998 Abandoned
Array ( [id] => 4137036 [patent_doc_number] => 06147346 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-11-14 [patent_title] => 'Mass spectrometer' [patent_app_type] => 1 [patent_app_number] => 9/154746 [patent_app_country] => US [patent_app_date] => 1998-09-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2983 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/147/06147346.pdf [firstpage_image] =>[orig_patent_app_number] => 154746 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/154746
Mass spectrometer Sep 16, 1998 Issued
Array ( [id] => 4276616 [patent_doc_number] => 06246065 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-12 [patent_title] => 'Electron beam projection exposure apparatus' [patent_app_type] => 1 [patent_app_number] => 9/145647 [patent_app_country] => US [patent_app_date] => 1998-09-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 3550 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/246/06246065.pdf [firstpage_image] =>[orig_patent_app_number] => 145647 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/145647
Electron beam projection exposure apparatus Sep 1, 1998 Issued
Array ( [id] => 1440919 [patent_doc_number] => 06495843 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-12-17 [patent_title] => 'Method for increasing emission through a potential barrier' [patent_app_type] => B1 [patent_app_number] => 09/645997 [patent_app_country] => US [patent_app_date] => 1998-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5044 [patent_no_of_claims] => 46 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 53 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/495/06495843.pdf [firstpage_image] =>[orig_patent_app_number] => 09645997 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/645997
Method for increasing emission through a potential barrier Aug 30, 1998 Issued
Array ( [id] => 4139179 [patent_doc_number] => 06121624 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-09-19 [patent_title] => 'Method for controlled implantation of elements into the surface or near surface of a substrate' [patent_app_type] => 1 [patent_app_number] => 9/138741 [patent_app_country] => US [patent_app_date] => 1998-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 3083 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 60 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/121/06121624.pdf [firstpage_image] =>[orig_patent_app_number] => 138741 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/138741
Method for controlled implantation of elements into the surface or near surface of a substrate Aug 23, 1998 Issued
Array ( [id] => 4413749 [patent_doc_number] => 06229141 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-05-08 [patent_title] => 'Analysis of alkali elements in insulators using secondary ion mass spectrometry' [patent_app_type] => 1 [patent_app_number] => 9/138740 [patent_app_country] => US [patent_app_date] => 1998-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 3112 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 41 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/229/06229141.pdf [firstpage_image] =>[orig_patent_app_number] => 138740 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/138740
Analysis of alkali elements in insulators using secondary ion mass spectrometry Aug 23, 1998 Issued
Array ( [id] => 4254007 [patent_doc_number] => 06222197 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-04-24 [patent_title] => 'Charged-particle-beam pattern-transfer methods and apparatus' [patent_app_type] => 1 [patent_app_number] => 9/138356 [patent_app_country] => US [patent_app_date] => 1998-08-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 36 [patent_no_of_words] => 14639 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 11 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/222/06222197.pdf [firstpage_image] =>[orig_patent_app_number] => 138356 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/138356
Charged-particle-beam pattern-transfer methods and apparatus Aug 20, 1998 Issued
Array ( [id] => 4160612 [patent_doc_number] => 06107623 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-22 [patent_title] => 'Methods and apparatus for tandem mass spectrometry' [patent_app_type] => 1 [patent_app_number] => 9/138152 [patent_app_country] => US [patent_app_date] => 1998-08-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5772 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 149 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/107/06107623.pdf [firstpage_image] =>[orig_patent_app_number] => 138152 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/138152
Methods and apparatus for tandem mass spectrometry Aug 20, 1998 Issued
Array ( [id] => 4358376 [patent_doc_number] => 06291822 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-09-18 [patent_title] => 'Scanning probe microscope' [patent_app_type] => 1 [patent_app_number] => 9/131456 [patent_app_country] => US [patent_app_date] => 1998-08-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3688 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 195 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/291/06291822.pdf [firstpage_image] =>[orig_patent_app_number] => 131456 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/131456
Scanning probe microscope Aug 9, 1998 Issued
Array ( [id] => 1554584 [patent_doc_number] => 06348690 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-02-19 [patent_title] => 'Method and an apparatus of an inspection system using an electron beam' [patent_app_type] => B1 [patent_app_number] => 09/131383 [patent_app_country] => US [patent_app_date] => 1998-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 17 [patent_no_of_words] => 8419 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/348/06348690.pdf [firstpage_image] =>[orig_patent_app_number] => 09131383 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/131383
Method and an apparatus of an inspection system using an electron beam Aug 6, 1998 Issued
Array ( [id] => 4363915 [patent_doc_number] => 06191419 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-20 [patent_title] => 'Machined electrostatic sector for mass spectrometer' [patent_app_type] => 1 [patent_app_number] => 9/130548 [patent_app_country] => US [patent_app_date] => 1998-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 1180 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/191/06191419.pdf [firstpage_image] =>[orig_patent_app_number] => 130548 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/130548
Machined electrostatic sector for mass spectrometer Aug 5, 1998 Issued
Array ( [id] => 4243576 [patent_doc_number] => 06080992 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-06-27 [patent_title] => 'Apparatus for fixing radiation beam irradiation field forming member' [patent_app_type] => 1 [patent_app_number] => 9/129838 [patent_app_country] => US [patent_app_date] => 1998-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 13 [patent_no_of_words] => 4204 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 177 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/080/06080992.pdf [firstpage_image] =>[orig_patent_app_number] => 129838 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/129838
Apparatus for fixing radiation beam irradiation field forming member Aug 5, 1998 Issued
Array ( [id] => 4189991 [patent_doc_number] => 06160256 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-12-12 [patent_title] => 'Time-of-flight mass spectrometer and mass spectrometric method sing same' [patent_app_type] => 1 [patent_app_number] => 9/130045 [patent_app_country] => US [patent_app_date] => 1998-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 2861 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/160/06160256.pdf [firstpage_image] =>[orig_patent_app_number] => 130045 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/130045
Time-of-flight mass spectrometer and mass spectrometric method sing same Aug 5, 1998 Issued
Array ( [id] => 4227136 [patent_doc_number] => 06011260 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-01-04 [patent_title] => 'Mass spectrometer' [patent_app_type] => 1 [patent_app_number] => 9/114945 [patent_app_country] => US [patent_app_date] => 1998-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3751 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/011/06011260.pdf [firstpage_image] =>[orig_patent_app_number] => 114945 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/114945
Mass spectrometer Jul 13, 1998 Issued
Array ( [id] => 4179294 [patent_doc_number] => 06084242 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-07-04 [patent_title] => 'Method and device for stimulating the immune system and generating healing at the cellular level' [patent_app_type] => 1 [patent_app_number] => 9/110349 [patent_app_country] => US [patent_app_date] => 1998-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4911 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/084/06084242.pdf [firstpage_image] =>[orig_patent_app_number] => 110349 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/110349
Method and device for stimulating the immune system and generating healing at the cellular level Jul 5, 1998 Issued
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