
Jared Barsky
Examiner (ID: 10819, Phone: (571)272-2795 , Office: P/1628 )
| Most Active Art Unit | 1628 |
| Art Unit(s) | 1628 |
| Total Applications | 1114 |
| Issued Applications | 491 |
| Pending Applications | 145 |
| Abandoned Applications | 502 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 3949544
[patent_doc_number] => 05990483
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-11-23
[patent_title] => 'Particle detection and particle detector devices'
[patent_app_type] => 1
[patent_app_number] => 8/939735
[patent_app_country] => US
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Array
(
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[patent_title] => 'Quadrupole mass spectrometers'
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Array
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[patent_title] => 'Ion source and accelerator for improved dynamic range and mass selection in a time of flight mass spectrometer'
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Array
(
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[patent_issue_date] => 1999-12-28
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[patent_app_date] => 1997-09-30
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| 90/004771 | MASS SPECTROMETER AND METHOD AND IMPROVED ION TRANSMISSION | Sep 29, 1997 | Issued |
Array
(
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[patent_title] => 'Charged-particle-beam (CPB) lithography apparatus, evaluation method, and CPB source'
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Array
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Array
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[patent_title] => 'Method and apparatus for MALDI analysis'
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Array
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[patent_title] => 'Focused ion beam optical axis adjustment method and focused ion beam apparatus'
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Array
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Array
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[patent_title] => 'Process and an apparatus for the curing of light-sensitive polymeric compositions'
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Array
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Array
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Array
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Array
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Array
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Array
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Array
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