Search

Jared Barsky

Examiner (ID: 10819, Phone: (571)272-2795 , Office: P/1628 )

Most Active Art Unit
1628
Art Unit(s)
1628
Total Applications
1114
Issued Applications
491
Pending Applications
145
Abandoned Applications
502

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 3949544 [patent_doc_number] => 05990483 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-11-23 [patent_title] => 'Particle detection and particle detector devices' [patent_app_type] => 1 [patent_app_number] => 8/939735 [patent_app_country] => US [patent_app_date] => 1997-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 13 [patent_no_of_words] => 4089 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 42 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/990/05990483.pdf [firstpage_image] =>[orig_patent_app_number] => 939735 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/939735
Particle detection and particle detector devices Oct 5, 1997 Issued
Array ( [id] => 4090241 [patent_doc_number] => 06025591 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-15 [patent_title] => 'Quadrupole mass spectrometers' [patent_app_type] => 1 [patent_app_number] => 8/939725 [patent_app_country] => US [patent_app_date] => 1997-10-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 19 [patent_no_of_words] => 2527 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 27 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/025/06025591.pdf [firstpage_image] =>[orig_patent_app_number] => 939725 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/939725
Quadrupole mass spectrometers Oct 2, 1997 Issued
Array ( [id] => 4243454 [patent_doc_number] => 06080985 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-06-27 [patent_title] => 'Ion source and accelerator for improved dynamic range and mass selection in a time of flight mass spectrometer' [patent_app_type] => 1 [patent_app_number] => 8/940576 [patent_app_country] => US [patent_app_date] => 1997-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 5512 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/080/06080985.pdf [firstpage_image] =>[orig_patent_app_number] => 940576 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/940576
Ion source and accelerator for improved dynamic range and mass selection in a time of flight mass spectrometer Sep 29, 1997 Issued
Array ( [id] => 4070222 [patent_doc_number] => 06008498 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-12-28 [patent_title] => 'Charged particle beam apparatus and method of using the same' [patent_app_type] => 1 [patent_app_number] => 8/940741 [patent_app_country] => US [patent_app_date] => 1997-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 6758 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/008/06008498.pdf [firstpage_image] =>[orig_patent_app_number] => 940741 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/940741
Charged particle beam apparatus and method of using the same Sep 29, 1997 Issued
90/004771 MASS SPECTROMETER AND METHOD AND IMPROVED ION TRANSMISSION Sep 29, 1997 Issued
Array ( [id] => 4222200 [patent_doc_number] => 06087667 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-07-11 [patent_title] => 'Charged-particle-beam (CPB) lithography apparatus, evaluation method, and CPB source' [patent_app_type] => 1 [patent_app_number] => 8/940638 [patent_app_country] => US [patent_app_date] => 1997-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 2752 [patent_no_of_claims] => 38 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/087/06087667.pdf [firstpage_image] =>[orig_patent_app_number] => 940638 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/940638
Charged-particle-beam (CPB) lithography apparatus, evaluation method, and CPB source Sep 29, 1997 Issued
Array ( [id] => 3960575 [patent_doc_number] => 05936252 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-08-10 [patent_title] => 'Charged particle beam performance measurement system and method thereof' [patent_app_type] => 1 [patent_app_number] => 8/936353 [patent_app_country] => US [patent_app_date] => 1997-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 14 [patent_no_of_words] => 4774 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/936/05936252.pdf [firstpage_image] =>[orig_patent_app_number] => 936353 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/936353
Charged particle beam performance measurement system and method thereof Sep 23, 1997 Issued
Array ( [id] => 4221673 [patent_doc_number] => 06111251 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-29 [patent_title] => 'Method and apparatus for MALDI analysis' [patent_app_type] => 1 [patent_app_number] => 8/934455 [patent_app_country] => US [patent_app_date] => 1997-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 24 [patent_no_of_words] => 6860 [patent_no_of_claims] => 39 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 15 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/111/06111251.pdf [firstpage_image] =>[orig_patent_app_number] => 934455 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/934455
Method and apparatus for MALDI analysis Sep 18, 1997 Issued
Array ( [id] => 3980051 [patent_doc_number] => 05917186 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-06-29 [patent_title] => 'Focused ion beam optical axis adjustment method and focused ion beam apparatus' [patent_app_type] => 1 [patent_app_number] => 8/925976 [patent_app_country] => US [patent_app_date] => 1997-09-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3774 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 179 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/917/05917186.pdf [firstpage_image] =>[orig_patent_app_number] => 925976 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/925976
Focused ion beam optical axis adjustment method and focused ion beam apparatus Sep 8, 1997 Issued
Array ( [id] => 4055636 [patent_doc_number] => 05969366 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-10-19 [patent_title] => 'Ion implanter with post mass selection deceleration' [patent_app_type] => 1 [patent_app_number] => 8/860748 [patent_app_country] => US [patent_app_date] => 1997-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 12287 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/969/05969366.pdf [firstpage_image] =>[orig_patent_app_number] => 860748 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/860748
Ion implanter with post mass selection deceleration Sep 7, 1997 Issued
Array ( [id] => 4048943 [patent_doc_number] => 05912470 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-06-15 [patent_title] => 'Process and an apparatus for the curing of light-sensitive polymeric compositions' [patent_app_type] => 1 [patent_app_number] => 8/924169 [patent_app_country] => US [patent_app_date] => 1997-09-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3193 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/912/05912470.pdf [firstpage_image] =>[orig_patent_app_number] => 924169 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/924169
Process and an apparatus for the curing of light-sensitive polymeric compositions Sep 4, 1997 Issued
Array ( [id] => 4002015 [patent_doc_number] => 05986260 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-11-16 [patent_title] => 'Mass analyzer' [patent_app_type] => 1 [patent_app_number] => 8/921365 [patent_app_country] => US [patent_app_date] => 1997-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 23 [patent_no_of_words] => 7028 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/986/05986260.pdf [firstpage_image] =>[orig_patent_app_number] => 921365 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/921365
Mass analyzer Aug 28, 1997 Issued
Array ( [id] => 4009090 [patent_doc_number] => 06005245 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-12-21 [patent_title] => 'Method and apparatus for ionizing a sample under atmospheric pressure and selectively introducing ions into a mass analysis region' [patent_app_type] => 1 [patent_app_number] => 8/919785 [patent_app_country] => US [patent_app_date] => 1997-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 37 [patent_no_of_words] => 9814 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 22 [patent_words_short_claim] => 64 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/005/06005245.pdf [firstpage_image] =>[orig_patent_app_number] => 919785 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/919785
Method and apparatus for ionizing a sample under atmospheric pressure and selectively introducing ions into a mass analysis region Aug 28, 1997 Issued
Array ( [id] => 3931397 [patent_doc_number] => 05952668 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-09-14 [patent_title] => 'Resolution in microscopy and microlithography' [patent_app_type] => 1 [patent_app_number] => 8/919382 [patent_app_country] => US [patent_app_date] => 1997-08-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 18 [patent_no_of_words] => 11425 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 228 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/952/05952668.pdf [firstpage_image] =>[orig_patent_app_number] => 919382 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/919382
Resolution in microscopy and microlithography Aug 27, 1997 Issued
Array ( [id] => 3980057 [patent_doc_number] => 05905259 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-05-18 [patent_title] => 'Linear time-of-flight mass spectrometer with high mass resolution' [patent_app_type] => 1 [patent_app_number] => 8/919295 [patent_app_country] => US [patent_app_date] => 1997-08-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 6133 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/905/05905259.pdf [firstpage_image] =>[orig_patent_app_number] => 919295 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/919295
Linear time-of-flight mass spectrometer with high mass resolution Aug 27, 1997 Issued
Array ( [id] => 4041584 [patent_doc_number] => 05856677 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-01-05 [patent_title] => 'Pattern projection method with charged particle beam and charged particle beam projection system' [patent_app_type] => 1 [patent_app_number] => 8/917845 [patent_app_country] => US [patent_app_date] => 1997-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 25 [patent_no_of_words] => 10391 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 120 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/856/05856677.pdf [firstpage_image] =>[orig_patent_app_number] => 917845 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/917845
Pattern projection method with charged particle beam and charged particle beam projection system Aug 26, 1997 Issued
Array ( [id] => 4376187 [patent_doc_number] => 06288407 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-09-11 [patent_title] => 'Electron beam-writing apparatus and electron beam-writing method' [patent_app_type] => 1 [patent_app_number] => 8/918165 [patent_app_country] => US [patent_app_date] => 1997-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 14 [patent_no_of_words] => 3377 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 169 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/288/06288407.pdf [firstpage_image] =>[orig_patent_app_number] => 918165 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/918165
Electron beam-writing apparatus and electron beam-writing method Aug 24, 1997 Issued
Array ( [id] => 4079734 [patent_doc_number] => 05965883 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-10-12 [patent_title] => 'Capillary for electrospray ion source' [patent_app_type] => 1 [patent_app_number] => 8/924477 [patent_app_country] => US [patent_app_date] => 1997-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 7 [patent_no_of_words] => 2524 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/965/05965883.pdf [firstpage_image] =>[orig_patent_app_number] => 924477 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/924477
Capillary for electrospray ion source Aug 24, 1997 Issued
Array ( [id] => 3971885 [patent_doc_number] => 05886345 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-03-23 [patent_title] => 'Accurate mass determination with maldi time-of-flight mass spectrometers using internal reference substances' [patent_app_type] => 1 [patent_app_number] => 8/918087 [patent_app_country] => US [patent_app_date] => 1997-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 5531 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/886/05886345.pdf [firstpage_image] =>[orig_patent_app_number] => 918087 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/918087
Accurate mass determination with maldi time-of-flight mass spectrometers using internal reference substances Aug 24, 1997 Issued
Array ( [id] => 4212007 [patent_doc_number] => 06028316 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-22 [patent_title] => 'Method and apparatus for removal of material utilizing near-blackbody radiator means' [patent_app_type] => 1 [patent_app_number] => 8/915814 [patent_app_country] => US [patent_app_date] => 1997-08-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 7288 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/028/06028316.pdf [firstpage_image] =>[orig_patent_app_number] => 915814 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/915814
Method and apparatus for removal of material utilizing near-blackbody radiator means Aug 20, 1997 Issued
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