
Jared Barsky
Examiner (ID: 10819, Phone: (571)272-2795 , Office: P/1628 )
| Most Active Art Unit | 1628 |
| Art Unit(s) | 1628 |
| Total Applications | 1114 |
| Issued Applications | 491 |
| Pending Applications | 145 |
| Abandoned Applications | 502 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 3775536
[patent_doc_number] => 05773837
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-06-30
[patent_title] => 'Apparatus for image transfer with charged particle beam, and deflector and mask used with such apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/871939
[patent_app_country] => US
[patent_app_date] => 1997-06-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
[patent_figures_cnt] => 26
[patent_no_of_words] => 13792
[patent_no_of_claims] => 1
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 84
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/773/05773837.pdf
[firstpage_image] =>[orig_patent_app_number] => 871939
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/871939 | Apparatus for image transfer with charged particle beam, and deflector and mask used with such apparatus | Jun 9, 1997 | Issued |
Array
(
[id] => 3775553
[patent_doc_number] => 05773838
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-06-30
[patent_title] => 'Apparatus for image transfer with charged particle beam, and deflector and mask used with such apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/871971
[patent_app_country] => US
[patent_app_date] => 1997-06-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
[patent_figures_cnt] => 25
[patent_no_of_words] => 13790
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 195
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/773/05773838.pdf
[firstpage_image] =>[orig_patent_app_number] => 871971
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/871971 | Apparatus for image transfer with charged particle beam, and deflector and mask used with such apparatus | Jun 9, 1997 | Issued |
Array
(
[id] => 3931137
[patent_doc_number] => 05952651
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-09-14
[patent_title] => 'Laser manipulation apparatus and cell plate used therefor'
[patent_app_type] => 1
[patent_app_number] => 8/872177
[patent_app_country] => US
[patent_app_date] => 1997-06-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 20
[patent_no_of_words] => 9196
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 105
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/952/05952651.pdf
[firstpage_image] =>[orig_patent_app_number] => 872177
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/872177 | Laser manipulation apparatus and cell plate used therefor | Jun 9, 1997 | Issued |
Array
(
[id] => 3811823
[patent_doc_number] => 05831274
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-11-03
[patent_title] => 'Apparatus for image transfer with charged particle beam, and deflector and mask used with such apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/871966
[patent_app_country] => US
[patent_app_date] => 1997-06-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
[patent_figures_cnt] => 26
[patent_no_of_words] => 13835
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 48
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/831/05831274.pdf
[firstpage_image] =>[orig_patent_app_number] => 871966
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/871966 | Apparatus for image transfer with charged particle beam, and deflector and mask used with such apparatus | Jun 9, 1997 | Issued |
Array
(
[id] => 4061883
[patent_doc_number] => 05864144
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-01-26
[patent_title] => 'Infrared radiation emitting device'
[patent_app_type] => 1
[patent_app_number] => 8/817526
[patent_app_country] => US
[patent_app_date] => 1997-06-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 14
[patent_no_of_words] => 6634
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 47
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/864/05864144.pdf
[firstpage_image] =>[orig_patent_app_number] => 817526
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/817526 | Infrared radiation emitting device | Jun 8, 1997 | Issued |
Array
(
[id] => 4009631
[patent_doc_number] => 05859428
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-01-12
[patent_title] => 'Beam generator'
[patent_app_type] => 1
[patent_app_number] => 8/869077
[patent_app_country] => US
[patent_app_date] => 1997-06-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 2336
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 105
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/859/05859428.pdf
[firstpage_image] =>[orig_patent_app_number] => 869077
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/869077 | Beam generator | Jun 3, 1997 | Issued |
Array
(
[id] => 3873874
[patent_doc_number] => 05838004
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-11-17
[patent_title] => 'Particle-optical apparatus comprising a fixed diaphragm for the monochromator filter'
[patent_app_type] => 1
[patent_app_number] => 8/849205
[patent_app_country] => US
[patent_app_date] => 1997-06-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 4
[patent_no_of_words] => 2512
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 134
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/838/05838004.pdf
[firstpage_image] =>[orig_patent_app_number] => 849205
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/849205 | Particle-optical apparatus comprising a fixed diaphragm for the monochromator filter | Jun 1, 1997 | Issued |
Array
(
[id] => 3980039
[patent_doc_number] => 05905258
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-05-18
[patent_title] => 'Hybrid ion mobility and mass spectrometer'
[patent_app_type] => 1
[patent_app_number] => 8/867245
[patent_app_country] => US
[patent_app_date] => 1997-06-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 11
[patent_no_of_words] => 8886
[patent_no_of_claims] => 46
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 101
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/905/05905258.pdf
[firstpage_image] =>[orig_patent_app_number] => 867245
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/867245 | Hybrid ion mobility and mass spectrometer | Jun 1, 1997 | Issued |
Array
(
[id] => 3820054
[patent_doc_number] => 05789748
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-08-04
[patent_title] => 'Low voltage electron beam system'
[patent_app_type] => 1
[patent_app_number] => 8/865377
[patent_app_country] => US
[patent_app_date] => 1997-05-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 18
[patent_no_of_words] => 5007
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 104
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/789/05789748.pdf
[firstpage_image] =>[orig_patent_app_number] => 865377
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/865377 | Low voltage electron beam system | May 28, 1997 | Issued |
Array
(
[id] => 3873975
[patent_doc_number] => 05838011
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-11-17
[patent_title] => 'Correction device for the correction of lens aberrations in particle-optical apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/861345
[patent_app_country] => US
[patent_app_date] => 1997-05-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 7
[patent_no_of_words] => 5362
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 215
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/838/05838011.pdf
[firstpage_image] =>[orig_patent_app_number] => 861345
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/861345 | Correction device for the correction of lens aberrations in particle-optical apparatus | May 20, 1997 | Issued |
Array
(
[id] => 3998591
[patent_doc_number] => 05920067
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-07-06
[patent_title] => 'Monocrystalline test and reference structures, and use for calibrating instruments'
[patent_app_type] => 1
[patent_app_number] => 8/859914
[patent_app_country] => US
[patent_app_date] => 1997-05-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 20
[patent_no_of_words] => 9862
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 78
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/920/05920067.pdf
[firstpage_image] =>[orig_patent_app_number] => 859914
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/859914 | Monocrystalline test and reference structures, and use for calibrating instruments | May 20, 1997 | Issued |
Array
(
[id] => 3820040
[patent_doc_number] => 05789747
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-08-04
[patent_title] => 'Three dimensional quadrupole mass spectrometry and mass spectrometer'
[patent_app_type] => 1
[patent_app_number] => 8/859657
[patent_app_country] => US
[patent_app_date] => 1997-05-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3003
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 103
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/789/05789747.pdf
[firstpage_image] =>[orig_patent_app_number] => 859657
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/859657 | Three dimensional quadrupole mass spectrometry and mass spectrometer | May 19, 1997 | Issued |
Array
(
[id] => 4056918
[patent_doc_number] => 05932885
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-08-03
[patent_title] => 'Thermophotovoltaic electric generator'
[patent_app_type] => 1
[patent_app_number] => 8/858335
[patent_app_country] => US
[patent_app_date] => 1997-05-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 17
[patent_no_of_words] => 9210
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 188
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/932/05932885.pdf
[firstpage_image] =>[orig_patent_app_number] => 858335
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/858335 | Thermophotovoltaic electric generator | May 18, 1997 | Issued |
Array
(
[id] => 3882168
[patent_doc_number] => 05804821
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-09-08
[patent_title] => 'Plasma ion source mass analyzer'
[patent_app_type] => 1
[patent_app_number] => 8/856605
[patent_app_country] => US
[patent_app_date] => 1997-05-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 3740
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 237
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/804/05804821.pdf
[firstpage_image] =>[orig_patent_app_number] => 856605
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/856605 | Plasma ion source mass analyzer | May 14, 1997 | Issued |
Array
(
[id] => 3879194
[patent_doc_number] => 05763930
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-06-09
[patent_title] => 'Plasma focus high energy photon source'
[patent_app_type] => 1
[patent_app_number] => 8/854507
[patent_app_country] => US
[patent_app_date] => 1997-05-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 2950
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 149
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/763/05763930.pdf
[firstpage_image] =>[orig_patent_app_number] => 854507
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/854507 | Plasma focus high energy photon source | May 11, 1997 | Issued |
Array
(
[id] => 4075597
[patent_doc_number] => 06069364
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-05-30
[patent_title] => 'Electron beam drawing apparatus and method of the same'
[patent_app_type] => 1
[patent_app_number] => 8/854386
[patent_app_country] => US
[patent_app_date] => 1997-05-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 15
[patent_no_of_words] => 3381
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 109
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/069/06069364.pdf
[firstpage_image] =>[orig_patent_app_number] => 854386
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/854386 | Electron beam drawing apparatus and method of the same | May 11, 1997 | Issued |
Array
(
[id] => 3781386
[patent_doc_number] => 05818041
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-10-06
[patent_title] => 'Mass spectrometer system and method for transporting and analyzing ions'
[patent_app_type] => 1
[patent_app_number] => 8/854855
[patent_app_country] => US
[patent_app_date] => 1997-05-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 10
[patent_no_of_words] => 4994
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 264
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/818/05818041.pdf
[firstpage_image] =>[orig_patent_app_number] => 854855
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/854855 | Mass spectrometer system and method for transporting and analyzing ions | May 11, 1997 | Issued |
Array
(
[id] => 3997792
[patent_doc_number] => 05892224
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-04-06
[patent_title] => 'Apparatus and methods for inspecting wafers and masks using multiple charged-particle beams'
[patent_app_type] => 1
[patent_app_number] => 8/855736
[patent_app_country] => US
[patent_app_date] => 1997-05-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 15
[patent_no_of_words] => 13228
[patent_no_of_claims] => 70
[patent_no_of_ind_claims] => 13
[patent_words_short_claim] => 26
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/892/05892224.pdf
[firstpage_image] =>[orig_patent_app_number] => 855736
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/855736 | Apparatus and methods for inspecting wafers and masks using multiple charged-particle beams | May 8, 1997 | Issued |
Array
(
[id] => 4069570
[patent_doc_number] => 05866903
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-02-02
[patent_title] => 'Equipment and process for quantitative x-ray analysis and medium with quantitative x-ray analysis program recorded'
[patent_app_type] => 1
[patent_app_number] => 8/853549
[patent_app_country] => US
[patent_app_date] => 1997-05-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 3
[patent_no_of_words] => 3098
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 91
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/866/05866903.pdf
[firstpage_image] =>[orig_patent_app_number] => 853549
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/853549 | Equipment and process for quantitative x-ray analysis and medium with quantitative x-ray analysis program recorded | May 8, 1997 | Issued |
Array
(
[id] => 3997996
[patent_doc_number] => 05892238
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-04-06
[patent_title] => 'Radiation therapy shielding assembly'
[patent_app_type] => 1
[patent_app_number] => 8/850585
[patent_app_country] => US
[patent_app_date] => 1997-05-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 865
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 134
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/892/05892238.pdf
[firstpage_image] =>[orig_patent_app_number] => 850585
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/850585 | Radiation therapy shielding assembly | May 1, 1997 | Issued |