
Jared Barsky
Examiner (ID: 10819, Phone: (571)272-2795 , Office: P/1628 )
| Most Active Art Unit | 1628 |
| Art Unit(s) | 1628 |
| Total Applications | 1114 |
| Issued Applications | 491 |
| Pending Applications | 145 |
| Abandoned Applications | 502 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 3735705
[patent_doc_number] => 05693939
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-12-02
[patent_title] => 'MeV neutral beam ion implanter'
[patent_app_type] => 1
[patent_app_number] => 8/675567
[patent_app_country] => US
[patent_app_date] => 1996-07-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 13
[patent_no_of_words] => 4219
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[patent_words_short_claim] => 160
[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/693/05693939.pdf
[firstpage_image] =>[orig_patent_app_number] => 675567
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/675567 | MeV neutral beam ion implanter | Jul 2, 1996 | Issued |
Array
(
[id] => 3653869
[patent_doc_number] => 05606162
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-02-25
[patent_title] => 'Microprobe for surface-scanning microscopes'
[patent_app_type] => 1
[patent_app_number] => 8/673023
[patent_app_country] => US
[patent_app_date] => 1996-07-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[firstpage_image] =>[orig_patent_app_number] => 673023
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/673023 | Microprobe for surface-scanning microscopes | Jun 30, 1996 | Issued |
Array
(
[id] => 3882008
[patent_doc_number] => 05747816
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-05-05
[patent_title] => 'Charged particle beam apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/670047
[patent_app_country] => US
[patent_app_date] => 1996-06-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[pdf_file] => patents/05/747/05747816.pdf
[firstpage_image] =>[orig_patent_app_number] => 670047
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/670047 | Charged particle beam apparatus | Jun 24, 1996 | Issued |
Array
(
[id] => 3698112
[patent_doc_number] => 05661299
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-08-26
[patent_title] => 'Miniature AMS detector for ultrasensitive detection of individual carbon-14 and tritium atoms'
[patent_app_type] => 1
[patent_app_number] => 8/668297
[patent_app_country] => US
[patent_app_date] => 1996-06-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 4080
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[firstpage_image] =>[orig_patent_app_number] => 668297
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/668297 | Miniature AMS detector for ultrasensitive detection of individual carbon-14 and tritium atoms | Jun 24, 1996 | Issued |
Array
(
[id] => 3701788
[patent_doc_number] => 05677530
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-10-14
[patent_title] => 'Scanning electron microscope'
[patent_app_type] => 1
[patent_app_number] => 8/668177
[patent_app_country] => US
[patent_app_date] => 1996-06-21
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[firstpage_image] =>[orig_patent_app_number] => 668177
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/668177 | Scanning electron microscope | Jun 20, 1996 | Issued |
Array
(
[id] => 3734493
[patent_doc_number] => 05635715
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-06-03
[patent_title] => 'Process for the characterization of an insulator and the corresponding electron microscope'
[patent_app_type] => 1
[patent_app_number] => 8/448376
[patent_app_country] => US
[patent_app_date] => 1996-06-18
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[firstpage_image] =>[orig_patent_app_number] => 448376
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/448376 | Process for the characterization of an insulator and the corresponding electron microscope | Jun 17, 1996 | Issued |
Array
(
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[patent_issue_date] => 1997-12-23
[patent_title] => 'Wafer metrology pattern integrating both overlay and critical dimension features for SEM or AFM measurements'
[patent_app_type] => 1
[patent_app_number] => 8/660486
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[pdf_file] => patents/05/701/05701013.pdf
[firstpage_image] =>[orig_patent_app_number] => 660486
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/660486 | Wafer metrology pattern integrating both overlay and critical dimension features for SEM or AFM measurements | Jun 6, 1996 | Issued |
Array
(
[id] => 3895407
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[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-11-10
[patent_title] => 'Method and apparatus for testing the function of microstructure elements'
[patent_app_type] => 1
[patent_app_number] => 8/659337
[patent_app_country] => US
[patent_app_date] => 1996-06-06
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[pdf_file] => patents/05/834/05834773.pdf
[firstpage_image] =>[orig_patent_app_number] => 659337
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/659337 | Method and apparatus for testing the function of microstructure elements | Jun 5, 1996 | Issued |
Array
(
[id] => 3745608
[patent_doc_number] => 05786598
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[patent_issue_date] => 1998-07-28
[patent_title] => 'Sterilization of packages and their contents using high-intensity, short-duration pulses of incoherent, polychromatic light in a broad spectrum'
[patent_app_type] => 1
[patent_app_number] => 8/651275
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/651275 | Sterilization of packages and their contents using high-intensity, short-duration pulses of incoherent, polychromatic light in a broad spectrum | May 21, 1996 | Issued |
Array
(
[id] => 3691724
[patent_doc_number] => 05644131
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-07-01
[patent_title] => 'Hyperbolic ion trap and associated methods of manufacture'
[patent_app_type] => 1
[patent_app_number] => 8/651367
[patent_app_country] => US
[patent_app_date] => 1996-05-22
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[firstpage_image] =>[orig_patent_app_number] => 651367
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/651367 | Hyperbolic ion trap and associated methods of manufacture | May 21, 1996 | Issued |
Array
(
[id] => 3686520
[patent_doc_number] => 05633505
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-05-27
[patent_title] => 'Semiconductor wafer incorporating marks for inspecting first layer overlay shift in global alignment process'
[patent_app_type] => 1
[patent_app_number] => 8/650666
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[patent_app_date] => 1996-05-20
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[pdf_file] => patents/05/633/05633505.pdf
[firstpage_image] =>[orig_patent_app_number] => 650666
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/650666 | Semiconductor wafer incorporating marks for inspecting first layer overlay shift in global alignment process | May 19, 1996 | Issued |
Array
(
[id] => 3698100
[patent_doc_number] => 05661298
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-08-26
[patent_title] => 'Mass spectrometer'
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Array
(
[id] => 3903103
[patent_doc_number] => 05750993
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-05-12
[patent_title] => 'Method of reducing noise in an ion trap mass spectrometer coupled to an atmospheric pressure ionization source'
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Array
(
[id] => 3892129
[patent_doc_number] => 05777343
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[patent_kind] => NA
[patent_issue_date] => 1998-07-07
[patent_title] => 'Uranium hexafluoride carrier'
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[patent_app_number] => 8/646977
[patent_app_country] => US
[patent_app_date] => 1996-05-08
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[firstpage_image] =>[orig_patent_app_number] => 646977
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/646977 | Uranium hexafluoride carrier | May 7, 1996 | Issued |
Array
(
[id] => 3632904
[patent_doc_number] => 05686728
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[patent_title] => 'Projection lithography system and method using all-reflective optical elements'
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Array
(
[id] => 3732442
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[patent_issue_date] => 1997-12-30
[patent_title] => 'Circuit scanning device and method'
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Array
(
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[patent_title] => 'Source for intense coherent electron pulses'
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Array
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Array
(
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Array
(
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[firstpage_image] =>[orig_patent_app_number] => 619625
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/619625 | UV apparatus for fluid treatment | Apr 4, 1996 | Issued |