
Jared Barsky
Examiner (ID: 10819, Phone: (571)272-2795 , Office: P/1628 )
| Most Active Art Unit | 1628 |
| Art Unit(s) | 1628 |
| Total Applications | 1114 |
| Issued Applications | 491 |
| Pending Applications | 145 |
| Abandoned Applications | 502 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
| 90/004095 | APPARATUS AND METHODS FOR TRACE COMPONENT ANALYSIS | Jan 15, 1996 | Issued |
Array
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[patent_issue_date] => 1996-12-17
[patent_title] => 'Electron beam nano-metrology system'
[patent_app_type] => 1
[patent_app_number] => 8/584988
[patent_app_country] => US
[patent_app_date] => 1996-01-11
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Array
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[patent_issue_date] => 1997-06-10
[patent_title] => 'Method for extracting ion current from space of high vacuum into space of low vacuum'
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Array
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[patent_title] => 'Method and apparatus for microlithography'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/581185 | Method and apparatus for microlithography | Dec 28, 1995 | Issued |
Array
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[patent_issue_date] => 1997-09-23
[patent_title] => 'Scanning electron microscope and speciman observation method thereby'
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[patent_app_date] => 1995-12-28
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/576607 | Apparatus and method for tomography of microscopic samples | Dec 20, 1995 | Issued |
Array
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[patent_title] => 'Missile launch and flyout simulator'
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/570185 | Device for the generation of electron beams | Dec 10, 1995 | Issued |
Array
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[id] => 3593944
[patent_doc_number] => 05585644
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-12-17
[patent_title] => 'Polyethylene naphthalate X-ray window'
[patent_app_type] => 1
[patent_app_number] => 8/568775
[patent_app_country] => US
[patent_app_date] => 1995-12-07
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[firstpage_image] =>[orig_patent_app_number] => 568775
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/568775 | Polyethylene naphthalate X-ray window | Dec 6, 1995 | Issued |
Array
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[id] => 3815219
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[patent_issue_date] => 1998-09-22
[patent_title] => 'Electron beam source and its manufacturing method and electron beam source apparatus and electron beam apparatus using the same'
[patent_app_type] => 1
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/568865 | Electron beam source and its manufacturing method and electron beam source apparatus and electron beam apparatus using the same | Dec 4, 1995 | Issued |
Array
(
[id] => 3554112
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[patent_issue_date] => 1996-11-05
[patent_title] => 'Method and device for the reflection of charged particles on surfaces'
[patent_app_type] => 1
[patent_app_number] => 8/565107
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Array
(
[id] => 3626441
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[patent_title] => 'Illuminator device for use with night vision devices'
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Array
(
[id] => 3651563
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[patent_issue_date] => 1997-05-13
[patent_title] => 'Process and apparatus for detecting sample molecules in a carrier gas'
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Array
(
[id] => 3671624
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Array
(
[id] => 3787568
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[patent_title] => 'Deflection based daughter ion selector'
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Array
(
[id] => 3692108
[patent_doc_number] => 05696375
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[patent_issue_date] => 1997-12-09
[patent_title] => 'Multideflector'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/560396 | Multideflector | Nov 16, 1995 | Issued |
| 08/556715 | SPM CANTILEVER AND A METHOD FOR MANUFACTURING THE SAME | Nov 12, 1995 | Abandoned |
Array
(
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[patent_title] => 'Method and apparatus for mass analysis of solution sample'
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Array
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Array
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