
Jared Barsky
Examiner (ID: 10819, Phone: (571)272-2795 , Office: P/1628 )
| Most Active Art Unit | 1628 |
| Art Unit(s) | 1628 |
| Total Applications | 1114 |
| Issued Applications | 491 |
| Pending Applications | 145 |
| Abandoned Applications | 502 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 3686409
[patent_doc_number] => 05633497
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-05-27
[patent_title] => 'Surface coating to improve performance of ion trap mass spectrometers'
[patent_app_type] => 1
[patent_app_number] => 8/552417
[patent_app_country] => US
[patent_app_date] => 1995-11-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 12
[patent_no_of_words] => 1247
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 72
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/633/05633497.pdf
[firstpage_image] =>[orig_patent_app_number] => 552417
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/552417 | Surface coating to improve performance of ion trap mass spectrometers | Nov 2, 1995 | Issued |
Array
(
[id] => 3533828
[patent_doc_number] => 05583336
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-12-10
[patent_title] => 'High throughput electron energy analyzer'
[patent_app_type] => 1
[patent_app_number] => 8/550164
[patent_app_country] => US
[patent_app_date] => 1995-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 4
[patent_no_of_words] => 3526
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 41
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/583/05583336.pdf
[firstpage_image] =>[orig_patent_app_number] => 550164
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/550164 | High throughput electron energy analyzer | Oct 29, 1995 | Issued |
Array
(
[id] => 3625982
[patent_doc_number] => 05689117
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-11-18
[patent_title] => 'Apparatus for image transfer with charged particle beam, and deflector and mask used with such apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/548616
[patent_app_country] => US
[patent_app_date] => 1995-10-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
[patent_figures_cnt] => 24
[patent_no_of_words] => 13799
[patent_no_of_claims] => 8
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[patent_words_short_claim] => 131
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/689/05689117.pdf
[firstpage_image] =>[orig_patent_app_number] => 548616
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/548616 | Apparatus for image transfer with charged particle beam, and deflector and mask used with such apparatus | Oct 25, 1995 | Issued |
Array
(
[id] => 3671515
[patent_doc_number] => 05600137
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-02-04
[patent_title] => 'Probe apparatus having reduced misalignment of conductive needles'
[patent_app_type] => 1
[patent_app_number] => 8/546046
[patent_app_country] => US
[patent_app_date] => 1995-10-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 17
[patent_no_of_words] => 7283
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 114
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/600/05600137.pdf
[firstpage_image] =>[orig_patent_app_number] => 546046
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/546046 | Probe apparatus having reduced misalignment of conductive needles | Oct 19, 1995 | Issued |
Array
(
[id] => 3594288
[patent_doc_number] => 05567949
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-10-22
[patent_title] => 'Charged particle beam transfer apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/545506
[patent_app_country] => US
[patent_app_date] => 1995-10-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_no_of_words] => 4114
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[pdf_file] => patents/05/567/05567949.pdf
[firstpage_image] =>[orig_patent_app_number] => 545506
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/545506 | Charged particle beam transfer apparatus | Oct 18, 1995 | Issued |
Array
(
[id] => 3548394
[patent_doc_number] => 05554857
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-09-10
[patent_title] => 'Method and apparatus for ion beam formation in an ion implanter'
[patent_app_type] => 1
[patent_app_number] => 8/545135
[patent_app_country] => US
[patent_app_date] => 1995-10-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[patent_no_of_words] => 5014
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/554/05554857.pdf
[firstpage_image] =>[orig_patent_app_number] => 545135
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/545135 | Method and apparatus for ion beam formation in an ion implanter | Oct 18, 1995 | Issued |
Array
(
[id] => 3591758
[patent_doc_number] => 05550372
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-08-27
[patent_title] => 'Apparatus and method for analyzing foreign matter on semiconductor wafers and for controlling the manufacturing process of semiconductor devices'
[patent_app_type] => 1
[patent_app_number] => 8/543826
[patent_app_country] => US
[patent_app_date] => 1995-10-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 18
[patent_no_of_words] => 5651
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 5
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/550/05550372.pdf
[firstpage_image] =>[orig_patent_app_number] => 543826
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/543826 | Apparatus and method for analyzing foreign matter on semiconductor wafers and for controlling the manufacturing process of semiconductor devices | Oct 15, 1995 | Issued |
Array
(
[id] => 3686562
[patent_doc_number] => 05633508
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-05-27
[patent_title] => 'Secondary shielding structure'
[patent_app_type] => 1
[patent_app_number] => 8/541247
[patent_app_country] => US
[patent_app_date] => 1995-10-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 11
[patent_no_of_words] => 2679
[patent_no_of_claims] => 10
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/633/05633508.pdf
[firstpage_image] =>[orig_patent_app_number] => 541247
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/541247 | Secondary shielding structure | Oct 11, 1995 | Issued |
Array
(
[id] => 3699489
[patent_doc_number] => 05596193
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-01-21
[patent_title] => 'Miniature quadrupole mass spectrometer array'
[patent_app_type] => 1
[patent_app_number] => 8/540817
[patent_app_country] => US
[patent_app_date] => 1995-10-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[patent_no_of_words] => 3074
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/596/05596193.pdf
[firstpage_image] =>[orig_patent_app_number] => 540817
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/540817 | Miniature quadrupole mass spectrometer array | Oct 10, 1995 | Issued |
| 08/544411 | MICROPROBE FR SURFACE-SCANNING MICROSCOPE | Oct 9, 1995 | Abandoned |
Array
(
[id] => 3721024
[patent_doc_number] => 05616920
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-04-01
[patent_title] => 'Apparatus for removing ions from an electron beam'
[patent_app_type] => 1
[patent_app_number] => 8/538865
[patent_app_country] => US
[patent_app_date] => 1995-10-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_no_of_words] => 1923
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[pdf_file] => patents/05/616/05616920.pdf
[firstpage_image] =>[orig_patent_app_number] => 538865
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/538865 | Apparatus for removing ions from an electron beam | Oct 3, 1995 | Issued |
Array
(
[id] => 3734573
[patent_doc_number] => 05635720
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-06-03
[patent_title] => 'Resolution-enhancement device for an optically-coupled image sensor for an electron microscope'
[patent_app_type] => 1
[patent_app_number] => 8/539017
[patent_app_country] => US
[patent_app_date] => 1995-10-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[pdf_file] => patents/05/635/05635720.pdf
[firstpage_image] =>[orig_patent_app_number] => 539017
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/539017 | Resolution-enhancement device for an optically-coupled image sensor for an electron microscope | Oct 2, 1995 | Issued |
Array
(
[id] => 3653963
[patent_doc_number] => 05606169
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-02-25
[patent_title] => 'Ultraviolet light sterilization retrofit for paperboard packaging filling machines'
[patent_app_type] => 1
[patent_app_number] => 8/533505
[patent_app_country] => US
[patent_app_date] => 1995-09-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[pdf_file] => patents/05/606/05606169.pdf
[firstpage_image] =>[orig_patent_app_number] => 533505
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/533505 | Ultraviolet light sterilization retrofit for paperboard packaging filling machines | Sep 24, 1995 | Issued |
Array
(
[id] => 3666185
[patent_doc_number] => 05625185
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-04-29
[patent_title] => 'Mass spectrometer, especially ICP-MS'
[patent_app_type] => 1
[patent_app_number] => 8/532456
[patent_app_country] => US
[patent_app_date] => 1995-09-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_no_of_words] => 1286
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[pdf_file] => patents/05/625/05625185.pdf
[firstpage_image] =>[orig_patent_app_number] => 532456
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/532456 | Mass spectrometer, especially ICP-MS | Sep 21, 1995 | Issued |
Array
(
[id] => 3557165
[patent_doc_number] => 05574279
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-11-12
[patent_title] => 'Probe with torsion lever structure, and scanning probe microscope and record/reproducing apparatus utilizing the same'
[patent_app_type] => 1
[patent_app_number] => 8/530965
[patent_app_country] => US
[patent_app_date] => 1995-09-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
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[patent_no_of_words] => 6733
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/574/05574279.pdf
[firstpage_image] =>[orig_patent_app_number] => 530965
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/530965 | Probe with torsion lever structure, and scanning probe microscope and record/reproducing apparatus utilizing the same | Sep 19, 1995 | Issued |
Array
(
[id] => 3729665
[patent_doc_number] => 05701009
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-12-23
[patent_title] => 'Gas detection devices'
[patent_app_type] => 1
[patent_app_number] => 8/513886
[patent_app_country] => US
[patent_app_date] => 1995-09-18
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/701/05701009.pdf
[firstpage_image] =>[orig_patent_app_number] => 513886
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/513886 | Gas detection devices | Sep 17, 1995 | Issued |
Array
(
[id] => 3662418
[patent_doc_number] => 05591971
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-01-07
[patent_title] => 'Shielding device for improving measurement accuracy and speed in scanning electron microscopy'
[patent_app_type] => 1
[patent_app_number] => 8/529675
[patent_app_country] => US
[patent_app_date] => 1995-09-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/591/05591971.pdf
[firstpage_image] =>[orig_patent_app_number] => 529675
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/529675 | Shielding device for improving measurement accuracy and speed in scanning electron microscopy | Sep 17, 1995 | Issued |
Array
(
[id] => 3734583
[patent_doc_number] => 05635721
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-06-03
[patent_title] => 'Apparatus for the liner acceleration of electrons, particularly for intraoperative radiation therapy'
[patent_app_type] => 1
[patent_app_number] => 8/528965
[patent_app_country] => US
[patent_app_date] => 1995-09-15
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[pdf_file] => patents/05/635/05635721.pdf
[firstpage_image] =>[orig_patent_app_number] => 528965
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/528965 | Apparatus for the liner acceleration of electrons, particularly for intraoperative radiation therapy | Sep 14, 1995 | Issued |
Array
(
[id] => 3637906
[patent_doc_number] => 05631471
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-05-20
[patent_title] => 'Device to irradiate surfaces with electrons'
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[patent_app_number] => 8/528957
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[pdf_file] => patents/05/631/05631471.pdf
[firstpage_image] =>[orig_patent_app_number] => 528957
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/528957 | Device to irradiate surfaces with electrons | Sep 14, 1995 | Issued |
Array
(
[id] => 3554125
[patent_doc_number] => 05572036
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-11-05
[patent_title] => 'Support element for an automatic load platform of a silicon wafer exposure unit'
[patent_app_type] => 1
[patent_app_number] => 8/492066
[patent_app_country] => US
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[pdf_file] => patents/05/572/05572036.pdf
[firstpage_image] =>[orig_patent_app_number] => 492066
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/492066 | Support element for an automatic load platform of a silicon wafer exposure unit | Sep 10, 1995 | Issued |