
Jared Barsky
Examiner (ID: 10819, Phone: (571)272-2795 , Office: P/1628 )
| Most Active Art Unit | 1628 |
| Art Unit(s) | 1628 |
| Total Applications | 1114 |
| Issued Applications | 491 |
| Pending Applications | 145 |
| Abandoned Applications | 502 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 3592961
[patent_doc_number] => 05497007
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-03-05
[patent_title] => 'Method for automatically establishing a wafer coordinate system'
[patent_app_type] => 1
[patent_app_number] => 8/379246
[patent_app_country] => US
[patent_app_date] => 1995-01-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 13
[patent_no_of_words] => 5858
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 119
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/497/05497007.pdf
[firstpage_image] =>[orig_patent_app_number] => 379246
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/379246 | Method for automatically establishing a wafer coordinate system | Jan 26, 1995 | Issued |
Array
(
[id] => 3446692
[patent_doc_number] => 05466935
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-11-14
[patent_title] => 'Programmable, scanned-probe microscope system and method'
[patent_app_type] => 1
[patent_app_number] => 8/377025
[patent_app_country] => US
[patent_app_date] => 1995-01-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 7
[patent_no_of_words] => 4375
[patent_no_of_claims] => 39
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 117
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/466/05466935.pdf
[firstpage_image] =>[orig_patent_app_number] => 377025
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/377025 | Programmable, scanned-probe microscope system and method | Jan 19, 1995 | Issued |
Array
(
[id] => 3537650
[patent_doc_number] => 05557110
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-09-17
[patent_title] => 'Aperture for use in electron beam system for pattern writing'
[patent_app_type] => 1
[patent_app_number] => 8/375487
[patent_app_country] => US
[patent_app_date] => 1995-01-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 3024
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 58
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/557/05557110.pdf
[firstpage_image] =>[orig_patent_app_number] => 375487
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/375487 | Aperture for use in electron beam system for pattern writing | Jan 18, 1995 | Issued |
Array
(
[id] => 3446677
[patent_doc_number] => 05466934
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-11-14
[patent_title] => 'Method and apparatus for identification of crystallographic defects'
[patent_app_type] => 1
[patent_app_number] => 8/374214
[patent_app_country] => US
[patent_app_date] => 1995-01-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 6
[patent_no_of_words] => 4900
[patent_no_of_claims] => 28
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 109
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/466/05466934.pdf
[firstpage_image] =>[orig_patent_app_number] => 374214
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/374214 | Method and apparatus for identification of crystallographic defects | Jan 17, 1995 | Issued |
Array
(
[id] => 3879718
[patent_doc_number] => 05825042
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-10-20
[patent_title] => 'Radiation shielding of plastic integrated circuits'
[patent_app_type] => 1
[patent_app_number] => 8/372235
[patent_app_country] => US
[patent_app_date] => 1995-01-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 10
[patent_no_of_words] => 5521
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 87
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/825/05825042.pdf
[firstpage_image] =>[orig_patent_app_number] => 372235
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/372235 | Radiation shielding of plastic integrated circuits | Jan 12, 1995 | Issued |
Array
(
[id] => 3558673
[patent_doc_number] => 05543615
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-08-06
[patent_title] => 'Beam charge exchanging apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/371775
[patent_app_country] => US
[patent_app_date] => 1995-01-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 7
[patent_no_of_words] => 3860
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 147
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/543/05543615.pdf
[firstpage_image] =>[orig_patent_app_number] => 371775
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/371775 | Beam charge exchanging apparatus | Jan 11, 1995 | Issued |
Array
(
[id] => 3567884
[patent_doc_number] => 05483074
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-01-09
[patent_title] => 'Flood beam electron gun'
[patent_app_type] => 1
[patent_app_number] => 8/371286
[patent_app_country] => US
[patent_app_date] => 1995-01-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 4032
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 103
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/483/05483074.pdf
[firstpage_image] =>[orig_patent_app_number] => 371286
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/371286 | Flood beam electron gun | Jan 10, 1995 | Issued |
Array
(
[id] => 3461260
[patent_doc_number] => 05473164
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-12-05
[patent_title] => 'Device for shielding of x-rays in electron bombardment of materials on a sheet, especially ink on a paper sheet'
[patent_app_type] => 1
[patent_app_number] => 8/367692
[patent_app_country] => US
[patent_app_date] => 1995-01-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 1812
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 240
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/473/05473164.pdf
[firstpage_image] =>[orig_patent_app_number] => 367692
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/367692 | Device for shielding of x-rays in electron bombardment of materials on a sheet, especially ink on a paper sheet | Jan 2, 1995 | Issued |
Array
(
[id] => 3575259
[patent_doc_number] => 05539211
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-07-23
[patent_title] => 'Charged beam apparatus having cleaning function and method of cleaning charged beam apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/365825
[patent_app_country] => US
[patent_app_date] => 1994-12-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 23
[patent_figures_cnt] => 39
[patent_no_of_words] => 17520
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 9
[patent_words_short_claim] => 123
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/539/05539211.pdf
[firstpage_image] =>[orig_patent_app_number] => 365825
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/365825 | Charged beam apparatus having cleaning function and method of cleaning charged beam apparatus | Dec 28, 1994 | Issued |
Array
(
[id] => 3560562
[patent_doc_number] => 05500527
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-03-19
[patent_title] => 'Electron/ion microscope with improved resolution'
[patent_app_type] => 1
[patent_app_number] => 8/365043
[patent_app_country] => US
[patent_app_date] => 1994-12-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 7
[patent_no_of_words] => 2559
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 202
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/500/05500527.pdf
[firstpage_image] =>[orig_patent_app_number] => 365043
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/365043 | Electron/ion microscope with improved resolution | Dec 26, 1994 | Issued |
Array
(
[id] => 3579329
[patent_doc_number] => 05523577
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-06-04
[patent_title] => 'Electron beam system'
[patent_app_type] => 1
[patent_app_number] => 8/360372
[patent_app_country] => US
[patent_app_date] => 1994-12-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 5424
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 77
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/523/05523577.pdf
[firstpage_image] =>[orig_patent_app_number] => 360372
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/360372 | Electron beam system | Dec 20, 1994 | Issued |
Array
(
[id] => 3465239
[patent_doc_number] => 05468955
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-11-21
[patent_title] => 'Neutral beam apparatus for in-situ production of reactants and kinetic energy transfer'
[patent_app_type] => 1
[patent_app_number] => 8/359974
[patent_app_country] => US
[patent_app_date] => 1994-12-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 19
[patent_no_of_words] => 13239
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 56
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/468/05468955.pdf
[firstpage_image] =>[orig_patent_app_number] => 359974
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/359974 | Neutral beam apparatus for in-situ production of reactants and kinetic energy transfer | Dec 19, 1994 | Issued |
Array
(
[id] => 3521180
[patent_doc_number] => 05506412
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-04-09
[patent_title] => 'Means for reducing the contamination of mass spectrometer leak detection ion sources'
[patent_app_type] => 1
[patent_app_number] => 8/357905
[patent_app_country] => US
[patent_app_date] => 1994-12-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 2180
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 50
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/506/05506412.pdf
[firstpage_image] =>[orig_patent_app_number] => 357905
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/357905 | Means for reducing the contamination of mass spectrometer leak detection ion sources | Dec 15, 1994 | Issued |
Array
(
[id] => 3500611
[patent_doc_number] => 05532496
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-07-02
[patent_title] => 'Proximity effect compensation in scattering-mask lithographic projection systems and apparatus therefore'
[patent_app_type] => 1
[patent_app_number] => 8/355887
[patent_app_country] => US
[patent_app_date] => 1994-12-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 6
[patent_no_of_words] => 3153
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 166
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/532/05532496.pdf
[firstpage_image] =>[orig_patent_app_number] => 355887
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/355887 | Proximity effect compensation in scattering-mask lithographic projection systems and apparatus therefore | Dec 13, 1994 | Issued |
Array
(
[id] => 3595472
[patent_doc_number] => 05521381
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-05-28
[patent_title] => 'Contamination analysis unit'
[patent_app_type] => 1
[patent_app_number] => 8/354325
[patent_app_country] => US
[patent_app_date] => 1994-12-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 2197
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 77
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/521/05521381.pdf
[firstpage_image] =>[orig_patent_app_number] => 354325
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/354325 | Contamination analysis unit | Dec 11, 1994 | Issued |
Array
(
[id] => 3431662
[patent_doc_number] => 05455418
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-10-03
[patent_title] => 'Micro-fourier transform ion cyclotron resonance mass spectrometer'
[patent_app_type] => 1
[patent_app_number] => 8/349864
[patent_app_country] => US
[patent_app_date] => 1994-12-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 3
[patent_no_of_words] => 2957
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 120
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/455/05455418.pdf
[firstpage_image] =>[orig_patent_app_number] => 349864
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/349864 | Micro-fourier transform ion cyclotron resonance mass spectrometer | Dec 5, 1994 | Issued |
Array
(
[id] => 3543676
[patent_doc_number] => 05481108
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-01-02
[patent_title] => 'Method for ion detection and mass spectrometry and apparatus thereof'
[patent_app_type] => 1
[patent_app_number] => 8/351155
[patent_app_country] => US
[patent_app_date] => 1994-11-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 10
[patent_no_of_words] => 2612
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 9
[patent_words_short_claim] => 29
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/481/05481108.pdf
[firstpage_image] =>[orig_patent_app_number] => 351155
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/351155 | Method for ion detection and mass spectrometry and apparatus thereof | Nov 29, 1994 | Issued |
Array
(
[id] => 3115911
[patent_doc_number] => 05464988
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-11-07
[patent_title] => 'Tritium waste package'
[patent_app_type] => 1
[patent_app_number] => 8/347134
[patent_app_country] => US
[patent_app_date] => 1994-11-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 1271
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 145
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/464/05464988.pdf
[firstpage_image] =>[orig_patent_app_number] => 347134
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/347134 | Tritium waste package | Nov 22, 1994 | Issued |
Array
(
[id] => 3423179
[patent_doc_number] => 05479025
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-12-26
[patent_title] => 'Boresight thermal reference source'
[patent_app_type] => 1
[patent_app_number] => 8/341796
[patent_app_country] => US
[patent_app_date] => 1994-11-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 4815
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 81
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/479/05479025.pdf
[firstpage_image] =>[orig_patent_app_number] => 341796
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/341796 | Boresight thermal reference source | Nov 17, 1994 | Issued |
Array
(
[id] => 3595593
[patent_doc_number] => 05521390
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-05-28
[patent_title] => 'Nanodisplacement producing apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/341949
[patent_app_country] => US
[patent_app_date] => 1994-11-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 6905
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 8
[patent_words_short_claim] => 60
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/521/05521390.pdf
[firstpage_image] =>[orig_patent_app_number] => 341949
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/341949 | Nanodisplacement producing apparatus | Nov 15, 1994 | Issued |