Search

Jasmine Jhihan B Clark

Examiner (ID: 12128, Phone: (571)272-1726 , Office: P/2816 )

Most Active Art Unit
2815
Art Unit(s)
3621, 2815, 2899, 2816, 2503
Total Applications
3004
Issued Applications
2715
Pending Applications
127
Abandoned Applications
162

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 15365869 [patent_doc_number] => 20200018699 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-01-16 [patent_title] => DROPLET SENSOR [patent_app_type] => utility [patent_app_number] => 16/503862 [patent_app_country] => US [patent_app_date] => 2019-07-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9121 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 50 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16503862 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/503862
Droplet sensor Jul 4, 2019 Issued
Array ( [id] => 17808665 [patent_doc_number] => 20220260500 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-08-18 [patent_title] => INSPECTION SUPPORT APPARATUS, INSPECTION SUPPORT METHOD, AND COMPUTER-READABLE MEDIUM [patent_app_type] => utility [patent_app_number] => 17/618019 [patent_app_country] => US [patent_app_date] => 2019-06-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6875 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 206 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17618019 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/618019
INSPECTION SUPPORT APPARATUS, INSPECTION SUPPORT METHOD, AND COMPUTER-READABLE MEDIUM Jun 18, 2019 Pending
Array ( [id] => 14899879 [patent_doc_number] => 20190293705 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-09-26 [patent_title] => METHOD, SYSTEM AND APPARATUS FOR FAULT DETECTION [patent_app_type] => utility [patent_app_number] => 16/440258 [patent_app_country] => US [patent_app_date] => 2019-06-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11528 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16440258 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/440258
Method, system and apparatus for fault detection Jun 12, 2019 Issued
Array ( [id] => 17998925 [patent_doc_number] => 11500027 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-11-15 [patent_title] => Method and apparatus for testing secondary battery internal short and secondary battery used therefor [patent_app_type] => utility [patent_app_number] => 16/960579 [patent_app_country] => US [patent_app_date] => 2019-06-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 6771 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16960579 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/960579
Method and apparatus for testing secondary battery internal short and secondary battery used therefor Jun 10, 2019 Issued
Array ( [id] => 17237727 [patent_doc_number] => 11181602 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-11-23 [patent_title] => Detecting damaged TMR sensors using bias currents and outliers [patent_app_type] => utility [patent_app_number] => 16/436462 [patent_app_country] => US [patent_app_date] => 2019-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 21 [patent_no_of_words] => 15476 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16436462 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/436462
Detecting damaged TMR sensors using bias currents and outliers Jun 9, 2019 Issued
Array ( [id] => 15256369 [patent_doc_number] => 20190376918 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-12-12 [patent_title] => METHOD FOR PRODUCING A NANOFILM, SENSOR ARRANGEMENT COMPRISING A NANOFILM, AND NANOSIEVE COMPRISING A NANOFILM [patent_app_type] => utility [patent_app_number] => 16/433289 [patent_app_country] => US [patent_app_date] => 2019-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7804 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16433289 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/433289
Method for producing a nanofilm, sensor arrangement comprising a nanofilm, and nanosieve comprising a nanofilm Jun 5, 2019 Issued
Array ( [id] => 17588847 [patent_doc_number] => 11327109 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-05-10 [patent_title] => Stacked semiconductor device and test method thereof [patent_app_type] => utility [patent_app_number] => 16/432284 [patent_app_country] => US [patent_app_date] => 2019-06-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 10998 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16432284 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/432284
Stacked semiconductor device and test method thereof Jun 4, 2019 Issued
Array ( [id] => 15213007 [patent_doc_number] => 20190369190 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-12-05 [patent_title] => METHOD FOR PROCESSING INTERIOR COMPUTED TOMOGRAPHY IMAGE USING ARTIFICIAL NEURAL NETWORK AND APPARATUS THEREFOR [patent_app_type] => utility [patent_app_number] => 16/431608 [patent_app_country] => US [patent_app_date] => 2019-06-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7988 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 32 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16431608 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/431608
METHOD FOR PROCESSING INTERIOR COMPUTED TOMOGRAPHY IMAGE USING ARTIFICIAL NEURAL NETWORK AND APPARATUS THEREFOR Jun 3, 2019 Abandoned
Array ( [id] => 17268544 [patent_doc_number] => 11193964 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-12-07 [patent_title] => System and method for measuring changes in dielectric properties in a structure [patent_app_type] => utility [patent_app_number] => 16/431370 [patent_app_country] => US [patent_app_date] => 2019-06-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3318 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 143 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16431370 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/431370
System and method for measuring changes in dielectric properties in a structure Jun 3, 2019 Issued
Array ( [id] => 16978974 [patent_doc_number] => 20210223211 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-07-22 [patent_title] => HAMMERING TEST TERMINAL, HAMMERING TEST SYSTEM, AND HAMMERING TEST DATA REGISTRATION METHOD [patent_app_type] => utility [patent_app_number] => 17/058805 [patent_app_country] => US [patent_app_date] => 2019-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13187 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -32 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17058805 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/058805
HAMMERING TEST TERMINAL, HAMMERING TEST SYSTEM, AND HAMMERING TEST DATA REGISTRATION METHOD May 27, 2019 Pending
Array ( [id] => 16438406 [patent_doc_number] => 20200355732 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-11-12 [patent_title] => IMPEDANCE MEASUREMENT CIRCUIT [patent_app_type] => utility [patent_app_number] => 16/407103 [patent_app_country] => US [patent_app_date] => 2019-05-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10065 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16407103 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/407103
IMPEDANCE MEASUREMENT CIRCUIT May 7, 2019 Abandoned
Array ( [id] => 17164221 [patent_doc_number] => 11150313 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2021-10-19 [patent_title] => On-chip excitation and readout architecture for high-density magnetic sensing arrays based on quantum defects [patent_app_type] => utility [patent_app_number] => 16/399651 [patent_app_country] => US [patent_app_date] => 2019-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 10450 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 186 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16399651 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/399651
On-chip excitation and readout architecture for high-density magnetic sensing arrays based on quantum defects Apr 29, 2019 Issued
Array ( [id] => 16400218 [patent_doc_number] => 20200341076 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-10-29 [patent_title] => Temperature Compensation Method For Hall Effect Proximity Sensors [patent_app_type] => utility [patent_app_number] => 16/396713 [patent_app_country] => US [patent_app_date] => 2019-04-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6419 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 87 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16396713 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/396713
Temperature Compensation Method For Hall Effect Proximity Sensors Apr 27, 2019 Pending
Array ( [id] => 16400192 [patent_doc_number] => 20200341050 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-10-29 [patent_title] => CURRENT DRIVER ARRAY TEST APPARATUS, TEST METHOD THEREOF, AND MICRO LIGHT EMITTING DIODE ARRAY TEST METHOD [patent_app_type] => utility [patent_app_number] => 16/396749 [patent_app_country] => US [patent_app_date] => 2019-04-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6897 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 196 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16396749 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/396749
CURRENT DRIVER ARRAY TEST APPARATUS, TEST METHOD THEREOF, AND MICRO LIGHT EMITTING DIODE ARRAY TEST METHOD Apr 27, 2019 Abandoned
Array ( [id] => 15529597 [patent_doc_number] => 20200057104 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-02-20 [patent_title] => FIELD-BIASED NONLINEAR OPTICAL METROLOGY USING CORONA DISCHARGE SOURCE [patent_app_type] => utility [patent_app_number] => 16/396227 [patent_app_country] => US [patent_app_date] => 2019-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 16113 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16396227 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/396227
FIELD-BIASED NONLINEAR OPTICAL METROLOGY USING CORONA DISCHARGE SOURCE Apr 25, 2019 Pending
Array ( [id] => 15652509 [patent_doc_number] => 20200088784 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-03-19 [patent_title] => SYSTEMS AND METHODS FOR DETERMINING CHARACTERISTICS OF SEMICONDUCTOR DEVICES [patent_app_type] => utility [patent_app_number] => 16/396455 [patent_app_country] => US [patent_app_date] => 2019-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 31761 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16396455 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/396455
SYSTEMS AND METHODS FOR DETERMINING CHARACTERISTICS OF SEMICONDUCTOR DEVICES Apr 25, 2019 Pending
Array ( [id] => 17596721 [patent_doc_number] => 20220146295 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-05-12 [patent_title] => DETERMINING A VAPOR PRESSURE USING A VAPOR PRESSURE METER FACTOR [patent_app_type] => utility [patent_app_number] => 17/440455 [patent_app_country] => US [patent_app_date] => 2019-04-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9563 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 45 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17440455 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/440455
DETERMINING A VAPOR PRESSURE USING A VAPOR PRESSURE METER FACTOR Apr 2, 2019 Pending
Array ( [id] => 17076379 [patent_doc_number] => 11112777 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-09-07 [patent_title] => Independent high-speed sampling for an oil drilling system [patent_app_type] => utility [patent_app_number] => 16/370389 [patent_app_country] => US [patent_app_date] => 2019-03-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7233 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 354 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16370389 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/370389
Independent high-speed sampling for an oil drilling system Mar 28, 2019 Issued
Array ( [id] => 17120577 [patent_doc_number] => 11131704 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-09-28 [patent_title] => Method and measuring apparatus for testing a device under test [patent_app_type] => utility [patent_app_number] => 16/364809 [patent_app_country] => US [patent_app_date] => 2019-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 6347 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 381 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16364809 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/364809
Method and measuring apparatus for testing a device under test Mar 25, 2019 Issued
Array ( [id] => 16345217 [patent_doc_number] => 20200309867 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-10-01 [patent_title] => CURRENT SENSOR FOR COMPENSATION OF ON-DIE TEMPERATURE GRADIENT [patent_app_type] => utility [patent_app_number] => 16/364951 [patent_app_country] => US [patent_app_date] => 2019-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6666 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16364951 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/364951
Current sensor for compensation of on-die temperature gradient Mar 25, 2019 Issued
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