Search

Jason L. Mccormack

Examiner (ID: 7907, Phone: (571)270-1489 , Office: P/2881 )

Most Active Art Unit
2881
Art Unit(s)
2881, 4177
Total Applications
1336
Issued Applications
1093
Pending Applications
117
Abandoned Applications
165

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 17838896 [patent_doc_number] => 20220276201 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-09-01 [patent_title] => ION MOBILITY SPECTROMETER WITH CENTER ROD [patent_app_type] => utility [patent_app_number] => 17/698048 [patent_app_country] => US [patent_app_date] => 2022-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10329 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -29 [patent_words_short_claim] => 41 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17698048 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/698048
Ion mobility spectrometer with center rod Mar 17, 2022 Issued
Array ( [id] => 19487209 [patent_doc_number] => 12106933 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-10-01 [patent_title] => Method to correct first order astigmatism and first order distortion in multi-beam scanning electron microscopes [patent_app_type] => utility [patent_app_number] => 17/694549 [patent_app_country] => US [patent_app_date] => 2022-03-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 9830 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17694549 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/694549
Method to correct first order astigmatism and first order distortion in multi-beam scanning electron microscopes Mar 13, 2022 Issued
Array ( [id] => 18978553 [patent_doc_number] => 11903707 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-02-20 [patent_title] => Enclosed desorption electrospray ionization probes and method of use thereof [patent_app_type] => utility [patent_app_number] => 17/692613 [patent_app_country] => US [patent_app_date] => 2022-03-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 29 [patent_no_of_words] => 7387 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17692613 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/692613
Enclosed desorption electrospray ionization probes and method of use thereof Mar 10, 2022 Issued
Array ( [id] => 17949166 [patent_doc_number] => 20220336185 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-10-20 [patent_title] => ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY [patent_app_type] => utility [patent_app_number] => 17/688339 [patent_app_country] => US [patent_app_date] => 2022-03-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14502 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17688339 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/688339
Arbitrary electron dose waveforms for electron microscopy Mar 6, 2022 Issued
Array ( [id] => 19918531 [patent_doc_number] => 12293907 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-05-06 [patent_title] => Physical-chemical property scoring for structure elucidation in ion spectrometry [patent_app_type] => utility [patent_app_number] => 17/688470 [patent_app_country] => US [patent_app_date] => 2022-03-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1149 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 234 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17688470 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/688470
Physical-chemical property scoring for structure elucidation in ion spectrometry Mar 6, 2022 Issued
Array ( [id] => 19384557 [patent_doc_number] => 20240274427 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-08-15 [patent_title] => MASS SPECTROMETER [patent_app_type] => utility [patent_app_number] => 18/290295 [patent_app_country] => US [patent_app_date] => 2022-03-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6137 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -4 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18290295 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/290295
MASS SPECTROMETER Mar 3, 2022 Pending
Array ( [id] => 19219102 [patent_doc_number] => 20240183806 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-06-06 [patent_title] => SYSTEM AND METHOD FOR DETERMINING LOCAL FOCUS POINTS DURING INSPECTION IN A CHARGED PARTICLE SYSTEM [patent_app_type] => utility [patent_app_number] => 18/284824 [patent_app_country] => US [patent_app_date] => 2022-03-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13114 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18284824 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/284824
System and method for determining local focus points during inspection in a charged particle system Mar 3, 2022 Issued
Array ( [id] => 19063066 [patent_doc_number] => 11942315 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-03-26 [patent_title] => Amplifier amplitude digital control for a mass spectrometer [patent_app_type] => utility [patent_app_number] => 17/685516 [patent_app_country] => US [patent_app_date] => 2022-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 11 [patent_no_of_words] => 8134 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17685516 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/685516
Amplifier amplitude digital control for a mass spectrometer Mar 2, 2022 Issued
Array ( [id] => 19183717 [patent_doc_number] => 11990315 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-05-21 [patent_title] => Measurement and correction of optical aberrations in charged particle beam microscopy [patent_app_type] => utility [patent_app_number] => 17/683076 [patent_app_country] => US [patent_app_date] => 2022-02-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 16 [patent_no_of_words] => 10268 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17683076 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/683076
Measurement and correction of optical aberrations in charged particle beam microscopy Feb 27, 2022 Issued
Array ( [id] => 19321377 [patent_doc_number] => 20240242924 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-07-18 [patent_title] => FOCUSED ION BEAM SYSTEM [patent_app_type] => utility [patent_app_number] => 18/560013 [patent_app_country] => US [patent_app_date] => 2022-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5393 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 223 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18560013 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/560013
FOCUSED ION BEAM SYSTEM Feb 24, 2022 Pending
Array ( [id] => 18061645 [patent_doc_number] => 20220392732 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-08 [patent_title] => CARBON NANOTUBE DEVICE [patent_app_type] => utility [patent_app_number] => 17/679652 [patent_app_country] => US [patent_app_date] => 2022-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2518 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17679652 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/679652
Carbon nanotube device Feb 23, 2022 Issued
Array ( [id] => 19035558 [patent_doc_number] => 20240085373 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-14 [patent_title] => DYNAMIC HEATING OF A DIFFERENTIAL MOBILITY SPECTROMETER CELL [patent_app_type] => utility [patent_app_number] => 18/262972 [patent_app_country] => US [patent_app_date] => 2022-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5954 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18262972 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/262972
DYNAMIC HEATING OF A DIFFERENTIAL MOBILITY SPECTROMETER CELL Feb 22, 2022 Pending
Array ( [id] => 18965218 [patent_doc_number] => 11898975 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-02-13 [patent_title] => Electron spectrometer [patent_app_type] => utility [patent_app_number] => 17/652237 [patent_app_country] => US [patent_app_date] => 2022-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 9619 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17652237 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/652237
Electron spectrometer Feb 22, 2022 Issued
Array ( [id] => 19206062 [patent_doc_number] => 20240177961 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-30 [patent_title] => ELECTRON BEAM MODULATION DEVICE AND ELECTRON BEAM MODULATION METHOD [patent_app_type] => utility [patent_app_number] => 18/284532 [patent_app_country] => US [patent_app_date] => 2022-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13122 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18284532 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/284532
ELECTRON BEAM MODULATION DEVICE AND ELECTRON BEAM MODULATION METHOD Feb 21, 2022 Pending
Array ( [id] => 17917402 [patent_doc_number] => 20220319798 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-10-06 [patent_title] => ELECTRON BEAM APPLICATION APPARATUS [patent_app_type] => utility [patent_app_number] => 17/676386 [patent_app_country] => US [patent_app_date] => 2022-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5348 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 195 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17676386 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/676386
Electron beam application apparatus Feb 20, 2022 Issued
Array ( [id] => 19582417 [patent_doc_number] => 12148543 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-11-19 [patent_title] => Ion trap loading assembly [patent_app_type] => utility [patent_app_number] => 17/651840 [patent_app_country] => US [patent_app_date] => 2022-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 10872 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 170 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17651840 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/651840
Ion trap loading assembly Feb 20, 2022 Issued
Array ( [id] => 17810760 [patent_doc_number] => 20220262595 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-08-18 [patent_title] => Estimation Model Generation Method and Electron Microscope [patent_app_type] => utility [patent_app_number] => 17/671896 [patent_app_country] => US [patent_app_date] => 2022-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8053 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17671896 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/671896
Estimation model generation method and electron microscope Feb 14, 2022 Issued
Array ( [id] => 18804270 [patent_doc_number] => 11837433 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-12-05 [patent_title] => Method of measuring relative rotational angle and scanning transmission electron microscope [patent_app_type] => utility [patent_app_number] => 17/669503 [patent_app_country] => US [patent_app_date] => 2022-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 25 [patent_no_of_words] => 9814 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 191 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17669503 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/669503
Method of measuring relative rotational angle and scanning transmission electron microscope Feb 10, 2022 Issued
Array ( [id] => 19161025 [patent_doc_number] => 20240153732 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-09 [patent_title] => SYSTEM AND METHOD FOR INSPECTION BY DEFLECTOR CONTROL IN A CHARGED PARTICLE SYSTEM [patent_app_type] => utility [patent_app_number] => 18/281272 [patent_app_country] => US [patent_app_date] => 2022-02-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 18003 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18281272 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/281272
SYSTEM AND METHOD FOR INSPECTION BY DEFLECTOR CONTROL IN A CHARGED PARTICLE SYSTEM Feb 8, 2022 Pending
Array ( [id] => 17954445 [patent_doc_number] => 11480545 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-10-25 [patent_title] => Ion mobility spectrometer and method of analyzing ions [patent_app_type] => utility [patent_app_number] => 17/667165 [patent_app_country] => US [patent_app_date] => 2022-02-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 18 [patent_no_of_words] => 6805 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 188 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17667165 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/667165
Ion mobility spectrometer and method of analyzing ions Feb 7, 2022 Issued
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