
Jason L. Mccormack
Examiner (ID: 17156, Phone: (571)270-1489 , Office: P/2881 )
| Most Active Art Unit | 2881 |
| Art Unit(s) | 2881, 4177 |
| Total Applications | 1362 |
| Issued Applications | 1112 |
| Pending Applications | 114 |
| Abandoned Applications | 166 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 18006244
[patent_doc_number] => 20220365010
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-11-17
[patent_title] => MULTIPLE SECONDARY ELECTRON BEAM ALIGNMENT METHOD, MULTIPLE SECONDARY ELECTRON BEAM ALIGNMENT APPARATUS, AND ELECTRON BEAM INSPECTION APPARATUS
[patent_app_type] => utility
[patent_app_number] => 17/658557
[patent_app_country] => US
[patent_app_date] => 2022-04-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 17027
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -8
[patent_words_short_claim] => 139
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17658557
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/658557 | Multiple secondary electron beam alignment method, multiple secondary electron beam alignment apparatus, and electron beam inspection apparatus | Apr 7, 2022 | Issued |
Array
(
[id] => 19356831
[patent_doc_number] => 12057287
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-08-06
[patent_title] => Methods and systems for aligning a multi-beam system
[patent_app_type] => utility
[patent_app_number] => 17/709025
[patent_app_country] => US
[patent_app_date] => 2022-03-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 13
[patent_no_of_words] => 6399
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 72
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17709025
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/709025 | Methods and systems for aligning a multi-beam system | Mar 29, 2022 | Issued |
Array
(
[id] => 19626981
[patent_doc_number] => 12165830
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-12-10
[patent_title] => Multiple charged-particle beam apparatus with low crosstalk
[patent_app_type] => utility
[patent_app_number] => 17/708517
[patent_app_country] => US
[patent_app_date] => 2022-03-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 17
[patent_no_of_words] => 16840
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 125
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17708517
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/708517 | Multiple charged-particle beam apparatus with low crosstalk | Mar 29, 2022 | Issued |
Array
(
[id] => 20704165
[patent_doc_number] => 12626882
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2026-05-12
[patent_title] => Sample carrier for use in a charged particle microscope, and a method of using such a sample carrier in a charged particle microscope
[patent_app_type] => utility
[patent_app_number] => 17/709391
[patent_app_country] => US
[patent_app_date] => 2022-03-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 9
[patent_no_of_words] => 2484
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 219
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17709391
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/709391 | Sample carrier for use in a charged particle microscope, and a method of using such a sample carrier in a charged particle microscope | Mar 29, 2022 | Issued |
Array
(
[id] => 17985901
[patent_doc_number] => 20220351938
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-11-03
[patent_title] => Charged Particle Beam System
[patent_app_type] => utility
[patent_app_number] => 17/702343
[patent_app_country] => US
[patent_app_date] => 2022-03-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 8896
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -15
[patent_words_short_claim] => 97
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17702343
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/702343 | Charged particle beam system | Mar 22, 2022 | Issued |
Array
(
[id] => 17838896
[patent_doc_number] => 20220276201
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-09-01
[patent_title] => ION MOBILITY SPECTROMETER WITH CENTER ROD
[patent_app_type] => utility
[patent_app_number] => 17/698048
[patent_app_country] => US
[patent_app_date] => 2022-03-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 10329
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -29
[patent_words_short_claim] => 41
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17698048
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/698048 | Ion mobility spectrometer with center rod | Mar 17, 2022 | Issued |
Array
(
[id] => 19487209
[patent_doc_number] => 12106933
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-10-01
[patent_title] => Method to correct first order astigmatism and first order distortion in multi-beam scanning electron microscopes
[patent_app_type] => utility
[patent_app_number] => 17/694549
[patent_app_country] => US
[patent_app_date] => 2022-03-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 9830
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 92
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17694549
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/694549 | Method to correct first order astigmatism and first order distortion in multi-beam scanning electron microscopes | Mar 13, 2022 | Issued |
Array
(
[id] => 18978553
[patent_doc_number] => 11903707
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-02-20
[patent_title] => Enclosed desorption electrospray ionization probes and method of use thereof
[patent_app_type] => utility
[patent_app_number] => 17/692613
[patent_app_country] => US
[patent_app_date] => 2022-03-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
[patent_figures_cnt] => 29
[patent_no_of_words] => 7387
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 129
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17692613
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/692613 | Enclosed desorption electrospray ionization probes and method of use thereof | Mar 10, 2022 | Issued |
Array
(
[id] => 17949166
[patent_doc_number] => 20220336185
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-10-20
[patent_title] => ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY
[patent_app_type] => utility
[patent_app_number] => 17/688339
[patent_app_country] => US
[patent_app_date] => 2022-03-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 14502
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -19
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17688339
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/688339 | Arbitrary electron dose waveforms for electron microscopy | Mar 6, 2022 | Issued |
Array
(
[id] => 19918531
[patent_doc_number] => 12293907
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-05-06
[patent_title] => Physical-chemical property scoring for structure elucidation in ion spectrometry
[patent_app_type] => utility
[patent_app_number] => 17/688470
[patent_app_country] => US
[patent_app_date] => 2022-03-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 1149
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 234
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17688470
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/688470 | Physical-chemical property scoring for structure elucidation in ion spectrometry | Mar 6, 2022 | Issued |
Array
(
[id] => 19219102
[patent_doc_number] => 20240183806
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-06-06
[patent_title] => SYSTEM AND METHOD FOR DETERMINING LOCAL FOCUS POINTS DURING INSPECTION IN A CHARGED PARTICLE SYSTEM
[patent_app_type] => utility
[patent_app_number] => 18/284824
[patent_app_country] => US
[patent_app_date] => 2022-03-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 13114
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 111
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18284824
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/284824 | System and method for determining local focus points during inspection in a charged particle system | Mar 3, 2022 | Issued |
Array
(
[id] => 20718251
[patent_doc_number] => 12633509
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2026-05-19
[patent_title] => Mass spectrometer
[patent_app_type] => utility
[patent_app_number] => 18/290295
[patent_app_country] => US
[patent_app_date] => 2022-03-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 12
[patent_no_of_words] => 2111
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 158
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18290295
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/290295 | Mass spectrometer | Mar 3, 2022 | Issued |
Array
(
[id] => 19063066
[patent_doc_number] => 11942315
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-03-26
[patent_title] => Amplifier amplitude digital control for a mass spectrometer
[patent_app_type] => utility
[patent_app_number] => 17/685516
[patent_app_country] => US
[patent_app_date] => 2022-03-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 11
[patent_no_of_words] => 8134
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 133
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17685516
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/685516 | Amplifier amplitude digital control for a mass spectrometer | Mar 2, 2022 | Issued |
Array
(
[id] => 19183717
[patent_doc_number] => 11990315
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-05-21
[patent_title] => Measurement and correction of optical aberrations in charged particle beam microscopy
[patent_app_type] => utility
[patent_app_number] => 17/683076
[patent_app_country] => US
[patent_app_date] => 2022-02-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 16
[patent_no_of_words] => 10268
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 129
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17683076
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/683076 | Measurement and correction of optical aberrations in charged particle beam microscopy | Feb 27, 2022 | Issued |
Array
(
[id] => 20746758
[patent_doc_number] => 12646680
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2026-06-02
[patent_title] => Focused ion beam system
[patent_app_type] => utility
[patent_app_number] => 18/560013
[patent_app_country] => US
[patent_app_date] => 2022-02-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 8
[patent_no_of_words] => 0
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 271
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18560013
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/560013 | Focused ion beam system | Feb 24, 2022 | Issued |
Array
(
[id] => 18061645
[patent_doc_number] => 20220392732
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-12-08
[patent_title] => CARBON NANOTUBE DEVICE
[patent_app_type] => utility
[patent_app_number] => 17/679652
[patent_app_country] => US
[patent_app_date] => 2022-02-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2518
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -11
[patent_words_short_claim] => 59
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17679652
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/679652 | Carbon nanotube device | Feb 23, 2022 | Issued |
Array
(
[id] => 20883031
[patent_doc_number] => 12699072
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2026-08-04
[patent_title] => Dynamic heating of a differential mobility spectrometer cell
[patent_app_type] => utility
[patent_app_number] => 18/262972
[patent_app_country] => US
[patent_app_date] => 2022-02-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 1208
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 92
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18262972
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/262972 | DYNAMIC HEATING OF A DIFFERENTIAL MOBILITY SPECTROMETER CELL | Feb 22, 2022 | Pending |
Array
(
[id] => 18965218
[patent_doc_number] => 11898975
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-02-13
[patent_title] => Electron spectrometer
[patent_app_type] => utility
[patent_app_number] => 17/652237
[patent_app_country] => US
[patent_app_date] => 2022-02-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 9619
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 81
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17652237
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/652237 | Electron spectrometer | Feb 22, 2022 | Issued |
Array
(
[id] => 19206062
[patent_doc_number] => 20240177961
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-05-30
[patent_title] => ELECTRON BEAM MODULATION DEVICE AND ELECTRON BEAM MODULATION METHOD
[patent_app_type] => utility
[patent_app_number] => 18/284532
[patent_app_country] => US
[patent_app_date] => 2022-02-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 13122
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -15
[patent_words_short_claim] => 113
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18284532
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/284532 | Electron beam modulation device and electron beam modulation method | Feb 21, 2022 | Issued |
Array
(
[id] => 17917402
[patent_doc_number] => 20220319798
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-10-06
[patent_title] => ELECTRON BEAM APPLICATION APPARATUS
[patent_app_type] => utility
[patent_app_number] => 17/676386
[patent_app_country] => US
[patent_app_date] => 2022-02-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5348
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -14
[patent_words_short_claim] => 195
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17676386
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/676386 | Electron beam application apparatus | Feb 20, 2022 | Issued |