Search

Jason L. Mccormack

Examiner (ID: 17156, Phone: (571)270-1489 , Office: P/2881 )

Most Active Art Unit
2881
Art Unit(s)
2881, 4177
Total Applications
1362
Issued Applications
1112
Pending Applications
114
Abandoned Applications
166

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 20389223 [patent_doc_number] => 12488957 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-12-02 [patent_title] => Crenellated sample holder and sputter target for sample preparation in cryo electron microscopy applications [patent_app_type] => utility [patent_app_number] => 18/193545 [patent_app_country] => US [patent_app_date] => 2023-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 22 [patent_no_of_words] => 1167 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 41 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18193545 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/193545
Crenellated sample holder and sputter target for sample preparation in cryo electron microscopy applications Mar 29, 2023 Issued
Array ( [id] => 20995538 [patent_doc_number] => 12744180 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-09-22 [patent_title] => Method and system for analyzing three-dimensional features [patent_app_type] => utility [patent_app_number] => 18/128223 [patent_app_country] => US [patent_app_date] => 2023-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 12 [patent_no_of_words] => 0 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 180 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18128223 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/128223
Method and system for analyzing three-dimensional features Mar 29, 2023 Pending
Array ( [id] => 19137948 [patent_doc_number] => 11972922 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-04-30 [patent_title] => Method for calibrating a scanning charged particle microscope [patent_app_type] => utility [patent_app_number] => 18/126322 [patent_app_country] => US [patent_app_date] => 2023-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 27 [patent_no_of_words] => 16810 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18126322 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/126322
Method for calibrating a scanning charged particle microscope Mar 23, 2023 Issued
Array ( [id] => 19626985 [patent_doc_number] => 12165834 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-12-10 [patent_title] => Method and apparatus for Schottky TFE inspection [patent_app_type] => utility [patent_app_number] => 18/187966 [patent_app_country] => US [patent_app_date] => 2023-03-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 4987 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18187966 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/187966
Method and apparatus for Schottky TFE inspection Mar 21, 2023 Issued
Array ( [id] => 18514538 [patent_doc_number] => 20230230795 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-07-20 [patent_title] => CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD [patent_app_type] => utility [patent_app_number] => 18/123216 [patent_app_country] => US [patent_app_date] => 2023-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 18043 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 16 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18123216 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/123216
Charged particle assessment tool, inspection method Mar 16, 2023 Issued
Array ( [id] => 19972350 [patent_doc_number] => 12340969 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-06-24 [patent_title] => Electron gun and electron microscope [patent_app_type] => utility [patent_app_number] => 18/122388 [patent_app_country] => US [patent_app_date] => 2023-03-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 6038 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 145 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18122388 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/122388
Electron gun and electron microscope Mar 15, 2023 Issued
Array ( [id] => 20204044 [patent_doc_number] => 12406827 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-09-02 [patent_title] => Microscopic specimen and analysis method thereof using microscope [patent_app_type] => utility [patent_app_number] => 18/184761 [patent_app_country] => US [patent_app_date] => 2023-03-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 0 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18184761 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/184761
Microscopic specimen and analysis method thereof using microscope Mar 15, 2023 Issued
Array ( [id] => 18540742 [patent_doc_number] => 20230245852 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-08-03 [patent_title] => MULTIPLE PARTICLE BEAM MICROSCOPE AND ASSOCIATED METHOD WITH FAST AUTOFOCUS AROUND AN ADJUSTABLE WORKING DISTANCE [patent_app_type] => utility [patent_app_number] => 18/185324 [patent_app_country] => US [patent_app_date] => 2023-03-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 43752 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18185324 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/185324
Multiple particle beam microscope and associated method with fast autofocus around an adjustable working distance Mar 15, 2023 Issued
Array ( [id] => 18653012 [patent_doc_number] => 20230298852 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-09-21 [patent_title] => DELAY TIME MEASUREMENT METHOD AND SYSTEM [patent_app_type] => utility [patent_app_number] => 18/120278 [patent_app_country] => US [patent_app_date] => 2023-03-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8343 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18120278 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/120278
Delay time measurement method and system Mar 9, 2023 Issued
Array ( [id] => 18631724 [patent_doc_number] => 20230290629 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-09-14 [patent_title] => High resolution multi-reflection time-of-flight mass analyser [patent_app_type] => utility [patent_app_number] => 18/118461 [patent_app_country] => US [patent_app_date] => 2023-03-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13168 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 359 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18118461 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/118461
High resolution multi-reflection time-of-flight mass analyser Mar 6, 2023 Issued
Array ( [id] => 18472968 [patent_doc_number] => 20230207256 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-29 [patent_title] => READOUT CIRCUIT FOR PIXELIZED ELECTRON DETECTOR [patent_app_type] => utility [patent_app_number] => 18/115712 [patent_app_country] => US [patent_app_date] => 2023-02-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 15600 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 61 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18115712 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/115712
READOUT CIRCUIT FOR PIXELIZED ELECTRON DETECTOR Feb 27, 2023 Pending
Array ( [id] => 18857171 [patent_doc_number] => 11854762 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2023-12-26 [patent_title] => MEMS sample holder, packaged product thereof, and apparatus of charged-particle beam such as electron microscope using the same [patent_app_type] => utility [patent_app_number] => 18/170526 [patent_app_country] => US [patent_app_date] => 2023-02-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 33 [patent_figures_cnt] => 34 [patent_no_of_words] => 4789 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18170526 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/170526
MEMS sample holder, packaged product thereof, and apparatus of charged-particle beam such as electron microscope using the same Feb 15, 2023 Issued
Array ( [id] => 20305325 [patent_doc_number] => 12451322 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-10-21 [patent_title] => Method of forming a multipole device, method of influencing an electron beam, and multipole device [patent_app_type] => utility [patent_app_number] => 18/110284 [patent_app_country] => US [patent_app_date] => 2023-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 4788 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18110284 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/110284
Method of forming a multipole device, method of influencing an electron beam, and multipole device Feb 14, 2023 Issued
Array ( [id] => 18555164 [patent_doc_number] => 20230253181 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-08-10 [patent_title] => Aberration Corrector and Electron Microscope [patent_app_type] => utility [patent_app_number] => 18/107042 [patent_app_country] => US [patent_app_date] => 2023-02-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6865 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18107042 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/107042
Aberration corrector and electron microscope Feb 7, 2023 Issued
Array ( [id] => 18408827 [patent_doc_number] => 20230170180 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-01 [patent_title] => METHODS AND APPARATUSES FOR ADJUSTING BEAM CONDITION OF CHARGED PARTICLES [patent_app_type] => utility [patent_app_number] => 18/102766 [patent_app_country] => US [patent_app_date] => 2023-01-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9080 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18102766 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/102766
Methods and apparatuses for adjusting beam condition of charged particles Jan 29, 2023 Issued
Array ( [id] => 18408828 [patent_doc_number] => 20230170181 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-01 [patent_title] => MULTIPLE PARTICLE BEAM SYSTEM WITH A MIRROR MODE OF OPERATION, METHOD FOR OPERATING A MULTIPLE PARTICLE BEAM SYSTEM WITH A MIRROR MODE OF OPERATION AND ASSOCIATED COMPUTER PROGRAM PRODUCT [patent_app_type] => utility [patent_app_number] => 18/159852 [patent_app_country] => US [patent_app_date] => 2023-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14046 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 461 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18159852 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/159852
Multiple particle beam system with a mirror mode of operation, method for operating a multiple particle beam system with a mirror mode of operation and associated computer program product Jan 25, 2023 Issued
Array ( [id] => 18500440 [patent_doc_number] => 20230223231 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-07-13 [patent_title] => METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELECTRON MICROSCOPY [patent_app_type] => utility [patent_app_number] => 18/159261 [patent_app_country] => US [patent_app_date] => 2023-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14633 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18159261 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/159261
Method, device and system for reducing off-axial aberration in electron microscopy Jan 24, 2023 Issued
Array ( [id] => 19369088 [patent_doc_number] => 12061167 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-08-13 [patent_title] => Desorber for a spectrometer [patent_app_type] => utility [patent_app_number] => 18/153031 [patent_app_country] => US [patent_app_date] => 2023-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 16 [patent_no_of_words] => 15525 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18153031 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/153031
Desorber for a spectrometer Jan 10, 2023 Issued
Array ( [id] => 18857187 [patent_doc_number] => 11854778 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-12-26 [patent_title] => Mass spectrometry imaging with substance identification using ion mobility [patent_app_type] => utility [patent_app_number] => 18/149189 [patent_app_country] => US [patent_app_date] => 2023-01-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 5645 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 215 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18149189 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/149189
Mass spectrometry imaging with substance identification using ion mobility Jan 2, 2023 Issued
Array ( [id] => 18361446 [patent_doc_number] => 20230143037 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-05-11 [patent_title] => SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTEM PROBES [patent_app_type] => utility [patent_app_number] => 18/148647 [patent_app_country] => US [patent_app_date] => 2022-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7811 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18148647 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/148647
SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTEM PROBES Dec 29, 2022 Abandoned
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