Search

Jason L. Mccormack

Examiner (ID: 7907, Phone: (571)270-1489 , Office: P/2881 )

Most Active Art Unit
2881
Art Unit(s)
2881, 4177
Total Applications
1336
Issued Applications
1093
Pending Applications
117
Abandoned Applications
165

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 20088819 [patent_doc_number] => 20250218755 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-07-03 [patent_title] => Micro-Channel Plate Mount Assembly for Ion Detector in Mass Spectrometry [patent_app_type] => utility [patent_app_number] => 18/698956 [patent_app_country] => US [patent_app_date] => 2022-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5042 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18698956 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/698956
Micro-Channel Plate Mount Assembly for Ion Detector in Mass Spectrometry Oct 4, 2022 Pending
Array ( [id] => 19604642 [patent_doc_number] => 20240395522 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-28 [patent_title] => Systems and Methods for Background Ion Detection in Mass Spectrometry [patent_app_type] => utility [patent_app_number] => 18/693311 [patent_app_country] => US [patent_app_date] => 2022-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9325 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18693311 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/693311
Systems and Methods for Background Ion Detection in Mass Spectrometry Sep 18, 2022 Pending
Array ( [id] => 19294467 [patent_doc_number] => 12033830 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-07-09 [patent_title] => Multiple charged-particle beam apparatus with low crosstalk [patent_app_type] => utility [patent_app_number] => 17/944157 [patent_app_country] => US [patent_app_date] => 2022-09-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 12777 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17944157 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/944157
Multiple charged-particle beam apparatus with low crosstalk Sep 12, 2022 Issued
Array ( [id] => 19604647 [patent_doc_number] => 20240395527 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-28 [patent_title] => SYSTEMS AND METHODS FOR FLASH BOILING OF A LIQUID SAMPLE [patent_app_type] => utility [patent_app_number] => 18/689467 [patent_app_country] => US [patent_app_date] => 2022-09-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6455 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18689467 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/689467
SYSTEMS AND METHODS FOR FLASH BOILING OF A LIQUID SAMPLE Sep 8, 2022 Pending
Array ( [id] => 18911275 [patent_doc_number] => 11874251 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-01-16 [patent_title] => Ion mobility spectrometer and method of analyzing ions [patent_app_type] => utility [patent_app_number] => 17/940097 [patent_app_country] => US [patent_app_date] => 2022-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 24 [patent_no_of_words] => 11300 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 303 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17940097 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/940097
Ion mobility spectrometer and method of analyzing ions Sep 7, 2022 Issued
Array ( [id] => 18254805 [patent_doc_number] => 20230081844 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-16 [patent_title] => METHOD FOR PARTICLE BEAM-INDUCED PROCESSING OF A DEFECT OF A MICROLITHOGRAPHIC PHOTOMASK [patent_app_type] => utility [patent_app_number] => 17/940688 [patent_app_country] => US [patent_app_date] => 2022-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12562 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17940688 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/940688
METHOD FOR PARTICLE BEAM-INDUCED PROCESSING OF A DEFECT OF A MICROLITHOGRAPHIC PHOTOMASK Sep 7, 2022 Pending
Array ( [id] => 19951197 [patent_doc_number] => 12322568 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-06-03 [patent_title] => Auto-focus sensor implementation for multi-column microscopes [patent_app_type] => utility [patent_app_number] => 17/930332 [patent_app_country] => US [patent_app_date] => 2022-09-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 3733 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 44 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17930332 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/930332
Auto-focus sensor implementation for multi-column microscopes Sep 6, 2022 Issued
Array ( [id] => 18240680 [patent_doc_number] => 20230072991 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-09 [patent_title] => Charged Particle Beam Device and Image Generation Method [patent_app_type] => utility [patent_app_number] => 17/939309 [patent_app_country] => US [patent_app_date] => 2022-09-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4934 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17939309 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/939309
Charged particle beam device and image generation method Sep 6, 2022 Issued
Array ( [id] => 19626988 [patent_doc_number] => 12165837 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-12-10 [patent_title] => System and method for scanning a sample using multi-beam inspection apparatus [patent_app_type] => utility [patent_app_number] => 17/901767 [patent_app_country] => US [patent_app_date] => 2022-09-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 27 [patent_figures_cnt] => 29 [patent_no_of_words] => 23887 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17901767 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/901767
System and method for scanning a sample using multi-beam inspection apparatus Aug 31, 2022 Issued
Array ( [id] => 19007646 [patent_doc_number] => 20240071717 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-29 [patent_title] => Application Management For Charged Particle Microscope Devices [patent_app_type] => utility [patent_app_number] => 17/823669 [patent_app_country] => US [patent_app_date] => 2022-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 19356 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17823669 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/823669
Application management for charged particle microscope devices Aug 30, 2022 Issued
Array ( [id] => 20305328 [patent_doc_number] => 12451325 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-10-21 [patent_title] => Charged particle beam axial calibration [patent_app_type] => utility [patent_app_number] => 17/897117 [patent_app_country] => US [patent_app_date] => 2022-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 17 [patent_no_of_words] => 5854 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 171 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17897117 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/897117
Charged particle beam axial calibration Aug 25, 2022 Issued
Array ( [id] => 19926168 [patent_doc_number] => 12300461 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-05-13 [patent_title] => Particle beam device, method for operating the particle beam device and computer program product [patent_app_type] => utility [patent_app_number] => 17/822530 [patent_app_country] => US [patent_app_date] => 2022-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3459 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 240 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17822530 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/822530
Particle beam device, method for operating the particle beam device and computer program product Aug 25, 2022 Issued
Array ( [id] => 19934996 [patent_doc_number] => 12308204 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-05-20 [patent_title] => Optical auto-focus unit and a method for auto-focus [patent_app_type] => utility [patent_app_number] => 17/893836 [patent_app_country] => US [patent_app_date] => 2022-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 0 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17893836 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/893836
Optical auto-focus unit and a method for auto-focus Aug 22, 2022 Issued
Array ( [id] => 18061656 [patent_doc_number] => 20220392743 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-08 [patent_title] => CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD [patent_app_type] => utility [patent_app_number] => 17/891983 [patent_app_country] => US [patent_app_date] => 2022-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7445 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17891983 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/891983
CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD Aug 18, 2022 Issued
Array ( [id] => 19515645 [patent_doc_number] => 20240347331 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-17 [patent_title] => INTENSITY-INDEPENDENT PRECURSOR INFERENCE IN MASS SPECTROSCOPY [patent_app_type] => utility [patent_app_number] => 18/682218 [patent_app_country] => US [patent_app_date] => 2022-08-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5411 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18682218 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/682218
INTENSITY-INDEPENDENT PRECURSOR INFERENCE IN MASS SPECTROSCOPY Aug 9, 2022 Pending
Array ( [id] => 18402039 [patent_doc_number] => 11664186 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2023-05-30 [patent_title] => Apparatus of electron beam comprising pinnacle limiting plate and method of reducing electron-electron interaction [patent_app_type] => utility [patent_app_number] => 17/817989 [patent_app_country] => US [patent_app_date] => 2022-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 7287 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17817989 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/817989
Apparatus of electron beam comprising pinnacle limiting plate and method of reducing electron-electron interaction Aug 6, 2022 Issued
Array ( [id] => 19934994 [patent_doc_number] => 12308202 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-05-20 [patent_title] => Multi-electron beam inspection apparatus, multipole array control method, and multi-electron beam inspection method [patent_app_type] => utility [patent_app_number] => 17/817474 [patent_app_country] => US [patent_app_date] => 2022-08-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 20 [patent_no_of_words] => 5844 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 174 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17817474 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/817474
Multi-electron beam inspection apparatus, multipole array control method, and multi-electron beam inspection method Aug 3, 2022 Issued
Array ( [id] => 18061649 [patent_doc_number] => 20220392736 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-08 [patent_title] => REDUCTION OF THERMAL MAGNETIC FIELD NOISE IN TEM CORRECTOR SYSTEMS [patent_app_type] => utility [patent_app_number] => 17/880624 [patent_app_country] => US [patent_app_date] => 2022-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5467 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => 0 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17880624 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/880624
Reduction of thermal magnetic field noise in TEM corrector systems Aug 2, 2022 Issued
Array ( [id] => 20132221 [patent_doc_number] => 12374539 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-07-29 [patent_title] => Interposer with load hole for ion trap [patent_app_type] => utility [patent_app_number] => 17/877261 [patent_app_country] => US [patent_app_date] => 2022-07-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 1224 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17877261 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/877261
Interposer with load hole for ion trap Jul 28, 2022 Issued
Array ( [id] => 18008395 [patent_doc_number] => 20220367162 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-11-17 [patent_title] => SEPARATING IONS IN AN ION TRAP [patent_app_type] => utility [patent_app_number] => 17/869016 [patent_app_country] => US [patent_app_date] => 2022-07-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 21099 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -36 [patent_words_short_claim] => 22 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17869016 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/869016
Separating ions in an ion trap Jul 19, 2022 Issued
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