
Jason L. Mccormack
Examiner (ID: 7907, Phone: (571)270-1489 , Office: P/2881 )
| Most Active Art Unit | 2881 |
| Art Unit(s) | 2881, 4177 |
| Total Applications | 1336 |
| Issued Applications | 1093 |
| Pending Applications | 117 |
| Abandoned Applications | 165 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 20088819
[patent_doc_number] => 20250218755
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-07-03
[patent_title] => Micro-Channel Plate Mount Assembly for Ion Detector in Mass Spectrometry
[patent_app_type] => utility
[patent_app_number] => 18/698956
[patent_app_country] => US
[patent_app_date] => 2022-10-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5042
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -16
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18698956
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/698956 | Micro-Channel Plate Mount Assembly for Ion Detector in Mass Spectrometry | Oct 4, 2022 | Pending |
Array
(
[id] => 19604642
[patent_doc_number] => 20240395522
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-11-28
[patent_title] => Systems and Methods for Background Ion Detection in Mass Spectrometry
[patent_app_type] => utility
[patent_app_number] => 18/693311
[patent_app_country] => US
[patent_app_date] => 2022-09-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 9325
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18693311
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/693311 | Systems and Methods for Background Ion Detection in Mass Spectrometry | Sep 18, 2022 | Pending |
Array
(
[id] => 19294467
[patent_doc_number] => 12033830
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-07-09
[patent_title] => Multiple charged-particle beam apparatus with low crosstalk
[patent_app_type] => utility
[patent_app_number] => 17/944157
[patent_app_country] => US
[patent_app_date] => 2022-09-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 12777
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 98
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17944157
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/944157 | Multiple charged-particle beam apparatus with low crosstalk | Sep 12, 2022 | Issued |
Array
(
[id] => 19604647
[patent_doc_number] => 20240395527
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-11-28
[patent_title] => SYSTEMS AND METHODS FOR FLASH BOILING OF A LIQUID SAMPLE
[patent_app_type] => utility
[patent_app_number] => 18/689467
[patent_app_country] => US
[patent_app_date] => 2022-09-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6455
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18689467
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/689467 | SYSTEMS AND METHODS FOR FLASH BOILING OF A LIQUID SAMPLE | Sep 8, 2022 | Pending |
Array
(
[id] => 18911275
[patent_doc_number] => 11874251
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-01-16
[patent_title] => Ion mobility spectrometer and method of analyzing ions
[patent_app_type] => utility
[patent_app_number] => 17/940097
[patent_app_country] => US
[patent_app_date] => 2022-09-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
[patent_figures_cnt] => 24
[patent_no_of_words] => 11300
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 303
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17940097
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/940097 | Ion mobility spectrometer and method of analyzing ions | Sep 7, 2022 | Issued |
Array
(
[id] => 18254805
[patent_doc_number] => 20230081844
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-03-16
[patent_title] => METHOD FOR PARTICLE BEAM-INDUCED PROCESSING OF A DEFECT OF A MICROLITHOGRAPHIC PHOTOMASK
[patent_app_type] => utility
[patent_app_number] => 17/940688
[patent_app_country] => US
[patent_app_date] => 2022-09-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 12562
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 88
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17940688
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/940688 | METHOD FOR PARTICLE BEAM-INDUCED PROCESSING OF A DEFECT OF A MICROLITHOGRAPHIC PHOTOMASK | Sep 7, 2022 | Pending |
Array
(
[id] => 19951197
[patent_doc_number] => 12322568
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-06-03
[patent_title] => Auto-focus sensor implementation for multi-column microscopes
[patent_app_type] => utility
[patent_app_number] => 17/930332
[patent_app_country] => US
[patent_app_date] => 2022-09-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 8
[patent_no_of_words] => 3733
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 44
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17930332
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/930332 | Auto-focus sensor implementation for multi-column microscopes | Sep 6, 2022 | Issued |
Array
(
[id] => 18240680
[patent_doc_number] => 20230072991
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-03-09
[patent_title] => Charged Particle Beam Device and Image Generation Method
[patent_app_type] => utility
[patent_app_number] => 17/939309
[patent_app_country] => US
[patent_app_date] => 2022-09-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4934
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -5
[patent_words_short_claim] => 137
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17939309
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/939309 | Charged particle beam device and image generation method | Sep 6, 2022 | Issued |
Array
(
[id] => 19626988
[patent_doc_number] => 12165837
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-12-10
[patent_title] => System and method for scanning a sample using multi-beam inspection apparatus
[patent_app_type] => utility
[patent_app_number] => 17/901767
[patent_app_country] => US
[patent_app_date] => 2022-09-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 27
[patent_figures_cnt] => 29
[patent_no_of_words] => 23887
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 197
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17901767
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/901767 | System and method for scanning a sample using multi-beam inspection apparatus | Aug 31, 2022 | Issued |
Array
(
[id] => 19007646
[patent_doc_number] => 20240071717
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-02-29
[patent_title] => Application Management For Charged Particle Microscope Devices
[patent_app_type] => utility
[patent_app_number] => 17/823669
[patent_app_country] => US
[patent_app_date] => 2022-08-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 19356
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 62
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17823669
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/823669 | Application management for charged particle microscope devices | Aug 30, 2022 | Issued |
Array
(
[id] => 20305328
[patent_doc_number] => 12451325
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-10-21
[patent_title] => Charged particle beam axial calibration
[patent_app_type] => utility
[patent_app_number] => 17/897117
[patent_app_country] => US
[patent_app_date] => 2022-08-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 17
[patent_no_of_words] => 5854
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 171
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17897117
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/897117 | Charged particle beam axial calibration | Aug 25, 2022 | Issued |
Array
(
[id] => 19926168
[patent_doc_number] => 12300461
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-05-13
[patent_title] => Particle beam device, method for operating the particle beam device and computer program product
[patent_app_type] => utility
[patent_app_number] => 17/822530
[patent_app_country] => US
[patent_app_date] => 2022-08-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 3459
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 240
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17822530
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/822530 | Particle beam device, method for operating the particle beam device and computer program product | Aug 25, 2022 | Issued |
Array
(
[id] => 19934996
[patent_doc_number] => 12308204
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-05-20
[patent_title] => Optical auto-focus unit and a method for auto-focus
[patent_app_type] => utility
[patent_app_number] => 17/893836
[patent_app_country] => US
[patent_app_date] => 2022-08-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 0
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 139
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17893836
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/893836 | Optical auto-focus unit and a method for auto-focus | Aug 22, 2022 | Issued |
Array
(
[id] => 18061656
[patent_doc_number] => 20220392743
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-12-08
[patent_title] => CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD
[patent_app_type] => utility
[patent_app_number] => 17/891983
[patent_app_country] => US
[patent_app_date] => 2022-08-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7445
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 119
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17891983
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/891983 | CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD | Aug 18, 2022 | Issued |
Array
(
[id] => 19515645
[patent_doc_number] => 20240347331
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-10-17
[patent_title] => INTENSITY-INDEPENDENT PRECURSOR INFERENCE IN MASS SPECTROSCOPY
[patent_app_type] => utility
[patent_app_number] => 18/682218
[patent_app_country] => US
[patent_app_date] => 2022-08-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5411
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 98
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18682218
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/682218 | INTENSITY-INDEPENDENT PRECURSOR INFERENCE IN MASS SPECTROSCOPY | Aug 9, 2022 | Pending |
Array
(
[id] => 18402039
[patent_doc_number] => 11664186
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2023-05-30
[patent_title] => Apparatus of electron beam comprising pinnacle limiting plate and method of reducing electron-electron interaction
[patent_app_type] => utility
[patent_app_number] => 17/817989
[patent_app_country] => US
[patent_app_date] => 2022-08-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 16
[patent_no_of_words] => 7287
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 140
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17817989
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/817989 | Apparatus of electron beam comprising pinnacle limiting plate and method of reducing electron-electron interaction | Aug 6, 2022 | Issued |
Array
(
[id] => 19934994
[patent_doc_number] => 12308202
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-05-20
[patent_title] => Multi-electron beam inspection apparatus, multipole array control method, and multi-electron beam inspection method
[patent_app_type] => utility
[patent_app_number] => 17/817474
[patent_app_country] => US
[patent_app_date] => 2022-08-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 20
[patent_no_of_words] => 5844
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 174
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17817474
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/817474 | Multi-electron beam inspection apparatus, multipole array control method, and multi-electron beam inspection method | Aug 3, 2022 | Issued |
Array
(
[id] => 18061649
[patent_doc_number] => 20220392736
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-12-08
[patent_title] => REDUCTION OF THERMAL MAGNETIC FIELD NOISE IN TEM CORRECTOR SYSTEMS
[patent_app_type] => utility
[patent_app_number] => 17/880624
[patent_app_country] => US
[patent_app_date] => 2022-08-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5467
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => 0
[patent_words_short_claim] => 94
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17880624
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/880624 | Reduction of thermal magnetic field noise in TEM corrector systems | Aug 2, 2022 | Issued |
Array
(
[id] => 20132221
[patent_doc_number] => 12374539
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-07-29
[patent_title] => Interposer with load hole for ion trap
[patent_app_type] => utility
[patent_app_number] => 17/877261
[patent_app_country] => US
[patent_app_date] => 2022-07-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 1224
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 101
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17877261
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/877261 | Interposer with load hole for ion trap | Jul 28, 2022 | Issued |
Array
(
[id] => 18008395
[patent_doc_number] => 20220367162
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-11-17
[patent_title] => SEPARATING IONS IN AN ION TRAP
[patent_app_type] => utility
[patent_app_number] => 17/869016
[patent_app_country] => US
[patent_app_date] => 2022-07-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 21099
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -36
[patent_words_short_claim] => 22
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17869016
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/869016 | Separating ions in an ion trap | Jul 19, 2022 | Issued |