Search

Javier A. Pagan

Examiner (ID: 6416, Phone: (571)270-7719 , Office: P/3788 )

Most Active Art Unit
3735
Art Unit(s)
3788, 3733, 3735
Total Applications
812
Issued Applications
526
Pending Applications
71
Abandoned Applications
242

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4094232 [patent_doc_number] => 06163378 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-12-19 [patent_title] => 'Spectroscopic time integrative correlation for rapid medical diagnostic and universal image analysis' [patent_app_type] => 1 [patent_app_number] => 9/332404 [patent_app_country] => US [patent_app_date] => 1999-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 10 [patent_no_of_words] => 4909 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/163/06163378.pdf [firstpage_image] =>[orig_patent_app_number] => 332404 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/332404
Spectroscopic time integrative correlation for rapid medical diagnostic and universal image analysis Jun 13, 1999 Issued
Array ( [id] => 4244796 [patent_doc_number] => 06118535 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-09-12 [patent_title] => 'In Situ alignment system for phase-shifting point-diffraction interferometry' [patent_app_type] => 1 [patent_app_number] => 9/324903 [patent_app_country] => US [patent_app_date] => 1999-06-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 4677 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/118/06118535.pdf [firstpage_image] =>[orig_patent_app_number] => 324903 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/324903
In Situ alignment system for phase-shifting point-diffraction interferometry Jun 1, 1999 Issued
Array ( [id] => 4375260 [patent_doc_number] => 06192169 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-20 [patent_title] => 'Enclosure for optical integrated circuit' [patent_app_type] => 1 [patent_app_number] => 9/322794 [patent_app_country] => US [patent_app_date] => 1999-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 4047 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 157 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/192/06192169.pdf [firstpage_image] =>[orig_patent_app_number] => 322794 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/322794
Enclosure for optical integrated circuit May 27, 1999 Issued
Array ( [id] => 4143196 [patent_doc_number] => 06147762 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-11-14 [patent_title] => 'Method of spectroscopic investigation of electromagnetic radiation by means of a fourier spectrometer' [patent_app_type] => 1 [patent_app_number] => 9/320705 [patent_app_country] => US [patent_app_date] => 1999-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2475 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 240 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/147/06147762.pdf [firstpage_image] =>[orig_patent_app_number] => 320705 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/320705
Method of spectroscopic investigation of electromagnetic radiation by means of a fourier spectrometer May 26, 1999 Issued
Array ( [id] => 4244115 [patent_doc_number] => 06075602 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-06-13 [patent_title] => 'Method and apparatus for measuring material properties using transient-grating spectroscopy' [patent_app_type] => 1 [patent_app_number] => 9/318322 [patent_app_country] => US [patent_app_date] => 1999-05-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 5605 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/075/06075602.pdf [firstpage_image] =>[orig_patent_app_number] => 318322 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/318322
Method and apparatus for measuring material properties using transient-grating spectroscopy May 24, 1999 Issued
Array ( [id] => 4152997 [patent_doc_number] => 06031616 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-29 [patent_title] => 'Laser pulley alignment system' [patent_app_type] => 1 [patent_app_number] => 9/318543 [patent_app_country] => US [patent_app_date] => 1999-05-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 12 [patent_no_of_words] => 4580 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 212 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/031/06031616.pdf [firstpage_image] =>[orig_patent_app_number] => 318543 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/318543
Laser pulley alignment system May 24, 1999 Issued
Array ( [id] => 4366877 [patent_doc_number] => 06175421 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-16 [patent_title] => 'Method and apparatus for measuring material properties using transient-grating spectroscopy' [patent_app_type] => 1 [patent_app_number] => 9/318323 [patent_app_country] => US [patent_app_date] => 1999-05-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 5609 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 170 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/175/06175421.pdf [firstpage_image] =>[orig_patent_app_number] => 318323 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/318323
Method and apparatus for measuring material properties using transient-grating spectroscopy May 24, 1999 Issued
Array ( [id] => 4207766 [patent_doc_number] => 06014223 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-01-11 [patent_title] => 'Method of determining the impurity concentration of impurity-doped polysilicon in semiconductor wafers' [patent_app_type] => 1 [patent_app_number] => 8/862428 [patent_app_country] => US [patent_app_date] => 1999-05-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2384 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/014/06014223.pdf [firstpage_image] =>[orig_patent_app_number] => 862428 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/862428
Method of determining the impurity concentration of impurity-doped polysilicon in semiconductor wafers May 22, 1999 Issued
Array ( [id] => 4248342 [patent_doc_number] => 06144447 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-11-07 [patent_title] => 'Apparatus for continuously measuring physical and chemical parameters in a fluid flow' [patent_app_type] => 1 [patent_app_number] => 9/316140 [patent_app_country] => US [patent_app_date] => 1999-05-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 1963 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/144/06144447.pdf [firstpage_image] =>[orig_patent_app_number] => 316140 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/316140
Apparatus for continuously measuring physical and chemical parameters in a fluid flow May 20, 1999 Issued
Array ( [id] => 4150845 [patent_doc_number] => 06061134 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-05-09 [patent_title] => 'Modulated Fourier Transform Raman fiber-optic spectroscopy' [patent_app_type] => 1 [patent_app_number] => 9/316176 [patent_app_country] => US [patent_app_date] => 1999-05-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 12 [patent_no_of_words] => 6112 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/061/06061134.pdf [firstpage_image] =>[orig_patent_app_number] => 316176 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/316176
Modulated Fourier Transform Raman fiber-optic spectroscopy May 20, 1999 Issued
Array ( [id] => 4195354 [patent_doc_number] => 06160627 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-12-12 [patent_title] => 'Optical fiber Mach-Zehnder interferometer filter' [patent_app_type] => 1 [patent_app_number] => 9/315998 [patent_app_country] => US [patent_app_date] => 1999-05-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2368 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 215 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/160/06160627.pdf [firstpage_image] =>[orig_patent_app_number] => 315998 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/315998
Optical fiber Mach-Zehnder interferometer filter May 20, 1999 Issued
Array ( [id] => 4263957 [patent_doc_number] => 06208425 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-03-27 [patent_title] => 'Endpoint detector and method for measuring a change in wafer thickness in chemical-mechanical polishing of semiconductor wafers' [patent_app_type] => 1 [patent_app_number] => 9/314594 [patent_app_country] => US [patent_app_date] => 1999-05-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2817 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/208/06208425.pdf [firstpage_image] =>[orig_patent_app_number] => 314594 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/314594
Endpoint detector and method for measuring a change in wafer thickness in chemical-mechanical polishing of semiconductor wafers May 18, 1999 Issued
Array ( [id] => 4244100 [patent_doc_number] => 06075601 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-06-13 [patent_title] => 'Optical probe calibration apparatus and method' [patent_app_type] => 1 [patent_app_number] => 9/309998 [patent_app_country] => US [patent_app_date] => 1999-05-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 19 [patent_no_of_words] => 6898 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/075/06075601.pdf [firstpage_image] =>[orig_patent_app_number] => 309998 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/309998
Optical probe calibration apparatus and method May 10, 1999 Issued
Array ( [id] => 4314974 [patent_doc_number] => 06188477 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-13 [patent_title] => 'Optical polarization sensing apparatus and method' [patent_app_type] => 1 [patent_app_number] => 9/305116 [patent_app_country] => US [patent_app_date] => 1999-05-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 4295 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/188/06188477.pdf [firstpage_image] =>[orig_patent_app_number] => 305116 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/305116
Optical polarization sensing apparatus and method May 3, 1999 Issued
Array ( [id] => 4115042 [patent_doc_number] => 06023334 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-08 [patent_title] => 'Method and apparatus for detecting minute irregularities on the surface of an object' [patent_app_type] => 1 [patent_app_number] => 9/299762 [patent_app_country] => US [patent_app_date] => 1999-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 42 [patent_no_of_words] => 12223 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/023/06023334.pdf [firstpage_image] =>[orig_patent_app_number] => 299762 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/299762
Method and apparatus for detecting minute irregularities on the surface of an object Apr 26, 1999 Issued
Array ( [id] => 4114758 [patent_doc_number] => 06100978 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-08 [patent_title] => 'Dual-domain point diffraction interferometer' [patent_app_type] => 1 [patent_app_number] => 9/300539 [patent_app_country] => US [patent_app_date] => 1999-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 18 [patent_no_of_words] => 8609 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 202 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/100/06100978.pdf [firstpage_image] =>[orig_patent_app_number] => 300539 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/300539
Dual-domain point diffraction interferometer Apr 26, 1999 Issued
Array ( [id] => 4214706 [patent_doc_number] => 06078397 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-06-20 [patent_title] => 'Method and apparatus for mapping the wall thickness of tubes during production' [patent_app_type] => 1 [patent_app_number] => 9/294208 [patent_app_country] => US [patent_app_date] => 1999-04-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 4791 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/078/06078397.pdf [firstpage_image] =>[orig_patent_app_number] => 294208 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/294208
Method and apparatus for mapping the wall thickness of tubes during production Apr 19, 1999 Issued
Array ( [id] => 4315030 [patent_doc_number] => 06188481 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-13 [patent_title] => 'Spatial interferometry' [patent_app_type] => 1 [patent_app_number] => 9/202947 [patent_app_country] => US [patent_app_date] => 1999-04-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 12 [patent_no_of_words] => 5519 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 24 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/188/06188481.pdf [firstpage_image] =>[orig_patent_app_number] => 202947 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/202947
Spatial interferometry Apr 15, 1999 Issued
Array ( [id] => 4084626 [patent_doc_number] => 05966215 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1999-10-12 [patent_title] => 'Line width insensitive wafer target detection in two directions' [patent_app_type] => 1 [patent_app_number] => 9/290217 [patent_app_country] => US [patent_app_date] => 1999-04-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 15 [patent_no_of_words] => 4027 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/966/05966215.pdf [firstpage_image] =>[orig_patent_app_number] => 290217 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/290217
Line width insensitive wafer target detection in two directions Apr 12, 1999 Issued
Array ( [id] => 4138019 [patent_doc_number] => 06128083 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-10-03 [patent_title] => 'Displacement measuring apparatus' [patent_app_type] => 1 [patent_app_number] => 9/287046 [patent_app_country] => US [patent_app_date] => 1999-04-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5909 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 289 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/128/06128083.pdf [firstpage_image] =>[orig_patent_app_number] => 287046 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/287046
Displacement measuring apparatus Apr 5, 1999 Issued
Menu