
Jeff William Natalini
Examiner (ID: 8453, Phone: (571)272-2266 , Office: P/2868 )
| Most Active Art Unit | 2858 |
| Art Unit(s) | 2858, 2831, 2868, 2896, 2818 |
| Total Applications | 1032 |
| Issued Applications | 816 |
| Pending Applications | 11 |
| Abandoned Applications | 214 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 7344080
[patent_doc_number] => 20040046544
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-03-11
[patent_title] => 'Inserting carriage for measuring and/or analytical device'
[patent_app_type] => new
[patent_app_number] => 10/433288
[patent_app_country] => US
[patent_app_date] => 2003-06-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0046/20040046544.pdf
[firstpage_image] =>[orig_patent_app_number] => 10433288
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/433288 | Inserting carriage for measuring and/or analytical device | Jun 1, 2003 | Abandoned |
Array
(
[id] => 988492
[patent_doc_number] => 06922047
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-07-26
[patent_title] => 'Startup/yank circuit for self-biased phase-locked loops'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/446838 | Startup/yank circuit for self-biased phase-locked loops | May 28, 2003 | Issued |
Array
(
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[patent_title] => 'Capacitance type sensor and method for manufacturing same'
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Array
(
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[patent_title] => 'Device for the recognition of residual synchronization errors of multiple slats of flaps placed next to each other in aircraft'
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Array
(
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[patent_title] => 'Non-destructive determination of machining induced surface defects on metal parts'
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Array
(
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[patent_title] => 'Traction motor fault detection system'
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Array
(
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[patent_title] => 'Method and system for measuring thickness of thin films with automatic stabilization of measurement accuracy'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/434625 | Method and system for measuring thickness of thin films with automatic stabilization of measurement accuracy | May 11, 2003 | Abandoned |
Array
(
[id] => 6768370
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[patent_title] => 'Planar capacitive transducer'
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/427473 | Apparatus and methods for measuring resistance of conductive layers | Apr 29, 2003 | Issued |
Array
(
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[patent_title] => 'Test instrument for arc fault circuit interrupters'
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Array
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Array
(
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Array
(
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Array
(
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Array
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Array
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