Search

Jennifer R. Sadula

Examiner (ID: 13881)

Most Active Art Unit
1756
Art Unit(s)
3734, 1756, 3763, 3306
Total Applications
298
Issued Applications
226
Pending Applications
41
Abandoned Applications
31

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 3521266 [patent_doc_number] => 05486772 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-01-23 [patent_title] => 'Reliability test method for semiconductor trench devices' [patent_app_type] => 1 [patent_app_number] => 8/268755 [patent_app_country] => US [patent_app_date] => 1994-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2666 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/486/05486772.pdf [firstpage_image] =>[orig_patent_app_number] => 268755 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/268755
Reliability test method for semiconductor trench devices Jun 29, 1994 Issued
08/269176 HIGH-TEMPERATURE SUPERCONDUCTING THIN FILM NONBOLOMETRIC MICROWAVE DETECTION SYSTEM AND METHOD Jun 29, 1994 Abandoned
Array ( [id] => 3424238 [patent_doc_number] => 05479095 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-12-26 [patent_title] => 'Method and apparatus for measurement of AC and DC electrical current' [patent_app_type] => 1 [patent_app_number] => 8/269145 [patent_app_country] => US [patent_app_date] => 1994-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 2584 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/479/05479095.pdf [firstpage_image] =>[orig_patent_app_number] => 269145 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/269145
Method and apparatus for measurement of AC and DC electrical current Jun 29, 1994 Issued
Array ( [id] => 3521237 [patent_doc_number] => 05486770 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-01-23 [patent_title] => 'High frequency wafer probe apparatus and method' [patent_app_type] => 1 [patent_app_number] => 8/265876 [patent_app_country] => US [patent_app_date] => 1994-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 3707 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 188 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/486/05486770.pdf [firstpage_image] =>[orig_patent_app_number] => 265876 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/265876
High frequency wafer probe apparatus and method Jun 26, 1994 Issued
08/265853 PROBING ADAPTER FOR TESTING IC PACKAGES Jun 26, 1994 Abandoned
Array ( [id] => 3557945 [patent_doc_number] => 05493236 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-02-20 [patent_title] => 'Test analysis apparatus and analysis method for semiconductor wafer using OBIC analysis' [patent_app_type] => 1 [patent_app_number] => 8/264718 [patent_app_country] => US [patent_app_date] => 1994-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 11 [patent_no_of_words] => 6134 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 161 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/493/05493236.pdf [firstpage_image] =>[orig_patent_app_number] => 264718 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/264718
Test analysis apparatus and analysis method for semiconductor wafer using OBIC analysis Jun 22, 1994 Issued
Array ( [id] => 3581105 [patent_doc_number] => 05523701 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-06-04 [patent_title] => 'Method and apparatus for monitoring machine performance' [patent_app_type] => 1 [patent_app_number] => 8/263344 [patent_app_country] => US [patent_app_date] => 1994-06-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 2897 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/523/05523701.pdf [firstpage_image] =>[orig_patent_app_number] => 263344 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/263344
Method and apparatus for monitoring machine performance Jun 20, 1994 Issued
Array ( [id] => 3497643 [patent_doc_number] => 05537052 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-07-16 [patent_title] => 'System and method for executing on board diagnostics and maintaining an event history on a circuit board' [patent_app_type] => 1 [patent_app_number] => 8/261817 [patent_app_country] => US [patent_app_date] => 1994-06-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3405 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/537/05537052.pdf [firstpage_image] =>[orig_patent_app_number] => 261817 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/261817
System and method for executing on board diagnostics and maintaining an event history on a circuit board Jun 16, 1994 Issued
Array ( [id] => 3499868 [patent_doc_number] => 05508632 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-16 [patent_title] => 'Method of simulating hot carrier deterioration of an MOS transistor' [patent_app_type] => 1 [patent_app_number] => 8/262112 [patent_app_country] => US [patent_app_date] => 1994-06-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 20 [patent_no_of_words] => 5813 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 290 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/508/05508632.pdf [firstpage_image] =>[orig_patent_app_number] => 262112 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/262112
Method of simulating hot carrier deterioration of an MOS transistor Jun 16, 1994 Issued
Array ( [id] => 3562368 [patent_doc_number] => 05502373 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-03-26 [patent_title] => 'Magneto-optical current measurement apparatus' [patent_app_type] => 1 [patent_app_number] => 8/260138 [patent_app_country] => US [patent_app_date] => 1994-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 2825 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 234 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/502/05502373.pdf [firstpage_image] =>[orig_patent_app_number] => 260138 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/260138
Magneto-optical current measurement apparatus Jun 14, 1994 Issued
08/260012 PROBE APPARATUS AND METHOD FOR INSPECTING OBJECT USING THE PROBE APPARATUS Jun 14, 1994 Abandoned
Array ( [id] => 3462745 [patent_doc_number] => 05473261 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-12-05 [patent_title] => 'Inspection apparatus and method for display device' [patent_app_type] => 1 [patent_app_number] => 8/255917 [patent_app_country] => US [patent_app_date] => 1994-06-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 18 [patent_no_of_words] => 7994 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 213 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/473/05473261.pdf [firstpage_image] =>[orig_patent_app_number] => 255917 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/255917
Inspection apparatus and method for display device Jun 6, 1994 Issued
Array ( [id] => 3466616 [patent_doc_number] => 05469050 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-11-21 [patent_title] => 'High-voltage measurement device' [patent_app_type] => 1 [patent_app_number] => 8/240721 [patent_app_country] => US [patent_app_date] => 1994-06-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 2093 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/469/05469050.pdf [firstpage_image] =>[orig_patent_app_number] => 240721 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/240721
High-voltage measurement device Jun 6, 1994 Issued
Array ( [id] => 3619675 [patent_doc_number] => 05510724 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-23 [patent_title] => 'Probe apparatus and burn-in apparatus' [patent_app_type] => 1 [patent_app_number] => 8/251365 [patent_app_country] => US [patent_app_date] => 1994-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 13976 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 195 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/510/05510724.pdf [firstpage_image] =>[orig_patent_app_number] => 251365 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/251365
Probe apparatus and burn-in apparatus May 30, 1994 Issued
Array ( [id] => 3557958 [patent_doc_number] => 05493237 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-02-20 [patent_title] => 'Integrated circuit chip testing apparatus' [patent_app_type] => 1 [patent_app_number] => 8/250267 [patent_app_country] => US [patent_app_date] => 1994-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1864 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 219 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/493/05493237.pdf [firstpage_image] =>[orig_patent_app_number] => 250267 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/250267
Integrated circuit chip testing apparatus May 26, 1994 Issued
08/244181 OPTICAL RF SENSOR FOR MEASURING VOLTAGE AND ELECTRIC FIELD May 23, 1994 Abandoned
Array ( [id] => 3522698 [patent_doc_number] => 05506510 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-09 [patent_title] => 'Adaptive alignment probe fixture for circuit board tester' [patent_app_type] => 1 [patent_app_number] => 8/245477 [patent_app_country] => US [patent_app_date] => 1994-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5102 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 184 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/506/05506510.pdf [firstpage_image] =>[orig_patent_app_number] => 245477 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/245477
Adaptive alignment probe fixture for circuit board tester May 17, 1994 Issued
Array ( [id] => 3487921 [patent_doc_number] => 05446371 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-08-29 [patent_title] => 'Precision analog-to-digital converter with low-resolution and high-resolution conversion paths' [patent_app_type] => 1 [patent_app_number] => 8/241835 [patent_app_country] => US [patent_app_date] => 1994-05-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 3545 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 241 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/446/05446371.pdf [firstpage_image] =>[orig_patent_app_number] => 241835 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/241835
Precision analog-to-digital converter with low-resolution and high-resolution conversion paths May 11, 1994 Issued
Array ( [id] => 3499800 [patent_doc_number] => 05508627 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-16 [patent_title] => 'Photon assisted sub-tunneling electrical probe, probe tip, and probing method' [patent_app_type] => 1 [patent_app_number] => 8/240993 [patent_app_country] => US [patent_app_date] => 1994-05-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2599 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 60 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/508/05508627.pdf [firstpage_image] =>[orig_patent_app_number] => 240993 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/240993
Photon assisted sub-tunneling electrical probe, probe tip, and probing method May 10, 1994 Issued
Array ( [id] => 3501830 [patent_doc_number] => 05532581 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-07-02 [patent_title] => 'Connector for measuring apparatus' [patent_app_type] => 1 [patent_app_number] => 8/240422 [patent_app_country] => US [patent_app_date] => 1994-05-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 4121 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 211 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/532/05532581.pdf [firstpage_image] =>[orig_patent_app_number] => 240422 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/240422
Connector for measuring apparatus May 9, 1994 Issued
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