| Application number | Title of the application | Filing Date | Status |
|---|
Array
(
[id] => 3521266
[patent_doc_number] => 05486772
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-01-23
[patent_title] => 'Reliability test method for semiconductor trench devices'
[patent_app_type] => 1
[patent_app_number] => 8/268755
[patent_app_country] => US
[patent_app_date] => 1994-06-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[pdf_file] => patents/05/486/05486772.pdf
[firstpage_image] =>[orig_patent_app_number] => 268755
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/268755 | Reliability test method for semiconductor trench devices | Jun 29, 1994 | Issued |
| 08/269176 | HIGH-TEMPERATURE SUPERCONDUCTING THIN FILM NONBOLOMETRIC MICROWAVE DETECTION SYSTEM AND METHOD | Jun 29, 1994 | Abandoned |
Array
(
[id] => 3424238
[patent_doc_number] => 05479095
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-12-26
[patent_title] => 'Method and apparatus for measurement of AC and DC electrical current'
[patent_app_type] => 1
[patent_app_number] => 8/269145
[patent_app_country] => US
[patent_app_date] => 1994-06-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/479/05479095.pdf
[firstpage_image] =>[orig_patent_app_number] => 269145
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/269145 | Method and apparatus for measurement of AC and DC electrical current | Jun 29, 1994 | Issued |
Array
(
[id] => 3521237
[patent_doc_number] => 05486770
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-01-23
[patent_title] => 'High frequency wafer probe apparatus and method'
[patent_app_type] => 1
[patent_app_number] => 8/265876
[patent_app_country] => US
[patent_app_date] => 1994-06-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 8
[patent_no_of_words] => 3707
[patent_no_of_claims] => 6
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[patent_words_short_claim] => 188
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/486/05486770.pdf
[firstpage_image] =>[orig_patent_app_number] => 265876
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/265876 | High frequency wafer probe apparatus and method | Jun 26, 1994 | Issued |
| 08/265853 | PROBING ADAPTER FOR TESTING IC PACKAGES | Jun 26, 1994 | Abandoned |
Array
(
[id] => 3557945
[patent_doc_number] => 05493236
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-02-20
[patent_title] => 'Test analysis apparatus and analysis method for semiconductor wafer using OBIC analysis'
[patent_app_type] => 1
[patent_app_number] => 8/264718
[patent_app_country] => US
[patent_app_date] => 1994-06-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 11
[patent_no_of_words] => 6134
[patent_no_of_claims] => 7
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[pdf_file] => patents/05/493/05493236.pdf
[firstpage_image] =>[orig_patent_app_number] => 264718
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/264718 | Test analysis apparatus and analysis method for semiconductor wafer using OBIC analysis | Jun 22, 1994 | Issued |
Array
(
[id] => 3581105
[patent_doc_number] => 05523701
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-06-04
[patent_title] => 'Method and apparatus for monitoring machine performance'
[patent_app_type] => 1
[patent_app_number] => 8/263344
[patent_app_country] => US
[patent_app_date] => 1994-06-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[patent_no_of_words] => 2897
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[pdf_file] => patents/05/523/05523701.pdf
[firstpage_image] =>[orig_patent_app_number] => 263344
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/263344 | Method and apparatus for monitoring machine performance | Jun 20, 1994 | Issued |
Array
(
[id] => 3497643
[patent_doc_number] => 05537052
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-07-16
[patent_title] => 'System and method for executing on board diagnostics and maintaining an event history on a circuit board'
[patent_app_type] => 1
[patent_app_number] => 8/261817
[patent_app_country] => US
[patent_app_date] => 1994-06-17
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[pdf_file] => patents/05/537/05537052.pdf
[firstpage_image] =>[orig_patent_app_number] => 261817
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/261817 | System and method for executing on board diagnostics and maintaining an event history on a circuit board | Jun 16, 1994 | Issued |
Array
(
[id] => 3499868
[patent_doc_number] => 05508632
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-04-16
[patent_title] => 'Method of simulating hot carrier deterioration of an MOS transistor'
[patent_app_type] => 1
[patent_app_number] => 8/262112
[patent_app_country] => US
[patent_app_date] => 1994-06-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 20
[patent_no_of_words] => 5813
[patent_no_of_claims] => 14
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[pdf_file] => patents/05/508/05508632.pdf
[firstpage_image] =>[orig_patent_app_number] => 262112
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/262112 | Method of simulating hot carrier deterioration of an MOS transistor | Jun 16, 1994 | Issued |
Array
(
[id] => 3562368
[patent_doc_number] => 05502373
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-03-26
[patent_title] => 'Magneto-optical current measurement apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/260138
[patent_app_country] => US
[patent_app_date] => 1994-06-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 2
[patent_no_of_words] => 2825
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 234
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/502/05502373.pdf
[firstpage_image] =>[orig_patent_app_number] => 260138
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/260138 | Magneto-optical current measurement apparatus | Jun 14, 1994 | Issued |
| 08/260012 | PROBE APPARATUS AND METHOD FOR INSPECTING OBJECT USING THE PROBE APPARATUS | Jun 14, 1994 | Abandoned |
Array
(
[id] => 3462745
[patent_doc_number] => 05473261
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-12-05
[patent_title] => 'Inspection apparatus and method for display device'
[patent_app_type] => 1
[patent_app_number] => 8/255917
[patent_app_country] => US
[patent_app_date] => 1994-06-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
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[pdf_file] => patents/05/473/05473261.pdf
[firstpage_image] =>[orig_patent_app_number] => 255917
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/255917 | Inspection apparatus and method for display device | Jun 6, 1994 | Issued |
Array
(
[id] => 3466616
[patent_doc_number] => 05469050
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-11-21
[patent_title] => 'High-voltage measurement device'
[patent_app_type] => 1
[patent_app_number] => 8/240721
[patent_app_country] => US
[patent_app_date] => 1994-06-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
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[pdf_file] => patents/05/469/05469050.pdf
[firstpage_image] =>[orig_patent_app_number] => 240721
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/240721 | High-voltage measurement device | Jun 6, 1994 | Issued |
Array
(
[id] => 3619675
[patent_doc_number] => 05510724
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-04-23
[patent_title] => 'Probe apparatus and burn-in apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/251365
[patent_app_country] => US
[patent_app_date] => 1994-05-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
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[patent_no_of_words] => 13976
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/510/05510724.pdf
[firstpage_image] =>[orig_patent_app_number] => 251365
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/251365 | Probe apparatus and burn-in apparatus | May 30, 1994 | Issued |
Array
(
[id] => 3557958
[patent_doc_number] => 05493237
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-02-20
[patent_title] => 'Integrated circuit chip testing apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/250267
[patent_app_country] => US
[patent_app_date] => 1994-05-27
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/493/05493237.pdf
[firstpage_image] =>[orig_patent_app_number] => 250267
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/250267 | Integrated circuit chip testing apparatus | May 26, 1994 | Issued |
| 08/244181 | OPTICAL RF SENSOR FOR MEASURING VOLTAGE AND ELECTRIC FIELD | May 23, 1994 | Abandoned |
Array
(
[id] => 3522698
[patent_doc_number] => 05506510
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-04-09
[patent_title] => 'Adaptive alignment probe fixture for circuit board tester'
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[patent_app_country] => US
[patent_app_date] => 1994-05-18
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[pdf_file] => patents/05/506/05506510.pdf
[firstpage_image] =>[orig_patent_app_number] => 245477
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/245477 | Adaptive alignment probe fixture for circuit board tester | May 17, 1994 | Issued |
Array
(
[id] => 3487921
[patent_doc_number] => 05446371
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-08-29
[patent_title] => 'Precision analog-to-digital converter with low-resolution and high-resolution conversion paths'
[patent_app_type] => 1
[patent_app_number] => 8/241835
[patent_app_country] => US
[patent_app_date] => 1994-05-12
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/446/05446371.pdf
[firstpage_image] =>[orig_patent_app_number] => 241835
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/241835 | Precision analog-to-digital converter with low-resolution and high-resolution conversion paths | May 11, 1994 | Issued |
Array
(
[id] => 3499800
[patent_doc_number] => 05508627
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-04-16
[patent_title] => 'Photon assisted sub-tunneling electrical probe, probe tip, and probing method'
[patent_app_type] => 1
[patent_app_number] => 8/240993
[patent_app_country] => US
[patent_app_date] => 1994-05-11
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[pdf_file] => patents/05/508/05508627.pdf
[firstpage_image] =>[orig_patent_app_number] => 240993
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/240993 | Photon assisted sub-tunneling electrical probe, probe tip, and probing method | May 10, 1994 | Issued |
Array
(
[id] => 3501830
[patent_doc_number] => 05532581
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-07-02
[patent_title] => 'Connector for measuring apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/240422
[patent_app_country] => US
[patent_app_date] => 1994-05-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[pdf_file] => patents/05/532/05532581.pdf
[firstpage_image] =>[orig_patent_app_number] => 240422
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/240422 | Connector for measuring apparatus | May 9, 1994 | Issued |