![](/images/general/no_picture/200_user.png)
Jennifer Wecker
Examiner (ID: 1325, Phone: (571)270-1109 , Office: P/1797 )
Most Active Art Unit | 1797 |
Art Unit(s) | 1772, 1797, 1779, 4172 |
Total Applications | 1000 |
Issued Applications | 753 |
Pending Applications | 59 |
Abandoned Applications | 188 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 3795793
[patent_doc_number] => 05737085
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[patent_kind] => NA
[patent_issue_date] => 1998-04-07
[patent_title] => 'Precision optical displacement measurement system'
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[patent_app_number] => 8/822556
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[patent_app_date] => 1997-03-19
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Array
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[patent_issue_date] => 2000-04-11
[patent_title] => 'Method and apparatus for three dimensional imaging using multi-phased structured light'
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Array
(
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[patent_issue_date] => 2000-05-16
[patent_title] => 'Pattern inspection method and system'
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Array
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[patent_issue_date] => 1998-09-15
[patent_title] => 'Device for measuring feeble light and method thereof'
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[patent_app_date] => 1997-02-24
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Array
(
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[patent_issue_date] => 1998-12-15
[patent_title] => 'Method for manufacturing a semiconductor device'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/804398 | Method for manufacturing a semiconductor device | Feb 20, 1997 | Issued |
08/802546 | PHOTOMETRY DEVICE AND CAMERA | Feb 17, 1997 | Abandoned |
Array
(
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[patent_doc_number] => 05790255
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[patent_issue_date] => 1998-08-04
[patent_title] => 'Transparent light beam detectors'
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Array
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Array
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[patent_issue_date] => 1999-11-16
[patent_title] => 'Alignment method and alignment system'
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[pdf_file] => patents/05/986/05986766.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/796556 | Alignment method and alignment system | Feb 5, 1997 | Issued |
Array
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[id] => 3889310
[patent_doc_number] => 05748323
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[patent_issue_date] => 1998-05-05
[patent_title] => 'Method and apparatus for wafer-focusing'
[patent_app_type] => 1
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Array
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[id] => 3795217
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[patent_issue_date] => 1998-10-13
[patent_title] => 'Systems and methods for optically measuring properties of hydrocarbon fuel gases'
[patent_app_type] => 1
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Array
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[patent_issue_date] => 1998-09-22
[patent_title] => 'Method and device for measuring the thickness of opaque and transparent films'
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Array
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[patent_title] => 'Resonant-cavity apparatus for cytometry or particle analysis'
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Array
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Array
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Array
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Array
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Array
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Array
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Array
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