
Jermele M. Hollington
Examiner (ID: 6714)
| Most Active Art Unit | 2858 |
| Art Unit(s) | 2858, 2829 |
| Total Applications | 1683 |
| Issued Applications | 1433 |
| Pending Applications | 93 |
| Abandoned Applications | 186 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 18593146
[patent_doc_number] => 11742055
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-08-29
[patent_title] => Carrier based high volume system level testing of devices with pop structures
[patent_app_type] => utility
[patent_app_number] => 17/984127
[patent_app_country] => US
[patent_app_date] => 2022-11-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 11
[patent_no_of_words] => 9114
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 229
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17984127
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/984127 | Carrier based high volume system level testing of devices with pop structures | Nov 8, 2022 | Issued |
Array
(
[id] => 19702784
[patent_doc_number] => 12196804
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-01-14
[patent_title] => System for scan mode exit and methods for scan mode exit
[patent_app_type] => utility
[patent_app_number] => 18/053411
[patent_app_country] => US
[patent_app_date] => 2022-11-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 5837
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 217
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18053411
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/053411 | System for scan mode exit and methods for scan mode exit | Nov 7, 2022 | Issued |
Array
(
[id] => 18212140
[patent_doc_number] => 20230058404
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-02-23
[patent_title] => CAPACITANCE DETECTION DEVICE AND INPUT DEVICE
[patent_app_type] => utility
[patent_app_number] => 17/980332
[patent_app_country] => US
[patent_app_date] => 2022-11-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 11948
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -10
[patent_words_short_claim] => 163
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17980332
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/980332 | Capacitance detection device and input device | Nov 2, 2022 | Issued |
Array
(
[id] => 18208084
[patent_doc_number] => 20230054342
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-02-23
[patent_title] => MODELLING AND PREDICTION OF VIRTUAL INLINE QUALITY CONTROL IN THE PRODUCTION OF MEMORY DEVICES
[patent_app_type] => utility
[patent_app_number] => 17/979142
[patent_app_country] => US
[patent_app_date] => 2022-11-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 15063
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 149
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17979142
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/979142 | Modelling and prediction of virtual inline quality control in the production of memory devices | Nov 1, 2022 | Issued |
Array
(
[id] => 19978281
[patent_doc_number] => 12345755
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-07-01
[patent_title] => Reverse recovery measurements and plots
[patent_app_type] => utility
[patent_app_number] => 17/976644
[patent_app_country] => US
[patent_app_date] => 2022-10-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
[patent_figures_cnt] => 17
[patent_no_of_words] => 1155
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 170
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17976644
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/976644 | Reverse recovery measurements and plots | Oct 27, 2022 | Issued |
Array
(
[id] => 20174082
[patent_doc_number] => 12392823
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-08-19
[patent_title] => Systems and methods for on-chip noise measurements
[patent_app_type] => utility
[patent_app_number] => 17/970853
[patent_app_country] => US
[patent_app_date] => 2022-10-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3256
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 122
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17970853
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/970853 | Systems and methods for on-chip noise measurements | Oct 20, 2022 | Issued |
Array
(
[id] => 18795029
[patent_doc_number] => 11828795
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2023-11-28
[patent_title] => Test system with a thermal head comprising a plurality of adapters for independent thermal control of zones
[patent_app_type] => utility
[patent_app_number] => 18/048833
[patent_app_country] => US
[patent_app_date] => 2022-10-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
[patent_figures_cnt] => 30
[patent_no_of_words] => 21368
[patent_no_of_claims] => 31
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 127
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18048833
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/048833 | Test system with a thermal head comprising a plurality of adapters for independent thermal control of zones | Oct 20, 2022 | Issued |
Array
(
[id] => 19382349
[patent_doc_number] => 20240272219
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-08-15
[patent_title] => Insulation Resistance Measuring Device and Battery System Including the Same
[patent_app_type] => utility
[patent_app_number] => 18/564693
[patent_app_country] => US
[patent_app_date] => 2022-10-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7626
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -8
[patent_words_short_claim] => 146
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18564693
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/564693 | Insulation Resistance Measuring Device and Battery System Including the Same | Oct 18, 2022 | Pending |
Array
(
[id] => 19086448
[patent_doc_number] => 20240113249
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-04-04
[patent_title] => REPAIR METHOD FOR SEALING THE BACK OF PHOTOVOLTAIC MODULES
[patent_app_type] => utility
[patent_app_number] => 17/957187
[patent_app_country] => US
[patent_app_date] => 2022-09-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 1643
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => 0
[patent_words_short_claim] => 512
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17957187
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/957187 | Repair method for sealing the back of photovoltaic modules | Sep 29, 2022 | Issued |
Array
(
[id] => 19587680
[patent_doc_number] => 20240385237
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-11-21
[patent_title] => DEVICE AND THERMAL TESTER FOR THERMAL TESTING DIES OF AN INTEGRATED CIRCUIT
[patent_app_type] => utility
[patent_app_number] => 18/694192
[patent_app_country] => US
[patent_app_date] => 2022-09-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3682
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -28
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18694192
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/694192 | DEVICE AND THERMAL TESTER FOR THERMAL TESTING DIES OF AN INTEGRATED CIRCUIT | Sep 20, 2022 | Pending |
Array
(
[id] => 18392731
[patent_doc_number] => 20230160951
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-05-25
[patent_title] => Method for Locating Open Circuit Failure Point of Test Structure
[patent_app_type] => utility
[patent_app_number] => 17/896336
[patent_app_country] => US
[patent_app_date] => 2022-08-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5101
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 346
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17896336
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/896336 | Method for locating open circuit failure point of test structure | Aug 25, 2022 | Issued |
Array
(
[id] => 18062171
[patent_doc_number] => 20220393258
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-12-08
[patent_title] => LITHIUM-ION BATTERY IMPENDING FAILURE DETECTION
[patent_app_type] => utility
[patent_app_number] => 17/892622
[patent_app_country] => US
[patent_app_date] => 2022-08-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5295
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 161
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17892622
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/892622 | Lithium-ion battery impending failure detection | Aug 21, 2022 | Issued |
Array
(
[id] => 19250270
[patent_doc_number] => 20240201259
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-06-20
[patent_title] => TEST BUTTON LOOP DEVICE AND CIRCUIT BREAKER
[patent_app_type] => utility
[patent_app_number] => 18/557214
[patent_app_country] => US
[patent_app_date] => 2022-08-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4518
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -11
[patent_words_short_claim] => 172
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18557214
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/557214 | TEST BUTTON LOOP DEVICE AND CIRCUIT BREAKER | Aug 15, 2022 | Issued |
Array
(
[id] => 19250270
[patent_doc_number] => 20240201259
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-06-20
[patent_title] => TEST BUTTON LOOP DEVICE AND CIRCUIT BREAKER
[patent_app_type] => utility
[patent_app_number] => 18/557214
[patent_app_country] => US
[patent_app_date] => 2022-08-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4518
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -11
[patent_words_short_claim] => 172
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18557214
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/557214 | TEST BUTTON LOOP DEVICE AND CIRCUIT BREAKER | Aug 15, 2022 | Issued |
Array
(
[id] => 19924063
[patent_doc_number] => 12298341
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-05-13
[patent_title] => Methods and apparatuses for acoustically testing MEMS devices
[patent_app_type] => utility
[patent_app_number] => 17/815840
[patent_app_country] => US
[patent_app_date] => 2022-07-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
[patent_figures_cnt] => 17
[patent_no_of_words] => 4348
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 7
[patent_words_short_claim] => 125
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17815840
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/815840 | Methods and apparatuses for acoustically testing MEMS devices | Jul 27, 2022 | Issued |
Array
(
[id] => 18924512
[patent_doc_number] => 20240027516
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-01-25
[patent_title] => TEST AND REPAIR OF INTERCONNECTS BETWEEN CHIPS
[patent_app_type] => utility
[patent_app_number] => 17/871807
[patent_app_country] => US
[patent_app_date] => 2022-07-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 13752
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 123
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17871807
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/871807 | TEST AND REPAIR OF INTERCONNECTS BETWEEN CHIPS | Jul 21, 2022 | Pending |
Array
(
[id] => 19492664
[patent_doc_number] => 12111368
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-10-08
[patent_title] => Fuse life expectancy prediction device for electric vehicle battery and prediction method thereof
[patent_app_type] => utility
[patent_app_number] => 17/870034
[patent_app_country] => US
[patent_app_date] => 2022-07-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 4745
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 90
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17870034
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/870034 | Fuse life expectancy prediction device for electric vehicle battery and prediction method thereof | Jul 20, 2022 | Issued |
Array
(
[id] => 18826123
[patent_doc_number] => 11841395
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-12-12
[patent_title] => Integrated circuit margin measurement and failure prediction device
[patent_app_type] => utility
[patent_app_number] => 17/862142
[patent_app_country] => US
[patent_app_date] => 2022-07-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 13
[patent_no_of_words] => 11837
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 235
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17862142
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/862142 | Integrated circuit margin measurement and failure prediction device | Jul 10, 2022 | Issued |
Array
(
[id] => 19529583
[patent_doc_number] => 20240353485
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-10-24
[patent_title] => MEASURING ARRANGEMENT FOR EXAMINING A LIGHT-EMITTING DIODE ASSEMBLY AND METHOD
[patent_app_type] => utility
[patent_app_number] => 18/575780
[patent_app_country] => US
[patent_app_date] => 2022-06-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6108
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -14
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18575780
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/575780 | MEASURING ARRANGEMENT FOR EXAMINING A LIGHT-EMITTING DIODE ASSEMBLY AND METHOD | Jun 29, 2022 | Pending |
Array
(
[id] => 18316069
[patent_doc_number] => 11630144
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-04-18
[patent_title] => In-situ monitoring method and apparatus for power electronic device explosion
[patent_app_type] => utility
[patent_app_number] => 17/850958
[patent_app_country] => US
[patent_app_date] => 2022-06-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 3366
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 210
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17850958
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/850958 | In-situ monitoring method and apparatus for power electronic device explosion | Jun 26, 2022 | Issued |