Jimmy Nguyen

Array ( [id] => 613313 [patent_doc_number] => 07148713 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-12-12 [patent_title] => 'Algoristic spring as probe' [patent_app_type] => utility [patent_app_number] => 11/261551 [patent_app_country] => US [patent_app_date] => 2005-10-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 6 [patent_no_of_words] => 1027 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/148/07148713.pdf [firstpage_image] =>[orig_patent_app_number] => 11261551 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5635357 [patent_doc_number] => 20060066330 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-03-30 [patent_title] => 'Inspection unit' [patent_app_type] => utility [patent_app_number] => 11/238046 [patent_app_country] => US [patent_app_date] => 2005-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5017 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0066/20060066330.pdf [firstpage_image] =>[orig_patent_app_number] => 11238046 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 660061 [patent_doc_number] => 07106080 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-09-12 [patent_title] => 'Probe card and contactor of the same' [patent_app_type] => utility [patent_app_number] => 11/239664 [patent_app_country] => US [patent_app_date] => 2005-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 23 [patent_no_of_words] => 8682 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 191 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/106/07106080.pdf [firstpage_image] =>[orig_patent_app_number] => 11239664 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 677417 [patent_doc_number] => 07088123 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-08-08 [patent_title] => 'System and method for extraction of C-V characteristics of ultra-thin oxides' [patent_app_type] => utility [patent_app_number] => 11/217144 [patent_app_country] => US [patent_app_date] => 2005-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 2067 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/088/07088123.pdf [firstpage_image] =>[orig_patent_app_number] => 11217144 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 660047 [patent_doc_number] => 07106073 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-09-12 [patent_title] => 'Method and system for area efficient charge-based capacitance measurement' [patent_app_type] => utility [patent_app_number] => 11/140142 [patent_app_country] => US [patent_app_date] => 2005-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 3230 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/106/07106073.pdf [firstpage_image] =>[orig_patent_app_number] => 11140142 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5635353 [patent_doc_number] => 20060066326 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-03-30 [patent_title] => 'Non-contact tester for electronic circuits' [patent_app_type] => utility [patent_app_number] => 11/113806 [patent_app_country] => US [patent_app_date] => 2005-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 4730 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0066/20060066326.pdf [firstpage_image] =>[orig_patent_app_number] => 11113806 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 759986 [patent_doc_number] => 07015712 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-03-21 [patent_title] => 'Production line environmental stress screening system' [patent_app_type] => utility [patent_app_number] => 11/107761 [patent_app_country] => US [patent_app_date] => 2005-04-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 16 [patent_no_of_words] => 3533 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 434 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/015/07015712.pdf [firstpage_image] =>[orig_patent_app_number] => 11107761 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 759995 [patent_doc_number] => 07015716 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-03-21 [patent_title] => 'Method for detecting a power load of a power supply module according to duty cycle detection, and related device' [patent_app_type] => utility [patent_app_number] => 10/907654 [patent_app_country] => US [patent_app_date] => 2005-04-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2668 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/015/07015716.pdf [firstpage_image] =>[orig_patent_app_number] => 10907654 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 949174 [patent_doc_number] => 06963210 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-11-08 [patent_title] => 'Various electrical characteristics and small test point testing module' [patent_app_type] => utility [patent_app_number] => 11/086457 [patent_app_country] => US [patent_app_date] => 2005-03-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 3998 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 614 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/963/06963210.pdf [firstpage_image] =>[orig_patent_app_number] => 11086457 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6975900 [patent_doc_number] => 20050285615 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-12-29 [patent_title] => 'SYSTEM LSI' [patent_app_type] => utility [patent_app_number] => 11/073855 [patent_app_country] => US [patent_app_date] => 2005-03-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3453 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0285/20050285615.pdf [firstpage_image] =>[orig_patent_app_number] => 11073855 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 770622 [patent_doc_number] => 07005879 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-02-28 [patent_title] => 'Device for probe card power bus noise reduction' [patent_app_type] => utility [patent_app_number] => 11/067755 [patent_app_country] => US [patent_app_date] => 2005-03-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2605 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 164 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/005/07005879.pdf [firstpage_image] =>[orig_patent_app_number] => 11067755 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 743486 [patent_doc_number] => 07030624 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-04-18 [patent_title] => 'Electrical circuit tester' [patent_app_type] => utility [patent_app_number] => 11/059861 [patent_app_country] => US [patent_app_date] => 2005-02-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1730 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 190 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/030/07030624.pdf [firstpage_image] =>[orig_patent_app_number] => 11059861 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7239061 [patent_doc_number] => 20050140379 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-06-30 [patent_title] => 'Probe navigation method and device and defect inspection device' [patent_app_type] => utility [patent_app_number] => 11/018356 [patent_app_country] => US [patent_app_date] => 2004-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 14063 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0140/20050140379.pdf [firstpage_image] =>[orig_patent_app_number] => 11018356 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 969921 [patent_doc_number] => 06940781 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-09-06 [patent_title] => 'Semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memory' [patent_app_type] => utility [patent_app_number] => 10/981463 [patent_app_country] => US [patent_app_date] => 2004-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 13 [patent_no_of_words] => 11735 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 201 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/940/06940781.pdf [firstpage_image] =>[orig_patent_app_number] => 10981463 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 938755 [patent_doc_number] => 06972584 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-12-06 [patent_title] => 'Power decoupling circuit for loop powered time-of-flight ranging systems' [patent_app_type] => utility [patent_app_number] => 10/953459 [patent_app_country] => US [patent_app_date] => 2004-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 4554 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 259 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/972/06972584.pdf [firstpage_image] =>[orig_patent_app_number] => 10953459 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7243888 [patent_doc_number] => 20050073329 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-04-07 [patent_title] => 'Method and apparatus for enabling reliable testing of printed circuit assemblies using a standard flying prober system' [patent_app_type] => utility [patent_app_number] => 10/953161 [patent_app_country] => US [patent_app_date] => 2004-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4653 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0073/20050073329.pdf [firstpage_image] =>[orig_patent_app_number] => 10953161 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 735000 [patent_doc_number] => 07038474 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-05-02 [patent_title] => 'Laser-induced critical parameter analysis of CMOS devices' [patent_app_type] => utility [patent_app_number] => 10/711556 [patent_app_country] => US [patent_app_date] => 2004-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 4230 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 260 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/038/07038474.pdf [firstpage_image] =>[orig_patent_app_number] => 10711556 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 972865 [patent_doc_number] => 06937005 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-08-30 [patent_title] => 'Rotating gripper wafer flipper' [patent_app_type] => utility [patent_app_number] => 10/930488 [patent_app_country] => US [patent_app_date] => 2004-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 12 [patent_no_of_words] => 4712 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/937/06937005.pdf [firstpage_image] =>[orig_patent_app_number] => 10930488 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7154583 [patent_doc_number] => 20050026324 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-02-03 [patent_title] => 'Rotating gripper wafer flipper' [patent_app_type] => utility [patent_app_number] => 10/930582 [patent_app_country] => US [patent_app_date] => 2004-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 4705 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0026/20050026324.pdf [firstpage_image] =>[orig_patent_app_number] => 10930582 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7155527 [patent_doc_number] => 20050083072 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-04-21 [patent_title] => 'Probe card and contactor of the same' [patent_app_type] => utility [patent_app_number] => 10/925861 [patent_app_country] => US [patent_app_date] => 2004-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 8261 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0083/20050083072.pdf [firstpage_image] =>[orig_patent_app_number] => 10925861 [rel_patent_id] =>[rel_patent_doc_number] =>)