
Jimmy Nguyen
Examiner (ID: 7143)
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2858, 2829 |
| Total Applications | 440 |
| Issued Applications | 398 |
| Pending Applications | 9 |
| Abandoned Applications | 33 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6638721
[patent_doc_number] => 20030006811
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-01-09
[patent_title] => 'Semiconductor integrated circuit device'
[patent_app_type] => new
[patent_app_number] => 10/036460
[patent_app_country] => US
[patent_app_date] => 2002-01-07
[patent_effective_date] => 0000-00-00
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[patent_no_of_words] => 6588
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0006/20030006811.pdf
[firstpage_image] =>[orig_patent_app_number] => 10036460
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/036460 | Semiconductor integrated circuit device | Jan 6, 2002 | Issued |
Array
(
[id] => 6759207
[patent_doc_number] => 20030122568
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-07-03
[patent_title] => 'Method and system for detecting an arc condition'
[patent_app_type] => new
[patent_app_number] => 10/035364
[patent_app_country] => US
[patent_app_date] => 2001-12-28
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0122/20030122568.pdf
[firstpage_image] =>[orig_patent_app_number] => 10035364
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/035364 | Method and system for detecting an arc condition | Dec 27, 2001 | Issued |
Array
(
[id] => 1117236
[patent_doc_number] => 06801050
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-10-05
[patent_title] => 'Driver circuit integrated with load current output circuit, pin electronics and IC tester having thereof'
[patent_app_type] => B2
[patent_app_number] => 10/032761
[patent_app_country] => US
[patent_app_date] => 2001-12-27
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[pdf_file] => patents/06/801/06801050.pdf
[firstpage_image] =>[orig_patent_app_number] => 10032761
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/032761 | Driver circuit integrated with load current output circuit, pin electronics and IC tester having thereof | Dec 26, 2001 | Issued |
Array
(
[id] => 6044947
[patent_doc_number] => 20020167304
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-11-14
[patent_title] => 'Test board de-embedding method to improve RF measurements accuracy on an automatic testing equipment for IC wafers'
[patent_app_type] => new
[patent_app_number] => 10/033364
[patent_app_country] => US
[patent_app_date] => 2001-12-26
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[pdf_file] => publications/A1/0167/20020167304.pdf
[firstpage_image] =>[orig_patent_app_number] => 10033364
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/033364 | Test board de-embedding method to improve RF measurements accuracy on an automatic testing equipment for IC wafers | Dec 25, 2001 | Issued |
Array
(
[id] => 6681297
[patent_doc_number] => 20030117161
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-06-26
[patent_title] => 'Parallel integrated circuit test apparatus and test method'
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[patent_app_number] => 10/026053
[patent_app_country] => US
[patent_app_date] => 2001-12-21
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[firstpage_image] =>[orig_patent_app_number] => 10026053
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/026053 | Parallel integrated circuit test apparatus and test method | Dec 20, 2001 | Issued |
Array
(
[id] => 7623433
[patent_doc_number] => 06686732
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-02-03
[patent_title] => 'Low-cost tester interface module'
[patent_app_type] => B2
[patent_app_number] => 10/026861
[patent_app_country] => US
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[pdf_file] => patents/06/686/06686732.pdf
[firstpage_image] =>[orig_patent_app_number] => 10026861
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/026861 | Low-cost tester interface module | Dec 19, 2001 | Issued |
Array
(
[id] => 1179504
[patent_doc_number] => 06747470
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-06-08
[patent_title] => 'Method and apparatus for on-die voltage fluctuation detection'
[patent_app_type] => B2
[patent_app_number] => 10/021055
[patent_app_country] => US
[patent_app_date] => 2001-12-19
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/747/06747470.pdf
[firstpage_image] =>[orig_patent_app_number] => 10021055
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/021055 | Method and apparatus for on-die voltage fluctuation detection | Dec 18, 2001 | Issued |
Array
(
[id] => 6205927
[patent_doc_number] => 20020070738
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-06-13
[patent_title] => 'Semiconductor device inspecting apparatus'
[patent_app_type] => new
[patent_app_number] => 10/006363
[patent_app_country] => US
[patent_app_date] => 2001-12-10
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0070/20020070738.pdf
[firstpage_image] =>[orig_patent_app_number] => 10006363
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/006363 | Semiconductor device inspecting apparatus | Dec 9, 2001 | Issued |
Array
(
[id] => 6092611
[patent_doc_number] => 20020050831
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-05-02
[patent_title] => 'Probe station having multiple enclosures'
[patent_app_type] => new
[patent_app_number] => 10/013185
[patent_app_country] => US
[patent_app_date] => 2001-12-07
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0050/20020050831.pdf
[firstpage_image] =>[orig_patent_app_number] => 10013185
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/013185 | Probe station having multiple enclosures | Dec 6, 2001 | Issued |
Array
(
[id] => 6124386
[patent_doc_number] => 20020074991
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-06-20
[patent_title] => 'Device for determining the primary current of a current transformer comprising saturation correction means'
[patent_app_type] => new
[patent_app_number] => 10/005159
[patent_app_country] => US
[patent_app_date] => 2001-12-07
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0074/20020074991.pdf
[firstpage_image] =>[orig_patent_app_number] => 10005159
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/005159 | Device for determining the primary current of a current transformer comprising saturation correction means | Dec 6, 2001 | Issued |
Array
(
[id] => 1505980
[patent_doc_number] => 06466047
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-10-15
[patent_title] => 'System for testing bumped semiconductor components with on-board multiplex circuit for expanding tester resources'
[patent_app_type] => B1
[patent_app_number] => 09/999502
[patent_app_country] => US
[patent_app_date] => 2001-12-04
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[pdf_file] => patents/06/466/06466047.pdf
[firstpage_image] =>[orig_patent_app_number] => 09999502
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/999502 | System for testing bumped semiconductor components with on-board multiplex circuit for expanding tester resources | Dec 3, 2001 | Issued |
Array
(
[id] => 1194142
[patent_doc_number] => 06731152
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-05-04
[patent_title] => 'Method and/or architecture for switching a precision current'
[patent_app_type] => B1
[patent_app_number] => 09/997357
[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/997357 | Method and/or architecture for switching a precision current | Nov 29, 2001 | Issued |
Array
(
[id] => 6748399
[patent_doc_number] => 20030042919
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-03-06
[patent_title] => 'Circuit trimming of packaged IC chip'
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[patent_app_number] => 09/990856
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[pdf_file] => publications/A1/0042/20030042919.pdf
[firstpage_image] =>[orig_patent_app_number] => 09990856
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/990856 | Circuit trimming of packaged IC chip | Nov 20, 2001 | Issued |
Array
(
[id] => 6799798
[patent_doc_number] => 20030094962
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[patent_title] => 'Dual plane probe card assembly and method of manufacture'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/992065 | Dual plane probe card assembly and method of manufacture | Nov 20, 2001 | Abandoned |
Array
(
[id] => 6076673
[patent_doc_number] => 20020079882
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[patent_title] => 'Autohandler and testing method'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/988361 | Autohandler and testing method | Nov 18, 2001 | Abandoned |
Array
(
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[patent_title] => 'Semiconductor device operable in a plurality of test operation modes'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/986883 | Semiconductor device operable in a plurality of test operation modes | Nov 12, 2001 | Issued |
Array
(
[id] => 6350221
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[patent_title] => 'Contactor, method for manufacturing the same, and probe card using the same'
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[firstpage_image] =>[orig_patent_app_number] => 09986561
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/986561 | Contractor, method for manufacturing the same, and probe card using the same | Nov 8, 2001 | Issued |
Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/007760 | Test cell structure for estimating electrical characteristics of closely-spaced bond pads formed on a substrate | Nov 7, 2001 | Abandoned |
Array
(
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[patent_title] => 'Configuration in which wafers are individually supplied to fabrication units and measuring units located in a fabrication cell'
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Array
(
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[firstpage_image] =>[orig_patent_app_number] => 09985358
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/985358 | Assembly apparatus and method of contactor | Nov 1, 2001 | Issued |