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Jimmy Nguyen

Examiner (ID: 7143)

Most Active Art Unit
2829
Art Unit(s)
2858, 2829
Total Applications
440
Issued Applications
398
Pending Applications
9
Abandoned Applications
33

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6638721 [patent_doc_number] => 20030006811 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-01-09 [patent_title] => 'Semiconductor integrated circuit device' [patent_app_type] => new [patent_app_number] => 10/036460 [patent_app_country] => US [patent_app_date] => 2002-01-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 6588 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0006/20030006811.pdf [firstpage_image] =>[orig_patent_app_number] => 10036460 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/036460
Semiconductor integrated circuit device Jan 6, 2002 Issued
Array ( [id] => 6759207 [patent_doc_number] => 20030122568 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-07-03 [patent_title] => 'Method and system for detecting an arc condition' [patent_app_type] => new [patent_app_number] => 10/035364 [patent_app_country] => US [patent_app_date] => 2001-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3403 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 64 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0122/20030122568.pdf [firstpage_image] =>[orig_patent_app_number] => 10035364 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/035364
Method and system for detecting an arc condition Dec 27, 2001 Issued
Array ( [id] => 1117236 [patent_doc_number] => 06801050 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-10-05 [patent_title] => 'Driver circuit integrated with load current output circuit, pin electronics and IC tester having thereof' [patent_app_type] => B2 [patent_app_number] => 10/032761 [patent_app_country] => US [patent_app_date] => 2001-12-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 13 [patent_no_of_words] => 6136 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/801/06801050.pdf [firstpage_image] =>[orig_patent_app_number] => 10032761 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/032761
Driver circuit integrated with load current output circuit, pin electronics and IC tester having thereof Dec 26, 2001 Issued
Array ( [id] => 6044947 [patent_doc_number] => 20020167304 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-11-14 [patent_title] => 'Test board de-embedding method to improve RF measurements accuracy on an automatic testing equipment for IC wafers' [patent_app_type] => new [patent_app_number] => 10/033364 [patent_app_country] => US [patent_app_date] => 2001-12-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 4064 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0167/20020167304.pdf [firstpage_image] =>[orig_patent_app_number] => 10033364 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/033364
Test board de-embedding method to improve RF measurements accuracy on an automatic testing equipment for IC wafers Dec 25, 2001 Issued
Array ( [id] => 6681297 [patent_doc_number] => 20030117161 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-06-26 [patent_title] => 'Parallel integrated circuit test apparatus and test method' [patent_app_type] => new [patent_app_number] => 10/026053 [patent_app_country] => US [patent_app_date] => 2001-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 7350 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0117/20030117161.pdf [firstpage_image] =>[orig_patent_app_number] => 10026053 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/026053
Parallel integrated circuit test apparatus and test method Dec 20, 2001 Issued
Array ( [id] => 7623433 [patent_doc_number] => 06686732 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-02-03 [patent_title] => 'Low-cost tester interface module' [patent_app_type] => B2 [patent_app_number] => 10/026861 [patent_app_country] => US [patent_app_date] => 2001-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2259 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 18 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/686/06686732.pdf [firstpage_image] =>[orig_patent_app_number] => 10026861 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/026861
Low-cost tester interface module Dec 19, 2001 Issued
Array ( [id] => 1179504 [patent_doc_number] => 06747470 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-06-08 [patent_title] => 'Method and apparatus for on-die voltage fluctuation detection' [patent_app_type] => B2 [patent_app_number] => 10/021055 [patent_app_country] => US [patent_app_date] => 2001-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6651 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/747/06747470.pdf [firstpage_image] =>[orig_patent_app_number] => 10021055 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/021055
Method and apparatus for on-die voltage fluctuation detection Dec 18, 2001 Issued
Array ( [id] => 6205927 [patent_doc_number] => 20020070738 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-06-13 [patent_title] => 'Semiconductor device inspecting apparatus' [patent_app_type] => new [patent_app_number] => 10/006363 [patent_app_country] => US [patent_app_date] => 2001-12-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 6547 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0070/20020070738.pdf [firstpage_image] =>[orig_patent_app_number] => 10006363 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/006363
Semiconductor device inspecting apparatus Dec 9, 2001 Issued
Array ( [id] => 6092611 [patent_doc_number] => 20020050831 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-05-02 [patent_title] => 'Probe station having multiple enclosures' [patent_app_type] => new [patent_app_number] => 10/013185 [patent_app_country] => US [patent_app_date] => 2001-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2703 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0050/20020050831.pdf [firstpage_image] =>[orig_patent_app_number] => 10013185 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/013185
Probe station having multiple enclosures Dec 6, 2001 Issued
Array ( [id] => 6124386 [patent_doc_number] => 20020074991 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-06-20 [patent_title] => 'Device for determining the primary current of a current transformer comprising saturation correction means' [patent_app_type] => new [patent_app_number] => 10/005159 [patent_app_country] => US [patent_app_date] => 2001-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3462 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 171 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0074/20020074991.pdf [firstpage_image] =>[orig_patent_app_number] => 10005159 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/005159
Device for determining the primary current of a current transformer comprising saturation correction means Dec 6, 2001 Issued
Array ( [id] => 1505980 [patent_doc_number] => 06466047 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-10-15 [patent_title] => 'System for testing bumped semiconductor components with on-board multiplex circuit for expanding tester resources' [patent_app_type] => B1 [patent_app_number] => 09/999502 [patent_app_country] => US [patent_app_date] => 2001-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 22 [patent_no_of_words] => 7080 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/466/06466047.pdf [firstpage_image] =>[orig_patent_app_number] => 09999502 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/999502
System for testing bumped semiconductor components with on-board multiplex circuit for expanding tester resources Dec 3, 2001 Issued
Array ( [id] => 1194142 [patent_doc_number] => 06731152 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-05-04 [patent_title] => 'Method and/or architecture for switching a precision current' [patent_app_type] => B1 [patent_app_number] => 09/997357 [patent_app_country] => US [patent_app_date] => 2001-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3401 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 61 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/731/06731152.pdf [firstpage_image] =>[orig_patent_app_number] => 09997357 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/997357
Method and/or architecture for switching a precision current Nov 29, 2001 Issued
Array ( [id] => 6748399 [patent_doc_number] => 20030042919 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-03-06 [patent_title] => 'Circuit trimming of packaged IC chip' [patent_app_type] => new [patent_app_number] => 09/990856 [patent_app_country] => US [patent_app_date] => 2001-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2340 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0042/20030042919.pdf [firstpage_image] =>[orig_patent_app_number] => 09990856 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/990856
Circuit trimming of packaged IC chip Nov 20, 2001 Issued
Array ( [id] => 6799798 [patent_doc_number] => 20030094962 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-05-22 [patent_title] => 'Dual plane probe card assembly and method of manufacture' [patent_app_type] => new [patent_app_number] => 09/992065 [patent_app_country] => US [patent_app_date] => 2001-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3981 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0094/20030094962.pdf [firstpage_image] =>[orig_patent_app_number] => 09992065 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/992065
Dual plane probe card assembly and method of manufacture Nov 20, 2001 Abandoned
Array ( [id] => 6076673 [patent_doc_number] => 20020079882 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-06-27 [patent_title] => 'Autohandler and testing method' [patent_app_type] => new [patent_app_number] => 09/988361 [patent_app_country] => US [patent_app_date] => 2001-11-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 8453 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 149 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0079/20020079882.pdf [firstpage_image] =>[orig_patent_app_number] => 09988361 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/988361
Autohandler and testing method Nov 18, 2001 Abandoned
Array ( [id] => 6338142 [patent_doc_number] => 20020034112 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-03-21 [patent_title] => 'Semiconductor device operable in a plurality of test operation modes' [patent_app_type] => new [patent_app_number] => 09/986883 [patent_app_country] => US [patent_app_date] => 2001-11-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 16814 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0034/20020034112.pdf [firstpage_image] =>[orig_patent_app_number] => 09986883 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/986883
Semiconductor device operable in a plurality of test operation modes Nov 12, 2001 Issued
Array ( [id] => 6350221 [patent_doc_number] => 20020057099 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-05-16 [patent_title] => 'Contactor, method for manufacturing the same, and probe card using the same' [patent_app_type] => new [patent_app_number] => 09/986561 [patent_app_country] => US [patent_app_date] => 2001-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 6601 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0057/20020057099.pdf [firstpage_image] =>[orig_patent_app_number] => 09986561 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/986561
Contractor, method for manufacturing the same, and probe card using the same Nov 8, 2001 Issued
Array ( [id] => 6124472 [patent_doc_number] => 20020075020 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-06-20 [patent_title] => 'Test cell structure for estimating electrical characteristics of closely-spaced bond pads formed on a substrate' [patent_app_type] => new [patent_app_number] => 10/007760 [patent_app_country] => US [patent_app_date] => 2001-11-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 4620 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 73 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0075/20020075020.pdf [firstpage_image] =>[orig_patent_app_number] => 10007760 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/007760
Test cell structure for estimating electrical characteristics of closely-spaced bond pads formed on a substrate Nov 7, 2001 Abandoned
Array ( [id] => 6618664 [patent_doc_number] => 20020064954 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-05-30 [patent_title] => 'Configuration in which wafers are individually supplied to fabrication units and measuring units located in a fabrication cell' [patent_app_type] => new [patent_app_number] => 10/015150 [patent_app_country] => US [patent_app_date] => 2001-11-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3371 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0064/20020064954.pdf [firstpage_image] =>[orig_patent_app_number] => 10015150 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/015150
Configuration in which wafers are individually supplied to fabrication units and measuring units located in a fabrication cell Nov 6, 2001 Issued
Array ( [id] => 6285730 [patent_doc_number] => 20020053922 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-05-09 [patent_title] => 'Assembly apparatus and method of contactor' [patent_app_type] => new [patent_app_number] => 09/985358 [patent_app_country] => US [patent_app_date] => 2001-11-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6357 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0053/20020053922.pdf [firstpage_image] =>[orig_patent_app_number] => 09985358 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/985358
Assembly apparatus and method of contactor Nov 1, 2001 Issued
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