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Jimmy Nguyen

Examiner (ID: 7143)

Most Active Art Unit
2829
Art Unit(s)
2858, 2829
Total Applications
440
Issued Applications
398
Pending Applications
9
Abandoned Applications
33

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 5982788 [patent_doc_number] => 20020097062 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-07-25 [patent_title] => 'Method and process of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing analysis, and manufacture' [patent_app_type] => new [patent_app_number] => 10/046559 [patent_app_country] => US [patent_app_date] => 2001-10-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4214 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 18 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0097/20020097062.pdf [firstpage_image] =>[orig_patent_app_number] => 10046559 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/046559
Method and process of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing analysis, and manufacture Oct 26, 2001 Abandoned
Array ( [id] => 6837448 [patent_doc_number] => 20030034788 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-02-20 [patent_title] => 'Refocusing wavelengths to a common focal plane for electrical trace testing' [patent_app_type] => new [patent_app_number] => 10/041649 [patent_app_country] => US [patent_app_date] => 2001-10-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5573 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0034/20030034788.pdf [firstpage_image] =>[orig_patent_app_number] => 10041649 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/041649
Refocusing wavelengths to a common focal plane for electrical trace testing Oct 23, 2001 Issued
Array ( [id] => 1142062 [patent_doc_number] => 06781394 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-08-24 [patent_title] => 'Testing circuits on substrate' [patent_app_type] => B1 [patent_app_number] => 10/035457 [patent_app_country] => US [patent_app_date] => 2001-10-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 19 [patent_no_of_words] => 3395 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/781/06781394.pdf [firstpage_image] =>[orig_patent_app_number] => 10035457 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/035457
Testing circuits on substrate Oct 21, 2001 Issued
Array ( [id] => 1190285 [patent_doc_number] => 06734692 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-05-11 [patent_title] => 'Inspection apparatus and sensor' [patent_app_type] => B2 [patent_app_number] => 09/926357 [patent_app_country] => US [patent_app_date] => 2001-10-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 16 [patent_no_of_words] => 7063 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/734/06734692.pdf [firstpage_image] =>[orig_patent_app_number] => 09926357 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/926357
Inspection apparatus and sensor Oct 21, 2001 Issued
Array ( [id] => 6649364 [patent_doc_number] => 20030076123 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-04-24 [patent_title] => 'Socket apparatus and method for removably mounting an electronic package' [patent_app_type] => new [patent_app_number] => 10/012864 [patent_app_country] => US [patent_app_date] => 2001-10-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 4996 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 151 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0076/20030076123.pdf [firstpage_image] =>[orig_patent_app_number] => 10012864 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/012864
Socket apparatus and method for removably mounting an electronic package Oct 21, 2001 Issued
Array ( [id] => 6812080 [patent_doc_number] => 20030071630 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-04-17 [patent_title] => 'Laminated core contact detection method and system' [patent_app_type] => new [patent_app_number] => 09/682764 [patent_app_country] => US [patent_app_date] => 2001-10-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4344 [patent_no_of_claims] => 40 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0071/20030071630.pdf [firstpage_image] =>[orig_patent_app_number] => 09682764 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/682764
Laminated core contact detection method and system Oct 15, 2001 Issued
Array ( [id] => 6781468 [patent_doc_number] => 20030062915 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-04-03 [patent_title] => 'Probe card with contact apparatus and method of manufacture' [patent_app_type] => new [patent_app_number] => 09/968963 [patent_app_country] => US [patent_app_date] => 2001-10-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3763 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 41 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0062/20030062915.pdf [firstpage_image] =>[orig_patent_app_number] => 09968963 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/968963
Probe card with contact apparatus and method of manufacture Oct 1, 2001 Issued
Array ( [id] => 6238255 [patent_doc_number] => 20020043970 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-04-18 [patent_title] => 'Method for inspecting electrical properties of a wafer and apparatus therefor' [patent_app_type] => new [patent_app_number] => 09/967959 [patent_app_country] => US [patent_app_date] => 2001-10-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5912 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0043/20020043970.pdf [firstpage_image] =>[orig_patent_app_number] => 09967959 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/967959
Method for inspecting electrical properties of a wafer and apparatus therefor Oct 1, 2001 Issued
Array ( [id] => 1315330 [patent_doc_number] => 06614220 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-09-02 [patent_title] => 'Method and device for automatic adjustment of printed circuit board conveying means in a test machine' [patent_app_type] => B2 [patent_app_number] => 09/966069 [patent_app_country] => US [patent_app_date] => 2001-10-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 1928 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/614/06614220.pdf [firstpage_image] =>[orig_patent_app_number] => 09966069 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/966069
Method and device for automatic adjustment of printed circuit board conveying means in a test machine Sep 30, 2001 Issued
Array ( [id] => 1289360 [patent_doc_number] => 06639396 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-10-28 [patent_title] => 'Detecting structure formed on a PCB to detect unavailability of the lines' [patent_app_type] => B2 [patent_app_number] => 09/964165 [patent_app_country] => US [patent_app_date] => 2001-09-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 11 [patent_no_of_words] => 1762 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/639/06639396.pdf [firstpage_image] =>[orig_patent_app_number] => 09964165 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/964165
Detecting structure formed on a PCB to detect unavailability of the lines Sep 25, 2001 Issued
Array ( [id] => 1370913 [patent_doc_number] => 06570398 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-05-27 [patent_title] => 'Socket apparatus particularly adapted for LGA type semiconductor devices' [patent_app_type] => B2 [patent_app_number] => 09/961659 [patent_app_country] => US [patent_app_date] => 2001-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 35 [patent_no_of_words] => 4643 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 302 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/570/06570398.pdf [firstpage_image] =>[orig_patent_app_number] => 09961659 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/961659
Socket apparatus particularly adapted for LGA type semiconductor devices Sep 23, 2001 Issued
Array ( [id] => 1047599 [patent_doc_number] => 06864675 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-03-08 [patent_title] => 'Mark forming method, mark forming apparatus and analyzing apparatus' [patent_app_type] => utility [patent_app_number] => 09/954661 [patent_app_country] => US [patent_app_date] => 2001-09-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 14 [patent_no_of_words] => 2541 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/864/06864675.pdf [firstpage_image] =>[orig_patent_app_number] => 09954661 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/954661
Mark forming method, mark forming apparatus and analyzing apparatus Sep 16, 2001 Issued
Array ( [id] => 1548024 [patent_doc_number] => 06445175 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-09-03 [patent_title] => 'Remote, wireless electrical signal measurement device' [patent_app_type] => B1 [patent_app_number] => 09/940745 [patent_app_country] => US [patent_app_date] => 2001-08-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 30 [patent_no_of_words] => 7384 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 157 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/445/06445175.pdf [firstpage_image] =>[orig_patent_app_number] => 09940745 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/940745
Remote, wireless electrical signal measurement device Aug 27, 2001 Issued
Array ( [id] => 6029493 [patent_doc_number] => 20020017917 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-02-14 [patent_title] => 'Inspection method for array substrate and inspection device for the same' [patent_app_type] => new [patent_app_number] => 09/917959 [patent_app_country] => US [patent_app_date] => 2001-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5274 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0017/20020017917.pdf [firstpage_image] =>[orig_patent_app_number] => 09917959 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/917959
Inspection method for array substrate and inspection device for the same Jul 29, 2001 Issued
Array ( [id] => 5997605 [patent_doc_number] => 20020027442 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-03-07 [patent_title] => 'Probe station having multiple enclosures' [patent_app_type] => new [patent_app_number] => 09/908218 [patent_app_country] => US [patent_app_date] => 2001-07-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2680 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0027/20020027442.pdf [firstpage_image] =>[orig_patent_app_number] => 09908218 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/908218
Probe station having multiple enclosures Jul 16, 2001 Issued
Array ( [id] => 1405957 [patent_doc_number] => 06541955 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-04-01 [patent_title] => 'Clamp for measuring an electrical current flowing in conductors' [patent_app_type] => B2 [patent_app_number] => 09/889043 [patent_app_country] => US [patent_app_date] => 2001-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 2851 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 254 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/541/06541955.pdf [firstpage_image] =>[orig_patent_app_number] => 09889043 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/889043
Clamp for measuring an electrical current flowing in conductors Jul 10, 2001 Issued
Array ( [id] => 6733759 [patent_doc_number] => 20030011394 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-01-16 [patent_title] => 'Self-aligning wafer burn-in probe' [patent_app_type] => new [patent_app_number] => 09/902964 [patent_app_country] => US [patent_app_date] => 2001-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3607 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0011/20030011394.pdf [firstpage_image] =>[orig_patent_app_number] => 09902964 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/902964
Self-aligning wafer burn-in probe Jul 10, 2001 Issued
Array ( [id] => 6733755 [patent_doc_number] => 20030011390 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-01-16 [patent_title] => 'Interface apparatus for integrated circuit testing' [patent_app_type] => new [patent_app_number] => 09/901855 [patent_app_country] => US [patent_app_date] => 2001-07-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 8426 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 43 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0011/20030011390.pdf [firstpage_image] =>[orig_patent_app_number] => 09901855 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/901855
Interface apparatus for integrated circuit testing Jul 8, 2001 Abandoned
Array ( [id] => 1516503 [patent_doc_number] => 06420881 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-07-16 [patent_title] => 'Interface for cable testing' [patent_app_type] => B2 [patent_app_number] => 09/898281 [patent_app_country] => US [patent_app_date] => 2001-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 13 [patent_no_of_words] => 4236 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 173 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/420/06420881.pdf [firstpage_image] =>[orig_patent_app_number] => 09898281 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/898281
Interface for cable testing Jul 1, 2001 Issued
Array ( [id] => 1207477 [patent_doc_number] => 06717429 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-04-06 [patent_title] => 'IC having comparator inputs connected to core circuitry and output pad' [patent_app_type] => B2 [patent_app_number] => 09/896467 [patent_app_country] => US [patent_app_date] => 2001-06-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 34 [patent_no_of_words] => 11378 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 159 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/717/06717429.pdf [firstpage_image] =>[orig_patent_app_number] => 09896467 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/896467
IC having comparator inputs connected to core circuitry and output pad Jun 28, 2001 Issued
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