
Jimmy Nguyen
Examiner (ID: 7143)
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2858, 2829 |
| Total Applications | 440 |
| Issued Applications | 398 |
| Pending Applications | 9 |
| Abandoned Applications | 33 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5982788
[patent_doc_number] => 20020097062
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-07-25
[patent_title] => 'Method and process of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing analysis, and manufacture'
[patent_app_type] => new
[patent_app_number] => 10/046559
[patent_app_country] => US
[patent_app_date] => 2001-10-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 4214
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[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0097/20020097062.pdf
[firstpage_image] =>[orig_patent_app_number] => 10046559
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/046559 | Method and process of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing analysis, and manufacture | Oct 26, 2001 | Abandoned |
Array
(
[id] => 6837448
[patent_doc_number] => 20030034788
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-02-20
[patent_title] => 'Refocusing wavelengths to a common focal plane for electrical trace testing'
[patent_app_type] => new
[patent_app_number] => 10/041649
[patent_app_country] => US
[patent_app_date] => 2001-10-24
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0034/20030034788.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/041649 | Refocusing wavelengths to a common focal plane for electrical trace testing | Oct 23, 2001 | Issued |
Array
(
[id] => 1142062
[patent_doc_number] => 06781394
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-08-24
[patent_title] => 'Testing circuits on substrate'
[patent_app_type] => B1
[patent_app_number] => 10/035457
[patent_app_country] => US
[patent_app_date] => 2001-10-22
[patent_effective_date] => 0000-00-00
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/035457 | Testing circuits on substrate | Oct 21, 2001 | Issued |
Array
(
[id] => 1190285
[patent_doc_number] => 06734692
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-05-11
[patent_title] => 'Inspection apparatus and sensor'
[patent_app_type] => B2
[patent_app_number] => 09/926357
[patent_app_country] => US
[patent_app_date] => 2001-10-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
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[pdf_file] => patents/06/734/06734692.pdf
[firstpage_image] =>[orig_patent_app_number] => 09926357
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/926357 | Inspection apparatus and sensor | Oct 21, 2001 | Issued |
Array
(
[id] => 6649364
[patent_doc_number] => 20030076123
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-04-24
[patent_title] => 'Socket apparatus and method for removably mounting an electronic package'
[patent_app_type] => new
[patent_app_number] => 10/012864
[patent_app_country] => US
[patent_app_date] => 2001-10-22
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0076/20030076123.pdf
[firstpage_image] =>[orig_patent_app_number] => 10012864
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/012864 | Socket apparatus and method for removably mounting an electronic package | Oct 21, 2001 | Issued |
Array
(
[id] => 6812080
[patent_doc_number] => 20030071630
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-04-17
[patent_title] => 'Laminated core contact detection method and system'
[patent_app_type] => new
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[patent_app_country] => US
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[pdf_file] => publications/A1/0071/20030071630.pdf
[firstpage_image] =>[orig_patent_app_number] => 09682764
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/682764 | Laminated core contact detection method and system | Oct 15, 2001 | Issued |
Array
(
[id] => 6781468
[patent_doc_number] => 20030062915
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-04-03
[patent_title] => 'Probe card with contact apparatus and method of manufacture'
[patent_app_type] => new
[patent_app_number] => 09/968963
[patent_app_country] => US
[patent_app_date] => 2001-10-02
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[pdf_file] => publications/A1/0062/20030062915.pdf
[firstpage_image] =>[orig_patent_app_number] => 09968963
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/968963 | Probe card with contact apparatus and method of manufacture | Oct 1, 2001 | Issued |
Array
(
[id] => 6238255
[patent_doc_number] => 20020043970
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-04-18
[patent_title] => 'Method for inspecting electrical properties of a wafer and apparatus therefor'
[patent_app_type] => new
[patent_app_number] => 09/967959
[patent_app_country] => US
[patent_app_date] => 2001-10-02
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[pdf_file] => publications/A1/0043/20020043970.pdf
[firstpage_image] =>[orig_patent_app_number] => 09967959
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/967959 | Method for inspecting electrical properties of a wafer and apparatus therefor | Oct 1, 2001 | Issued |
Array
(
[id] => 1315330
[patent_doc_number] => 06614220
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2003-09-02
[patent_title] => 'Method and device for automatic adjustment of printed circuit board conveying means in a test machine'
[patent_app_type] => B2
[patent_app_number] => 09/966069
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[patent_app_date] => 2001-10-01
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/966069 | Method and device for automatic adjustment of printed circuit board conveying means in a test machine | Sep 30, 2001 | Issued |
Array
(
[id] => 1289360
[patent_doc_number] => 06639396
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2003-10-28
[patent_title] => 'Detecting structure formed on a PCB to detect unavailability of the lines'
[patent_app_type] => B2
[patent_app_number] => 09/964165
[patent_app_country] => US
[patent_app_date] => 2001-09-26
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/639/06639396.pdf
[firstpage_image] =>[orig_patent_app_number] => 09964165
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/964165 | Detecting structure formed on a PCB to detect unavailability of the lines | Sep 25, 2001 | Issued |
Array
(
[id] => 1370913
[patent_doc_number] => 06570398
[patent_country] => US
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[patent_issue_date] => 2003-05-27
[patent_title] => 'Socket apparatus particularly adapted for LGA type semiconductor devices'
[patent_app_type] => B2
[patent_app_number] => 09/961659
[patent_app_country] => US
[patent_app_date] => 2001-09-24
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/961659 | Socket apparatus particularly adapted for LGA type semiconductor devices | Sep 23, 2001 | Issued |
Array
(
[id] => 1047599
[patent_doc_number] => 06864675
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-03-08
[patent_title] => 'Mark forming method, mark forming apparatus and analyzing apparatus'
[patent_app_type] => utility
[patent_app_number] => 09/954661
[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/954661 | Mark forming method, mark forming apparatus and analyzing apparatus | Sep 16, 2001 | Issued |
Array
(
[id] => 1548024
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[patent_title] => 'Remote, wireless electrical signal measurement device'
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Array
(
[id] => 6029493
[patent_doc_number] => 20020017917
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[patent_issue_date] => 2002-02-14
[patent_title] => 'Inspection method for array substrate and inspection device for the same'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/917959 | Inspection method for array substrate and inspection device for the same | Jul 29, 2001 | Issued |
Array
(
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[patent_title] => 'Probe station having multiple enclosures'
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Array
(
[id] => 1405957
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[patent_title] => 'Clamp for measuring an electrical current flowing in conductors'
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[firstpage_image] =>[orig_patent_app_number] => 09889043
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Array
(
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[patent_title] => 'Self-aligning wafer burn-in probe'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/902964 | Self-aligning wafer burn-in probe | Jul 10, 2001 | Issued |
Array
(
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Array
(
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Array
(
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[patent_title] => 'IC having comparator inputs connected to core circuitry and output pad'
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[firstpage_image] =>[orig_patent_app_number] => 09896467
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/896467 | IC having comparator inputs connected to core circuitry and output pad | Jun 28, 2001 | Issued |