Search

Jimmy Nguyen

Examiner (ID: 7143)

Most Active Art Unit
2829
Art Unit(s)
2858, 2829
Total Applications
440
Issued Applications
398
Pending Applications
9
Abandoned Applications
33

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 1094230 [patent_doc_number] => 06825680 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-11-30 [patent_title] => 'Automated semiconductor probing device' [patent_app_type] => B1 [patent_app_number] => 09/885362 [patent_app_country] => US [patent_app_date] => 2001-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2677 [patent_no_of_claims] => 50 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/825/06825680.pdf [firstpage_image] =>[orig_patent_app_number] => 09885362 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/885362
Automated semiconductor probing device Jun 19, 2001 Issued
09/857559 Multilevel current generator with digital control and system for testing the endurance of a component equipped with same Jun 5, 2001 Abandoned
Array ( [id] => 5799037 [patent_doc_number] => 20020008505 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-01-24 [patent_title] => 'Peak detector' [patent_app_type] => new [patent_app_number] => 09/861776 [patent_app_country] => US [patent_app_date] => 2001-05-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1920 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 227 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0008/20020008505.pdf [firstpage_image] =>[orig_patent_app_number] => 09861776 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/861776
Peak detector May 20, 2001 Issued
Array ( [id] => 1469030 [patent_doc_number] => 06459287 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-10-01 [patent_title] => 'Attachable/detachable probing point' [patent_app_type] => B1 [patent_app_number] => 09/860964 [patent_app_country] => US [patent_app_date] => 2001-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 3129 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/459/06459287.pdf [firstpage_image] =>[orig_patent_app_number] => 09860964 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/860964
Attachable/detachable probing point May 17, 2001 Issued
Array ( [id] => 5840943 [patent_doc_number] => 20020130678 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-09-19 [patent_title] => 'Multi-channel semiconductor test system' [patent_app_type] => new [patent_app_number] => 09/861147 [patent_app_country] => US [patent_app_date] => 2001-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1665 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0130/20020130678.pdf [firstpage_image] =>[orig_patent_app_number] => 09861147 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/861147
Multi-channel semiconductor test system May 17, 2001 Issued
Array ( [id] => 1529928 [patent_doc_number] => 06480011 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-11-12 [patent_title] => 'Screening of semiconductor integrated circuit devices' [patent_app_type] => B2 [patent_app_number] => 09/859478 [patent_app_country] => US [patent_app_date] => 2001-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 13 [patent_no_of_words] => 7002 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 165 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/480/06480011.pdf [firstpage_image] =>[orig_patent_app_number] => 09859478 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/859478
Screening of semiconductor integrated circuit devices May 17, 2001 Issued
Array ( [id] => 6107811 [patent_doc_number] => 20020171441 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-11-21 [patent_title] => 'Method and apparatus for accelerated life testing of a solar cell' [patent_app_type] => new [patent_app_number] => 09/859717 [patent_app_country] => US [patent_app_date] => 2001-05-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1388 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0171/20020171441.pdf [firstpage_image] =>[orig_patent_app_number] => 09859717 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/859717
Method and apparatus for accelerated life testing of a solar cell May 16, 2001 Abandoned
Array ( [id] => 6107812 [patent_doc_number] => 20020171442 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-11-21 [patent_title] => 'APPLICATION AND TEST METHODOLOGY FOR USE WITH COMPRESSION LAND GRID ARRAY CONNECTORS' [patent_app_type] => new [patent_app_number] => 09/860189 [patent_app_country] => US [patent_app_date] => 2001-05-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 1972 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0171/20020171442.pdf [firstpage_image] =>[orig_patent_app_number] => 09860189 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/860189
Application and test methodology for use with compression land grid array connectors May 16, 2001 Issued
Array ( [id] => 6479847 [patent_doc_number] => 20020024353 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-02-28 [patent_title] => 'Regulable test integrated circuit system for signal noise and method of using same' [patent_app_type] => new [patent_app_number] => 09/858538 [patent_app_country] => US [patent_app_date] => 2001-05-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 3117 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0024/20020024353.pdf [firstpage_image] =>[orig_patent_app_number] => 09858538 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/858538
Regulable test integrated circuit system for signal noise and method of using same May 16, 2001 Issued
Array ( [id] => 1348488 [patent_doc_number] => 06586923 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-07-01 [patent_title] => 'Non-contact type current measuring instrument' [patent_app_type] => B2 [patent_app_number] => 09/854477 [patent_app_country] => US [patent_app_date] => 2001-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 2585 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 179 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/586/06586923.pdf [firstpage_image] =>[orig_patent_app_number] => 09854477 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/854477
Non-contact type current measuring instrument May 14, 2001 Issued
Array ( [id] => 1169236 [patent_doc_number] => 06759863 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-07-06 [patent_title] => 'Wireless radio frequency technique design and method for testing of integrated circuits and wafers' [patent_app_type] => B2 [patent_app_number] => 09/854905 [patent_app_country] => US [patent_app_date] => 2001-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 36 [patent_no_of_words] => 13010 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/759/06759863.pdf [firstpage_image] =>[orig_patent_app_number] => 09854905 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/854905
Wireless radio frequency technique design and method for testing of integrated circuits and wafers May 14, 2001 Issued
Array ( [id] => 6107815 [patent_doc_number] => 20020171444 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-11-21 [patent_title] => 'Floating and self-aligning suspension system to automatically align and attach a connector to an assembly' [patent_app_type] => new [patent_app_number] => 09/858223 [patent_app_country] => US [patent_app_date] => 2001-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 2574 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 48 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0171/20020171444.pdf [firstpage_image] =>[orig_patent_app_number] => 09858223 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/858223
Floating and self-aligning suspension system to automatically align and attach a connector to an assembly May 14, 2001 Issued
Array ( [id] => 1183870 [patent_doc_number] => 06737880 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-05-18 [patent_title] => 'Device and method for probing instantaneous high-speed local supply voltage fluctuation in VLSI integrated circuits using IR emissions' [patent_app_type] => B2 [patent_app_number] => 09/855050 [patent_app_country] => US [patent_app_date] => 2001-05-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 3000 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 61 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/737/06737880.pdf [firstpage_image] =>[orig_patent_app_number] => 09855050 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/855050
Device and method for probing instantaneous high-speed local supply voltage fluctuation in VLSI integrated circuits using IR emissions May 13, 2001 Issued
Array ( [id] => 6092621 [patent_doc_number] => 20020050835 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-05-02 [patent_title] => 'Method and apparatus for the simultaneous electrical testing of multiple semiconductor devices' [patent_app_type] => new [patent_app_number] => 09/855295 [patent_app_country] => US [patent_app_date] => 2001-05-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4099 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0050/20020050835.pdf [firstpage_image] =>[orig_patent_app_number] => 09855295 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/855295
Method and apparatus for the simultaneous electrical testing of multiple semiconductor devices May 13, 2001 Abandoned
Array ( [id] => 1421168 [patent_doc_number] => 06525552 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-02-25 [patent_title] => 'Modular probe apparatus' [patent_app_type] => B2 [patent_app_number] => 09/854152 [patent_app_country] => US [patent_app_date] => 2001-05-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2909 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/525/06525552.pdf [firstpage_image] =>[orig_patent_app_number] => 09854152 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/854152
Modular probe apparatus May 10, 2001 Issued
Array ( [id] => 6479697 [patent_doc_number] => 20020024347 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-02-28 [patent_title] => 'Microstructure testing head' [patent_app_type] => new [patent_app_number] => 09/853884 [patent_app_country] => US [patent_app_date] => 2001-05-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3874 [patent_no_of_claims] => 44 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0024/20020024347.pdf [firstpage_image] =>[orig_patent_app_number] => 09853884 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/853884
Microstructure testing head May 9, 2001 Issued
Array ( [id] => 1060507 [patent_doc_number] => 06853208 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-02-08 [patent_title] => 'Vertical probe card' [patent_app_type] => utility [patent_app_number] => 09/851946 [patent_app_country] => US [patent_app_date] => 2001-05-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1693 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/853/06853208.pdf [firstpage_image] =>[orig_patent_app_number] => 09851946 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/851946
Vertical probe card May 9, 2001 Issued
Array ( [id] => 6881842 [patent_doc_number] => 20010048314 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-12-06 [patent_title] => 'Component holder for testing devices and component holder system microlithography' [patent_app_type] => new [patent_app_number] => 09/852969 [patent_app_country] => US [patent_app_date] => 2001-05-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3867 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 13 [patent_words_short_claim] => 23 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0048/20010048314.pdf [firstpage_image] =>[orig_patent_app_number] => 09852969 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/852969
Component holder for testing devices and component holder system microlithography May 9, 2001 Issued
Array ( [id] => 6044945 [patent_doc_number] => 20020167302 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-11-14 [patent_title] => 'Surge current measurement' [patent_app_type] => new [patent_app_number] => 09/852395 [patent_app_country] => US [patent_app_date] => 2001-05-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2329 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0167/20020167302.pdf [firstpage_image] =>[orig_patent_app_number] => 09852395 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/852395
Surge current measurement May 8, 2001 Issued
Array ( [id] => 1576718 [patent_doc_number] => 06469492 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-10-22 [patent_title] => 'Precision RMS measurement' [patent_app_type] => B1 [patent_app_number] => 09/852396 [patent_app_country] => US [patent_app_date] => 2001-05-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2203 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/469/06469492.pdf [firstpage_image] =>[orig_patent_app_number] => 09852396 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/852396
Precision RMS measurement May 8, 2001 Issued
Menu