
Jimmy Nguyen
Examiner (ID: 7143)
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2858, 2829 |
| Total Applications | 440 |
| Issued Applications | 398 |
| Pending Applications | 9 |
| Abandoned Applications | 33 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 1094230
[patent_doc_number] => 06825680
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-11-30
[patent_title] => 'Automated semiconductor probing device'
[patent_app_type] => B1
[patent_app_number] => 09/885362
[patent_app_country] => US
[patent_app_date] => 2001-06-20
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/825/06825680.pdf
[firstpage_image] =>[orig_patent_app_number] => 09885362
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/885362 | Automated semiconductor probing device | Jun 19, 2001 | Issued |
| 09/857559 | Multilevel current generator with digital control and system for testing the endurance of a component equipped with same | Jun 5, 2001 | Abandoned |
Array
(
[id] => 5799037
[patent_doc_number] => 20020008505
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[patent_issue_date] => 2002-01-24
[patent_title] => 'Peak detector'
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Array
(
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[patent_issue_date] => 2002-10-01
[patent_title] => 'Attachable/detachable probing point'
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Array
(
[id] => 5840943
[patent_doc_number] => 20020130678
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[patent_issue_date] => 2002-09-19
[patent_title] => 'Multi-channel semiconductor test system'
[patent_app_type] => new
[patent_app_number] => 09/861147
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/861147 | Multi-channel semiconductor test system | May 17, 2001 | Issued |
Array
(
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[patent_title] => 'Screening of semiconductor integrated circuit devices'
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Array
(
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[patent_title] => 'Method and apparatus for accelerated life testing of a solar cell'
[patent_app_type] => new
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[firstpage_image] =>[orig_patent_app_number] => 09859717
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/859717 | Method and apparatus for accelerated life testing of a solar cell | May 16, 2001 | Abandoned |
Array
(
[id] => 6107812
[patent_doc_number] => 20020171442
[patent_country] => US
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[patent_issue_date] => 2002-11-21
[patent_title] => 'APPLICATION AND TEST METHODOLOGY FOR USE WITH COMPRESSION LAND GRID ARRAY CONNECTORS'
[patent_app_type] => new
[patent_app_number] => 09/860189
[patent_app_country] => US
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[pdf_file] => publications/A1/0171/20020171442.pdf
[firstpage_image] =>[orig_patent_app_number] => 09860189
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/860189 | Application and test methodology for use with compression land grid array connectors | May 16, 2001 | Issued |
Array
(
[id] => 6479847
[patent_doc_number] => 20020024353
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[patent_issue_date] => 2002-02-28
[patent_title] => 'Regulable test integrated circuit system for signal noise and method of using same'
[patent_app_type] => new
[patent_app_number] => 09/858538
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[patent_app_date] => 2001-05-17
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/858538 | Regulable test integrated circuit system for signal noise and method of using same | May 16, 2001 | Issued |
Array
(
[id] => 1348488
[patent_doc_number] => 06586923
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[patent_kind] => B2
[patent_issue_date] => 2003-07-01
[patent_title] => 'Non-contact type current measuring instrument'
[patent_app_type] => B2
[patent_app_number] => 09/854477
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/854477 | Non-contact type current measuring instrument | May 14, 2001 | Issued |
Array
(
[id] => 1169236
[patent_doc_number] => 06759863
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[patent_kind] => B2
[patent_issue_date] => 2004-07-06
[patent_title] => 'Wireless radio frequency technique design and method for testing of integrated circuits and wafers'
[patent_app_type] => B2
[patent_app_number] => 09/854905
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Array
(
[id] => 6107815
[patent_doc_number] => 20020171444
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[patent_title] => 'Floating and self-aligning suspension system to automatically align and attach a connector to an assembly'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/858223 | Floating and self-aligning suspension system to automatically align and attach a connector to an assembly | May 14, 2001 | Issued |
Array
(
[id] => 1183870
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[patent_title] => 'Device and method for probing instantaneous high-speed local supply voltage fluctuation in VLSI integrated circuits using IR emissions'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/855050 | Device and method for probing instantaneous high-speed local supply voltage fluctuation in VLSI integrated circuits using IR emissions | May 13, 2001 | Issued |
Array
(
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[patent_title] => 'Method and apparatus for the simultaneous electrical testing of multiple semiconductor devices'
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Array
(
[id] => 1421168
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[patent_title] => 'Modular probe apparatus'
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Array
(
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Array
(
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Array
(
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Array
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Array
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