
Jimmy Nguyen
Examiner (ID: 7143)
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2858, 2829 |
| Total Applications | 440 |
| Issued Applications | 398 |
| Pending Applications | 9 |
| Abandoned Applications | 33 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6881843
[patent_doc_number] => 20010048315
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2001-12-06
[patent_title] => 'Apparatus for measuring thermal properties and making thermomechanical modification on sample surface with peltier tip'
[patent_app_type] => new
[patent_app_number] => 09/851319
[patent_app_country] => US
[patent_app_date] => 2001-05-09
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0048/20010048315.pdf
[firstpage_image] =>[orig_patent_app_number] => 09851319
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/851319 | Apparatus for measuring thermal properties and making thermomechanical modification on sample surface with peltier tip | May 8, 2001 | Issued |
Array
(
[id] => 1425570
[patent_doc_number] => 06507209
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-01-14
[patent_title] => 'Tester accuracy using multiple passes'
[patent_app_type] => B1
[patent_app_number] => 09/850806
[patent_app_country] => US
[patent_app_date] => 2001-05-08
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[pdf_file] => patents/06/507/06507209.pdf
[firstpage_image] =>[orig_patent_app_number] => 09850806
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/850806 | Tester accuracy using multiple passes | May 7, 2001 | Issued |
Array
(
[id] => 1232979
[patent_doc_number] => 06693449
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-02-17
[patent_title] => 'Circuit and method for determining the operating point of a semiconductor device'
[patent_app_type] => B1
[patent_app_number] => 09/851512
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/851512 | Circuit and method for determining the operating point of a semiconductor device | May 7, 2001 | Issued |
Array
(
[id] => 6998696
[patent_doc_number] => 20010052782
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2001-12-20
[patent_title] => 'BGA on-board tester'
[patent_app_type] => new
[patent_app_number] => 09/851490
[patent_app_country] => US
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[patent_effective_date] => 0000-00-00
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/851490 | BGA on-board tester | May 7, 2001 | Issued |
Array
(
[id] => 1381961
[patent_doc_number] => 06563301
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2003-05-13
[patent_title] => 'Advanced production test method and apparatus for testing electronic devices'
[patent_app_type] => B2
[patent_app_number] => 09/845912
[patent_app_country] => US
[patent_app_date] => 2001-04-30
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[pdf_file] => patents/06/563/06563301.pdf
[firstpage_image] =>[orig_patent_app_number] => 09845912
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/845912 | Advanced production test method and apparatus for testing electronic devices | Apr 29, 2001 | Issued |
Array
(
[id] => 1598375
[patent_doc_number] => 06492830
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[patent_kind] => B1
[patent_issue_date] => 2002-12-10
[patent_title] => 'Method and circuit for measuring charge dump of an individual transistor in an SOI device'
[patent_app_type] => B1
[patent_app_number] => 09/845860
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/845860 | Method and circuit for measuring charge dump of an individual transistor in an SOI device | Apr 29, 2001 | Issued |
Array
(
[id] => 1413147
[patent_doc_number] => 06535015
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-03-18
[patent_title] => 'Device and method for testing performance of silicon structures'
[patent_app_type] => B1
[patent_app_number] => 09/845266
[patent_app_country] => US
[patent_app_date] => 2001-04-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[pdf_file] => patents/06/535/06535015.pdf
[firstpage_image] =>[orig_patent_app_number] => 09845266
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/845266 | Device and method for testing performance of silicon structures | Apr 29, 2001 | Issued |
Array
(
[id] => 1151682
[patent_doc_number] => 06774658
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-08-10
[patent_title] => 'Device testing using a holding-circuit'
[patent_app_type] => B2
[patent_app_number] => 09/843606
[patent_app_country] => US
[patent_app_date] => 2001-04-26
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/774/06774658.pdf
[firstpage_image] =>[orig_patent_app_number] => 09843606
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/843606 | Device testing using a holding-circuit | Apr 25, 2001 | Issued |
Array
(
[id] => 1389340
[patent_doc_number] => 06556035
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2003-04-29
[patent_title] => 'Test key layout for detecting via-open failure'
[patent_app_type] => B2
[patent_app_number] => 09/843408
[patent_app_country] => US
[patent_app_date] => 2001-04-26
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[pdf_file] => patents/06/556/06556035.pdf
[firstpage_image] =>[orig_patent_app_number] => 09843408
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/843408 | Test key layout for detecting via-open failure | Apr 25, 2001 | Issued |
Array
(
[id] => 6447698
[patent_doc_number] => 20020149384
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-10-17
[patent_title] => 'Test probe including control device'
[patent_app_type] => new
[patent_app_number] => 09/834249
[patent_app_country] => US
[patent_app_date] => 2001-04-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 2012
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[pdf_file] => publications/A1/0149/20020149384.pdf
[firstpage_image] =>[orig_patent_app_number] => 09834249
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/834249 | Test probe including control device | Apr 10, 2001 | Abandoned |
Array
(
[id] => 1381936
[patent_doc_number] => 06563300
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-05-13
[patent_title] => 'Method and apparatus for fault detection using multiple tool error signals'
[patent_app_type] => B1
[patent_app_number] => 09/832781
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[pdf_file] => patents/06/563/06563300.pdf
[firstpage_image] =>[orig_patent_app_number] => 09832781
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/832781 | Method and apparatus for fault detection using multiple tool error signals | Apr 10, 2001 | Issued |
Array
(
[id] => 1133381
[patent_doc_number] => 06788090
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[patent_issue_date] => 2004-09-07
[patent_title] => 'Method and apparatus for inspecting semiconductor device'
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Array
(
[id] => 6447739
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[patent_title] => 'Method for the accurate electrical testing of semiconductor devices'
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Array
(
[id] => 1456146
[patent_doc_number] => 06462572
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[patent_issue_date] => 2002-10-08
[patent_title] => 'Socket used for semiconductor device and testing system connected to socket through dual-transmission lines'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/815550 | Socket used for semiconductor device and testing system connected to socket through dual-transmission lines | Mar 21, 2001 | Issued |
Array
(
[id] => 6510743
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[patent_issue_date] => 2002-09-26
[patent_title] => 'Wafer-level burn-in oven'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/813074 | Wafer-level burn-in oven | Mar 19, 2001 | Issued |
Array
(
[id] => 1393709
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[patent_title] => 'System and method for scheduling and monitoring electrical device usage'
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[firstpage_image] =>[orig_patent_app_number] => 09681290
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/681290 | System and method for scheduling and monitoring electrical device usage | Mar 13, 2001 | Issued |
Array
(
[id] => 6368334
[patent_doc_number] => 20020118031
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[patent_title] => 'Connector test card'
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[firstpage_image] =>[orig_patent_app_number] => 09794602
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/794602 | Connector test card | Feb 26, 2001 | Abandoned |
Array
(
[id] => 1292037
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[patent_title] => 'Method of predicting lifetime of semiconductor integrated circuit and method for reliability testing of the circuit'
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/774195 | Split resistor probe and method | Jan 28, 2001 | Issued |
Array
(
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