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Jimmy Nguyen

Examiner (ID: 7143)

Most Active Art Unit
2829
Art Unit(s)
2858, 2829
Total Applications
440
Issued Applications
398
Pending Applications
9
Abandoned Applications
33

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4387441 [patent_doc_number] => 06304097 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-16 [patent_title] => 'System, IC chip, on-chip test structure, and corresponding method for modeling one or more target interconnect capacitances' [patent_app_type] => 1 [patent_app_number] => 9/757067 [patent_app_country] => US [patent_app_date] => 2001-01-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4389 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 189 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/304/06304097.pdf [firstpage_image] =>[orig_patent_app_number] => 757067 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/757067
System, IC chip, on-chip test structure, and corresponding method for modeling one or more target interconnect capacitances Jan 7, 2001 Issued
Array ( [id] => 6902039 [patent_doc_number] => 20010000948 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-05-10 [patent_title] => 'System, IC chip, on-chip test structure, and corresponding method for modeling one or more target interconnect capacitances' [patent_app_type] => new-utility [patent_app_number] => 09/757066 [patent_app_country] => US [patent_app_date] => 2001-01-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4438 [patent_no_of_claims] => 38 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0000/20010000948.pdf [firstpage_image] =>[orig_patent_app_number] => 09757066 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/757066
System, IC chip, on-chip test structure, and corresponding method for modeling one or more target interconnect capacitances Jan 7, 2001 Issued
Array ( [id] => 1329303 [patent_doc_number] => 06603324 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-08-05 [patent_title] => 'Special contact points for accessing internal circuitry of an integrated circuit' [patent_app_type] => B2 [patent_app_number] => 09/753312 [patent_app_country] => US [patent_app_date] => 2000-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 34 [patent_no_of_words] => 9673 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 175 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/603/06603324.pdf [firstpage_image] =>[orig_patent_app_number] => 09753312 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/753312
Special contact points for accessing internal circuitry of an integrated circuit Dec 28, 2000 Issued
Array ( [id] => 1306852 [patent_doc_number] => 06621260 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-09-16 [patent_title] => 'Special contact points for accessing internal circuitry of an integrated circuit' [patent_app_type] => B2 [patent_app_number] => 09/752795 [patent_app_country] => US [patent_app_date] => 2000-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 35 [patent_no_of_words] => 9671 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/621/06621260.pdf [firstpage_image] =>[orig_patent_app_number] => 09752795 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/752795
Special contact points for accessing internal circuitry of an integrated circuit Dec 28, 2000 Issued
Array ( [id] => 6893407 [patent_doc_number] => 20010015773 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-08-23 [patent_title] => 'Special contact points for accessing internal circuitry of an integrated circuit' [patent_app_type] => new [patent_app_number] => 09/752902 [patent_app_country] => US [patent_app_date] => 2000-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 9757 [patent_no_of_claims] => 64 [patent_no_of_ind_claims] => 12 [patent_words_short_claim] => 32 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0015/20010015773.pdf [firstpage_image] =>[orig_patent_app_number] => 09752902 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/752902
Special contact points for accessing internal circuitry of an integrated circuit Dec 28, 2000 Issued
Array ( [id] => 7040236 [patent_doc_number] => 20010005144 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-06-28 [patent_title] => 'Configuration for testing a multiplicity of semiconductor chips' [patent_app_type] => new-utility [patent_app_number] => 09/748531 [patent_app_country] => US [patent_app_date] => 2000-12-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1296 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0005/20010005144.pdf [firstpage_image] =>[orig_patent_app_number] => 09748531 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/748531
Configuration for testing a multiplicity of semiconductor chips Dec 25, 2000 Abandoned
Array ( [id] => 6076741 [patent_doc_number] => 20020079912 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-06-27 [patent_title] => 'Test socket and system' [patent_app_type] => new [patent_app_number] => 09/746340 [patent_app_country] => US [patent_app_date] => 2000-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2715 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0079/20020079912.pdf [firstpage_image] =>[orig_patent_app_number] => 09746340 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/746340
Test socket and system Dec 21, 2000 Issued
Array ( [id] => 1591374 [patent_doc_number] => 06483285 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-11-19 [patent_title] => 'Electricity meter with an additional computing module' [patent_app_type] => B2 [patent_app_number] => 09/745908 [patent_app_country] => US [patent_app_date] => 2000-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 3344 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/483/06483285.pdf [firstpage_image] =>[orig_patent_app_number] => 09745908 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/745908
Electricity meter with an additional computing module Dec 20, 2000 Issued
Array ( [id] => 7026860 [patent_doc_number] => 20010013772 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-08-16 [patent_title] => 'Chuck device and chuck method' [patent_app_type] => new [patent_app_number] => 09/740867 [patent_app_country] => US [patent_app_date] => 2000-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6864 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 41 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0013/20010013772.pdf [firstpage_image] =>[orig_patent_app_number] => 09740867 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/740867
Chuck device and chuck method Dec 20, 2000 Abandoned
Array ( [id] => 6078770 [patent_doc_number] => 20020080852 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-06-27 [patent_title] => 'Method and apparatus for isolating an ambient air temperature sensor' [patent_app_type] => new [patent_app_number] => 09/745829 [patent_app_country] => US [patent_app_date] => 2000-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2923 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0080/20020080852.pdf [firstpage_image] =>[orig_patent_app_number] => 09745829 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/745829
Method and apparatus for isolating an ambient air temperature sensor Dec 20, 2000 Issued
Array ( [id] => 6920771 [patent_doc_number] => 20010028256 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-10-11 [patent_title] => 'Diagnostic apparatus for electronics circuit and diagnostic method using same' [patent_app_type] => new [patent_app_number] => 09/746082 [patent_app_country] => US [patent_app_date] => 2000-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 6418 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0028/20010028256.pdf [firstpage_image] =>[orig_patent_app_number] => 09746082 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/746082
Diagnostic apparatus for electronics circuit and diagnostic method using same Dec 20, 2000 Abandoned
Array ( [id] => 6934561 [patent_doc_number] => 20010055905 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-12-27 [patent_title] => 'TAB, probe card, TAB handler and method for measuring IC chip' [patent_app_type] => new [patent_app_number] => 09/741112 [patent_app_country] => US [patent_app_date] => 2000-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4526 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 60 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0055/20010055905.pdf [firstpage_image] =>[orig_patent_app_number] => 09741112 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/741112
TAB, probe card, TAB handler and method for measuring IC chip Dec 20, 2000 Abandoned
Array ( [id] => 7645080 [patent_doc_number] => 06472892 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-10-29 [patent_title] => 'Configuration for testing chips using a printed circuit board' [patent_app_type] => B2 [patent_app_number] => 09/745567 [patent_app_country] => US [patent_app_date] => 2000-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 1911 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 7 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/472/06472892.pdf [firstpage_image] =>[orig_patent_app_number] => 09745567 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/745567
Configuration for testing chips using a printed circuit board Dec 20, 2000 Issued
Array ( [id] => 1562470 [patent_doc_number] => 06437595 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-08-20 [patent_title] => 'Method and system for providing an automated switching box for testing of integrated circuit devices' [patent_app_type] => B1 [patent_app_number] => 09/742845 [patent_app_country] => US [patent_app_date] => 2000-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 3525 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 196 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/437/06437595.pdf [firstpage_image] =>[orig_patent_app_number] => 09742845 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/742845
Method and system for providing an automated switching box for testing of integrated circuit devices Dec 19, 2000 Issued
Array ( [id] => 1406313 [patent_doc_number] => 06531865 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-03-11 [patent_title] => 'Method of and apparatus for testing an integrated circuit package' [patent_app_type] => B1 [patent_app_number] => 09/741626 [patent_app_country] => US [patent_app_date] => 2000-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 3238 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/531/06531865.pdf [firstpage_image] =>[orig_patent_app_number] => 09741626 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/741626
Method of and apparatus for testing an integrated circuit package Dec 18, 2000 Issued
Array ( [id] => 6124388 [patent_doc_number] => 20020074992 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-06-20 [patent_title] => 'Method and apparatus for characterization of electronic circuitry' [patent_app_type] => new [patent_app_number] => 09/741123 [patent_app_country] => US [patent_app_date] => 2000-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 2579 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 26 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0074/20020074992.pdf [firstpage_image] =>[orig_patent_app_number] => 09741123 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/741123
Method and apparatus for characterization of electronic circuitry Dec 18, 2000 Issued
Array ( [id] => 6902037 [patent_doc_number] => 20010000946 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-05-10 [patent_title] => 'Method of and apparatus for ascertaining at least one characteristic of a substance' [patent_app_type] => new-utility [patent_app_number] => 09/734616 [patent_app_country] => US [patent_app_date] => 2000-12-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 10484 [patent_no_of_claims] => 70 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0000/20010000946.pdf [firstpage_image] =>[orig_patent_app_number] => 09734616 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/734616
Method of and apparatus for ascertaining at least one characteristic of a substance Dec 12, 2000 Issued
Array ( [id] => 6973153 [patent_doc_number] => 20010003420 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-06-14 [patent_title] => 'System and process for exploiting a test' [patent_app_type] => new-utility [patent_app_number] => 09/731791 [patent_app_country] => US [patent_app_date] => 2000-12-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1824 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0003/20010003420.pdf [firstpage_image] =>[orig_patent_app_number] => 09731791 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/731791
System and process for exploiting a test Dec 7, 2000 Issued
Array ( [id] => 1548137 [patent_doc_number] => 06445204 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-09-03 [patent_title] => 'Apparatus for probing digital signals within printed circuit boards' [patent_app_type] => B1 [patent_app_number] => 09/731762 [patent_app_country] => US [patent_app_date] => 2000-12-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 15 [patent_no_of_words] => 6345 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 48 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/445/06445204.pdf [firstpage_image] =>[orig_patent_app_number] => 09731762 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/731762
Apparatus for probing digital signals within printed circuit boards Dec 7, 2000 Issued
Array ( [id] => 7624962 [patent_doc_number] => 06724208 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-04-20 [patent_title] => 'Probe pin for testing electrical characteristics of apparatus, probe card using probe pins' [patent_app_type] => B2 [patent_app_number] => 09/733228 [patent_app_country] => US [patent_app_date] => 2000-12-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 17 [patent_no_of_words] => 5309 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 5 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/724/06724208.pdf [firstpage_image] =>[orig_patent_app_number] => 09733228 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/733228
Probe pin for testing electrical characteristics of apparatus, probe card using probe pins Dec 7, 2000 Issued
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