
Jimmy Nguyen
Examiner (ID: 7143)
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2858, 2829 |
| Total Applications | 440 |
| Issued Applications | 398 |
| Pending Applications | 9 |
| Abandoned Applications | 33 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4387441
[patent_doc_number] => 06304097
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-10-16
[patent_title] => 'System, IC chip, on-chip test structure, and corresponding method for modeling one or more target interconnect capacitances'
[patent_app_type] => 1
[patent_app_number] => 9/757067
[patent_app_country] => US
[patent_app_date] => 2001-01-08
[patent_effective_date] => 0000-00-00
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[patent_figures_cnt] => 4
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[patent_words_short_claim] => 189
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/304/06304097.pdf
[firstpage_image] =>[orig_patent_app_number] => 757067
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/757067 | System, IC chip, on-chip test structure, and corresponding method for modeling one or more target interconnect capacitances | Jan 7, 2001 | Issued |
Array
(
[id] => 6902039
[patent_doc_number] => 20010000948
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2001-05-10
[patent_title] => 'System, IC chip, on-chip test structure, and corresponding method for modeling one or more target interconnect capacitances'
[patent_app_type] => new-utility
[patent_app_number] => 09/757066
[patent_app_country] => US
[patent_app_date] => 2001-01-08
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0000/20010000948.pdf
[firstpage_image] =>[orig_patent_app_number] => 09757066
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/757066 | System, IC chip, on-chip test structure, and corresponding method for modeling one or more target interconnect capacitances | Jan 7, 2001 | Issued |
Array
(
[id] => 1329303
[patent_doc_number] => 06603324
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2003-08-05
[patent_title] => 'Special contact points for accessing internal circuitry of an integrated circuit'
[patent_app_type] => B2
[patent_app_number] => 09/753312
[patent_app_country] => US
[patent_app_date] => 2000-12-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
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[pdf_file] => patents/06/603/06603324.pdf
[firstpage_image] =>[orig_patent_app_number] => 09753312
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/753312 | Special contact points for accessing internal circuitry of an integrated circuit | Dec 28, 2000 | Issued |
Array
(
[id] => 1306852
[patent_doc_number] => 06621260
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2003-09-16
[patent_title] => 'Special contact points for accessing internal circuitry of an integrated circuit'
[patent_app_type] => B2
[patent_app_number] => 09/752795
[patent_app_country] => US
[patent_app_date] => 2000-12-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/752795 | Special contact points for accessing internal circuitry of an integrated circuit | Dec 28, 2000 | Issued |
Array
(
[id] => 6893407
[patent_doc_number] => 20010015773
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[patent_issue_date] => 2001-08-23
[patent_title] => 'Special contact points for accessing internal circuitry of an integrated circuit'
[patent_app_type] => new
[patent_app_number] => 09/752902
[patent_app_country] => US
[patent_app_date] => 2000-12-29
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[firstpage_image] =>[orig_patent_app_number] => 09752902
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/752902 | Special contact points for accessing internal circuitry of an integrated circuit | Dec 28, 2000 | Issued |
Array
(
[id] => 7040236
[patent_doc_number] => 20010005144
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2001-06-28
[patent_title] => 'Configuration for testing a multiplicity of semiconductor chips'
[patent_app_type] => new-utility
[patent_app_number] => 09/748531
[patent_app_country] => US
[patent_app_date] => 2000-12-26
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0005/20010005144.pdf
[firstpage_image] =>[orig_patent_app_number] => 09748531
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/748531 | Configuration for testing a multiplicity of semiconductor chips | Dec 25, 2000 | Abandoned |
Array
(
[id] => 6076741
[patent_doc_number] => 20020079912
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-06-27
[patent_title] => 'Test socket and system'
[patent_app_type] => new
[patent_app_number] => 09/746340
[patent_app_country] => US
[patent_app_date] => 2000-12-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_no_of_words] => 2715
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[pdf_file] => publications/A1/0079/20020079912.pdf
[firstpage_image] =>[orig_patent_app_number] => 09746340
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/746340 | Test socket and system | Dec 21, 2000 | Issued |
Array
(
[id] => 1591374
[patent_doc_number] => 06483285
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2002-11-19
[patent_title] => 'Electricity meter with an additional computing module'
[patent_app_type] => B2
[patent_app_number] => 09/745908
[patent_app_country] => US
[patent_app_date] => 2000-12-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 3344
[patent_no_of_claims] => 11
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[pdf_file] => patents/06/483/06483285.pdf
[firstpage_image] =>[orig_patent_app_number] => 09745908
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/745908 | Electricity meter with an additional computing module | Dec 20, 2000 | Issued |
Array
(
[id] => 7026860
[patent_doc_number] => 20010013772
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2001-08-16
[patent_title] => 'Chuck device and chuck method'
[patent_app_type] => new
[patent_app_number] => 09/740867
[patent_app_country] => US
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[patent_drawing_sheets_cnt] => 5
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[pdf_file] => publications/A1/0013/20010013772.pdf
[firstpage_image] =>[orig_patent_app_number] => 09740867
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/740867 | Chuck device and chuck method | Dec 20, 2000 | Abandoned |
Array
(
[id] => 6078770
[patent_doc_number] => 20020080852
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-06-27
[patent_title] => 'Method and apparatus for isolating an ambient air temperature sensor'
[patent_app_type] => new
[patent_app_number] => 09/745829
[patent_app_country] => US
[patent_app_date] => 2000-12-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[pdf_file] => publications/A1/0080/20020080852.pdf
[firstpage_image] =>[orig_patent_app_number] => 09745829
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/745829 | Method and apparatus for isolating an ambient air temperature sensor | Dec 20, 2000 | Issued |
Array
(
[id] => 6920771
[patent_doc_number] => 20010028256
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2001-10-11
[patent_title] => 'Diagnostic apparatus for electronics circuit and diagnostic method using same'
[patent_app_type] => new
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/746082 | Diagnostic apparatus for electronics circuit and diagnostic method using same | Dec 20, 2000 | Abandoned |
Array
(
[id] => 6934561
[patent_doc_number] => 20010055905
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[patent_kind] => A1
[patent_issue_date] => 2001-12-27
[patent_title] => 'TAB, probe card, TAB handler and method for measuring IC chip'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/741112 | TAB, probe card, TAB handler and method for measuring IC chip | Dec 20, 2000 | Abandoned |
Array
(
[id] => 7645080
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Array
(
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[patent_title] => 'Method and system for providing an automated switching box for testing of integrated circuit devices'
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Array
(
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/741123 | Method and apparatus for characterization of electronic circuitry | Dec 18, 2000 | Issued |
Array
(
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Array
(
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Array
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Array
(
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[firstpage_image] =>[orig_patent_app_number] => 09733228
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/733228 | Probe pin for testing electrical characteristics of apparatus, probe card using probe pins | Dec 7, 2000 | Issued |