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Jimmy Nguyen

Examiner (ID: 7143)

Most Active Art Unit
2829
Art Unit(s)
2858, 2829
Total Applications
440
Issued Applications
398
Pending Applications
9
Abandoned Applications
33

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 7012818 [patent_doc_number] => 20010050569 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-12-13 [patent_title] => 'Apparatus and method of inspecting semiconductor integrated circuit' [patent_app_type] => new [patent_app_number] => 09/730750 [patent_app_country] => US [patent_app_date] => 2000-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 6342 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0050/20010050569.pdf [firstpage_image] =>[orig_patent_app_number] => 09730750 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/730750
Apparatus and method of inspecting semiconductor integrated circuit Dec 6, 2000 Issued
Array ( [id] => 7645077 [patent_doc_number] => 06472895 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-10-29 [patent_title] => 'Method and system for adapting burn-in boards to multiple burn-in systems' [patent_app_type] => B2 [patent_app_number] => 09/732031 [patent_app_country] => US [patent_app_date] => 2000-12-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3851 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/472/06472895.pdf [firstpage_image] =>[orig_patent_app_number] => 09732031 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/732031
Method and system for adapting burn-in boards to multiple burn-in systems Dec 5, 2000 Issued
Array ( [id] => 5826318 [patent_doc_number] => 20020067156 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-06-06 [patent_title] => 'Apparatus and method for enabling auto-insertion of production level devices' [patent_app_type] => new [patent_app_number] => 09/727668 [patent_app_country] => US [patent_app_date] => 2000-12-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 2705 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 63 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0067/20020067156.pdf [firstpage_image] =>[orig_patent_app_number] => 09727668 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/727668
Apparatus and method for enabling auto-insertion of production level devices Nov 30, 2000 Issued
Array ( [id] => 1509964 [patent_doc_number] => 06441607 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-08-27 [patent_title] => 'Apparatus for docking a floating test stage in a terrestrial base' [patent_app_type] => B1 [patent_app_number] => 09/728809 [patent_app_country] => US [patent_app_date] => 2000-12-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 2412 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/441/06441607.pdf [firstpage_image] =>[orig_patent_app_number] => 09728809 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/728809
Apparatus for docking a floating test stage in a terrestrial base Nov 30, 2000 Issued
Array ( [id] => 1421586 [patent_doc_number] => 06512364 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-01-28 [patent_title] => 'Testing sensor' [patent_app_type] => B1 [patent_app_number] => 09/716773 [patent_app_country] => US [patent_app_date] => 2000-11-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 61 [patent_no_of_words] => 21028 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 263 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/512/06512364.pdf [firstpage_image] =>[orig_patent_app_number] => 09716773 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/716773
Testing sensor Nov 19, 2000 Issued
Array ( [id] => 1476799 [patent_doc_number] => 06388460 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-14 [patent_title] => 'Alternate timing wafer burn-in method' [patent_app_type] => B1 [patent_app_number] => 09/698713 [patent_app_country] => US [patent_app_date] => 2000-10-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 2329 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/388/06388460.pdf [firstpage_image] =>[orig_patent_app_number] => 09698713 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/698713
Alternate timing wafer burn-in method Oct 26, 2000 Issued
Array ( [id] => 7630876 [patent_doc_number] => 06636056 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-10-21 [patent_title] => 'Apparatus and method for testing integrated circuits' [patent_app_type] => B1 [patent_app_number] => 09/693339 [patent_app_country] => US [patent_app_date] => 2000-10-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 16 [patent_no_of_words] => 5268 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 3 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/636/06636056.pdf [firstpage_image] =>[orig_patent_app_number] => 09693339 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/693339
Apparatus and method for testing integrated circuits Oct 19, 2000 Issued
Array ( [id] => 1348442 [patent_doc_number] => 06586920 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-07-01 [patent_title] => 'Lightning detector' [patent_app_type] => B1 [patent_app_number] => 09/689816 [patent_app_country] => US [patent_app_date] => 2000-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 17 [patent_no_of_words] => 6845 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/586/06586920.pdf [firstpage_image] =>[orig_patent_app_number] => 09689816 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/689816
Lightning detector Oct 12, 2000 Issued
Array ( [id] => 1536939 [patent_doc_number] => 06489786 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-12-03 [patent_title] => 'Non-isolated type voltage sensor' [patent_app_type] => B1 [patent_app_number] => 09/686368 [patent_app_country] => US [patent_app_date] => 2000-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3625 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/489/06489786.pdf [firstpage_image] =>[orig_patent_app_number] => 09686368 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/686368
Non-isolated type voltage sensor Oct 11, 2000 Issued
Array ( [id] => 1422626 [patent_doc_number] => 06522126 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-02-18 [patent_title] => 'Semiconductor tester, and method of testing semiconductor using the same' [patent_app_type] => B1 [patent_app_number] => 09/684779 [patent_app_country] => US [patent_app_date] => 2000-10-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 22 [patent_no_of_words] => 5560 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/522/06522126.pdf [firstpage_image] =>[orig_patent_app_number] => 09684779 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/684779
Semiconductor tester, and method of testing semiconductor using the same Oct 9, 2000 Issued
Array ( [id] => 1406644 [patent_doc_number] => 06541989 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-04-01 [patent_title] => 'Testing device for semiconductor components and a method of using the device' [patent_app_type] => B1 [patent_app_number] => 09/675994 [patent_app_country] => US [patent_app_date] => 2000-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2069 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/541/06541989.pdf [firstpage_image] =>[orig_patent_app_number] => 09675994 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/675994
Testing device for semiconductor components and a method of using the device Sep 28, 2000 Issued
Array ( [id] => 1469039 [patent_doc_number] => 06459293 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-10-01 [patent_title] => 'Multiple parameter testing with improved sensitivity' [patent_app_type] => B1 [patent_app_number] => 09/672695 [patent_app_country] => US [patent_app_date] => 2000-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5387 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 46 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/459/06459293.pdf [firstpage_image] =>[orig_patent_app_number] => 09672695 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/672695
Multiple parameter testing with improved sensitivity Sep 28, 2000 Issued
Array ( [id] => 1516525 [patent_doc_number] => 06420888 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-07-16 [patent_title] => 'Test system and associated interface module' [patent_app_type] => B1 [patent_app_number] => 09/676144 [patent_app_country] => US [patent_app_date] => 2000-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 16 [patent_no_of_words] => 10326 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/420/06420888.pdf [firstpage_image] =>[orig_patent_app_number] => 09676144 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/676144
Test system and associated interface module Sep 28, 2000 Issued
Array ( [id] => 1591626 [patent_doc_number] => 06483334 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-11-19 [patent_title] => 'Method for reliability testing of semiconductor IC' [patent_app_type] => B1 [patent_app_number] => 09/670384 [patent_app_country] => US [patent_app_date] => 2000-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 2548 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/483/06483334.pdf [firstpage_image] =>[orig_patent_app_number] => 09670384 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/670384
Method for reliability testing of semiconductor IC Sep 27, 2000 Issued
Array ( [id] => 1603392 [patent_doc_number] => 06433574 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-08-13 [patent_title] => 'Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources' [patent_app_type] => B1 [patent_app_number] => 09/675072 [patent_app_country] => US [patent_app_date] => 2000-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 22 [patent_no_of_words] => 7042 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/433/06433574.pdf [firstpage_image] =>[orig_patent_app_number] => 09675072 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/675072
Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources Sep 27, 2000 Issued
Array ( [id] => 7630875 [patent_doc_number] => 06636057 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-10-21 [patent_title] => 'Electric part testing apparatus with movable adapter' [patent_app_type] => B1 [patent_app_number] => 09/667753 [patent_app_country] => US [patent_app_date] => 2000-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 14 [patent_no_of_words] => 10086 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 6 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/636/06636057.pdf [firstpage_image] =>[orig_patent_app_number] => 09667753 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/667753
Electric part testing apparatus with movable adapter Sep 20, 2000 Issued
Array ( [id] => 1341829 [patent_doc_number] => 06593765 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-07-15 [patent_title] => 'Testing apparatus and testing method for semiconductor integrated circuit' [patent_app_type] => B1 [patent_app_number] => 09/663700 [patent_app_country] => US [patent_app_date] => 2000-09-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 34 [patent_figures_cnt] => 47 [patent_no_of_words] => 19172 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 13 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/593/06593765.pdf [firstpage_image] =>[orig_patent_app_number] => 09663700 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/663700
Testing apparatus and testing method for semiconductor integrated circuit Sep 14, 2000 Issued
Array ( [id] => 1536987 [patent_doc_number] => 06489800 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-12-03 [patent_title] => 'Method of testing an integrated circuit' [patent_app_type] => B1 [patent_app_number] => 09/661727 [patent_app_country] => US [patent_app_date] => 2000-09-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 2960 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/489/06489800.pdf [firstpage_image] =>[orig_patent_app_number] => 09661727 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/661727
Method of testing an integrated circuit Sep 13, 2000 Issued
Array ( [id] => 1425831 [patent_doc_number] => 06515500 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-02-04 [patent_title] => 'Method and apparatus of testing and analyzing CMOS integrated circuit' [patent_app_type] => B1 [patent_app_number] => 09/661793 [patent_app_country] => US [patent_app_date] => 2000-09-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 15587 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/515/06515500.pdf [firstpage_image] =>[orig_patent_app_number] => 09661793 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/661793
Method and apparatus of testing and analyzing CMOS integrated circuit Sep 13, 2000 Issued
Array ( [id] => 1591593 [patent_doc_number] => 06483330 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-11-19 [patent_title] => 'Method for selecting components for a matched set using wafer interposers' [patent_app_type] => B1 [patent_app_number] => 09/659152 [patent_app_country] => US [patent_app_date] => 2000-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 7062 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/483/06483330.pdf [firstpage_image] =>[orig_patent_app_number] => 09659152 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/659152
Method for selecting components for a matched set using wafer interposers Sep 10, 2000 Issued
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