
Jimmy Nguyen
Examiner (ID: 7143)
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2858, 2829 |
| Total Applications | 440 |
| Issued Applications | 398 |
| Pending Applications | 9 |
| Abandoned Applications | 33 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 7012818
[patent_doc_number] => 20010050569
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2001-12-13
[patent_title] => 'Apparatus and method of inspecting semiconductor integrated circuit'
[patent_app_type] => new
[patent_app_number] => 09/730750
[patent_app_country] => US
[patent_app_date] => 2000-12-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 6342
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 69
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0050/20010050569.pdf
[firstpage_image] =>[orig_patent_app_number] => 09730750
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/730750 | Apparatus and method of inspecting semiconductor integrated circuit | Dec 6, 2000 | Issued |
Array
(
[id] => 7645077
[patent_doc_number] => 06472895
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2002-10-29
[patent_title] => 'Method and system for adapting burn-in boards to multiple burn-in systems'
[patent_app_type] => B2
[patent_app_number] => 09/732031
[patent_app_country] => US
[patent_app_date] => 2000-12-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 3851
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 106
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/472/06472895.pdf
[firstpage_image] =>[orig_patent_app_number] => 09732031
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/732031 | Method and system for adapting burn-in boards to multiple burn-in systems | Dec 5, 2000 | Issued |
Array
(
[id] => 5826318
[patent_doc_number] => 20020067156
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-06-06
[patent_title] => 'Apparatus and method for enabling auto-insertion of production level devices'
[patent_app_type] => new
[patent_app_number] => 09/727668
[patent_app_country] => US
[patent_app_date] => 2000-12-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 2705
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 63
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0067/20020067156.pdf
[firstpage_image] =>[orig_patent_app_number] => 09727668
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/727668 | Apparatus and method for enabling auto-insertion of production level devices | Nov 30, 2000 | Issued |
Array
(
[id] => 1509964
[patent_doc_number] => 06441607
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-08-27
[patent_title] => 'Apparatus for docking a floating test stage in a terrestrial base'
[patent_app_type] => B1
[patent_app_number] => 09/728809
[patent_app_country] => US
[patent_app_date] => 2000-12-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 6
[patent_no_of_words] => 2412
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 150
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/441/06441607.pdf
[firstpage_image] =>[orig_patent_app_number] => 09728809
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/728809 | Apparatus for docking a floating test stage in a terrestrial base | Nov 30, 2000 | Issued |
Array
(
[id] => 1421586
[patent_doc_number] => 06512364
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-01-28
[patent_title] => 'Testing sensor'
[patent_app_type] => B1
[patent_app_number] => 09/716773
[patent_app_country] => US
[patent_app_date] => 2000-11-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 26
[patent_figures_cnt] => 61
[patent_no_of_words] => 21028
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 263
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/512/06512364.pdf
[firstpage_image] =>[orig_patent_app_number] => 09716773
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/716773 | Testing sensor | Nov 19, 2000 | Issued |
Array
(
[id] => 1476799
[patent_doc_number] => 06388460
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-05-14
[patent_title] => 'Alternate timing wafer burn-in method'
[patent_app_type] => B1
[patent_app_number] => 09/698713
[patent_app_country] => US
[patent_app_date] => 2000-10-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 7
[patent_no_of_words] => 2329
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 81
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/388/06388460.pdf
[firstpage_image] =>[orig_patent_app_number] => 09698713
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/698713 | Alternate timing wafer burn-in method | Oct 26, 2000 | Issued |
Array
(
[id] => 7630876
[patent_doc_number] => 06636056
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-10-21
[patent_title] => 'Apparatus and method for testing integrated circuits'
[patent_app_type] => B1
[patent_app_number] => 09/693339
[patent_app_country] => US
[patent_app_date] => 2000-10-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 16
[patent_no_of_words] => 5268
[patent_no_of_claims] => 29
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 3
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/636/06636056.pdf
[firstpage_image] =>[orig_patent_app_number] => 09693339
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/693339 | Apparatus and method for testing integrated circuits | Oct 19, 2000 | Issued |
Array
(
[id] => 1348442
[patent_doc_number] => 06586920
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-07-01
[patent_title] => 'Lightning detector'
[patent_app_type] => B1
[patent_app_number] => 09/689816
[patent_app_country] => US
[patent_app_date] => 2000-10-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 17
[patent_no_of_words] => 6845
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 58
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/586/06586920.pdf
[firstpage_image] =>[orig_patent_app_number] => 09689816
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/689816 | Lightning detector | Oct 12, 2000 | Issued |
Array
(
[id] => 1536939
[patent_doc_number] => 06489786
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-12-03
[patent_title] => 'Non-isolated type voltage sensor'
[patent_app_type] => B1
[patent_app_number] => 09/686368
[patent_app_country] => US
[patent_app_date] => 2000-10-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 3625
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 107
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/489/06489786.pdf
[firstpage_image] =>[orig_patent_app_number] => 09686368
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/686368 | Non-isolated type voltage sensor | Oct 11, 2000 | Issued |
Array
(
[id] => 1422626
[patent_doc_number] => 06522126
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-02-18
[patent_title] => 'Semiconductor tester, and method of testing semiconductor using the same'
[patent_app_type] => B1
[patent_app_number] => 09/684779
[patent_app_country] => US
[patent_app_date] => 2000-10-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 22
[patent_no_of_words] => 5560
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 105
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/522/06522126.pdf
[firstpage_image] =>[orig_patent_app_number] => 09684779
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/684779 | Semiconductor tester, and method of testing semiconductor using the same | Oct 9, 2000 | Issued |
Array
(
[id] => 1406644
[patent_doc_number] => 06541989
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-04-01
[patent_title] => 'Testing device for semiconductor components and a method of using the device'
[patent_app_type] => B1
[patent_app_number] => 09/675994
[patent_app_country] => US
[patent_app_date] => 2000-09-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 3
[patent_no_of_words] => 2069
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 81
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/541/06541989.pdf
[firstpage_image] =>[orig_patent_app_number] => 09675994
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/675994 | Testing device for semiconductor components and a method of using the device | Sep 28, 2000 | Issued |
Array
(
[id] => 1469039
[patent_doc_number] => 06459293
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-10-01
[patent_title] => 'Multiple parameter testing with improved sensitivity'
[patent_app_type] => B1
[patent_app_number] => 09/672695
[patent_app_country] => US
[patent_app_date] => 2000-09-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 5387
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 46
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/459/06459293.pdf
[firstpage_image] =>[orig_patent_app_number] => 09672695
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/672695 | Multiple parameter testing with improved sensitivity | Sep 28, 2000 | Issued |
Array
(
[id] => 1516525
[patent_doc_number] => 06420888
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-07-16
[patent_title] => 'Test system and associated interface module'
[patent_app_type] => B1
[patent_app_number] => 09/676144
[patent_app_country] => US
[patent_app_date] => 2000-09-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 16
[patent_no_of_words] => 10326
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 158
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/420/06420888.pdf
[firstpage_image] =>[orig_patent_app_number] => 09676144
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/676144 | Test system and associated interface module | Sep 28, 2000 | Issued |
Array
(
[id] => 1591626
[patent_doc_number] => 06483334
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-11-19
[patent_title] => 'Method for reliability testing of semiconductor IC'
[patent_app_type] => B1
[patent_app_number] => 09/670384
[patent_app_country] => US
[patent_app_date] => 2000-09-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 7
[patent_no_of_words] => 2548
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 142
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/483/06483334.pdf
[firstpage_image] =>[orig_patent_app_number] => 09670384
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/670384 | Method for reliability testing of semiconductor IC | Sep 27, 2000 | Issued |
Array
(
[id] => 1603392
[patent_doc_number] => 06433574
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-08-13
[patent_title] => 'Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources'
[patent_app_type] => B1
[patent_app_number] => 09/675072
[patent_app_country] => US
[patent_app_date] => 2000-09-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 22
[patent_no_of_words] => 7042
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 100
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/433/06433574.pdf
[firstpage_image] =>[orig_patent_app_number] => 09675072
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/675072 | Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources | Sep 27, 2000 | Issued |
Array
(
[id] => 7630875
[patent_doc_number] => 06636057
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-10-21
[patent_title] => 'Electric part testing apparatus with movable adapter'
[patent_app_type] => B1
[patent_app_number] => 09/667753
[patent_app_country] => US
[patent_app_date] => 2000-09-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 14
[patent_no_of_words] => 10086
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 6
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/636/06636057.pdf
[firstpage_image] =>[orig_patent_app_number] => 09667753
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/667753 | Electric part testing apparatus with movable adapter | Sep 20, 2000 | Issued |
Array
(
[id] => 1341829
[patent_doc_number] => 06593765
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-07-15
[patent_title] => 'Testing apparatus and testing method for semiconductor integrated circuit'
[patent_app_type] => B1
[patent_app_number] => 09/663700
[patent_app_country] => US
[patent_app_date] => 2000-09-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 34
[patent_figures_cnt] => 47
[patent_no_of_words] => 19172
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 13
[patent_words_short_claim] => 67
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/593/06593765.pdf
[firstpage_image] =>[orig_patent_app_number] => 09663700
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/663700 | Testing apparatus and testing method for semiconductor integrated circuit | Sep 14, 2000 | Issued |
Array
(
[id] => 1536987
[patent_doc_number] => 06489800
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-12-03
[patent_title] => 'Method of testing an integrated circuit'
[patent_app_type] => B1
[patent_app_number] => 09/661727
[patent_app_country] => US
[patent_app_date] => 2000-09-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 2960
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 74
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/489/06489800.pdf
[firstpage_image] =>[orig_patent_app_number] => 09661727
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/661727 | Method of testing an integrated circuit | Sep 13, 2000 | Issued |
Array
(
[id] => 1425831
[patent_doc_number] => 06515500
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-02-04
[patent_title] => 'Method and apparatus of testing and analyzing CMOS integrated circuit'
[patent_app_type] => B1
[patent_app_number] => 09/661793
[patent_app_country] => US
[patent_app_date] => 2000-09-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
[patent_figures_cnt] => 18
[patent_no_of_words] => 15587
[patent_no_of_claims] => 29
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 105
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/515/06515500.pdf
[firstpage_image] =>[orig_patent_app_number] => 09661793
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/661793 | Method and apparatus of testing and analyzing CMOS integrated circuit | Sep 13, 2000 | Issued |
Array
(
[id] => 1591593
[patent_doc_number] => 06483330
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-11-19
[patent_title] => 'Method for selecting components for a matched set using wafer interposers'
[patent_app_type] => B1
[patent_app_number] => 09/659152
[patent_app_country] => US
[patent_app_date] => 2000-09-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 11
[patent_no_of_words] => 7062
[patent_no_of_claims] => 42
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 100
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/483/06483330.pdf
[firstpage_image] =>[orig_patent_app_number] => 09659152
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/659152 | Method for selecting components for a matched set using wafer interposers | Sep 10, 2000 | Issued |