Search

Jimmy Nguyen

Examiner (ID: 7143)

Most Active Art Unit
2829
Art Unit(s)
2858, 2829
Total Applications
440
Issued Applications
398
Pending Applications
9
Abandoned Applications
33

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 7639659 [patent_doc_number] => 06396257 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-28 [patent_title] => 'Test head manipulator for semiconductor tester with manual assist for vertical test head movement' [patent_app_type] => B1 [patent_app_number] => 09/558875 [patent_app_country] => US [patent_app_date] => 2000-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2478 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 12 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/396/06396257.pdf [firstpage_image] =>[orig_patent_app_number] => 09558875 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/558875
Test head manipulator for semiconductor tester with manual assist for vertical test head movement Apr 25, 2000 Issued
Array ( [id] => 1412992 [patent_doc_number] => 06535005 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-03-18 [patent_title] => 'Systems and methods for obtaining an electrical characteristics of a circuit board assembly process' [patent_app_type] => B1 [patent_app_number] => 09/558638 [patent_app_country] => US [patent_app_date] => 2000-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 11 [patent_no_of_words] => 7162 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/535/06535005.pdf [firstpage_image] =>[orig_patent_app_number] => 09558638 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/558638
Systems and methods for obtaining an electrical characteristics of a circuit board assembly process Apr 25, 2000 Issued
Array ( [id] => 1522582 [patent_doc_number] => 06414508 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-07-02 [patent_title] => 'Methods for predicting reliability of semiconductor devices using voltage stressing' [patent_app_type] => B1 [patent_app_number] => 09/557747 [patent_app_country] => US [patent_app_date] => 2000-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 14 [patent_no_of_words] => 7349 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/414/06414508.pdf [firstpage_image] =>[orig_patent_app_number] => 09557747 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/557747
Methods for predicting reliability of semiconductor devices using voltage stressing Apr 24, 2000 Issued
Array ( [id] => 1419194 [patent_doc_number] => 06529021 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-03-04 [patent_title] => 'Self-scrub buckling beam probe' [patent_app_type] => B1 [patent_app_number] => 09/558428 [patent_app_country] => US [patent_app_date] => 2000-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3414 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 235 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/529/06529021.pdf [firstpage_image] =>[orig_patent_app_number] => 09558428 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/558428
Self-scrub buckling beam probe Apr 24, 2000 Issued
Array ( [id] => 1413065 [patent_doc_number] => 06535009 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-03-18 [patent_title] => 'Configuration for carrying out burn-in processing operations of semiconductor devices at wafer level' [patent_app_type] => B1 [patent_app_number] => 09/553126 [patent_app_country] => US [patent_app_date] => 2000-04-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 2735 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 21 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/535/06535009.pdf [firstpage_image] =>[orig_patent_app_number] => 09553126 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/553126
Configuration for carrying out burn-in processing operations of semiconductor devices at wafer level Apr 18, 2000 Issued
Array ( [id] => 7639618 [patent_doc_number] => 06396298 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-28 [patent_title] => 'Active feedback pulsed measurement method' [patent_app_type] => B1 [patent_app_number] => 09/549503 [patent_app_country] => US [patent_app_date] => 2000-04-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 6360 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 24 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/396/06396298.pdf [firstpage_image] =>[orig_patent_app_number] => 09549503 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/549503
Active feedback pulsed measurement method Apr 13, 2000 Issued
Array ( [id] => 1569046 [patent_doc_number] => 06377065 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-04-23 [patent_title] => 'Glitch detection for semiconductor test system' [patent_app_type] => B1 [patent_app_number] => 09/548875 [patent_app_country] => US [patent_app_date] => 2000-04-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 27 [patent_no_of_words] => 4721 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 174 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/377/06377065.pdf [firstpage_image] =>[orig_patent_app_number] => 09548875 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/548875
Glitch detection for semiconductor test system Apr 12, 2000 Issued
Array ( [id] => 1516455 [patent_doc_number] => 06420864 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-07-16 [patent_title] => 'Modular substrate measurement system' [patent_app_type] => B1 [patent_app_number] => 09/548773 [patent_app_country] => US [patent_app_date] => 2000-04-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 3402 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/420/06420864.pdf [firstpage_image] =>[orig_patent_app_number] => 09548773 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/548773
Modular substrate measurement system Apr 12, 2000 Issued
Array ( [id] => 4326854 [patent_doc_number] => 06331770 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-12-18 [patent_title] => 'Application specific event based semiconductor test system' [patent_app_type] => 1 [patent_app_number] => 9/547753 [patent_app_country] => US [patent_app_date] => 2000-04-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 12 [patent_no_of_words] => 7375 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/331/06331770.pdf [firstpage_image] =>[orig_patent_app_number] => 547753 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/547753
Application specific event based semiconductor test system Apr 11, 2000 Issued
Array ( [id] => 1366300 [patent_doc_number] => 06573703 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-06-03 [patent_title] => 'Semiconductor device' [patent_app_type] => B1 [patent_app_number] => 09/543364 [patent_app_country] => US [patent_app_date] => 2000-04-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 20 [patent_no_of_words] => 5480 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 60 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/573/06573703.pdf [firstpage_image] =>[orig_patent_app_number] => 09543364 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/543364
Semiconductor device Apr 4, 2000 Issued
Array ( [id] => 1479088 [patent_doc_number] => 06344737 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-02-05 [patent_title] => 'Picker nest for holding an IC package with minimized stress on an IC component during testing' [patent_app_type] => B1 [patent_app_number] => 09/541572 [patent_app_country] => US [patent_app_date] => 2000-04-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 10 [patent_no_of_words] => 3342 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 195 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/344/06344737.pdf [firstpage_image] =>[orig_patent_app_number] => 09541572 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/541572
Picker nest for holding an IC package with minimized stress on an IC component during testing Apr 2, 2000 Issued
Array ( [id] => 1322430 [patent_doc_number] => 06605955 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-08-12 [patent_title] => 'Temperature controlled wafer chuck system with low thermal resistance' [patent_app_type] => B1 [patent_app_number] => 09/491275 [patent_app_country] => US [patent_app_date] => 2000-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 32 [patent_no_of_words] => 12203 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 87 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/605/06605955.pdf [firstpage_image] =>[orig_patent_app_number] => 09491275 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/491275
Temperature controlled wafer chuck system with low thermal resistance Jan 25, 2000 Issued
Array ( [id] => 4357809 [patent_doc_number] => 06215324 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-04-10 [patent_title] => 'Dynamic burn-in test equipment' [patent_app_type] => 1 [patent_app_number] => 9/478053 [patent_app_country] => US [patent_app_date] => 2000-01-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6434 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 186 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/215/06215324.pdf [firstpage_image] =>[orig_patent_app_number] => 478053 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/478053
Dynamic burn-in test equipment Jan 4, 2000 Issued
Array ( [id] => 4267509 [patent_doc_number] => 06259245 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-10 [patent_title] => 'Electric-current sensing device' [patent_app_type] => 1 [patent_app_number] => 9/472742 [patent_app_country] => US [patent_app_date] => 1999-12-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 5430 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 256 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/259/06259245.pdf [firstpage_image] =>[orig_patent_app_number] => 472742 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/472742
Electric-current sensing device Dec 26, 1999 Issued
Array ( [id] => 1376761 [patent_doc_number] => 06566857 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-05-20 [patent_title] => 'Testing of digital-to-analog converters' [patent_app_type] => B1 [patent_app_number] => 09/468201 [patent_app_country] => US [patent_app_date] => 1999-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3063 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/566/06566857.pdf [firstpage_image] =>[orig_patent_app_number] => 09468201 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/468201
Testing of digital-to-analog converters Dec 19, 1999 Issued
Array ( [id] => 1452771 [patent_doc_number] => 06456059 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-09-24 [patent_title] => 'Non-homogeneous material magnetic flux sensor and method' [patent_app_type] => B1 [patent_app_number] => 09/459683 [patent_app_country] => US [patent_app_date] => 1999-12-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 12 [patent_no_of_words] => 8836 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 78 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/456/06456059.pdf [firstpage_image] =>[orig_patent_app_number] => 09459683 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/459683
Non-homogeneous material magnetic flux sensor and method Dec 12, 1999 Issued
Array ( [id] => 1563612 [patent_doc_number] => 06362643 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-03-26 [patent_title] => 'Apparatus and method for testing driving circuit in liquid crystal display' [patent_app_type] => B1 [patent_app_number] => 09/458822 [patent_app_country] => US [patent_app_date] => 1999-12-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 10489 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/362/06362643.pdf [firstpage_image] =>[orig_patent_app_number] => 09458822 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/458822
Apparatus and method for testing driving circuit in liquid crystal display Dec 12, 1999 Issued
Array ( [id] => 7639662 [patent_doc_number] => 06396254 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-28 [patent_title] => 'Read channel' [patent_app_type] => B1 [patent_app_number] => 09/454626 [patent_app_country] => US [patent_app_date] => 1999-12-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 23 [patent_no_of_words] => 11323 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 5 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/396/06396254.pdf [firstpage_image] =>[orig_patent_app_number] => 09454626 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/454626
Read channel Dec 5, 1999 Issued
Array ( [id] => 7646922 [patent_doc_number] => 06476596 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-11-05 [patent_title] => 'Method and apparatus for detection of terahertz electric fields using polarization-sensitive excitonic electroabsorption' [patent_app_type] => B1 [patent_app_number] => 09/459386 [patent_app_country] => US [patent_app_date] => 1999-12-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 13 [patent_no_of_words] => 4349 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 12 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/476/06476596.pdf [firstpage_image] =>[orig_patent_app_number] => 09459386 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/459386
Method and apparatus for detection of terahertz electric fields using polarization-sensitive excitonic electroabsorption Dec 5, 1999 Issued
Array ( [id] => 4338717 [patent_doc_number] => 06313635 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-11-06 [patent_title] => 'High voltage sensor assembly' [patent_app_type] => 1 [patent_app_number] => 9/454036 [patent_app_country] => US [patent_app_date] => 1999-12-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 7 [patent_no_of_words] => 5395 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 151 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/313/06313635.pdf [firstpage_image] =>[orig_patent_app_number] => 454036 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/454036
High voltage sensor assembly Dec 2, 1999 Issued
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