
Jimmy Nguyen
Examiner (ID: 7143)
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2858, 2829 |
| Total Applications | 440 |
| Issued Applications | 398 |
| Pending Applications | 9 |
| Abandoned Applications | 33 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 7639659
[patent_doc_number] => 06396257
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-05-28
[patent_title] => 'Test head manipulator for semiconductor tester with manual assist for vertical test head movement'
[patent_app_type] => B1
[patent_app_number] => 09/558875
[patent_app_country] => US
[patent_app_date] => 2000-04-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2478
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 12
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/396/06396257.pdf
[firstpage_image] =>[orig_patent_app_number] => 09558875
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/558875 | Test head manipulator for semiconductor tester with manual assist for vertical test head movement | Apr 25, 2000 | Issued |
Array
(
[id] => 1412992
[patent_doc_number] => 06535005
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-03-18
[patent_title] => 'Systems and methods for obtaining an electrical characteristics of a circuit board assembly process'
[patent_app_type] => B1
[patent_app_number] => 09/558638
[patent_app_country] => US
[patent_app_date] => 2000-04-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 11
[patent_no_of_words] => 7162
[patent_no_of_claims] => 35
[patent_no_of_ind_claims] => 7
[patent_words_short_claim] => 89
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/535/06535005.pdf
[firstpage_image] =>[orig_patent_app_number] => 09558638
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/558638 | Systems and methods for obtaining an electrical characteristics of a circuit board assembly process | Apr 25, 2000 | Issued |
Array
(
[id] => 1522582
[patent_doc_number] => 06414508
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-07-02
[patent_title] => 'Methods for predicting reliability of semiconductor devices using voltage stressing'
[patent_app_type] => B1
[patent_app_number] => 09/557747
[patent_app_country] => US
[patent_app_date] => 2000-04-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 14
[patent_no_of_words] => 7349
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 140
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/414/06414508.pdf
[firstpage_image] =>[orig_patent_app_number] => 09557747
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/557747 | Methods for predicting reliability of semiconductor devices using voltage stressing | Apr 24, 2000 | Issued |
Array
(
[id] => 1419194
[patent_doc_number] => 06529021
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-03-04
[patent_title] => 'Self-scrub buckling beam probe'
[patent_app_type] => B1
[patent_app_number] => 09/558428
[patent_app_country] => US
[patent_app_date] => 2000-04-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3414
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 235
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/529/06529021.pdf
[firstpage_image] =>[orig_patent_app_number] => 09558428
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/558428 | Self-scrub buckling beam probe | Apr 24, 2000 | Issued |
Array
(
[id] => 1413065
[patent_doc_number] => 06535009
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-03-18
[patent_title] => 'Configuration for carrying out burn-in processing operations of semiconductor devices at wafer level'
[patent_app_type] => B1
[patent_app_number] => 09/553126
[patent_app_country] => US
[patent_app_date] => 2000-04-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 2
[patent_no_of_words] => 2735
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 21
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/535/06535009.pdf
[firstpage_image] =>[orig_patent_app_number] => 09553126
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/553126 | Configuration for carrying out burn-in processing operations of semiconductor devices at wafer level | Apr 18, 2000 | Issued |
Array
(
[id] => 7639618
[patent_doc_number] => 06396298
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-05-28
[patent_title] => 'Active feedback pulsed measurement method'
[patent_app_type] => B1
[patent_app_number] => 09/549503
[patent_app_country] => US
[patent_app_date] => 2000-04-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 8
[patent_no_of_words] => 6360
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 24
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/396/06396298.pdf
[firstpage_image] =>[orig_patent_app_number] => 09549503
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/549503 | Active feedback pulsed measurement method | Apr 13, 2000 | Issued |
Array
(
[id] => 1569046
[patent_doc_number] => 06377065
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-04-23
[patent_title] => 'Glitch detection for semiconductor test system'
[patent_app_type] => B1
[patent_app_number] => 09/548875
[patent_app_country] => US
[patent_app_date] => 2000-04-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 27
[patent_no_of_words] => 4721
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 174
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/377/06377065.pdf
[firstpage_image] =>[orig_patent_app_number] => 09548875
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/548875 | Glitch detection for semiconductor test system | Apr 12, 2000 | Issued |
Array
(
[id] => 1516455
[patent_doc_number] => 06420864
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-07-16
[patent_title] => 'Modular substrate measurement system'
[patent_app_type] => B1
[patent_app_number] => 09/548773
[patent_app_country] => US
[patent_app_date] => 2000-04-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 7
[patent_no_of_words] => 3402
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 132
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/420/06420864.pdf
[firstpage_image] =>[orig_patent_app_number] => 09548773
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/548773 | Modular substrate measurement system | Apr 12, 2000 | Issued |
Array
(
[id] => 4326854
[patent_doc_number] => 06331770
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-12-18
[patent_title] => 'Application specific event based semiconductor test system'
[patent_app_type] => 1
[patent_app_number] => 9/547753
[patent_app_country] => US
[patent_app_date] => 2000-04-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 12
[patent_no_of_words] => 7375
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 118
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/331/06331770.pdf
[firstpage_image] =>[orig_patent_app_number] => 547753
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/547753 | Application specific event based semiconductor test system | Apr 11, 2000 | Issued |
Array
(
[id] => 1366300
[patent_doc_number] => 06573703
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-06-03
[patent_title] => 'Semiconductor device'
[patent_app_type] => B1
[patent_app_number] => 09/543364
[patent_app_country] => US
[patent_app_date] => 2000-04-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 20
[patent_no_of_words] => 5480
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 60
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/573/06573703.pdf
[firstpage_image] =>[orig_patent_app_number] => 09543364
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/543364 | Semiconductor device | Apr 4, 2000 | Issued |
Array
(
[id] => 1479088
[patent_doc_number] => 06344737
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-02-05
[patent_title] => 'Picker nest for holding an IC package with minimized stress on an IC component during testing'
[patent_app_type] => B1
[patent_app_number] => 09/541572
[patent_app_country] => US
[patent_app_date] => 2000-04-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 10
[patent_no_of_words] => 3342
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 195
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/344/06344737.pdf
[firstpage_image] =>[orig_patent_app_number] => 09541572
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/541572 | Picker nest for holding an IC package with minimized stress on an IC component during testing | Apr 2, 2000 | Issued |
Array
(
[id] => 1322430
[patent_doc_number] => 06605955
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-08-12
[patent_title] => 'Temperature controlled wafer chuck system with low thermal resistance'
[patent_app_type] => B1
[patent_app_number] => 09/491275
[patent_app_country] => US
[patent_app_date] => 2000-01-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 32
[patent_no_of_words] => 12203
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 87
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/605/06605955.pdf
[firstpage_image] =>[orig_patent_app_number] => 09491275
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/491275 | Temperature controlled wafer chuck system with low thermal resistance | Jan 25, 2000 | Issued |
Array
(
[id] => 4357809
[patent_doc_number] => 06215324
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-04-10
[patent_title] => 'Dynamic burn-in test equipment'
[patent_app_type] => 1
[patent_app_number] => 9/478053
[patent_app_country] => US
[patent_app_date] => 2000-01-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 6434
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 186
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/215/06215324.pdf
[firstpage_image] =>[orig_patent_app_number] => 478053
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/478053 | Dynamic burn-in test equipment | Jan 4, 2000 | Issued |
Array
(
[id] => 4267509
[patent_doc_number] => 06259245
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-07-10
[patent_title] => 'Electric-current sensing device'
[patent_app_type] => 1
[patent_app_number] => 9/472742
[patent_app_country] => US
[patent_app_date] => 1999-12-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 15
[patent_no_of_words] => 5430
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 256
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/259/06259245.pdf
[firstpage_image] =>[orig_patent_app_number] => 472742
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/472742 | Electric-current sensing device | Dec 26, 1999 | Issued |
Array
(
[id] => 1376761
[patent_doc_number] => 06566857
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-05-20
[patent_title] => 'Testing of digital-to-analog converters'
[patent_app_type] => B1
[patent_app_number] => 09/468201
[patent_app_country] => US
[patent_app_date] => 1999-12-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 3063
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 7
[patent_words_short_claim] => 76
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/566/06566857.pdf
[firstpage_image] =>[orig_patent_app_number] => 09468201
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/468201 | Testing of digital-to-analog converters | Dec 19, 1999 | Issued |
Array
(
[id] => 1452771
[patent_doc_number] => 06456059
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-09-24
[patent_title] => 'Non-homogeneous material magnetic flux sensor and method'
[patent_app_type] => B1
[patent_app_number] => 09/459683
[patent_app_country] => US
[patent_app_date] => 1999-12-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 12
[patent_no_of_words] => 8836
[patent_no_of_claims] => 34
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 78
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/456/06456059.pdf
[firstpage_image] =>[orig_patent_app_number] => 09459683
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/459683 | Non-homogeneous material magnetic flux sensor and method | Dec 12, 1999 | Issued |
Array
(
[id] => 1563612
[patent_doc_number] => 06362643
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-03-26
[patent_title] => 'Apparatus and method for testing driving circuit in liquid crystal display'
[patent_app_type] => B1
[patent_app_number] => 09/458822
[patent_app_country] => US
[patent_app_date] => 1999-12-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 10489
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 10
[patent_words_short_claim] => 142
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/362/06362643.pdf
[firstpage_image] =>[orig_patent_app_number] => 09458822
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/458822 | Apparatus and method for testing driving circuit in liquid crystal display | Dec 12, 1999 | Issued |
Array
(
[id] => 7639662
[patent_doc_number] => 06396254
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-05-28
[patent_title] => 'Read channel'
[patent_app_type] => B1
[patent_app_number] => 09/454626
[patent_app_country] => US
[patent_app_date] => 1999-12-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 23
[patent_no_of_words] => 11323
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 5
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/396/06396254.pdf
[firstpage_image] =>[orig_patent_app_number] => 09454626
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/454626 | Read channel | Dec 5, 1999 | Issued |
Array
(
[id] => 7646922
[patent_doc_number] => 06476596
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-11-05
[patent_title] => 'Method and apparatus for detection of terahertz electric fields using polarization-sensitive excitonic electroabsorption'
[patent_app_type] => B1
[patent_app_number] => 09/459386
[patent_app_country] => US
[patent_app_date] => 1999-12-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 13
[patent_no_of_words] => 4349
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 12
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/476/06476596.pdf
[firstpage_image] =>[orig_patent_app_number] => 09459386
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/459386 | Method and apparatus for detection of terahertz electric fields using polarization-sensitive excitonic electroabsorption | Dec 5, 1999 | Issued |
Array
(
[id] => 4338717
[patent_doc_number] => 06313635
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-11-06
[patent_title] => 'High voltage sensor assembly'
[patent_app_type] => 1
[patent_app_number] => 9/454036
[patent_app_country] => US
[patent_app_date] => 1999-12-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 7
[patent_no_of_words] => 5395
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 151
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/313/06313635.pdf
[firstpage_image] =>[orig_patent_app_number] => 454036
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/454036 | High voltage sensor assembly | Dec 2, 1999 | Issued |