Jimmy Nguyen

Array ( [id] => 1425523 [patent_doc_number] => 06507203 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-01-14 [patent_title] => 'Test head assembly' [patent_app_type] => B1 [patent_app_number] => 09/451896 [patent_app_country] => US [patent_app_date] => 1999-12-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 4510 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/507/06507203.pdf [firstpage_image] =>[orig_patent_app_number] => 09451896 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4311923 [patent_doc_number] => 06326798 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-12-04 [patent_title] => 'Electric beam tester and image processing apparatus' [patent_app_type] => 1 [patent_app_number] => 9/451854 [patent_app_country] => US [patent_app_date] => 1999-12-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 2738 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/326/06326798.pdf [firstpage_image] =>[orig_patent_app_number] => 451854 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4378433 [patent_doc_number] => 06288557 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-09-11 [patent_title] => 'Probe station having inner and outer shielding' [patent_app_type] => 1 [patent_app_number] => 9/451698 [patent_app_country] => US [patent_app_date] => 1999-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2570 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/288/06288557.pdf [firstpage_image] =>[orig_patent_app_number] => 451698 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1576826 [patent_doc_number] => 06469528 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-10-22 [patent_title] => 'Electro-optic sampling probe and measuring method using the same' [patent_app_type] => B2 [patent_app_number] => 09/452295 [patent_app_country] => US [patent_app_date] => 1999-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3616 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/469/06469528.pdf [firstpage_image] =>[orig_patent_app_number] => 09452295 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1476779 [patent_doc_number] => 06388454 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-14 [patent_title] => 'Electro-optic sampling prober' [patent_app_type] => B1 [patent_app_number] => 09/452297 [patent_app_country] => US [patent_app_date] => 1999-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5262 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 239 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/388/06388454.pdf [firstpage_image] =>[orig_patent_app_number] => 09452297 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4284567 [patent_doc_number] => 06281694 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-28 [patent_title] => 'Monitor method for testing probe pins' [patent_app_type] => 1 [patent_app_number] => 9/449662 [patent_app_country] => US [patent_app_date] => 1999-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 1924 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 63 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/281/06281694.pdf [firstpage_image] =>[orig_patent_app_number] => 449662 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1597739 [patent_doc_number] => 06384617 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-07 [patent_title] => 'Signal transfer device for probe test fixture' [patent_app_type] => B1 [patent_app_number] => 09/441473 [patent_app_country] => US [patent_app_date] => 1999-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2869 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 148 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/384/06384617.pdf [firstpage_image] =>[orig_patent_app_number] => 09441473 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4391501 [patent_doc_number] => 06262571 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-17 [patent_title] => 'Adjustable electrical connector for test fixture nest' [patent_app_type] => 1 [patent_app_number] => 9/442434 [patent_app_country] => US [patent_app_date] => 1999-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 4012 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/262/06262571.pdf [firstpage_image] =>[orig_patent_app_number] => 442434 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1462067 [patent_doc_number] => 06392428 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-21 [patent_title] => 'Wafer level interposer' [patent_app_type] => B1 [patent_app_number] => 09/440751 [patent_app_country] => US [patent_app_date] => 1999-11-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 3757 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 165 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/392/06392428.pdf [firstpage_image] =>[orig_patent_app_number] => 09440751 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4375377 [patent_doc_number] => 06275054 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-14 [patent_title] => 'Electrical contact system' [patent_app_type] => 1 [patent_app_number] => 9/440800 [patent_app_country] => US [patent_app_date] => 1999-11-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 16 [patent_no_of_words] => 3182 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 265 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/275/06275054.pdf [firstpage_image] =>[orig_patent_app_number] => 440800 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4338899 [patent_doc_number] => 06313647 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-11-06 [patent_title] => 'Technique for measuring resistivity' [patent_app_type] => 1 [patent_app_number] => 9/436586 [patent_app_country] => US [patent_app_date] => 1999-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 14 [patent_no_of_words] => 4615 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/313/06313647.pdf [firstpage_image] =>[orig_patent_app_number] => 436586 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1562435 [patent_doc_number] => 06437587 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-08-20 [patent_title] => 'ICT test fixture for fine pitch testing' [patent_app_type] => B1 [patent_app_number] => 09/434195 [patent_app_country] => US [patent_app_date] => 1999-11-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 5072 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/437/06437587.pdf [firstpage_image] =>[orig_patent_app_number] => 09434195 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5886325 [patent_doc_number] => 20020011864 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-01-31 [patent_title] => 'SOCKET PIN AND SOCKET FOR ELECTRICAL TESTING OF SEMICONDUCTOR PACKAGES' [patent_app_type] => new [patent_app_number] => 09/430997 [patent_app_country] => US [patent_app_date] => 1999-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3133 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0011/20020011864.pdf [firstpage_image] =>[orig_patent_app_number] => 09430997 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4415759 [patent_doc_number] => 06229326 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-05-08 [patent_title] => 'Method and apparatus for testing electronic device in burn-in process' [patent_app_type] => 1 [patent_app_number] => 9/412152 [patent_app_country] => US [patent_app_date] => 1999-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2733 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/229/06229326.pdf [firstpage_image] =>[orig_patent_app_number] => 412152 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4414876 [patent_doc_number] => 06310486 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-30 [patent_title] => 'Integrated test cell' [patent_app_type] => 1 [patent_app_number] => 9/410857 [patent_app_country] => US [patent_app_date] => 1999-10-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2982 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/310/06310486.pdf [firstpage_image] =>[orig_patent_app_number] => 410857 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1519495 [patent_doc_number] => 06501290 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-12-31 [patent_title] => 'Direct to chuck coolant delivery for integrated circuit testing' [patent_app_type] => B2 [patent_app_number] => 09/408891 [patent_app_country] => US [patent_app_date] => 1999-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 1827 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/501/06501290.pdf [firstpage_image] =>[orig_patent_app_number] => 09408891 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4391678 [patent_doc_number] => 06262584 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-17 [patent_title] => 'IC device temperature control system and IC device inspection apparatus incorporating the same' [patent_app_type] => 1 [patent_app_number] => 9/408777 [patent_app_country] => US [patent_app_date] => 1999-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 6152 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/262/06262584.pdf [firstpage_image] =>[orig_patent_app_number] => 408777 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4293734 [patent_doc_number] => 06268718 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-31 [patent_title] => 'Burn-in test device' [patent_app_type] => 1 [patent_app_number] => 9/401390 [patent_app_country] => US [patent_app_date] => 1999-09-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 2565 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/268/06268718.pdf [firstpage_image] =>[orig_patent_app_number] => 401390 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4415704 [patent_doc_number] => 06265887 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-24 [patent_title] => 'Mounting fixture for a pin grid array device' [patent_app_type] => 1 [patent_app_number] => 9/400750 [patent_app_country] => US [patent_app_date] => 1999-09-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2148 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/265/06265887.pdf [firstpage_image] =>[orig_patent_app_number] => 400750 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4245861 [patent_doc_number] => 06091237 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-07-18 [patent_title] => 'Three-phrase clamp-type power meter' [patent_app_type] => 1 [patent_app_number] => 9/395350 [patent_app_country] => US [patent_app_date] => 1999-09-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3435 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 232 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/091/06091237.pdf [firstpage_image] =>[orig_patent_app_number] => 395350 [rel_patent_id] =>[rel_patent_doc_number] =>)