
Jimmy Nguyen
Examiner (ID: 7143)
| Most Active Art Unit | 2829 |
| Art Unit(s) | 2858, 2829 |
| Total Applications | 440 |
| Issued Applications | 398 |
| Pending Applications | 9 |
| Abandoned Applications | 33 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 1472104
[patent_doc_number] => 06407562
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-06-18
[patent_title] => 'Probe tip terminating device providing an easily changeable feed-through termination'
[patent_app_type] => B1
[patent_app_number] => 09/354759
[patent_app_country] => US
[patent_app_date] => 1999-07-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[patent_no_of_words] => 2299
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/407/06407562.pdf
[firstpage_image] =>[orig_patent_app_number] => 09354759
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/354759 | Probe tip terminating device providing an easily changeable feed-through termination | Jul 28, 1999 | Issued |
Array
(
[id] => 4389953
[patent_doc_number] => 06278285
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-08-21
[patent_title] => 'Configuration for testing integrated components'
[patent_app_type] => 1
[patent_app_number] => 9/356955
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[patent_app_date] => 1999-07-19
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Array
(
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[patent_doc_number] => 06529028
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[patent_kind] => B1
[patent_issue_date] => 2003-03-04
[patent_title] => 'Configuration for testing a plurality of memory chips on a wafer'
[patent_app_type] => B1
[patent_app_number] => 09/302649
[patent_app_country] => US
[patent_app_date] => 1999-04-30
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/302649 | Configuration for testing a plurality of memory chips on a wafer | Apr 29, 1999 | Issued |
Array
(
[id] => 4414128
[patent_doc_number] => 06239591
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-05-29
[patent_title] => 'Method and apparatus for monitoring SOI hysterises effects'
[patent_app_type] => 1
[patent_app_number] => 9/303358
[patent_app_country] => US
[patent_app_date] => 1999-04-29
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[pdf_file] => patents/06/239/06239591.pdf
[firstpage_image] =>[orig_patent_app_number] => 303358
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/303358 | Method and apparatus for monitoring SOI hysterises effects | Apr 28, 1999 | Issued |
Array
(
[id] => 4279409
[patent_doc_number] => 06246251
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-06-12
[patent_title] => 'Test process and apparatus for testing singulated semiconductor die'
[patent_app_type] => 1
[patent_app_number] => 9/298659
[patent_app_country] => US
[patent_app_date] => 1999-04-23
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[pdf_file] => patents/06/246/06246251.pdf
[firstpage_image] =>[orig_patent_app_number] => 298659
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/298659 | Test process and apparatus for testing singulated semiconductor die | Apr 22, 1999 | Issued |
Array
(
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[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-10-09
[patent_title] => 'Procedure for the calibration of a measuring device'
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[pdf_file] => patents/06/300/06300757.pdf
[firstpage_image] =>[orig_patent_app_number] => 296035
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/296035 | Procedure for the calibration of a measuring device | Apr 20, 1999 | Issued |
Array
(
[id] => 1497681
[patent_doc_number] => 06404181
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[patent_issue_date] => 2002-06-11
[patent_title] => 'Parts container, method of inspecting parts using same, and apparatus therefor'
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[patent_app_number] => 09/284643
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[patent_app_date] => 1999-04-16
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[pdf_file] => patents/06/404/06404181.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/284643 | Parts container, method of inspecting parts using same, and apparatus therefor | Apr 15, 1999 | Issued |
Array
(
[id] => 4267727
[patent_doc_number] => 06259261
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-07-10
[patent_title] => 'Method and apparatus for electrically testing semiconductor devices fabricated on a wafer'
[patent_app_type] => 1
[patent_app_number] => 9/292741
[patent_app_country] => US
[patent_app_date] => 1999-04-16
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[pdf_file] => patents/06/259/06259261.pdf
[firstpage_image] =>[orig_patent_app_number] => 292741
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/292741 | Method and apparatus for electrically testing semiconductor devices fabricated on a wafer | Apr 15, 1999 | Issued |
Array
(
[id] => 1553666
[patent_doc_number] => 06400166
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2002-06-04
[patent_title] => 'Micro probe and method of fabricating same'
[patent_app_type] => B2
[patent_app_number] => 09/292721
[patent_app_country] => US
[patent_app_date] => 1999-04-15
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[pdf_file] => patents/06/400/06400166.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/292721 | Micro probe and method of fabricating same | Apr 14, 1999 | Issued |
Array
(
[id] => 4425254
[patent_doc_number] => 06225816
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-05-01
[patent_title] => 'Split resistor probe and method'
[patent_app_type] => 1
[patent_app_number] => 9/288347
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[pdf_file] => patents/06/225/06225816.pdf
[firstpage_image] =>[orig_patent_app_number] => 288347
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/288347 | Split resistor probe and method | Apr 7, 1999 | Issued |
Array
(
[id] => 4375391
[patent_doc_number] => 06275055
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-08-14
[patent_title] => 'Semiconductor integrated circuit'
[patent_app_type] => 1
[patent_app_number] => 9/286291
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[firstpage_image] =>[orig_patent_app_number] => 286291
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/286291 | Semiconductor integrated circuit | Apr 5, 1999 | Issued |
Array
(
[id] => 4267827
[patent_doc_number] => 06259268
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[patent_issue_date] => 2001-07-10
[patent_title] => 'Voltage stress testable embedded dual capacitor structure and process for its testing'
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Array
(
[id] => 1311658
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Array
(
[id] => 1366818
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Array
(
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Array
(
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Array
(
[id] => 1525092
[patent_doc_number] => 06353313
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[patent_title] => 'Remote, wireless electrical signal measurement device'
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Array
(
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Array
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Array
(
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